Follow us on Twitter
twitter icon@FreshPatents


Process Control patents

      

This page is updated frequently with new Process Control-related patent applications.




 Image handling apparatus, image processing system, image process controlling method, and image process controlling program product patent thumbnailImage handling apparatus, image processing system, image process controlling method, and image process controlling program product
An image handling apparatus is disclosed, including an operation panel, hardware resources, a transferring part, and an image generation controlling part. The transferring part transfers image handle information input at the input screen to an external apparatus.

 Industrial automation packaged power solution for intelligent motor control and intelligent switchgear with energy management patent thumbnailIndustrial automation packaged power solution for intelligent motor control and intelligent switchgear with energy management
Systems, methods and apparatus are disclosed for interfacing process controllers in a process automation system with one or more intelligent electrical devices of an electrical automation system to use process and electrical control space information to perform actions and make decisions regarding actions in a connected enterprise system to facilitate energy management goals as well as process control goals in view of electrical control space information and process control space information.. .
Rockwell Automation Technologies, Inc.


 Skill confirmation interleaved wagering system patent thumbnailSkill confirmation interleaved wagering system
A skill confirmation interleaved wagering system is disclosed. The skill confirmation interleaved wagering system uses an interactive controller, a process controller and a wager server to authenticate skill level demonstrated by a user of the interactive application by generating simulated application telemetry data, comparing it to the application telemetry data, and then authorizing wagers based on the authentication..
Gamblit Gaming, Llc


 Statistical process control and analytics for translation supply chain operational management patent thumbnailStatistical process control and analytics for translation supply chain operational management
A method for translation supply chain analytics includes receiving operational variables of a translation process from a translation supply chain. The method further includes determining a cognitive leverage and a productivity factor for post editing of matches of a plurality of match types generated by the translation supply chain based at least in part on the operational variables from the translation supply chain.
International Business Machines Corporation


 Methods and apparatus to use vibration data to determine a condition of a process control device patent thumbnailMethods and apparatus to use vibration data to determine a condition of a process control device
Methods and apparatus to use vibration data to determine a condition of a process control device are disclosed. An example apparatus includes a vibration monitoring circuit to: collect first vibration data associated with a process control device during calibration of the process control device; calculate an operating threshold of the process control device based on the first vibration data; collect usage information associated with the process control device, the usage information indicative of a remaining portion of useful life associated with the process control device; adjust the operating threshold based on the usage information, the adjusted operating threshold reflective of the remaining portion of useful life associated with the process control device; and determine a condition of the process control device if second vibration data associated with the process control device collected after the calibration exceeds the adjusted operating threshold..
Fisher Controls International Llc


 Decentralized peripheral patent thumbnailDecentralized peripheral
A decentralized peripheral having process input and process output modules which, in a process control mode of operation, interact with field devices connected to these modules, and having an interface module in which a process image is stored, wherein in the process control mode of operation the process input modules write process input values for processing via an automation device connected to the decentralized peripheral into the process image, and the automation device writes process output values for processing via the process output modules into the process image such that as real a behavior as possible of this decentralized peripheral can be simulated.. .
Siemens Aktiengesellschaft


 Intra-field process control for lithography patent thumbnailIntra-field process control for lithography
In some embodiments, the present application is directed to a method and system for process control of a lithography tool. The method transfers a reference pattern to exposure fields of a reference workpiece to form pairs of overlapping reference layers.
Taiwan Semiconductor Manufacturing Co., Ltd.


 Process control for integrated hydrogen storage in fuel cell energy storage system patent thumbnailProcess control for integrated hydrogen storage in fuel cell energy storage system
A process control system includes a storage chamber, a fuel cell in fluid communication with the storage chamber via a feed line, a suction dampening drum in fluid communication with the fuel cell via a product line, a compressor in fluid communication with the suction dampening drum and the storage chamber, a recycle line disposed between the feed line and the product line, and a pressure controller disposed in the recycle line. When the fuel cell is in an electrolysis mode, the pressure controller may be operated to maintain a minimum pressure level inside the drum..
The Boeing Company


 Methods for detecting endpoint for through-silicon via reveal applications patent thumbnailMethods for detecting endpoint for through-silicon via reveal applications
Systems and methods for processing a semiconductor wafer includes a plasma processing chamber. The plasma processing chamber includes an exterior, an interior region with a wafer receiving mechanism and a viewport disposed on a sidewall of the plasma processing chamber providing visual access from the exterior to the wafer received on the wafer receiving mechanism.
Lam Research Corporation


 Method and  converting diagrams into application engineering elements patent thumbnailMethod and converting diagrams into application engineering elements
A method includes obtaining information defining a diagram that contains a diagram element graphically representing a component of an industrial process control and automation system. The method also includes generating a graph representing the diagram element by identifying reference points in the diagram element, identifying at least one direction of each of multiple lines in the diagram element, and forming the graph using the at least one direction of each line and the reference points.
Honeywell International Inc.


Viscometer and methods of use thereof

Disclosed herein is a method for viscosity measurement of non-newtonian fluid for in-line measurement and process control. The process involves mixing additives to a base fluid to form the non-newtonian fluid.
Schlumberger Canada Limited

Tool path generator with embedded process control commands for additive manufacturing

A tool path generator with embedded process control commands enables feed-forward process control for additive manufacturing.. .
Sandia Corporation

Process control alarm auditing

Methods, apparatus, systems and articles of manufacture are disclosed to audit process control alarms. An example disclosed method includes identifying components in the process control system that correspond to alarms to be audited.
Fisher-rosemount Systems, Inc.

Gas-phase synthesis of wires

The present invention provides a method and a system for forming wires (1) that enables a large scale process combined with a high structural complexity and material quality comparable to wires formed using substrate-based synthesis. The wires (1) are grown from catalytic seed particles (2) suspended in a gas within a reactor.
Qunano Ab

Diagnostic method, id module and process control system

A diagnostic method of diagnosing a type of a field device, includes: setting a plurality of connection units included in an i/o module to be in a state of being capable of inputting or outputting a hybrid signal which is an analog signal having a digital signal superimposed thereon, the connection units being connected to the field device and capable of inputting the hybrid signal, outputting the hybrid signal, inputting a digital signal, and outputting a digital signal; and diagnosing the type of the field device which is connected to the connection units of the i/o module, based on the digital signal included in the hybrid signal obtained through the connection units.. .
Yokogawa Electric Corporation

Communications device with adaptive scanner for process control

A method of process control within a plant includes providing a first and second field device associated with processing equipment sensing a first and second process parameter respectively. The field devices are communicably coupled to a host computer by a communications path including a shared field communications channel portion (shared communications channel) that terminates at a communications device which includes a processor and memory that implements an adaptive scan period determination algorithm (adaptive scanner) which determines a first scan period for the first field device and a second scan period for the second field device each based on a parameter relevant to a data type of the process parameter or communications used.
Honeywell International Inc.

Data processing system

The present invention easily realizes synchronization between processor cores in a multicore system. A data processing system receiving a group of data of different kinds from the outside and performing data processes by kinds includes: a plurality of data process control units corresponding to the kinds of the data group and performing data processes on the data group of corresponding kinds; and a memory unit which can be accessed by the data process control units and has a first region storing a value indicating whether the data process by the data process control units can be executed or not.
Renesas Electronics Corporation

Computing device, process control method, and computer-readable recording medium

A computing device includes a plurality of registers that store therein information that is used by a process to execute processing. When a process which is executed is switched from a first process to a second process and when the second process does not plan to use a second register in the plurality of registers, the computing device saves information stored in a first register that is being used by the first process into the second register.
Fujitsu Limited

Dyeing process control conveyor drive rope-like fabric dyeing machine

Disclosed is a method for controlling a dyeing process of a conveyor drive rope-like dyeing machine, which uses the number of cycles of circulation of fabric in a dyeing bath as a control unit for controlling the dyeing process. In other words, the entire dyeing process, including the speed of adding chemicals, the speed of heating/cooling, the time interval of holding temperature, and the time interval of rinsing with water, and the likes of the dyeing process, is controlled with the number of cycles of circulation of fabric as the control unit for a computer or a programmable logic controller to control the dyeing process..

System for spraying the inside of can bodies

A system for spraying a coating such as lacquer on the internal surface of a can body (2) comprising vacuum chuck gears (42) for each vacuum chuck (16). The vacuum chucks hold the can body as it rotates about a main process turret (10) and to a spray station (32, 34).
Crown Packaging Technology, Inc.

Method of controlling etch-pattern density and device made using such method

A method of controlling an etch-pattern density of a polysilicon layer includes depositing polysilicon on a wafer. The method includes determining polysilicon-etch regions that include dmos source regions within circuit-device areas of the wafer.
Polar Semiconductor, Llc

Method for performing process fault tolerant control of an electronic device with aid of control signals, and associated apparatus and associated computer program product

A method for performing process fault tolerant control of an electronic device, and an associated apparatus and an associated computer program product are provided, where the method includes: using at least one driver in a kernel layer of an operating system (os) of the electronic device to perform detection to determine whether a specific process running on the electronic device will be influenced by an error of the electronic device; and when it is detected that the specific process running on the electronic device will be influenced by the error of the electronic device, using at least one control signal of the os to perform process control on the specific process and using a package manager service (pms) module of the os to trigger a rescue procedure. For example, the method may further include: when triggering the rescue procedure, preventing immediately triggering termination of the specific process..
Mediatek Inc.

High pressure rf-dc sputtering and methods to improve film uniformity and step-coverage of this process

Embodiments of the invention generally provide a processing chamber used to perform a physical vapor deposition (pvd) process and methods of depositing multi-compositional films. The processing chamber may include: an improved rf feed configuration to reduce any standing wave effects; an improved magnetron design to enhance rf plasma uniformity, deposited film composition and thickness uniformity; an improved substrate biasing configuration to improve process control; and an improved process kit design to improve rf field uniformity near the critical surfaces of the substrate.
Applied Materials, Inc.

Snapshot management architecture for process control operator training system lifecycle

A cloud-based operator training system includes a snapshot management architecture, which provides a hybrid system for generation of control system level scenarios and system-state snapshots, and which can improve the fidelity of a training simulation. By implementing the simulation system on a cloud platform, the system can generate a large and growing set of snapshot files representing various control states and corresponding process states.
Rockwell Automation Technologies, Inc.

Adaptive pid control system for industrial turbines

The subject matter of this specification can be embodied in, among other things, a method that includes providing a process controller configured to perform a control algorithm based on at least one first control parameter, providing a parameter controller configured to perform a parameter adjustment algorithm, providing a turbine having an output sensor, providing to the process controller at least one first control parameter and a first input value, controlling the turbine based on the at least one first control parameter and the first input value, receiving a turbine response value provided by the turbine output sensor, determining at least one second control parameter based on the turbine response value and the parameter adjustment algorithm, providing, to the process controller from the parameter controller, the at least one second control parameter, and controlling the turbine based on the at the least one second control parameter and a second input value.. .
Woodward, Inc.

Automation facility and expanding the automation facility with at least one field device

An automation facility and method for expanding the automation facility with at least one field device, wherein expansion of the expansion of the automation facility with a further field device occurs in a simplified manner such that no disruptive influence on process control during the expansion occurs.. .

Image forming apparatus

An image forming apparatus configured to convey a recording material having an unfixed image on a surface includes a fixing device configured to fix the unfixed image on the recording material and a control device configured to perform image forming process control of the image forming apparatus, the fixing device including: a heating member heated by a heating device and a pressure member that binds the recording material on the surface of which the unfixed image is formed, and while letting the recording material pass between the pressure member oneself and the heating member, fixes the unfixed image onto the recording material, the control device calculating integrated energy consumption per unit time based on power consumption of the heating device and time needed for a print mode, and performing control of changing the image forming process.. .
Konica Minolta, Inc.

System and providing closed loop infusion formulation delivery

A system and method for providing closed loop infusion formulation delivery which accurately calculates a delivery amount based on a sensed biological state by adjusting an algorithm's programmable control parameters. The algorithm calculates a delivery amount having proportional, derivative, and basal rate components.
Medtronic Minimed, Inc.

3d ic bump height metrology apc

The present disclosure relates to a method of bump metrology that relies upon advanced process control (apc) to provide substrate warpage parameters describing a warpage of a substrate to a bump metrology module to improve focus of the bump metrology module. In some embodiments, the method measures one or more substrate warpage parameters of a semiconductor substrate.
Taiwan Semiconductor Manufacturing Co., Ltd.

Process control device, process control method, and non-transitory computer-readable medium

In a process control device, a workflow definition unit defines a workflow made up of multiple pieces of work. A deferred status setting unit sets, to a deferred status, incomplete work from among the pieces of work constituting the workflow.
Fuji Xerox Co., Ltd.

Statistical overlay error prediction for feed forward and feedback correction of overlay errors, root cause analysis and process control

A method to collect data and train, validate and deploy statistical models to predict overlay errors using patterned wafer geometry data and other relevant information includes selecting a training wafer set, measuring at multiple lithography steps and calculating geometry differences, applying a plurality of predictive models to the training wafer geometry differences and comparing predicted overlay to the measured overlay on the training wafer set. The most accurate predictive model is identified and the results fed-forward to the lithography scanner tool which can correct for these effects and reduce overlay errors during the wafer scan-and-expose processes..
Kla-tenor Corporation

Process control for long chain branching control in polyethylene production

Polymerization process control methods for making polyethylene are provided. The process control methods include performing a polymerization reaction in a polymerization reactor to produce the polyethylene, where ethylene, and optionally one or more comonomers, in the polymerization reaction is catalyzed by an electron donor-free ziegler-natta catalyst and an alkyl aluminum co-catalyst.
Univation Technologies, Llc

Computer security system and method

A method is provided for protecting a computer system, comprising creating an isolated process, then assigning a first process group to the process; creating an additional group process within the first process group; performing a first determination by an application programming interface (api) that the additional group process is within the first process group, and as a result of the first determination, causing the additional group process to inherit and duplicate a handle of the process. Process communications and control within isolated groups is permitted freely, whereas process control by an isolated process for non-isolated processes or isolated processes in different groups is constrained or prohibited..

Quality/process control of a lateral flow assay device based on flow monitoring

A method for providing quality control on a lateral flow assay device or for triggering a process-related step, the device including a substrate having at least one sample receiving area, at least one reagent zone downstream and in fluid communication with the at least one sample receiving area, at least one detection zone downstream and in fluid communication with the at least one reagent zone and at least one wicking zone downstream of the at least one detection zone, each fluidly interconnected therewith along at least one fluid flow path. The detection material provided in the at least one reagent zone produces a detectable signal that can be tracked and monitored prior to the completion of at least one test being performed on the lateral flow assay device..
Ortho-clinical Diagnostics, Inc.

Adaptive control for charged particle beam processing

An improved process control for a charged beam system is provided that allows the capability of accurately producing complex two and three dimensional structures from a computer generated model in a material deposition process. The process control actively monitors the material deposition process and makes corrective adjustments as necessary to produce a pattern or structure that is within an acceptable tolerance range with little or no user intervention.
Fei Company

Fuel cell system

There is provided a technique to suppress water from remaining in a fuel cell and auxiliary machines after a stop of operation of a fuel cell system. A fuel cell system 100 includes a controller 10, a fuel cell 20, a cathode gas supply discharge system 30 and an anode gas supply discharge circulation system 50.
Toyota Jidosha Kabushiki Kaisha

Manufacturing reverse conducting insulated gate bipolar transistor

A manufacturing method for reverse conducting insulated gate bipolar transistor, the manufacturing method is characterized by the use of polysilicon for filling in grooves on the back of a reverse conducting insulated gate bipolar transistor. The parameters of reverse conducting diodes on the back of the reverse conducting insulated gate bipolar transistor can be controlled simply by controlling the doping concentration of the polysilicon accurately, indicating relatively low requirements for process control.
Csmc Technologies Fab1 Co., Ltd.

Fast response heaters and associated control systems used in combination with metal treatment furnaces

System and method for using fast response heaters to pre-heat metal before entering a metal treatment furnace, which may improve control over metal processing, especially in response to changes in material, mass flow rate, line speed, and/or desired treatment process. Fast response heaters may be used with control systems to adjust the output of the fast response heater based on operator inputs, direct or indirect sensing of process parameters, and/or the use of thermal models to quickly adjust fast response heater output while a metal treatment furnace remains at a constant temperature or slowly transitions into a new operating state.
Novelis Inc.

Tool for inserting components of a flame arrestor assembly into a process control device

A tool for inserting a flame arrestor assembly into a process control device having a first passageway of a first depth and a second passageway of a second depth different from the first depth. The tool includes a head portion having a first diameter, and a tip portion having a second diameter less than the first diameter.
Tescom Corporation

Flame arrestor assembly

A flame arrestor assembly configured to extinguish a flame propagating between a process control device and a combustible environment outside the process control device. The flame arrestor assembly includes a flame arrestor and a retaining element.
Tescom Corporation

Mobile communication subscriber multifunction identification module

A mobile communication subscriber multifunction identification module comprises a switch controller 2 connected to a contact group 1 adapted to be connected to the system bus 10 through, for example, a contact group of a radio device 9, designed for connection of the identification module, a data bus 6 to which a group of 4 to 512 programmable non-volatile read only memory cells 7, an access key storage unit 8 for several mobile communication wireless networks of various standards, for example, gsm, cdma, umts, lte, and a memory cell 7 switch controller 2 to which a process controller 4 is connected, the switch controller 2 and the data bus 6 being installed on a wafer. The technical result of using the invention consists in enhancing the reliability and improving the conditions of the programming..

Overlay and semiconductor process control using a wafer geometry metric

The present invention may include acquiring a wafer shape value at a plurality of points of a wafer surface at a first and second process level, generating a wafer shape change value at each of the points, generating a set of slope of shape change values at each of the points, calculating a set of process tool correctables utilizing the generated set of slope of shape change values, generating a set of slope shape change residuals (sscrs) by calculating a slope of shape change residual value at each of the points utilizing the set of process tool correctables, defining a plurality of metric analysis regions distributed across the surface, and then generating one or more residual slope shape change metrics for each metric analysis region based on one or more sscrs within each metric analysis region.. .
Kla-tencor Corporation

Process optimization using mixed integer nonlinear programming

Real-time dynamic optimization of a process model in an online model-based process control computing environment. A mixed integer nonlinear programming (minlp) solver utilizes a switch to activate and deactivate a first-principle model of a process unit.
Invensys Systems, Inc.

Method and system for process control with flexible sampling

The generation of flexible sparse metrology sample plans includes receiving a full set of metrology signals from one or more wafers from a metrology tool, determining a set of wafer properties based on the full set of metrology signals and calculating a wafer property metric associated with the set of wafer properties, calculating one or more independent characterization metrics based on the full set of metrology signals, and generating a flexible sparse sample plan based on the set of wafer properties, the wafer property metric, and the one or more independent characterization metrics. The one or more independent characterization metrics of the one or more properties calculated with metrology signals from the flexible sparse sampling plan is within a selected threshold from one or more independent characterization metrics of the one or more properties calculated with the full set of metrology signals..
Kla-tencor Corporation

Systems and methods for scalable parallel data processing and process control

The present invention provides an apparatus and/or method for modular, scalable and nestable parallel data processing and process control systems from molecular to module/enclosure level, comprised of calculable inter- and intra-modular processing time standards and shorter look-ahead propagation paths; based on regular and irregular hexagonal and dodecagonal prisms, derivative dumbbells and variants as actual and/or approximated tilings/tessellations which may be arranged in columns, rows, stacks and arrays with or without rounding and/or a sliding fit. Non-sliding fit systems are fundamentally solid.

System and monitoring device calibration

A system and method for monitoring device calibration. The system includes an asset management computer communicatively coupled to field devices.
Honeywell International Inc.

Optimized decision-making multiple ore dressing production indexes based on cloud server and mobile terminals

Provided is an optimized decision-making system for multiple ore dressing production indexes based on a cloud server and mobile terminals, including mobile intelligent terminals, a cloud server, a mobile industrial private cloud server, a collecting computer and process controllers plc or dcs. The mobile industrial private cloud server calculates out multiple decision-making result solution sets; the intelligent mobile terminals determine the final decision-making results; the mobile industrial private cloud server calculates out process control set values; the mobile intelligent terminals determine the final process control set values; and the process controllers plc or dcs control equipment on a production line for production according to the final process control set values.
Northeastern University

Custom application environment in a process control device

Methods and apparatus are disclosed to provide a custom application space in a device controller. Example disclosed methods involve communicatively coupling a device controller to a host.
Fisher Controls International Llc

Total -weight detection-based method and system thereof for on-line measuring and controlling moisture in circulation drying of grain

A total weight detection-based method and system thereof for on-line measuring and controlling a moisture in circulation drying of grain. In the method, by detecting a real-time weight of the grain in a drying machine and calculating a real-time average moisture of the grain, process control on circulation drying operation is implemented.
Changchun Jida Scientific Instruments Equipment Co. Ltd

Standby process controller and standby process control electronic device

A standby process controller includes a mode control unit which is on standby without starting a standby-in process when a power-off signal is detected, stops audio and image output of an operation execution unit, sets a pre-standby mode to an electronic device so as to allow a standby-in process to be started and ended at any time, and releases the setting of the pre-standby mode when a power-on signal is detected, and a standby-in process start control unit which starts the standby-in process when a predetermined time elapses since the pre-standby mode is set. A standby-out process can be immediately performed in a case where a user performs a power-on operation within several seconds after a power-off operation is performed..
Alpine Electronics, Inc.

Sheet processing device and image forming system

A sheet processing device includes: a stacking unit configured to stack a plurality of sheets to obtain a sheet bundle; a stitched-sheet number acquiring unit configured to acquire a number of sheets in the sheet bundle, which is a target to be stitched; a permanent stitching unit configured to permanently stitch the sheet bundle; a temporary stitching unit configured to be capable of temporarily stitching a plurality of areas of the sheet bundle; a selecting unit configured to select any one of the permanent stitching unit and the temporary stitching unit to be used; and a stitching-process control unit configured to, when the temporary stitching unit is selected by the selecting unit, control the temporary stitching unit so as to change a number of areas that are stitched by the temporary stitching unit.. .
Ricoh Company, Ltd.



Process Control topics:
  • Process Control
  • Feedback Signal
  • Aqueous Solution
  • Wind Turbine
  • Implantation
  • Ion Implant
  • Workstations
  • Workstation
  • Internationalization
  • Dictionary
  • Executable
  • Validation
  • Scalability
  • Objective Function
  • Constraints


  • Follow us on Twitter
    twitter icon@FreshPatents

    ###

    This listing is a sample listing of patent applications related to Process Control for is only meant as a recent sample of applications filed, not a comprehensive history. There may be associated servicemarks and trademarks related to these patents. Please check with patent attorney if you need further assistance or plan to use for business purposes. This patent data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Process Control with additional patents listed. Browse our RSS directory or Search for other possible listings.


    0.7586

    file didn't exist2598

    479094 - 0 - 51