This page is updated frequently with new Objective Lens-related patent applications.
|System for imaging a secondary charged particle beam with adaptive secondary charged particle optics|
A secondary charged particle imaging system for imaging a secondary charged particle beam emanating from a sample by impingement of a primary charged particle beam is provided. The system includes a detector arrangement, and an adaptive secondary charged particle optics.
Ict Integrated Circuit Testing Gesellscaft Für Halbleiterprüftechnik Mbh
|Observation optical system and observation apparatus including the same|
Provided is an observation optical system including: an objective lens; an image inverting unit; and an ocular lens, the objective lens including, in order from object side to observation side: a positive first lens unit; a negative second lens unit; and a positive third lens unit, wherein the first lens unit consists of a positive front unit and a positive rear unit separated by an air interval, which is largest along optical axis, wherein the second lens unit moves to have a component orthogonal to optical axis for image blur correction, and wherein a lateral magnification of second lens unit, a curvature radius of a lens surface of second lens unit closest to observation side, a curvature radius of a lens surface of third lens unit closest to object side, the air interval between front and rear units, and a focal length of first lens unit are appropriately set.. .
Canon Kabushiki Kaisha
|Microscope lens and microscope system including the same|
Embodiments of the invention provide a microscope lens, which comprises an eye lens end and an objective lens end, wherein a central axis of the eye lens end intersects a central axis of the objective lens end, and the microscope lens further comprises a reflector disposed between the eye lens end and the objective lens end, such that light from one of the eye lens end and the objective lens end is reflected by the reflector before exiting from the other of the eye lens end and the objective lens end. Embodiments of the invention also provide a microscope system comprising the above microscope lens.
Hefei Boe Optoelectronics Technology Co., Ltd.
|Phase-contrast microscope and phase plate with annular phase-shift region|
A phase-contrast microscope includes a light source, an objective lens having a numerical aperture (na), a condenser annulus having an annular light-transmission region, and a phase plate having a first annular phase-shift region. The annular phase-shift region is arranged to receive radiation from the sample region at an angle from the sample region corresponding to greater than one-half of the na of the objective lens..
|Small smart weapon and weapon system employing the same|
A weapon and weapon system, and methods of manufacturing and operating the same. In one embodiment, the weapon includes a warhead including destructive elements and a guidance section with a seeker configured to guide the weapon to a target.
Lone Star Ip Holdings, Lp
|Illumination apparatus, vehicle component and vehicle|
An illumination apparatus for a vehicle component, especially for a rearview device of a motor vehicle, features at least one illuminant for emitting light and a condenser unit having at least one condenser lens. The condenser unit is adapted to focus the light emitted by the at least one illuminant into an optical path.
Smr Patents S.à.r.l.
|Endoscope and image processing apparatus using the same|
An endoscope to acquire a 3d image and a wide view-angle image and an image processing apparatus using the endoscope includes a front image acquirer to acquire a front image and a lower image acquirer to acquire a lower image in a downward direction of the front image acquirer. The front image acquirer includes a first objective lens and a second objective lens arranged side by side in a horizontal direction.
Samsung Electronics Co., Ltd.
|Defect inspecting method, sorting method and producing photomask blank|
Disclosed is a method of inspecting a defect present at a surface portion of a photomask blank which includes an optical film, and a thin film. The method includes: selecting and designating an inspection treatment procedure and a criterion for determination of rugged shape of the defect which correspond to modes of the optical film and the thin film of the photomask blank; applying inspection light to a region including the defect while maintaining a distance between the defect and an objective lens of an inspecting optical system, based on the designated inspection treatment procedure, and collecting reflected light from the region irradiated with the inspection light, as a magnified image of the region, through the inspecting optical system; and determining the rugged shape of the defect, from light intensity distribution of the magnified image, based on the designated criterion for determination..
Shin-etsu Chemical Co., Ltd.
|Firearm accessory mount|
A mount for attaching an accessory to a firearm that has a mounting rail and a scope with an objective lens. The mount includes a body with a passageway defined by a perimeter.
Whg Properties, Llc
|Microscope system, controlling microscope system, and computer-readable recording medium|
A microscope system includes: a microscope main body including an objective lens arranged in such a manner that an optical axis of the objective lens is aligned with an observation light path of the microscope main body; and an automatic focus unit including a light source, a dichroic mirror arranged so as to be inserted on or to be deviated from the observation light path and configured to reflect light emitted from the light source in a direction of the optical axis of the objective lens, and a dichroic mirror moving mechanism. The microscope main body further includes a controller having a dichroic mirror movement control unit configured to control the dichroic mirror moving mechanism to move the dichroic mirror to an arrangement position of the dichroic mirror on the observation light path, the arrangement position being correlated to the objective lens in advance..
Finder and imaging apparatus
A finder is a reverse galileo type finder comprising, in order from the object side to the eye point side: an objective lens group having a negative refractive power; and an eyepiece lens group having a positive refractive power. The distance between the objective lens group and the eyepiece lens group is the longest distance from among distances between lenses, as an air converted length, in an observation optical system from the objective lens group to the eyepiece lens group.
Dual-pupil re-imaging optical systems
Dual-pupil, dual spectral band wide field-of-view re-imaged refractive optical imaging systems. In one example an optical imaging system includes a dual-band front objective lens group configured to receive electromagnetic radiation over the field-of-view of the optical imaging system, to form a first pupil, and to direct the electromagnetic radiation through the first pupil, the electromagnetic radiation including first and second non-overlapping spectral bands, and the field-of-view spanning at least 45°×45°, and a re-imaging refractive optical sub-system configured to receive the electromagnetic radiation via the first pupil, to form at least one intermediate image plane, and to focus the electromagnetic radiation via at least one second pupil onto at least one final image plane to form a first image from the first spectral band and a second image from the second spectral band.
Quasi-monocentric-lens-based multi-scale optical system
Optical systems based on an objective lens comprising one or more plastic lens elements are disclosed. The inclusion of plastic lens element reduces one or more of system cost, size, weight, and/or complexity.
Scanning probe microscope and optical axis adjustment scanning probe microscope
A scanning probe microscope includes: a cantilever; a cantilever supporting portion; a movement mechanism that moves a position of the cantilever; a light source that emits detection light; a detector that receives the detection light reflected on a reflecting surface of the cantilever; an objective lens; and a controller that controls the movement mechanism to perform a process including: detecting a spot position of a spot light of the detection light; detecting a position of the cantilever from an image captured by the imaging device; and controlling the movement mechanism based on the spot position, the position of the cantilever, an incident angle of the detection light, and the attachment angle such that the detection light is reflected on the reflecting surface when the cantilever is attached to the cantilever supporting portion.. .
Hitachi High-tech Science Corporation
Optical measuring device
Provided is an optical measuring device that can realize a wide measurement region without an increase in the measurement time or a reduction in the measurement region while avoiding damage to a measurement target due to excessive light exposure, using a simple configuration. The device includes a light source, an optical splitting unit configured to split a light beam emitted from the light source into a signal beam and a reference beam, an objective lens configured to focus the signal beam and irradiate a measurement target with the signal beam, a scanning unit configured to move the focus position of the signal beam, an optical element having lower transmissivity in its peripheral portion than in its central portion, interference optics configured to combine the reference beam with the signal beam reflected or scattered by the measurement target, thereby generating interference beams, and photodetectors configured to detect the respective interference beams..
Hitachi-lg Data Storage, Inc.
Zoom objective lens of operating microscope
Disclosed is a zoom objective lens (16) of an operating microscope (10), wherein the zoom objective lens (16) and a lens cone of the operating microscope (10) are provided along a same axis (24). The zoom objective lens (16) comprises a positive lens group (11) and a negative lens group (12) provided along a same axis (24).
Zumax Medical Co., Ltd
Full-color three-dimensionnal optical sectioning microscopic imaging system and method based on structured illumination
The present invention provides a full-color three-dimensional optical sectioning microscopic imaging system and method based on structured illumination, includes an illumination source, a dichroic prism positioned at the illumination optical path, a structured light generator positioned at the reflected optical path of the dichroic prism, a lens positioned at the transmitted optical path of the dichroic prism, a beam splitter positioned at the optical path of the lens, an objective lens and a sample stage positioned at the upper optical path of the beam splitter, a reflector mirror and a tube lens positioned at the lower optical path of the beam splitter and a ccd camera positioned behind the tube lens. The illumination source is an incoherent monochrome led or a white light led the structured light generator is a dmd (digital micro-mirror device)..
Xi'an Institute Of Optics And Precision Mechanics Of Cas
Charged particle beam device and inspecting and/or imaging a sample
A charged particle beam device for imaging and/or inspecting a sample is described. The charged particle beam device includes a beam emitter for emitting a primary charged particle beam; and a retarding field device for retarding the primary beam before impinging on the sample, the retarding field device including a magnetic-electrostatic objective lens and a proxy electrode.
Ict Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh
Microscope observation container and observation device
In the microscope observation container according to the present invention, an observed sample is accommodated by an objective lens barrel provided with a housing extending along the radiation direction of excitation light and an objective lens fixed to an inside surface of the housing. The microscope observation container is provided with a structure for collecting a liquid immersion medium added by dispensation, the structure having a portion contacted by the objective lens barrel during observation.
Hitachi High-technologies Corporation
Microparticle measurement device
In a microparticle measurement device, a sample is passed through each channel in a multi-flow channel, and a predetermined linear area is illuminated with light. Measurement light originating from a microparticle in the sample, such as scattered or fluorescent light, is shaped into a parallel beam by an objective lens and passes through a first and second transmission portions.
National University Corporation Kagawa University
Ophthalmic surgical apparatus and attachment for ophthalmic surgery
An ophthalmic surgical apparatus includes an observation optical system, an illumination optical system, an interference optical system, and an image forming unit. The observation optical system is configured to observe an eye through an objective lens.
Kabushiki Kaisha Topcon
Electron beam device
The present invention provides an electron beam device that achieves high spatial resolution and high luminance, while remaining insusceptible to the effects of external disturbance. The present invention relates to an electron beam device, wherein, between, e.g., an electron source for generating an electron beam and an objective lens for focusing the electron beam onto a sample, a high voltage beam tube is disposed close to the electron source and a low voltage beam tube is disposed close to the objective lens.
Hitachi High-technologies Corporation
Methods and apparatus having a two-surface microlens array for low f-number plenoptic cameras
Innovations relating to systems for generating plenoptic images, are disclosed. One system includes an objective lens having a focal plane, a light sensor positioned to receive light propagating through the objective lens, a first optical element array positioned between the objective lens and the sensor, the first optical element array including a first plurality of optical elements, and a second optical element array positioned between the first optical element array and the sensor, the second optical element array comprising a second plurality of optical elements.
Sensor with ultra-narrow bandpass
An optical system with ultra-narrow optical band-pass comprising an objective lens group, and a relay group, having a collimating system, the relay group being in optical communication with the objective lens group.. .
Bae Systems Information And Electronic Systems Integration Inc.
Integrated automotive system, compact, low-profile nozzle assembly and compact fluidic circuit for cleaning a wide-angle image sensor's exterior surface
A low profile, integrated camera wash nozzle assembly 1010 is readily and unobtrusively integrated into a vehicle's exterior trim surfaces 1420 to make a more visually appealing exterior design while not compromising spray performance. A system and nozzle assembly (e.g., 710, 810, 1010) for cleaning an exterior objective lens or wide-angle sensor's exterior surface 1022 to remove accumulated debris sprays washer fluid at a selected shallow angle which is substantially transverse to the lenses central viewing axis 1050.
Wide-field retinal imaging system
A retinal imager for imaging a retina of an eye includes an illumination source operable to generate illumination light and a beam splitter operable to receive the illumination light and direct the illumination light along an optical axis. The retinal imager also includes a field lens disposed along the optical axis and an objective lens disposed along the optical axis and operable to contact a cornea of the eye.
Phoenix Technology Group
Pattern inspection apparatus and pattern inspection method
A pattern inspection apparatus includes a transmitted illumination optical system to illuminate change the shape of a first inspection light, a reflected illumination optical system to illuminate a mask substrate with a second inspection light by using an objective lens and a polarizing element, and let a reflected light from the mask substrate pass therethrough, a drive mechanism to enable the polarizing element to be moved from/to outside/inside an optical path, a sensor to receive a transmitted light from the mask substrate illuminated with the first inspection light during stage moving, and an aperture stop, between the mask substrate and the sensor, to adjust a light flux diameter of the transmitted light so that the transmitted light reaching the sensor can be switched between high and low numerical aperture (na) states with which the transmitted light from the mask substrate can enter the objective lens.. .
Nuflare Technology, Inc.
Inverted microscope and inverted microscope system
This inverted microscope comprises the following elements: an immersion objective lens, a medium container which is disposed above the immersion objective lens with a gap, and which has a bottom surface having a transparent portion and being capable of retaining a first immersion medium between the transparent portion and the immersion objective lens, and also which is capable of storing inside thereof a second immersion medium having a refractive index which is the same as or similar to that of the first immersion medium; and a movable stage to support a sample container, which accommodates a specimen, in a horizontally movable manner inside the medium container and which has a transparent portion in at least a part of a bottom surface thereof.. .
Device and optically inspecting and analyzing stent-like objects
The device has an apparatus for rotatably holding and positioning at least one stent-like object and a unit for illuminating at least inner and outer surfaces thereof, including at least a wide field epi illumination device and a diffuse back illumination device for simultaneously illuminating the stent-like object. The illumination unit may further include diffuse side illumination device for inspecting side surfaces of the stent-like object.
Sensofar Medical, S.l.
Endoscopic system, image processing device, image processing method, and program
To solve the above problem, a first technology is an image processing device configured to estimate an approximate center of rotation of an endoscopic device based on motion detection in response to a movement of an objective lens at a distal portion of the endoscopic device by manipulating a proximal portion of the endoscopic device.. .
Apparatus of plural charged-particle beams
A multi-beam apparatus for observing a sample with high resolution and high throughput is proposed. In the apparatus, a source-conversion unit forms plural and parallel images of one single electron source by deflecting plural beamlets of a parallel primary-electron beam therefrom, and one objective lens focuses the plural deflected beamlets onto a sample surface and forms plural probe spots thereon.
Hermes Microvision, Inc.
Optical systems for multi-sensor endoscopes
There is provided herein an optical system for a tip section of a multi-sensor endoscope, the system comprising: a front-pointing camera sensor; a front objective lens system; a side-pointing camera sensor; and a side objective lens system, wherein at least one of said front and side objective lens systems comprises a front and a rear sub-systems separated by a stop diaphragm, said front sub-system comprises, in order from the object side, a first front negative lens and a second front positive lens, said rear sub-system comprises, in order from the object side, a first rear positive lens, an achromatic sub-assembly comprising a second rear positive lens and a third rear negative lens, wherein the following condition is satisfied: f(first rear positive lens)≦1.8f, where f is the composite focal length of the total lens system and f(first rear positive lens) is the focal length of said first rear positive lens.. .
Endochoice Innovation Center Ltd.
Three-dimensional drift control apparatus and microscope apparatus
A three-dimensional direction drift control apparatus and a microscope apparatus that correct misalignment of a relative position between an object lens and a sample. A near-infrared light emitted from a light source is irradiated onto a surface of a glass cover holding a sample on a stage.
An optical arrangement and imaging a sample
An optical arrangement for imaging a sample is disclosed. The optical arrangement comprises at least one first objective lens and at least one second objective lens, at least one illumination source for producing an illumination beam, detector for imaging radiation from the sample, and at least one mirror for reflecting the radiation from one of the first objective lens or the second objective lens into the detector.
European Molecular Biology Laboratory
Microscope objective lens
A microscope objective lens includes, in order from an object side, a first lens group having positive refractive power, a second lens group having positive refractive power, and a third lens group having negative refractive power, and is configured such that the first lens group includes, on the most object side, a positive meniscus lens whose concave surface is directed to the object side, such that the second lens group includes a diffractive optical element having positive refractive power, and such that the diffractive optical element is arranged at a position closer to the image than a portion at which the diameter of a light flux passing through the first lens group and the second lens group is the larges. .
With a microspectroscopy device provided with an objective lens with a high numerical aperture, a defocus arises from thermal drift, etc., necessitating auto-focusing. Conventional auto-focus based on through-focus image acquisition takes time, and thus, it cannot be applied to continuous measurement over a long time wherein high-speed sampling is carried out.
Hitachi High-technologies Corporation
Multi-angle rear-viewing endoscope and operation thereof
A rear-viewing endoscope includes a rigid section having first and second ends, and a cavity situated between the first and second ends. The rigid section has a longitudinal length and defining a longitudinal axis (lar).
Optical methods and devices for enhancing image contrast in the presence of bright background
A device including: a light source for outputting illumination light to an object to be imaged; an image sensor for an image of the object as illuminated by the light source; a first objective lens for focusing the illumination light on the object; and a spatial filter positioned in an optical path at a spatial frequency plane of the first objective lens, the spatial filter having an opaque central region and a transparent region outside of the central region, the opaque central region being such that it improves contrast of the image on the image sensor.. .
Omnitek Partners Llc
Method of reducing coma and chromatic abberation in a charged particle beam device, and charged particle beam device
The present disclosure provides a method of reducing coma and chromatic aberration in a charged particle beam device for providing a beam tilt of a charged particle beam. The method includes tilting the charged particle beam with a deflection assembly consisting of two or more electrostatic deflection elements, wherein at least one deflection element of the two or more deflection elements is a post-lens deflector, while the charged particle beam is guided through an essentially coma-free z-position of an objective lens, and reducing off-axis chromatic aberrations with a magnetic deflection element, wherein tilting the charged particle beam reduces coma independent of off-axis chromatic aberrations..
Ict Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh
Single-sensor system for extracting depth information from image blur
Hardware and software methodology are described for three-dimensional imaging in connection with a single sensor. A plurality of images is captured at different degrees of focus without focus change of an objective lens between such images.
California Institute Of Technology
Techniques for scanned illumination
Imaging systems are provided for high speed, high resolution imaging of biochemical materials. In an example embodiment, an imaging system comprises an objective lens component, a line generator, a digital camera, a positioning stage, and a scan mirror.
Complete Genomics, Inc.
Method for inspecting an object with an array of beams
According to an embodiment of the invention there may be provided a system for inspecting an object, the system may include a traveling lens acousto-optic device that is configured to generate a sequence of traveling lenses that propagate through an active region of the traveling lens acousto-optic device; an illumination unit that that is configured to illuminate the sequence of traveling lenses to provide a sequence of input beams; a first beam splitter that is configured to split the sequence of input beams to an intermediate array of intermediate beams, the intermediate array comprises multiple sequences of intermediate beams, the sequences of intermediate beams are spaced apart from each other; a masking unit that is configured to mask first beams of the intermediate array and unmask output beams of the intermediate array in an alternating manner; multiple detectors; and an objective lens that is configured to receive the output beams, direct the output beams towards multiple areas of the object, receive collected beams from the multiple areas of the object, and direct the collected beams towards the multiple detectors; and wherein each detector is associated with an area of the multiple areas.. .
Applied Materials Israel Ltd.
Fully automatic rapid microscope slide scanner
Microscope slide scanner. In an embodiment the microscope slide scanner comprises a single enclosure unit that includes at least one objective lens, at least one line scan camera, at least one communication port, and at least one processor.
Leica Biosystems Imaging, Inc.
Optical microscope and detecting lens immersion
An optical microscope and method for detecting lens immersion in optical microscopy includes an ultrasound circuit acoustically coupled to both an objective lens and a sample slide of an optical microscope, the ultrasound circuit comprising an ultrasound transmitter and an ultrasound receiver. The optical microscope and method includes transmitting an ultrasound pulse from the ultrasound transmitter to the ultrasound receiver, determining that a transit time of the ultrasound pulse is less than a threshold time, and providing an output signal from the pulse discriminator indicating that the ultrasound pulse is less than the threshold time..
General Electric Company
System and imaging a secondary charged particle beam with adaptive secondary charged particle optics
A method of imaging a secondary charged particle beam emanating from a sample by impingement of a primary charged particle beam is provided. The method includes setting a first operating parameter to a first value.
Ict Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh
Method for positioning micro-tool and micro-manipulator device
A method for positioning a micro-tool (4) comprises: a positioning gauge positioning process (si) including placing a gauge surface (5d) of a positioning gauge (5) at a needle tip position while the positioning gauge (5) is fixed to a holding part (30), and aligning a mark (5b) provided in the positioning gauge (5) with the optical axis (62a) of an objective lens (62); a positioning gauge focus adjustment process (s2) to focus on the mark (5b) in a state where the positioning gauge (5) has been positioned; and a micro-tool attachment process (s3) including fixing the micro-tool (4) to the holding part (30) after removing the positioning-gauge (5) from the holding part (30).. .
Narishige Lifemed Co., Ltd.
Charged particle beam apparatus
Disclosed is a charged particle beam apparatus wherein charged particles emitted from a sample are efficiently acquired at a position as close as possible to the sample, said position being in the objective lens. This charged particle beam apparatus is provided with: a charged particle beam receiving surface that is provided with a scintillator that emits light by means of charged particles; a photodetector that detects light emitted from the scintillator; a mirror that guides, to the photodetector, the light emitted from the scintillator; and an objective lens for focusing the charged particle beam to a sample.
Hitachi High-tecnologies Corporation
Inspection apparatus and method, lithographic apparatus, lithographic processing cell and device manufacturing method
The present invention determines property of a target (30) on a substrate (w), such as a grating on a wafer. An inspection apparatus has an illumination source (702, 710) with two or more illumination beams (716, 716′, 716″, 716′″) in the pupil plane of a high numerical aperture objective lens (l3).
Asml Netherlands B.v.
Defect inspecting method, sorting method, and producing photomask blank
A method of inspecting a defect present at a surface portion of a photomask blank having at least one thin film formed on a substrate by use of the inspecting optical system. The method includes setting the distance between the defect and an objective lens of an inspecting optical system to a defocus distance, applying inspection light to the defect through the objective lens, collecting reflected light from the region irradiated with the inspection light, through the objective lens, as a magnified image, identifying a light intensity variation portion of the magnified image, and determining the rugged shape of the defect on the basis of a variation in light intensity of the light intensity variation portion of the magnified image..
Shin-etsu Chemical Co., Ltd.
A removable objective lens arrangement
A removable objective lens arrangement (5) having a removable plate (30), at least one support device (60,70) fixably mounted on the removable plate (30) and an objective lens (40) adjustably mounted within the at least one support device (60, 70).. .
European Molecular Biology Laboratory
Scanning luminescence light microscope with gratings of luminescence inhibition light and further light
A scanning luminescence light microscope for spatial high resolution imaging a structure marked with a luminescent marker comprises a light source for luminescence inhibition light and for further light; a light shaping and aligning device; and a detector registering luminescence light emitted by the luminescent marker. The device, by means of two optical gratings and an objective lens, forms two crossing line gratings of the luminescence inhibition light, and two crossing line gratings of the further light so that local intensity minima of an overall intensity distribution of the luminescence inhibition light are delimited in at least two directions, and that local intensity maxima or local intensity minima of an overall intensity distribution of the further light coincide with the local intensity minima of the luminescence inhibition light.
Max-planck-gesellschaft Zur Foerderung Der Wissenschaften E.v.
Optical arrangement for imaging a sample
An optical arrangement (10) for imaging a sample (20). The arrangement comprises an illumination objective lens (30) for producing an illumination beam (40) and a detection objective lens (50) for imaging radiation (60) from the sample (20).
European Molecular Biology Laboratory
Microscope system and microscopy method
Provided is a microscope system including a motor-driven stage on which is mounted a culture vessel containing one or more cell clusters, each including cells having a target molecule labeled with a fluorescent or luminescent chemical; a low-magnification-image acquiring unit that acquires low-magnification images of the cell clusters in the culture vessel mounted on the stage; a detecting unit that detects the position of each cell cluster in the culture vessel by analyzing the acquired low-magnification images; and a high-magnification-image acquiring unit that, after the detected position is aligned with the optical axis of an objective lens, acquires slice images of fluorescence or luminescence emitted from the cells forming the cell cluster at a higher magnification than the low-magnification-image acquiring unit at intervals along the optical axis while the stage and/or the lens is moved to change stepwise the distance between the lens and the cell cluster.. .
Photoacoustic microscope apparatus
A photoacoustic microscope apparatus includes a light source that emits excitation light which generates photoacoustic waves, an objective lens which focuses the excitation light on a specimen, a scanning unit which moves a focused position of the excitation light on the specimen, a photoacoustic-wave detecting unit which has a sensor unit that detects a photoacoustic wave generated, and an image constructing unit which constructs an image based on data from the photoacoustic-wave detecting unit. For the sensor unit, an angle of a range which is capable of receiving the photoacoustic wave incident on the sensor unit is larger than an angle corresponding to a numerical aperture on a side illuminated of the objective lens..
Optical instrument for identifying and locating micro-etching on an ophthalmic lens
An optical instrument includes: a collimation element (30) having a focal distance; a point light source (25-27) with a wavelength of between 700 and 1000 nm and a diameter less than or equal to a fiftieth of the focal distance, placed at a first focus of the collimation element, so that the light becomes a beam (20) of collimated light; a backscatterer (12); a support for receiving an ophthalmic lens (14), with the collimation element, support and backscatterer being placed so that the beam of collimated light encounters the lens location (15) where micro-etching is present; an image analyzing element (32) and an image capture element (31) linked to the analyzing element and including an objective lens (35) placed at a second focus of the collimation element, which objective lens is developed to provide the analyzing element with images of the backscatterer in order to identify and locate the micro-etching.. .
Essilor International (compagnie GÉnÉrale D'optique)