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Microscope

Microscope-related patent applications - as published by the U.S. Patent and Trademark Office (USPTO).


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Securely collecting and processing medical imagery
Greatdef Corp.
October 12, 2017 - N°20170293718

A system for recording hipaa compliant medical imagery may be configured using two separate systems. A first system comprising a separate and independent medical imaging device such as a microscope, an endoscope, or a similar medical imaging tool. The desired medical imaging tool is configured so that a high-definition recording device is able to capture the imagery displayed by the ...
Structured illumination microscope and image processing method using the same
Samsung Display Co., Ltd.
October 12, 2017 - N°20170293261

A structured illumination microscope includes a holographic image generator that generates a holographic image at a position overlapping an observation object. The structured illumination microscope further includes an image sensor that senses an interference image generated by overlapping the observation object with the holographic image. The structured illumination microscope additionally includes an image recovery processor that recovers an image of ...
Continuous particle imaging and classification system
Woods Hole Oceanographic Institution
October 12, 2017 - N°20170293217

The innovative systems and methods described herein use a high-resolution imaging microscope for capturing images of marine microorganisms and particles in situ in an aquatic environment. Using darkfield illumination, high-resolution images may be obtained, capturing features of the microorganism or particle as small as 10 μm in remarkable clarity. Utilizing an open flow-through approach in sample imaging, the delicate ...
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Microscope Patent Applications
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Surgical microscope
Mitaka Kohki Co., Ltd.
October 12, 2017 - N°20170293132

A surgical microscope employs a pentaprism beam splitter as a branching unit to branch each beam passed through variable power optical systems into a first beam and a second beam, the first beam being horizontally reflected for an eyepiece unit, the second beam being vertically transmitted for an imaging device. The pentaprism alone is capable of simultaneously conducting reflection to ...
Mirror device
Leica Microsystems Cms Gmbh
October 12, 2017 - N°20170293131

The invention relates to a mirror device tor deflecting illuminating light in spim microscopy. The invention is characterized by a holding component that comprises a connecting element for mounting the holding component on a microscope objective, at least one deflection mirror being detachably mounted on the holding component.
Medical stereomicroscope optical system and medical observation apparatus
Sony Corporation
October 12, 2017 - N°20170293129

An image quality is improved although a medical stereomicroscope optical system and a medical observation apparatus are small and light. An objective optical system and a plurality of imaging optical systems are arranged in an order from an object side to an image side, and the imaging optical system has at least a single aspheric surface. Accordingly, a spherical aberration ...
Microscope Patent Pack
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Microscope Patent Applications
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inventor
  • 558+ full patent PDF documents of Microscope-related inventions.
  • Exact USPTO filing data with full-text, images, drawings & claims.
  • Index pages: Table View and Image-Grid View layouts. All images in each PDF.
Microscope and component for multi-beam scanning
Carl Zeiss Microscopy Gmbh
October 12, 2017 - N°20170293126

A laser-scanning microscope having an illumination-beam path and a detection-beam path and a microscope objective. A component for generating a plurality of scanning beams from at least one illumination beam is located in the illumination-beam path. A wedge-shaped, light-transmitting first component part provided in the illumination beam path generates spatially offset partial beams, the scanning beams being generated at the ...
Fully digitally controller for cantilever-based instruments
Oxford Instruments Afm Inc.
October 12, 2017 - N°20170292971

A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (adc). The resulting digitized representation of the output signal is then processed with field programmable ...
Device and method for analysing a defect of a photolithographic mask or of a wafer
Carl Zeiss Smt Gmbh
October 12, 2017 - N°20170292923

The present application relates to a scanning probe microscope comprising a probe arrangement for analyzing at least one defect of a photolithographic mask or of a wafer, wherein the scanning probe microscope comprises: (a) at least one first probe embodied to analyze the at least one defect; (b) means for producing at least one mark, by use of which the ...
System and method for measuring oil content in water using laser-induced fluorescent imaging
Carl Zeiss Smt Gmbh
October 12, 2017 - N°20170292913

The invention is a system and method to measure oil content in water utilizing the fluorescence of oil emitted under excitation by laser. Oil and water mixture is transferred through the system to a measurement section in a microscope, which produces high resolution 3-dimensional images of the oil and water mixture with the fluorescence. The images are analyzed to calculate ...
Optical platelet counter method
Foce Technology International Bv
October 12, 2017 - N°20170292905

Platelets or blood cells are detected in a fluid sample by adjusting a focal depth of a microscope through a range of values, the microscope having a mounted sample and an objective lens adapted with one or both of (a) a spherical aberration correction unmatched to a utilized cover plate for the sample, or (2) a numerical aperture unmatched to a ...
Copper heat dissipation material, carrier-attached copper foil, connector, terminal, laminate, shield material, printed-wiring board, metal ...
Jx Nippon Mining & Metals Corporation
October 12, 2017 - N°20170291397

A copper heat dissipation material having a satisfactory heat dissipation performance is provided. The copper heat dissipation material has an alloy layer containing at least one metal selected from cu, co, ni, w, p, zn, cr, fe, sn and mo on one or both surfaces, in which surface roughness sz of the one or both surfaces, measured by a laser ...
Method for automatic correction of astigmatism
Intelligent Virus Imaging Inc.
October 05, 2017 - N°20170287676

The method is for automatic astigmatism correction of a lens system. A first image of a first frequency spectrum in a microscope is provided. The first image of a view is not in focus. The first image is then imaged. A first roundness measure of a distribution and directions of intensities in the first image is determined. The lens is ...
Microscope Patent Pack
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Microscope Patent Applications
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inventor
  • 558+ full patent PDF documents of Microscope-related inventions.
  • Exact USPTO filing data with full-text, images, drawings & claims.
  • Index pages: Table View and Image-Grid View layouts. All images in each PDF.
Digital microscope and focusing method thereof
Tagye Technology Hangzhou Co., Ltd.
October 05, 2017 - N°20170285319

A digital microscope and a focusing thereof are provided. The microscope integrates a focusing lens unit, a zooming lens unit and related control circuits into the interior of the microscope. The control unit executes a focus searching algorithm and focus tracking algorithm, controls movement of the focusing lens unit and the zooming lens unit and achieves auto-focus by adjusting the ...
Polarizing device for polarizing microscopes and method for using the polarizing device
Chengdu Westimage Technology Co., Ltd
October 05, 2017 - N°20170285316

A polarizing device for a polarizing microscope, including: a base plate on which the polarizing microscope is fixed, a base support, a lower polarizing assembly, and an upper polarizing assembly. The base support is vertically disposed at one side of the base plate. The lower polarizing assembly is disposed at the lower-middle part of the base support, and the upper ...
Laser scanning microscope
Olympus Corporation
October 05, 2017 - N°20170285315

Provided is a laser scanning microscope including a stage on which a sample is placed, an objective lens that is disposed below the stage and that focuses laser light from a light source onto the sample, a scanner that scans the laser light focused by the objective lens over the sample, a condenser lens disposed opposite the objective lens with ...
Scanning probe microscope and probe contact detection method
Hitachi High-tech Science Corporation
October 05, 2017 - N°20170285067

According to this invention, a scanning probe microscope for scanning a surface of a sample with a probe by bringing the probe into contact with the surface of the sample, comprises a cantilever having the probe at its tip; a displacement detection unit to detect both a bending amount and a torsion amount of the cantilever; and a contact determination ...
Thermoelectric conversion material, method of manufacturing thermoelectric conversion material, and thermoelectric conversion module
Furukawa Co., Ltd.
September 28, 2017 - N°20170279025

A thermoelectric conversion material (10) according to an embodiment includes a plurality of parent-phase particles (22) and nanoparticles (30). The parent-phase particles (22) have a crystalline structure. Each of the nanoparticles (30) includes an oxide and exists at an interface between the parent-phase particles (22). The nanoparticles (30) include at least one element that constitutes the crystalline structure. When a range of 6 μm×4 ...
Charged particle beam device
Hitachi High-technologies Corporation
September 28, 2017 - N°20170278671

The scanning charged particle beam microscope according to the present application is characterized in that, in acquiring an image of the fov (field of view), interspaced beam irradiation points are set, and then, a deflector is controlled so that a charged particle beam scan is performed faster when the charged particle beam irradiates a position on the sample between each ...
Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices
Protochips, Inc.
September 28, 2017 - N°20170278670

A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
Three-dimensional image reconstruction method, image processor, and electron microscope
Jeol Ltd.
September 28, 2017 - N°20170278669

A three-dimensional image reconstruction method associated with the present invention comprises the steps of: obtaining a first transmission electron microscope image of a sample containing the membrane proteins present within a lipid membrane, the image having been taken by illuminating an electron beam on the sample from a direction tilted relative to a line normal to the membrane surface of ...
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