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|| List of recent Microscope-related patents
| Photoresist simulation|
A processor based method for measuring dimensional properties of a photoresist profile by determining a number acid generators and quenchers within a photoresist volume, determining a number of photons absorbed by the photoresist volume, determining a number of the acid generators converted to acid, determining a number of acid and quencher reactions within the photoresist volume, calculating a development of the photoresist volume, producing with the processor a three-dimensional simulated scanning electron microscope image of the photoresist profile created by the development of the photoresist volume, and measuring the dimensional properties of the photoresist profile.. .
| Negative-electrode material, negative electrode active material, negative electrode, and alkali metal ion battery|
A negative-electrode material is a carbonaceous negative-electrode material used in an alkali metal ion battery and an average layer spacing d002 of face (002) calculated by an x-ray diffraction method using cukα radiation as a radiation source is equal to or more than 0.340 nm. When the negative-electrode material is embedded in an epoxy resin, the epoxy resin is cured, the resultant cured material is cut and polished to expose a cross-section of the negative-electrode material, and the cross-section is observed in a bright field with 1000 times magnification using an optical microscope, a first region and a second region having different reflectance ratios are observed from the cross-section of the negative-electrode material..
| High speed x-ray inspection microscope|
The x-ray system may also be utilized in methods for high speed metrology or inspection, which in turn enable rapid process development, as well as manufacturing process control and yield management.. .
| Immersion liquid retainer, observed portion fixing apparatus and microscope|
An immersion liquid retainer is an immersion liquid retainer used for an observation made with a microscope including an immersion objective. The immersion liquid retainer includes a fixing part in which a first penetration hole for viewing an observed portion of a specimen is formed and which is fixed to the specimen, and an immersion liquid retaining part where a concave part that has a bottom surface configured with a transparent flat plate and is intended to retain an immersion liquid is formed.
| Adaptive device for inspecting endfaces of fiber-optic connector having multiple rows of fibers|
A device for shifting the imaging axis of a microscope for inspecting endfaces of a fiber-optic connector having multiple rows of endfaces has a supporting body for receiving a microscope; a first swinging lever mounted on top of the supporting body and rotatable about a first swinging axis perpendicular to the imaging axis of the microscope; a first connecting piece extending from the first swinging lever towards the imaging axis; a second swinging lever pivoted on the first connecting piece and rotatable about a second swinging axis perpendicular to the first swinging axis; and a fitting tip connected to the second swinging lever for interfacing with the fiber-optic connector. Using two sets of biasing means and adjustment drivers, the imaging axis passing through the supporting body and the fitting tip can be shifted in two mutually perpendicular directions to selectively align with any endface of the fiber-optic connector..
| Optical device|
For an optical device as a transmission-type scanning optical microscope having a pinhole or a slit for limiting the amount of a detected light beam, a method of moving a scanning beam without moving an observation sample to be scanned is realized. A scanning beam from a beam scanning mechanism that has passed through an observation sample is focused onto a reflection plate, and is then returned back again to the observation sample.
A variety of actions are controlled based on an operator's various finger gestures used on the touch screen disposed on the display surface of the display means, for example, making contact by a finger (tap), making two consecutive contacts by a finger (double-tap), making contact by a finger, and moving the finger without releasing it (drag), making contact by a finger and maintaining the contact for a predetermined time or longer (touch-and-hold), making simultaneous contact by two fingers, and increasing spacing between the fingers (pinch-out) or decreasing the spacing (pinch-in), and making simultaneous contact by two fingers, and moving the fingers in parallel (double-drag).. .
| Motion-compensated confocal microscope|
A motion-compensated confocal microscope includes a laser scanning system, a fiber-optic component having a proximal end and a distal end such that the fiber-optic component is optically coupled to the laser scanning system to receive illumination light at the proximal end and to emit at least a portion of the illumination light at the distal end, and a detection system configured to receive and detect light returned from a specimen being observed and to output an image signal. The light returned from the specimen is received by the distal end of the fiber-optic component and transmitted back and out the proximal end of the fiber-optic component.
| Automatic microscopic focus system and method for analysis of transparent or low contrast specimens|
A microscope system and method empirically determines the boundaries of the depth of field of an objective lens. The system and method are largely automated, with the manipulation of a specimen to be imaged being carried out by processors and associated equipment.
| Specimen holder for holding a semiconductor device during a sample preparation procedure carried out using first and second sample preparation apparatuses|
A specimen holder is configured to hold, during a sample preparation procedure carried out using first and second sample preparation apparatuses, a semiconductor device to be analyzed using an electron microscope. The specimen holder includes a holding portion having a support configured to support the semiconductor device; and a supporting portion configured to releasable support the holding portion.
| Imaging a sample in a tem equipped with a phase plate|
The invention relates to a method of forming an image of a sample in a transmission electron microscope equipped with a phase plate. Prior art use of such a phase plate can introduce artifacts in the form of ringing and a halo.
| Coordinate correcting method, defect image acquiring method and electron microscope|
In accordance with an embodiment, a coordinate correcting method includes generating a pattern image for matching from an sem image acquired by an electron microscope in accordance with a defect coordinate, performing matching between a defect image and the pattern image, superimposing the defect image and the pattern image between which the matching has been performed on a difference image, specifying a position to which a defect position on the difference image corresponds on the pattern image, and converting the corresponding position on the sem image to a coordinate on a wafer. The defect coordinate, the defect image and the difference image are obtained by a defect inspection apparatus..
| Image quality adjusting method, non-transitory computer-readable recording medium, and electron microscope|
In accordance with an embodiment, a method of adjusting quality of an image of patterns common in shape includes acquiring a first gray value and a first waveform within a reference image, acquiring a sample image, acquiring a second gray value and a second waveform from third and fourth regions within a sample image, respectively, and adjusting the brightness and contrast of the sample image. The first gray value is a standard for the brightness of the image from a first region within a reference image.
| Widefield microscope illumination system and widefield illumination method|
A widefield microscope illumination system and a method for illumination, the system having a microscope objective with an optical objective axis, an illumination light source sending widefield illumination light along illumination beam paths having corresponding illumination axes along which the illumination light penetrates into the microscope objective through illumination light entry sites located within a predetermined illumination light entry area, a spatially resolving light detector detecting detected light sent from an illuminated sample through the microscope objective along a detected light beam path, and an automatic illumination light beam path manipulation device, controlled by a control system, which is arranged in front of the microscope objective in relation to the direction of the illumination light beam path, and by which illumination light beam path manipulation device the illumination axes are automatically movable at time intervals to a plurality of illumination light entry sites.. .
| Sheet heater and image fixing device including the sheet heater|
A sheet heater that includes a sheet article composed of a conductive resin composition containing a conductive material and a resin, and a pair of metal plate electrodes, each of the electrodes being bonded to each of the ends of the sheet article, wherein when elements of the sheet article are detected at a portion 1 μm depth from a surface of the metal plate electrode, a peak area ratio of silicon (si) to metal ion (m) is 1/100 to 1, the metal ion m being most abundant of all metal ions detected at the portion, the peaks being obtained by measuring an x ray generated at the portion by applying an x ray to the portion with the scanning electron microscope-energy dispersive x-ray spectrometer.. .
|Scanning probe microscope|
A scanning probe microscope including: a scanning probe microscope unit section including, a cantilever having a probe, a cantilever holder configured to fix the cantilever, a sample holder on which a sample is configured to be placed, a horizontal fine transfer mechanism configured to relatively scan a surface of the sample with the probe, a vertical fine transfer mechanism configured to control a distance between the probe and the sample surface, an optical microscope configured to observe the cantilever and the sample; a control device; an imaging device to which a viewing field, wider than that of the optical microscope and capable of observing the cantilever and the sample at the same time, can be set; and an image display device configured to display images observed by the optical microscope and the imaging device.. .
Arrays which utilize labeling molecules for calibrating a measuring device, such as microscopes, have a first structure based on a dna origami as a calibration sample, wherein the dna origami is formed into a predetermined structure by short dna segments. The dna origami is optionally present in an arranged manner on a support, wherein a number of short dna segments which form the predetermined structure include a labeling molecule.
|Method and apparatus for preparing cytological specimens|
An automated system for preparing a plurality of cytological specimens from a plurality of fluid samples in vials includes an apparatus for collecting a monolayer of cells from each sample and transferring the cells to a microscope slide for fixing, staining, and inspection. The system includes a first loading station for receiving the sample vials, a second loading station for receiving consumables such as filter membranes, a slide dispenser, and an unloading area for removing completed specimen slides.
|Automated staining and decolorization of biological material|
An improved method and apparatus for staining samples of biological material for accurate analysis of the sample. Biological material is applied to a substrate, such as a microscope slide.
|System and method for quality assurance in pathology|
Systems and methods for improving quality assurance in pathology using automated quality assessment and digital image enhancements on digital slides prior to analysis by the pathologist are provided. A digital pathology system (slide scanning instrument and software) creates, assesses and improves the quality of a digital slide.
|Laser scanning microscope|
A laser scanning reflection or fluorescent microscope is provided with focusing-detecting unit having a laser beam focusing objective, an image detector that detects light reflected from the sample or back fluoresced light emitted by the sample, and a drive that simultaneously displaces the objective and the image detector.. .
|Laser scanning microscope|
A laser scanning microscope having a laser light source for fluorescence excitation, in particular a short pulse light source for multiphoton excitation; a scanning mirror array for scanning illumination of a specimen and a scanning optics for the generation of a diffraction-limited reference image plane as a first intermediate image plane; an optical system, preferably with a high numerical aperture, for the preferably demagnified imaging of the reference plane in a second intermediate image; an axially slideable mirror in the second intermediate image plane; a beam splitter array between the reference image plane and said optical system; and a tube lens and a first microscope objective for aberration-free imaging of the reference image plane in a specimen. Imaging of the image m of the second intermediate image plane in the specimen is effected with a magnification of m≠n/n′ and/or a magnification m of the second intermediate image plane in the specimen according to the equation m=y′/y=n/n′ξ, with .
|Surgical microscope apparatus|
At a front end of the lateral arm of a surgical microscope apparatus, the apparatus has an intake port. A band is tied around the front end of the lateral arm so that a drape is drawn only to a surgical microscope.
|Test sample device and test method for an optical microscope with subwavelength resolution|
A test sample device for an optical microscope which images a sample in different light states with a local resolution in the subwavelength range of the visible spectral range, wherein the test sample device comprises: a test piece, which is designed to be microexamined with the microscope and has a surface on which nanostructures are arranged, wherein each nanostructure, viewed along the surface, has a dimension in the subwavelength range, wherein the nanostructures are spaced apart from one another by an amount which lies above the wavelength of the visible spectral range, and wherein the nanostructures are switchable collectively between a bright state, in which they illuminate, and a dark state, in which they do not illuminate, and a drive, which is designed to move the test piece in the subwavelength range, whereby the different light states can be realized by different movement states of the test piece.. .
|System and apparatus for color correction in transmission-microscope slides|
The present invention concerns a system and method for calibration and adjustment of the pixel color values represented within a digital image of a sample by a transmission microscope. Furthermore the present invention is directed to providing sufficient color information in order to generate a color mapping matrix that allows for the creation of a synthetic image to depict the sample under a desired illumination.
|Scanning transmission electron microscopy for imaging extended areas|
A scanning transmission electron microscope for imaging a specimen includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam.
|Methods and apparatus for nanolapping|
A lapping system for lapping portions of a workpiece. The lapping system includes, a lap that is defined by a surface.
|Hexagonal plate-shaped zinc oxide particles, method for production of the same, and cosmetic, heat releasing filler, heat releasing resin composition, heat releasing grease, and heat releasing coating composition comprising the same|
An object of the present invention is to provide hexagonal plate-shaped zinc oxide particles which can be used as a cosmetic raw material, a heat releasing filler and the like, a method for production of the same, and a cosmetic, a heat releasing filler, a heat releasing resin composition, a heat releasing grease and a heat releasing coating composition each comprising the same. Provided are hexagonal plate-shaped zinc oxide particles having hexagonal-shaped surfaces, wherein the primary particle diameter is 0.01 μm or more and the aspect ratio is 2.5 or more, and 50% or more of 250 particles in a transmission electron microscope photograph satisfy both the requirements (1) the particle has a hexagonal-shaped surface; and (2) dmin/dmax≧0.3, where dmax: a length of the largest diagonal line of three diagonal lines of the hexagonal-shaped surface of the hexagonal plate-shaped zinc oxide particle; and dmin: a length of the smallest diagonal line of three diagonal lines of the hexagonal-shaped surface of the hexagonal plate-shaped zinc oxide particle..
|Fluorescence observation device, domed base and fluorescence microscope provided with multiple light sources having different illumination angles|
The present invention relates to a fluorescence observation device, a domed base and a fluorescence microscope. The fluorescence observation device includes a dome, a multi-angle light-emitting unit and a controller unit.
|Surgical microscope objective having an adjustable focal intercept|
A surgical microscope objective has an adjustable focal intercept and defines an optical axis. The objective has an objective body wherein a negative member is fixed and in which a positive member can be displaced.
|Microscope and microinsemination method using microscope|
A microscope includes a light source; a condenser lens irradiating a sample with a light from the light source; an objective facing the condenser lens across the sample; a first polarization plate placed between the light source and the condenser lens; a condenser turret placed between the first polarization plate and the condenser lens and having a plurality of optical elements placed inside; a polarization plate placed on the image side with respect to the objective; and a compensator placed between the first polarization plate and the polarization plate. In the microscope, according to the observation method, an optical element to be placed in an optical path among the plurality of optical elements placed inside the condenser turret is switched by rotation of the condenser turret..
|System and method for remote control of a microscope|
A system and method for remote control of an automated microscope via a widely distributed network.. .
|Method to characterize shales at high spatial resolution|
Apparatus and methods of characterizing a subterranean formation sample including collecting a sample from a formation, and analyzing the formation to obtain an image with 100 nm or less resolution, wherein the analyzing comprises atomic force microscopy (afm), infrared spectroscopy (ir), and thermal analysis. Kerogen maturity, mineralogy, kerogen content, mechanical properties, and transition temperatures—including registered maps of those quantities—may be obtained in 5 minutes or less.
|Magnetic toner for electrostatic latent image development|
A magnetic toner for electrostatic latent image development includes toner particles containing toner core particle containing at least a binder resin and a magnetic powder, and a shell layer coating the toner core particle. In the toner, in the case where the surfaces of the shell layers are observed using a scanning electron microscope, the magnetic powder is not observed, and approximately spherical particles derived from the resin fine particles are not observed on the surfaces of the shell layers for toner particles having a particle diameter in a specific range.
|High-strength steel sheet excellent in workability and manufacturing method thereof|
Provided are: a high-strength steel sheet which is improved in both elongation and local formability and thus exhibits excellent workability; and a manufacturing method thereof. The high-strength steel sheet contains c, si, mn, al, p and s with the remainder including iron and unavoidable impurities, and has a metal structure which includes polygonal ferrite, bainite, tempered martensite, and retained austenite.
|Creating and viewing three dimensional virtual slides|
Systems and methods for creating and viewing three dimensional digital slides are provided. One or more microscope slides are positioned in an image acquisition device that scans the specimens on the slides and makes two dimensional images at a medium or high resolution.
|System and method to determine slide quality of a digitized microscope slide|
Systems and methods for assessing the quality of a digital slide image. In an embodiment, the digital slide image is divided into a plurality of image regions.
|Systems and methods for distributed video microscopy|
System and methods are provided for distributed microscopy. A plurality of microscopes may capture images and send them to a media server.
|Image processing device, image processing method, image processing program, and virtual microscope system|
An image processing device for processing a stained sample image including hematoxylin stain is provided with a dye spectrum storage unit that stores a dye spectrum of dye used in staining, a change characteristic calculation unit that calculates a change characteristic in a wavelength direction of the dye spectrum based on the dye spectrum, a dye amount/wavelength shift amount estimation unit that estimates at least a dye amount of the hematoxylin stain and a shift amount in the wavelength direction for each pixel in the stained sample image based on the dye spectrum and the change characteristic; and a cell nucleus extraction unit that extracts a cell nucleus region of the stained sample image based on the shift amount estimated in the wavelength direction.. .
|Light extraction transparent substrate for organic el element, and organic el element using the same|
A light extraction transparent substrate for an organic el element includes a transparent supporting substrate; a diffraction grating having a first concavity and convexity layer having first concavities and convexities formed on a surface thereof, which is located on a surface of the transparent supporting substrate, and a microlens having a second concavity and convexity layer having second concavities and convexities formed on a surface thereof, which is located on a surface of the transparent supporting substrate. When a fourier-transformed image is obtained by performing two-dimensional fast fourier transform processing on a concavity and convexity analysis image obtained by analyzing the shape of each of the first and second concavities and convexities by use of an atomic force microscope, the fourier-transformed image shows a circular or annular pattern substantially centered at an origin at which an absolute value of wavenumber is 0 μm−1..
|Microscope with a viewing direction perpendicular to the illumination direction|
A microscope and imaging method in which a layer of the sample is illuminated by a thin strip of light and the sample is viewed perpendicular to the plane of the strip of light. The depth of the strip of light thus essentially determines the depth of focus of the system.
|Sample holding apparatus for electron microscope, and electron microscope apparatus|
A sample holding apparatus for electron microscope includes: a sample holding assembly including an assembly of three components of an upper diaphragm holding part, a sample holding plate and a lower diaphragm holding part; and a holding part that holds the sample holding assembly replaceably. The sample holding assembly includes a cell defined between a diaphragm of the upper diaphragm holding part and a diaphragm of the lower diaphragm holding part, and a flow channel connected to the cell, in which a sample mounted at a protrusion of the sample holding plate is placed.
|Parallel radial mirror analyser for scanning microscopes|
A parallel radial mirror analyser (prma) (700) for facilitating rotationally symmetric detection of charged particles caused by a charged beam incident on a specimen is disclosed. The prma comprises a zero-volt equipotential grid (728), and a plurality of electrodes (702, 704, 706, 708, 710, 712, 714, 716, 718, 720, 722) electrically configured to generate corresponding electrostatic fields for deflecting the charged particles in accordance with respective energy levels of the charged particles to exit through the grid (728) to form corresponding second-order focal points on a detector (206).
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Microscope topics: Microscope, Electron Microscope, Scanning Electron Microscope, Microscopy, Adsorption, Objective Lens, Optical Microscope, Polynomial, Fluorescence, Second Wave, Crystallin, Recording Device, Video Processing, Control Unit, Holographic
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