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Microscope patents



      
           
This page is updated frequently with new Microscope-related patents. Subscribe to the Microscope RSS feed to automatically get the update: related Microscope RSS feeds.

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Date/App# patent app List of recent Microscope-related patents
04/17/14
20140108476
 Determination of the transfer function of a signal-processing system without a known input signal patent thumbnailDetermination of the transfer function of a signal-processing system without a known input signal
Methods for determining the transfer function of a signal-processing system that do not require a known input signal. The methods are based on two representations 1(x) and i2(x) of an object, which the system has produced from differently scaled input signals originating from the object, or from a representation i1(x) of a first object and from a representation i2(x) of an object that is geometrically similar thereto but has been scaled differently.
04/17/14
20140107634
 Apparatus and method for eye surgery patent thumbnailApparatus and method for eye surgery
There is proposed an apparatus for eye surgery, which comprises a stand (24) having a stand base (32) that is movable or realized for mounting on a wall or ceiling, and having a stand arm arrangement (34, 36) that is manually adjustable, at least partially, relative to the stand base, an operation microscope (38) being attached to the stand arm arrangement. Further, the eye-surgery apparatus comprises a laser appliance, which provides pulsed, focussed laser radiation having radiation properties suited to the application of incisions in the human eye (14).
04/17/14
20140105794
 Nano-pipet fabrication patent thumbnailNano-pipet fabrication
A hollow high aspect ratio sample, such as a nano-test-tube, with a tip that is closed off is secured in a particle beam device, such as a transmission electron microscope. The tip is engaged with the particle beam of the particle beam device until a hole opens up on the tip, thereby turning the high aspect ratio sample into a nano-pipet.
04/17/14
20140105353
 X-ray tomography device patent thumbnailX-ray tomography device
An x-ray tomography device for providing a 3d image of a sample comprising an x-ray source, a cell, a photon detector and a processing unit. The processing unit computes the 3d image on the basis of the images corresponding to a plurality of cell angles.
04/17/14
20140104681
 Spatial filter to combine excitation light and emission light in an episcopic multiplexed confocal scanning microscope patent thumbnailSpatial filter to combine excitation light and emission light in an episcopic multiplexed confocal scanning microscope
In an episcopic multiplexed confocal scanning microscope system, a spatial filter is placed at a conjugate plane to a back aperture plane at a back aperture of an objective lens. The spatial filter is used to combine excitation light and emission light from a multiplexed confocal microscope module..
04/17/14
20140104608
 Optical microscope and optical instrumentation patent thumbnailOptical microscope and optical instrumentation
An optical microscope that can prevent an increase in the complexity of the light source system is equipped with optics readily capable of adequate operation even when the modulation frequency is increased to reduce the impact of the intensity noise of the laser. The optical microscope irradiates a sample with a first train of optical pulses having a first optical frequency, which is generated by a first light source, and a second train of optical pulses having a second optical frequency, which is temporally synchronized with the first train of optical pulses and is generated by a second light source, and detects light scattered from the sample.
04/17/14
20140104407
 Structured illumination optical system and structured illumination microscope device patent thumbnailStructured illumination optical system and structured illumination microscope device
An illumination optical system includes: a beam splitter located near a conjugate position of a specimen and configured to split beams from a light source into a plurality of groups of beams having different splitting directions around an optical axis; a beam selector configured to select and transmit one group of beams from the plurality of groups of beams and that is rotatable with respect to the optical axis; and a ½ wavelength plate located near the beam selector and rotatable about the optical axis. The rotation angles of the ½ wavelength plate and of the beam selector about the optical axis are respectively set so that the polarization direction of the beam which has passed through the ½ wavelength plate is perpendicular to the splitting direction of the one group of beams that has been selected by the beam selector and split by the beam splitter..
04/17/14
20140103582
 Nano-pipet fabrication patent thumbnailNano-pipet fabrication
A hollow high aspect ratio sample, such as a nano-test-tube, with a tip that is closed off is secured in a particle beam device, such as a transmission electron microscope. The tip is engaged with the particle beam of the particle beam device until a hole opens up on the tip, thereby turning the high aspect ratio sample into a nano-pipet.
04/17/14
20140103208
 Electron microscope patent thumbnailElectron microscope
This electron microscope (20) comprises: a first imaging device (291); a second imaging device (240) that can be moved away from transmitted light (p); and another detection device (260). The second imaging device is disposed in an observation chamber (230) above the first imaging device, and an attachment portion (231) of the other detection device is disposed at a position rotated 90 degrees from the attachment position of the second imaging device on the same plane on which the second imaging device is disposed.
04/10/14
20140101624
 Contour alignment system patent thumbnailContour alignment system
The present disclosure describes a method of calibrating a contour. The method includes designing an anchor pattern, printing the anchor pattern on a substrate, collecting scanning electron microscope (sem) data of the printed anchor pattern on the substrate, wherein the sem data includes a sem image of the printed anchor pattern on the substrate, converting the sem image of the printed anchor pattern on the substrate into a sem contour of the printed anchor pattern, analyzing the sem contour of the printed anchor pattern, and aligning the sem contour of the anchor pattern to form the calibrated sem contour..
04/10/14
20140099659
Multiview light-sheet microscopy
A live biological specimen is imaged by generating a plurality of light sheets; directing the plurality of light sheets along an illumination axis through the biological specimen such that the light sheets spatially and temporally overlap within the biological specimen along an image plane, and optically interact with the biological specimen within the image plane; and recording, at each of a plurality of views, images of the fluorescence emitted along a detection axis from the biological specimen due to the optical interaction between the light sheets and the biological specimen. The temporal overlap is within a time shift that is less than a resolution time that corresponds to a spatial resolution limit of the microscope..
04/10/14
20140099630
Quantitative determination method for target particles, photometric analysis device, and computer program for photometric analysis
The method of the present invention includes: preparing a sample solution containing the target particles and luminescent probes to be bound to the target particles, and binding these in the sample solution; moving a position of a light detection region of the optical system in the sample solution using a confocal microscope or a multiphoton microscope, and detecting light signal emitted from the luminescent probe in the light detection region while moving the position of the light detection region, and individually detecting the target particles directly or indirectly; and counting the number of the detected target particles, and calculating the concentration of the target particles in the sample solution from the number of the counted target particles on the basis of a calibration curve that approximates the correlation between the concentration or quantity of the target particles in the sample solution and the number of the target particles.. .
04/10/14
20140097342
Electron microscope and image capturing method using electron beam
The present invention is characterized by an electron microscope which intermittently applies an electron beam to a sample and detects a secondary electron signal, wherein an arbitrarily defined detection time (t2) shorter than the pulse width (tp) of the applied electron beam is selected, and a secondary electron image is formed using the secondary electron signal acquired during the detection time. Consequently, it is possible to reflect necessary sample information including the internal structure and laminated interface of the sample in the contrast of an image and prevent unnecessary information from being superimposed on the image, thereby making it possible to obtain the secondary electron image with improved sample information selectivity and image quality..
04/03/14
20140096293
Method and apparatus for inspecting thermal assist type magnetic head
To reliably detect scattered light generated in the near field light generation area in the inspection of a thermal assist type magnetic head (herein after refer to magnetic head), the present invention provides a magnetic head inspection apparatus including: a scanning probe microscope including a cantilever having a probe with a magnetic film formed on the surface of the tip; a probe unit for supplying alternating current to a terminal formed in a magnetic head element, so that the laser beam is incident on the near field light emitting part; an imaging unit for taking an image of the probe unit and the magnetic head element; a scattered light detection unit for detecting the scattered light generated from the probe present in the generation area of the near field light of the magnetic head element, through a pinhole; and a signal processing unit for inspecting the magnetic head element.. .
04/03/14
20140095100
Calibrating single plasmonic nanostructures for quantitative biosening
A method for calibrating multiple nanostructures in parallel for quantitative biosensing using a chip for localized surface plasmon resonance (lspr) biosensing and imaging. The chip is a glass coverslip compatible for use in a standard microscope with at least one array of functionalized plasmonic nanostructures patterned onto it using electron beam nanolithography.
04/03/14
20140093977
Light microscopy chips and data analysis methodology for quantitative localzied surface plasmon resonance (lspr) biosensing and imaging
A chip for localized surface plasmon resonance (lspr) biosensing and imaging having a glass coverslip compatible for use in a standard microscope and at least one array of functionalized plasmonic nanostructures patterned onto the glass coverslip with electron beam nanolithography. The nanostructures can be regenerated allowing the chip to be used multiple times.
04/03/14
20140093893
In situ heat induced antigen recovery and staining method
An automated in situ heat induced antigen recovery and staining method and apparatus for treating a plurality of microscope slides. The process of heat induced antigen recovery and the process of staining the biological sample on the microscope slide are conducted in the same apparatus, wherein the microscope slides do not need to be physically removed from one apparatus to another.
04/03/14
20140092717
Method and apparatus for inspecting thermal assist type magnetic head
An apparatus for inspecting a thermal assist type magnetic head is constituted by a scanning probe microscope means including a cantilever having a probe with a magnetic film formed on the surface of a tip portion thereof; a probe unit which provides an alternating current to a terminal formed on the thermal assist type magnetic head element and causes a pulse drive current or pulse drive voltage; a scattered light detection means which scans the near-field light emitting part with the probe to detect the scattered light generated from the probe in the generation region of the near-field light; an imaging means which image the thermal assist type magnetic head element; and a signal process means inspects the thermal assist type magnetic head element and an output signal outputted from the scanning probe microscope means by scanning with the probe while providing an alternating current to the terminal.. .
04/03/14
20140092716
Method and apparatus for inspecting thermal assist type magnetic head
An apparatus for inspecting a thermal assist type magnetic head is configured to include a scanning probe microscope unit comprising a cantilever having a probe with a magnetic film formed on the surface of a tip portion thereof; a prober unit which provides an alternating current to a terminal formed on the thermal assist type magnetic head element; a scattered light detection unit which detects scattered light generated from the probe; and a signal process unit which detects defect by using an output signal from the scanning probe microscope unit by scanning the surface of the thermal assist type magnetic head element with the probe in a state that the magnetic field is generated and the near-field light is stopped, and an output signal from the scattered light detection unit by scanning the surface with the probe while near-field light is generated and the magnetic field is off.. .
04/03/14
20140092460
Optical filter device, in particular for microscopes
An optical filter device having a polarizing beamsplitter, an achromatic polarization manipulator, and at least one dichroic mirror. The polarization manipulator is arranged optically between a first input/output of the polarizing beamsplitter and the dichroic mirror.
04/03/14
20140092459
Scanning microscope
There is provided a scanning microscope so configured that when the position of the exit pupil of an imaging optical system and a position conjugate to the exit pupil change, the position of the rotation center of a scanned light flux is moved and follows the changed exit pupil position. A scanning microscope includes a light source, an objective lens, and a scan unit.
04/03/14
20140092362
Illumination system for opthalmic microscope, and its operation method
The present invention discloses a illumination system for ophthalmic microscope and its operation method. Light beams generated by white led, passes through the condenser and relay system to produce illumination on retina of the eye and boundary of the illumination is determined by the aperture stop.
04/03/14
20140092231
Charged particle microscope device and image capturing method
A specimen image capture method using a charged particle microscope device includes: a first image acquisition step in which the gain of a detector in a charged particle microscope is set to a first gain value, charged particle beam scanning is carried out on a specimen, and a first image is obtained; a second image acquisition step in which the gain of the detector is set to a second gain value, which is different to the first gain value, charged particle beam scanning is carried out on the specimen, and a second image is obtained; and an image combination step in which the first gain value and the second gain value are used and the first image and the second image are combined.. .
04/03/14
20140092229
Small-profile lensless optical microscopy imaging and tomography instruments and elements for low cost and integrated microscopy
Arrangements for small-sized, inexpensive, and innovative lensless and other micro-optic microscopy imaging and tomography are presented. An imaging region comprising flat or curved surfaces is provided with an illumination source proximate to the imaging region or arranged for collimated illumination.
03/27/14
20140090117
Magnetic head inspection system and magnetic head inspection method
The magnetic head inspection method includes, exciting the cantilever of a magnetic force microscope at a predetermined frequency, the cantilever being provided with a magnetic probe on the end thereof, floating the magnetic probe over the writing head of the magnetic head and two-dimensionally scanning a search range, detecting the specific position of the writing head based on the search two-dimensional magnetic field intensity of the writing head with exciting state of the cantilever in the two-dimensional scan, setting a shape detection range smaller than the search range for detecting the shape of the writing head based on the specific position, and floating the magnetic probe over the writing head with exciting state of the cantilever, detecting the shape of the writing head by detecting the detection two-dimensional magnetic field intensity of the writing head in the two-dimensional scan.. .
03/27/14
20140086033
Method and apparatus for inspecting thermal assist type magnetic head device
In order to enable inspection of the physical shape of a near-field light emitting portion of a thermal assist type magnetic head, a thermal assist type magnetic head device is placed on a table movable in a plane, a probe fixed to a cantilever scans a plane apart at a constant distance from the surface of the sample placed on the table while moving the table in a plane, the displacement of the cantilever is detected by applying light to the scanning cantilever and detecting reflected light from the cantilever, an atomic force microscope (afm) image of the thermal assist type magnetic head device is formed using information about the detected displacement of the cantilever and positional information about the table, and the quality of a physical shape including the size or typical dimensions of the near-field light emitting portion is determined by processing the formed afm image.. .
03/27/14
20140085715
Diffraction phase microscopy with white light
A microscope and methods for obtaining a phase image of a substantially transparent specimen. Light collected from a specimen illuminated by a temporally incoherent source is diffracted into a first order and either the zeroth or first order is low-pass filtered in a fourier transform plane before the orders are recombined at a focal plane detector.
03/27/14
20140085714
Apparatus for selectively connecting items
An apparatus for selectively connecting an accessory item to a surgical microscope includes a center pivot. An adapter arm includes an adapter support having a substantially planar support body which extends laterally in an outboard direction from the center pivot and has laterally spaced inboard and outboard support regions separated by a laterally oriented centerline.
03/27/14
20140085713
Phase derivative microscopy
Methods and a module for use with a microscope for enhancing image contrast in an image of a phase object. A transmission image of a specimen is formed in an image plane, of which a fourier transform is generated in a fourier plane.
03/27/14
20140084160
Photon induced near field electron microscope and biological imaging system
A method of obtaining pinem images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses.
03/27/14
20140084159
Scanning electron microscope and method for preparing specimen
To select a highly critical defect as a defect to be analyzed, an automatic classification result from a review sem is used to select a defect to be analyzed. Further, to avoid an effect on a defect itself, a mark is placed in a position associated with the defect with the distance from the defect to the marking position changed on a defect basis.
03/27/14
20140084158
Scanning electron microscope
A scanning electron microscope has a first condenser lens (121) having a lens gap (121a) facing toward an electron source (50) and a second condenser lens (122) having a lens gap (122a) facing toward an objective lens (13). The first and second condenser lenses are disposed between the electron source (50) and the objective lens (13).
03/27/14
20140082920
High aspect ratio sample holder
An elongated member is formed which has a frontal and a distal end, and a length axis. The frontal end satisfies vacuum sealing and maneuverability specifications of a sample holder for a particle beam microscope.
03/20/14
20140082775
Modular uhv compatible angle physical contact fiber connection for transferable fiber interferometer type dynamic force microscope head
A modular transferable ultra-high vacuum compatible device has a body with a tunnel through its thickness. An interferometric sensor is mounted above the body and has a brace on which a cantilever is disposed and through which an optical fiber passes so that the two may be aligned prior to installation in an atomic force measurement apparatus.
03/20/14
20140082757
Transformed caenorhabditis elegans and method for screening for substances regulating glucose metabolism using same
The present invention relates to a method for preparing a transformed caenorhabditis elegans (c. Elegans) which reacts to glucose by exhibiting fluorescence, and to a method for screening for a candidate substance and for a novel gene capable of regulating glucose metabolism and metabolic diseases using the transformed caenorhabditis elegans.
03/20/14
20140078469
Slit lamp unit for a surgical microscope
The present invention relates to a slit lamp unit (1) for a surgical microscope, the slit lamp unit (1) comprising a slit illumination unit (2) having a slit illumination optic for generating a slit illumination beam path (5, 6), and a guide rail (3) for displacement of the slit illumination unit (2) along a direction designated by the guide rail (3), the guide rail being embodied for displacement of the slit illumination unit (2) along a linear direction (12), and the slit illumination unit (2) being mounted on the guide rail (3) rotatably around a rotation axis (13) perpendicular to said linear displacement direction (12).. .
03/20/14
20140078285
Imaging apparatus and microscope system having the same
Disclosed is an imaging apparatus including: a spectroscopic measurement section configured to measure a spectral characteristic of a subject; a spectral image capture section configured to capture a subject image separated into a plurality of colors through color separation to create a plurality of spectral images; and a color separation characteristic determining section configured to determine a color separation characteristic to be used for image capturing of the spectral image capture section, based on the spectral characteristic of the subject measured by the spectroscopic measurement section. The color separation characteristic determining section determines a count of color separations in the image capturing of the spectral image capture section and spectral bands corresponding to each of the color separations..
03/20/14
20140077080
X-ray detector for electron microscope
Multiple detectors arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors preferably include a shutter and a cold shield that reduce ice formation on the detector.
03/13/14
20140074419
Three-dimensional mapping using scanning electron microscope images
A method includes irradiating a surface of a sample, which is made-up of multiple types of materials, with a beam of primary electrons. Emitted electrons emitted from the irradiated sample are detected using multiple detectors that are positioned at respective different positions relative to the sample, so as to produce respective detector outputs.
03/13/14
20140073056
Method for identifying gambiered guangdong silk
A method for identifying gambiered guangdong silk includes the steps of: detecting the surface state of fiber by microscope; detecting the pyrolysis fragments of fabrics by pyrolysis gas chromatography; determining the crude protein content in the fiber by kjeldahl determination; and detecting the dye component of the fabrics by high performance liquid chromatography. The method of the present invention can accurately identify the true and fake, good and bad of the gambiered guangdong silk, and then make an accurate evaluation on the gambiered guangdong silk; and the present invention is simple, useful, environmental and has low cost..
03/13/14
20140073000
Methods and means for manipulating particles
The present invention is concerned with a system for sorting target particles from a flow of particles. The system has a microscope, a light source, a ccd camera, microfluidic chip device with microfluidic channels, a detection apparatus for detecting the target particles with predefined specific features, a response generating apparatus for generating a signal in response to the detection of the target particles, and an optical tweezing system for controlling movement of optical traps, the optical tweezing system is operably linked to the response signal..
03/13/14
20140072362
Adaptor for connecting an electronic device having a camera to an optical device
This invention comprises an adaptor device for connecting an electronic device having a camera to a range of optical devices, including but not limited to binoculars, monoculars, riflescopes, spotting scopes, telescopes, and microscopes. This adaptor device has a plurality of protrusion that provide a self-centering and fitted connection between the electronic and optical device, so that the optical axes are aligned so that the user may take images or video on their electronic device through the optical device.
03/13/14
20140072104
X-ray microscope system with cryogenic handling system and method
A cartridge-based cryogenic imaging system includes a sample handling system. This system uses a kinematic base and cold interface system that provides vertical loading to horizontally mounted high-precision rotation stages that are able to facilitate automated high-resolution three-dimensional (3d) imaging with computed tomography (ct).
03/13/14
20140071452
Fluid channels for computational imaging in optofluidic microscopes
A microscope is disclosed, the microscope having a light source defining an optical axis along a z direction and a detector disposed in x-y direction, orthogonal to the optical axis, the detector configured to capture images of an object. The microscope includes a fluid channel having an inlet and an outlet configured with a fluid flow to transport the object from the inlet to the outlet.
03/13/14
20140071260
Digital confocal optical profile microscopy
Various embodiments of microscopy systems, devices, and associated methods of analysis are described herein. In one embodiment, a method of operating a microscope includes acquiring a profile of a light signal from a sample with a photo detector without passing the light signal through a physical pinhole.
03/13/14
20140070099
Particle beam microscope for generating material data
A method of operating a particle beam microscopy. A particle beam is scanned across a scanning region of a surface of the object.
03/13/14
20140070095
Method of performing tomographic imaging of a sample in a charged-particle microscope
The invention relates to a method of performing tomographic imaging involving repeatedly directing a charged particle beam through a sample for a series of sample tilts to acquire a corresponding set of images and mathematically combining the images to construct a composite image. The latter of which consists of, at each of a second series of sample tilts, using a spectral detector to accrue a spectral map of said sample, thus acquiring a collection of spectral maps; analyzing said spectral maps to derive compositional data of the sample; and employing said compositional data in constructing said composite image..
03/13/14
20140069165
Inert gas delivery system for electrical inspection apparatus
An apparatus for electrical inspection is disclosed. The apparatus comprises an inert gas delivery system that delivers inert gas near a microscope imaging element and electrical test probes.
03/06/14
20140067346
Photoresist simulation
A processor based method for measuring dimensional properties of a photoresist profile by determining a number acid generators and quenchers within a photoresist volume, determining a number of photons absorbed by the photoresist volume, determining a number of the acid generators converted to acid, determining a number of acid and quencher reactions within the photoresist volume, calculating a development of the photoresist volume, producing with the processor a three-dimensional simulated scanning electron microscope image of the photoresist profile created by the development of the photoresist volume, and measuring the dimensional properties of the photoresist profile.. .
03/06/14
20140065486
Negative-electrode material, negative electrode active material, negative electrode, and alkali metal ion battery
A negative-electrode material is a carbonaceous negative-electrode material used in an alkali metal ion battery and an average layer spacing d002 of face (002) calculated by an x-ray diffraction method using cukα radiation as a radiation source is equal to or more than 0.340 nm. When the negative-electrode material is embedded in an epoxy resin, the epoxy resin is cured, the resultant cured material is cut and polished to expose a cross-section of the negative-electrode material, and the cross-section is observed in a bright field with 1000 times magnification using an optical microscope, a first region and a second region having different reflectance ratios are observed from the cross-section of the negative-electrode material..


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Microscope topics: Microscope, Electron Microscope, Scanning Electron Microscope, Microscopy, Adsorption, Objective Lens, Optical Microscope, Polynomial, Fluorescence, Second Wave, Crystallin, Recording Device, Video Processing, Control Unit, Holographic

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