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Microscope patents



      
           
This page is updated frequently with new Microscope-related patent applications. Subscribe to the Microscope RSS feed to automatically get the update: related Microscope RSS feeds. RSS updates for this page: Microscope RSS RSS


Microscope system and storage medium

Diagnostic apparatus

Stage device

Date/App# patent app List of recent Microscope-related patents
08/21/14
20140235431
 Exhaust gas-purifying catalyst patent thumbnailnew patent Exhaust gas-purifying catalyst
An exhaust gas-purifying catalyst includes a substrate, and a catalytic layer facing the substrate and including a precious metal, alumina, an oxygen storage material, and a sulfate of an alkaline-earth metal having an average particle diameter falling within a range of 0.01 to 0.70 μm, the average particle diameter being obtained by observation using a scanning electron microscope. Another exhaust gas-purifying catalyst includes a substrate, and a catalytic layer formed on the substrate using slurry containing a precious metal, alumina, an oxygen storage material, and a sulfate of an alkaline-earth metal having an average particle diameter falling within a range of 0.01 to 0.70 μm, the average particle diameter being obtained by observation using a scanning electron microscope..
08/21/14
20140233692
 Multi energy x-ray microscope data acquisition and image reconstruction system and method patent thumbnailnew patent Multi energy x-ray microscope data acquisition and image reconstruction system and method
A multi energy, such as dual-energy (“de”), x-ray imaging system data acquisition and image reconstruction system and method enables optimizing the image contrast of a sample. Using the de x-ray imaging system and its associated user interface applications, an operator performs a low energy (“le”) and high energy (“he”) x-ray scan of the same volume of interest of the sample.
08/21/14
20140233098
 Diagnostic apparatus patent thumbnailnew patent Diagnostic apparatus
An automated microscope apparatus comprises an outer housing having an external wall; optionally but preferably an internal wall in the housing configured to form a first compartment and a separate second compartment in the outer housing; a microscope assembly in the housing (preferably in the first compartment); a microprocessor in the housing (preferably in the second compartment), and (optionally but preferably) a heat sink mounted on the housing external wall, preferably adjacent the second compartment, with the microprocessor thermally coupled to said heat sink and operatively associated with the microscope assembly. Systems and methods employing the same are also described, along with component parts thereof..
08/21/14
20140233097
 Stage device patent thumbnailnew patent Stage device
A stage device includes a planar base to be fixed to a microscope, a first stage that is disposed on the base and is movable in a plane parallel to a principal surface of the base, a second stage that is disposed on the base and is rotatable about an optical axis of an objective lens which is perpendicular to a movement direction of the first stage, a specimen support that is placed on the second stage and is slidable in the plane, and a first clutch mechanism that is coupled to the specimen support and the first stage and is capable of transmitting power from the first stage to the specimen support. The first clutch mechanism does not transmit power from the first stage to the specimen support when the second stage rotates, and transmits power from the first stage to the specimen support when the first stage moves..
08/21/14
20140233094
 Microscope system and storage medium patent thumbnailnew patent Microscope system and storage medium
A microscope system includes: an objective; a correction apparatus which corrects a spherical aberration; a controller which obtains a plurality of combinations of a relative position of the objective to a sample and an optimum value, which is a set value of the correction apparatus in a state in which a spherical aberration caused in accordance with the relative position has been corrected, calculates a function expressing the relationship between the relative position and the optimum value on the basis of the obtained plurality of combinations by interpolation, and calculates the optimum value according to an observation target surface of the sample, on the basis of the function and the relative position which is determined from the observation target surface; and a correction apparatus driving apparatus which drives the correction apparatus in accordance with the optimum value, which is calculated by the controller.. .
08/21/14
20140232848
 Method for varying the scanning field of a laser scanning microscope patent thumbnailnew patent Method for varying the scanning field of a laser scanning microscope
Disclosed is a method for varying the size of the scanning field of a multifocal laser scanning microscope, said scanning field being scanned in x columns and y lines, and n laser spots being arranged at a distance d from one another in the scanning field along the slow scanning axis in the sample plane, the distance between the scanned lines in the sample plane being a=d/k, where k ε n, the size of the scanning field being varied by varying k. After scanning k lines, a vertical skip is made, e.g.
08/21/14
20140232844
 Method and apparatus for defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope patent thumbnailnew patent Method and apparatus for defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope
A method for defining a z-range in a sample in which a z-stack of the sample is to be recorded by means of a microscope is provided, wherein the z-range is defined automatically on the basis of a z-value situated in the sample and taking at least one predetermined parameter into account.. .
08/21/14
20140231638
 Slide scanner with a tilted image patent thumbnailnew patent Slide scanner with a tilted image
An instrument and method for scanning a large microscope specimen uses a light source and at least one lens to focus light from the specimen onto a detector array. The specimen holder is located on a scanning stage and the detector array is dynamically tilted about a scan direction during the scan to maintain focus across the width of the scan strip as the scan proceeds.
08/21/14
20140231619
 Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection patent thumbnailnew patent Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection
There is provided a way of enabling the discrimination or identification of the kind of a light-emitting particle corresponding to each pulse form signal in the scanning molecule counting method using the optical measurement by the confocal or multiphoton microscope. In the inventive technique, the position of a light detection region in a sample solution periodically along a predetermined route is moved in measuring the light intensity from the light detection region; and a signal of light from a light-emitting particle is detected individually.
08/21/14
20140230576
 Sub-millinewton capacitive mems force sensor for mechanical testing on a microscope patent thumbnailnew patent Sub-millinewton capacitive mems force sensor for mechanical testing on a microscope
Most mechanical tests (compression testing, tensile testing, flexure testing, shear testing) of samples in the sub-mm size scale are performed under the observation with an optical microscope or a scanning electron microscope. However, the following problems exist with prior art force sensors as e.g they cannot be used for in-plane mechanical testing (a- and b-direction) of a sample; they cannot be used for vertical testing (c-direction) of a sample.
08/14/14
20140230103
Method and apparatus of using peak force tapping mode to measure physical properties of a sample
Methods and apparatuses are provided for automatically controlling and stabilizing aspects of a scanning probe microscope (spm), such as an atomic force microscope (afm), using peak force tapping (pft) mode. In an embodiment, a controller automatically controls periodic motion of a probe relative to a sample in response to a substantially instantaneous force determined and automatically controls a gain in a feedback loop.
08/14/14
20140227734
Electron microscopic observation method for observing biological sample in shape as it is, and composition for evaporation suppression under vacuum, scanning electron microscope, and transmission electron microscope used in the method
The sample observation method by an electron microscope according to the invention includes applying a composition for evaporation suppression containing at least one kind selected from an amphiphilic compound, oils and fats, and an ionic liquid to the surface of a sample to form a thin film, and covering the sample with the thin film, and displaying an electron microscopic image of the sample, which is covered with the thin film and accommodated in a sample chamber under vacuum, on a display device.. .
08/14/14
20140227714
In situ heat induced antigen recovery and staining apparatus and method
An automated in situ heat induced antigen recovery and staining method and apparatus for treating a plurality of microscope slides. The process of heat induced antigen recovery and the process of staining the biological sample on the microscope slide are conducted in the same apparatus, wherein the microscope slides do not need to be physically removed from one apparatus to another.
08/14/14
20140226881
Three-dimensional single-molecule fluorescence imaging beyond the diffraction limit using a double-helix point spread function
Embodiments of the present invention can resolve molecules beyond the optical diffraction limit in three dimensions. A double-helix point spread function can be used to in conjunction with a microscope to provide dual-lobed images of a molecule.
08/14/14
20140226797
Sample-containing cell for x-ray microscope and method for observing x-ray microscopic image
Observation samples in a sample solution are held due to absorption or the like on a rear face of a first x-ray transmission film. In a mirror body, while an x-ray emission film and x-ray transmission films are bent to be convex outward due to a pressure difference, an x-ray transmission film is bent to be convex toward the x-ray transmission film side due to gas expansion in a second cavity part.
08/14/14
20140226204
Optical assembly and light microscope
The invention relates to an optical assembly for spectral filtration of light, having a plurality of filters which are permeable to light of different spectral ranges, a filter selection mirror which can be moved for selectable deflection of light to different optical paths to the different filters, and an output mirror which can be moved to guide light coming from one of the filters to an optical path which is the same for all the filters. The optical assembly is characterized according to the invention in that in each case at least one stationary deflection optical system is provided for each of the optical paths to the different filters to guide light from the filter selection mirror to the respective filter and/or light from the respective filter to the output mirror, and the stationary deflection optical systems are arranged so that optical path lengths on the different optical paths from the filter selection mirror to the output mirror are equal.
08/14/14
20140226165
Height measurement by correlating intensity with position of scanning object along optical axis of a structured illumination microscope
A method for imaging an object using a microscope includes obtaining axial response data, the axial response data representative of a relationship between a separation between a top surface of the object and an objective lens of the microscope and an intensity of light reflected by the top surface of the object; positioning the object at a distance from the objective lens that is within a linear region of the axial response data; sequentially illuminating the object with a plurality of periodic patterns; obtaining a plurality of images of the object, each image resulting from the illumination of the object with a corresponding one of the plurality of periodic patterns; determining a reconstructed image of the object based on the plurality of images of the object; and, based on variations in the intensity of the reconstructed image, determining a topographic profile of the top surface of the object.. .
08/14/14
20140224988
Phase plate and electron microscope
Provided is a phase plate for use in an electron microscope which lessens the problem of image information loss caused by interruption of an electron beam and ameliorates the problem of anisotropic potential distributions. This phase plate comprises openings (23) connected into a single opening, and multiple electrodes (11) arranged in the opening from the outer portion of the opening towards the center of the opening.
08/07/14
20140223615
Method and apparatus of operating a scanning probe microscope
Methods and apparatuses are provided for automatically controlling and stabilizing aspects of a scanning probe microscope (spm), such as an atomic force microscope (afm), using peak force tapping (pft) mode. In an embodiment, a controller automatically controls periodic motion of a probe relative to a sample in response to a substantially instantaneous force determined, and automatically controls a gain in a feedback loop.
08/07/14
20140223614
Potential measurement device and atomic force microscope
A device includes: an electrode; a displacement measurement unit outputting voltage corresponding to electrostatic force between the electrode and a sample; a first power supply applying a first voltage between the electrode and sample; a second power supply adding, to the first voltage, a second voltage having a different frequency than the first voltage, and applying the added voltage; and a signal detection unit outputting a particular frequency component's magnitude contained in the displacement measurement unit's output, in which the signal detection unit extracts, from the output by the displacement measurement unit, and outputs, to a potential calculation unit, magnitude and phase of a frequency component of a frequency identical to the frequency of the first voltage, and magnitude of a frequency component of a frequency identical to a frequency equivalent to a difference between the frequencies of the first and second voltages, to measure the sample's surface potential.. .
08/07/14
20140223613
Scanning probe microscope and control method thereof
A scanning probe microscope includes a cantilever having a probe at a free thereof, a displacement detector to output a displacement signal of the cantilever, a vibrator to vibrate the cantilever, and a scanner to three-dimensionally relatively move the sample and probe. A mixed signal generator includes an amplitude information detecting section to provide a vibrating signal to the vibrator and generate an amplitude signal including information of an amplitude of the displacement signal, and a phase difference information detecting section to generate a phase signal including information of a phase difference between the displacement signal and the synchronous signal, and adds the displacement signal and the synchronous signal to generate a mixed signal.
08/07/14
20140223612
Modular atomic force microscope
A modular afm/spm which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular afm/spm includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the xyz translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument.
08/07/14
20140221227
Automated cancer diagnostic methods using fish
In various embodiments methods for automated screening for gene amplification in biological tissue samples using an automated fluorescence microscope to analyze fluorescence in situ hybridized samples are provided. Various additional embodiments provide methods of high throughput screening for gene amplification..
08/07/14
20140220622
Digital holographic microscopy apparatus and method for clinical diagnostic hematology
An apparatus, method, and apparatus for hematology analysis comprising using a holographic microscope, in one embodiment a transmission-type holographic microscope. In one aspect, laser light is provided and split into first and second sample beams, the first sample beam for imaging with a first magnification, the second sample beam for imaging with a second magnification.
08/07/14
20140220592
Method of calibration
The following processes are performed to improve the accuracy of the process of estimating the volume of a cell clump from an image including the cell clump. First, the image including the cell clump is acquired, and the optical density of the cell clump in the image is measured.
08/07/14
20140220386
Substrate for magnetic disk and magnetic disk
A magnetic disk substrate is characterized in that when laser light with a wavelength of 405 nm and a laser power of 25 mw is irradiated with a spot size of 5 μm and scattered light from the substrate is detected, the number of defects detected to have a size of 0.1 μm to not more than 0.3 μm is less than 50 per 24 cm2 and, with respect to the defects, there is no defect in which, in a bearing curve obtained by a bearing curve plot method using an atomic force microscope, a portion from an apex of the defect to 45% thereof is located in an area of defect height higher than a virtual line connecting from the apex of the defect to 45% thereof.. .
08/07/14
20140218794
Confocal fluorescence microscope
A confocal fluorescence microscope of the present invention consists of: a light source unit broadly comprising one or more short wavelength laser beams; a lens unit which converts parallel light, emitted from a light source, into linear light having an appropriate size; a multi-color mirror which reflects the light source and enables fluorescence to transmit so as to separate the light source and the fluorescence; a scan mirror which radiates the light source over a wide area and scatters the fluorescence over a large-area camera; a microscope unit which radiates the incident light source to a target object, collects the fluorescence emitted from the target, and outputs the collected fluorescence; and a detecting unit which removes the background of the outputted fluorescent signal and observes the outputted fluorescent signal.. .
08/07/14
20140218793
Apparatus for microscopic detection of hardness
An adjustable stage mount includes a housing having a base defining a hole and an adjustable stage including a ball joint extension that rotatably engages the hole and is rotatably securable about the x-, y-, and z-axes. An adjustable indenter mount includes a housing defining a hole and an adjustable indenter including a ball joint extension that rotatably engages the hole and is rotatably securable about the x-, y-, and z-axes.
08/07/14
20140218726
System and method for multiplex spectroscopic imaging
A system for measuring an sample includes an illumination source providing electromagnetic radiation pulses at a selected temporal frequency. A microscope focuses the radiation to interact with the sample and produce resultant electromagnetic radiation.
08/07/14
20140218688
Apparatus and method for imaging an eye
A slit lamp mounted eye imaging a slit lamp integrated, a handheld, oct integrated, or attached to a separate chinrest-joystick assembly apparatus for producing a wide field and/or magnified views of the posterior or the anterior segments of an eye through an undilated or dilated pupil. The apparatus images sections and focal planes and utilizes an illumination system that uses one or more leds, shifting optical elements, flipping masks, and/or aperture stops where the light can be delivered into the optical system on optical axis or off axis from center of optical system and return imaging path from the eye, creating artifacts in different locations on the eye image.
08/07/14
20140218687
Apparatus and method for imaging an eye
A slit lamp mounted eye imaging, a slit lamp integrated, a handheld, oct integrated, or attached to a separate chinrest-joystick assembly apparatus and method for producing a wide field and/or magnified views of the posterior or the anterior segments of an eye through an undilated or dilated pupil is disclosed. The apparatus images sections and focal planes and utilizes an illumination system that uses one or more leds, shifting optical elements, flipping masks, and/or aperture stops where the light can be delivered into the optical system on optical axis or off axis from center of optical system and return imaging path from the eye, creating artifacts in different locations on the eye image.
08/07/14
20140217288
Photoconductive element, lens, terahertz emission microscope and method of producing device
[solving means] a photoconductive element includes a base material, electrodes and a film material. The base material has an incident surface on which a terahertz electromagnetic wave is incident, the terahertz electromagnetic wave generated by irradiating a device to be observed with a pulse laser generated from a light source.
07/31/14
20140212913
Embedding resin composition for electron microscope, and method for observing sample on electron microscope using said composition
An anion selected from the group consisting of bf4−, pf6−, (cf3so2)2n−, a halide ion, a conjugate base of carboxylic acid, a conjugate base of sulfonic acid and a conjugate base of an inorganic acid.. .
07/31/14
20140211307
Laser scan confocal microscope
Fluorescence is generated from an irradiated point on an inspection surface of a sample and the fluorescence is collected by an objective lens. Here, because of the magnification chromatic aberration of the objective lens, the fluorescence going out from the objective lens travels along a path shifted from the irradiation light and changed substantially into a non-scan light by a galvano-scanner.
07/31/14
20140211305
Laser scanning microscope
A laser scanning microscope (lsm) consisting of at least one light source from which an illumination beam path extends in the direction of a sample, at least one detection beam path for transmitting sample light to a detector array, a first pinhole for confocal filtering in front of the detector array, a scanner for causing a relative motion between the illumination light and the sample in at least one direction, and a microscope lens. For illuminating a sample, at least two illumination beams, which the microscope lens focuses as illumination points in a sample plane, are generated in the illumination beam path.
07/31/14
20140211304
Surgical microscope system
A surgical microscope system includes a camera 20. The camera 20 includes ccds 21 and a focusing mechanism (41, 42, 43).
07/31/14
20140211163
Slit lamp microscope
The slit lamp microscope is capable of easily adjusting a slit-light and a backlight. The slit lamp microscope comprises: a slit lamp for emitting a slit-light; a mirror unit having a reflecting mirror or a prism, which reflects the slit-light emitted from the slit lamp toward an eye of an examinee; a microscope unit for observing the eye of the examinee; and a backlight source for emitting a backlight, which illuminates a circumference of the slit-light, toward the eye of the examinee.
07/31/14
20140211020
Video capture attachment and monitor for optical viewing instrument
The present invention is an attachable and detachable video image capture and display instrument that comprises a digital video capture device that can easily be physically connected to a gun scope, spotting scope, telescope, microscope, monocular, binocular or other optical viewing instrument or optical instrument used for viewing or examining an object or scene. It has electronic output to a display device, recording instrument, computing instrumen video projection devise, or data transmission instrument by way of connections of various options including wires, blue tooth, cellular, or other methods of video and audio data transmission.
07/31/14
20140210983
Optical microscope device and testing apparatus comprising same
The present invention allows observation or capturing of a high-contrast image of a sample for which sufficient contrast cannot be obtained in bright-field observation, such as a wafer having a pattern with a small pattern height. According to the present invention, a sample is illuminated through an objective lens used for capturing an image, and an imaging optics are provided with an aperture filter so that an image is captured while light of bright-field observation components is significantly attenuated..
07/24/14
20140206112
Method for reducing charge in critical dimension-scanning electron microscope metrology
Methods and compositions are provided for reducing or eliminating charge buildup during scanning electron microscopy (sem) metrology of a critical dimension (cd) in a structure produced by lithography. An under layer is utilized that comprises silicon in the construction of the structure.
07/24/14
20140205176
Optical platelet counter method
Platelets or blood cells are detected in a fluid sample by adjusting a focal depth of a microscope through a range of values, the microscope having a mounted sample and an objective lens adapted with one or both of (a) a spherical aberration correction unmatched to a utilized cover plate for the sample, or (2) a numerical aperture unmatched to a utilized illumination source for the sample. Images are recorded at different specific focal depths and in multiple z planes of a fluid bearing the platelets, where the position of platelets may overlap on different of the multiple z planes that are recorded, the images recorded through the cover plate, thus causing the generation of a specific light-dark pattern indicative of platelets at particular positions and at multiple depths in the fluid media.
07/24/14
20140205083
System for applying and reading out an information field identifying and protecting an object
A hard/software system for applying and reading out an information field identifying and protecting an item, comprises an applying unit, a reading unit, a control unit, and a database unit. The applying unit (for example, a laser or printer) generates the information field and transports it to the item.
07/24/14
20140204340
Apparatus for imaging an eye
A slit lamp mounted eye imaging a slit lamp integrated, a handheld, oct integrated, or attached to a separate chinrest-joystick assembly apparatus for producing a wide field and/or magnified views of the posterior or the anterior segments of an eye through an undilated or dilated pupil. The apparatus images sections and focal planes and utilizes an illumination system that uses one or more leds, shifting optical elements, flipping masks, and/or aperture stops where the light can be delivered into the optical system on optical axis or off axis from center of optical system and return imaging path from the eye, creating artifacts in different locations on the eye image.
07/24/14
20140204196
Focus and imaging system and techniques using error signal
Systems and techniques for an optical scanning microscope and/or other appropriate imaging system includes components for scanning and collecting focused images of a tissue sample and/or other object disposed on a slide. The focusing system described herein provides for determining best focus for each snapshot as a snapshot is captured, which may be referred to as “on-the-fly focusing.” best focus may be determined using an error function generated according to movement of a dither focusing lens.
07/24/14
20140204195
Microscope, objective optical system, and image acquisition apparatus
A microscope includes an objective optical system including an imaging optical system configured to form an image of an object, a re-imaging optical system configured to re-form an image of the object image formed by the imaging optical system, and a reflection unit arranged on an optical path between the imaging optical system and the re-imaging optical system and configured to be locally changeable in at least one of a position thereof in an optical axis direction and an inclination thereof relative to an optical axis, and an image sensor configured to capture the image re-formed by the objective optical system.. .
07/24/14
20140204194
Defect observation method and device therefor
This invention relates to a method for performing an analysis of defective material and the refractive index, and a three-dimensional analysis of very small pattern shapes including the steps of imaging by a scanning electron microscope to acquire an image of the position of a defect under observation using information of inspection results obtained by an optical inspection device, creating a model of the defect by using the acquired image of the defect under observation, calculating the values detected by the detector when reflected and scattered light emitted from a defect model is received by the detector when light is irradiated onto the defect model thus created, comparing the detection values thus calculated and the values detected by the detector, which has received light actually reflected and scattered from the sample, to obtain information relating to the height of the defect under observation, the material, or the refractive index.. .
07/24/14
20140203191
Method of observing samples with a fluorescent microscope
The invention relates to a method of inspecting parts of a sample on a tem grid with a fluorescence microscope, as arises when performing correlative microscopy, more specifically for samples on a holey carbon grid. A problem occurs when imaging vitrified ice with sample material when the ice is heated by the light used.
07/24/14
20140202265
Method for embedding a biological sample in a transparent matrix for analysis using single plane illumination microscopy
The invention is directed to method for positioning and aligning a preferably biological sample in the detection area of the objective of a microscope arrangement. According to the invention, the method mentioned above has the following method steps: a sample is introduced into a transparent medium, preferably agarose gel, which is initially liquid; the medium is changed from the liquid state to the solid state, wherein the sample is fixated within the medium, but the transparency of the medium is retained; the solidified medium is positioned in the microscope arrangement in such a way that the sample enclosed therein is situated in the detection area of the objective.
07/17/14
20140199765
Lance device and associated methods for delivering a biological material into a cell
Systems, devices, and methods for delivering a biological material into a cell are provided. In one example, a lance device for introducing biological material into a cell and configured for use in a nanoinjection system including a microscope is provided.
07/17/14
20140199204
Cuprous oxide powder and method for producing same
There are provided a cuprous oxide powder having a smaller particle diameter than that of conventional cuprous oxide powders, and a method for producing the cuprous oxide powder by a chemical reducing process. In a method for producing a cuprous oxide powder by adding a reducing agent, such as a reducing sugar, to a solution containing copper hydroxide, which is formed by adding one of an alkali solution and a copper ion containing solution to the other thereof, to deposit cuprous oxide particles by reduction, 0.00001 to 0.04 moles (10 to 40000 ppm) of ferrous ions with respect to the amount of copper ions in the copper ion containing solution are added to the copper ion containing solution before forming copper hydroxide, to produce a cuprous oxide powder which has a mean primary particle diameter of not greater than 0.5 micrometers when it is measured by a scanning electron microscope (sem), the cuprous oxide powder having a 50% particle diameter (d50 diameter) of not greater than 0.8 micrometers when it is calculated by a laser diffraction type particle size distribution measurement, the cuprous oxide powder containing 0.30 ppm or more of iron..


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Microscope topics: Microscope, Electron Microscope, Scanning Electron Microscope, Microscopy, Adsorption, Objective Lens, Optical Microscope, Polynomial, Fluorescence, Second Wave, Crystallin, Recording Device, Video Processing, Control Unit, Holographic

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