|| List of recent Microscope-related patents
|Contour alignment system|
The present disclosure describes a method of calibrating a contour. The method includes designing an anchor pattern, printing the anchor pattern on a substrate, collecting scanning electron microscope (sem) data of the printed anchor pattern on the substrate, wherein the sem data includes a sem image of the printed anchor pattern on the substrate, converting the sem image of the printed anchor pattern on the substrate into a sem contour of the printed anchor pattern, analyzing the sem contour of the printed anchor pattern, and aligning the sem contour of the anchor pattern to form the calibrated sem contour..
|Multiview light-sheet microscopy|
A live biological specimen is imaged by generating a plurality of light sheets; directing the plurality of light sheets along an illumination axis through the biological specimen such that the light sheets spatially and temporally overlap within the biological specimen along an image plane, and optically interact with the biological specimen within the image plane; and recording, at each of a plurality of views, images of the fluorescence emitted along a detection axis from the biological specimen due to the optical interaction between the light sheets and the biological specimen. The temporal overlap is within a time shift that is less than a resolution time that corresponds to a spatial resolution limit of the microscope..
|Quantitative determination method for target particles, photometric analysis device, and computer program for photometric analysis|
The method of the present invention includes: preparing a sample solution containing the target particles and luminescent probes to be bound to the target particles, and binding these in the sample solution; moving a position of a light detection region of the optical system in the sample solution using a confocal microscope or a multiphoton microscope, and detecting light signal emitted from the luminescent probe in the light detection region while moving the position of the light detection region, and individually detecting the target particles directly or indirectly; and counting the number of the detected target particles, and calculating the concentration of the target particles in the sample solution from the number of the counted target particles on the basis of a calibration curve that approximates the correlation between the concentration or quantity of the target particles in the sample solution and the number of the target particles.. .
|Electron microscope and image capturing method using electron beam|
The present invention is characterized by an electron microscope which intermittently applies an electron beam to a sample and detects a secondary electron signal, wherein an arbitrarily defined detection time (t2) shorter than the pulse width (tp) of the applied electron beam is selected, and a secondary electron image is formed using the secondary electron signal acquired during the detection time. Consequently, it is possible to reflect necessary sample information including the internal structure and laminated interface of the sample in the contrast of an image and prevent unnecessary information from being superimposed on the image, thereby making it possible to obtain the secondary electron image with improved sample information selectivity and image quality..
|Method and apparatus for inspecting thermal assist type magnetic head|
To reliably detect scattered light generated in the near field light generation area in the inspection of a thermal assist type magnetic head (herein after refer to magnetic head), the present invention provides a magnetic head inspection apparatus including: a scanning probe microscope including a cantilever having a probe with a magnetic film formed on the surface of the tip; a probe unit for supplying alternating current to a terminal formed in a magnetic head element, so that the laser beam is incident on the near field light emitting part; an imaging unit for taking an image of the probe unit and the magnetic head element; a scattered light detection unit for detecting the scattered light generated from the probe present in the generation area of the near field light of the magnetic head element, through a pinhole; and a signal processing unit for inspecting the magnetic head element.. .
|Calibrating single plasmonic nanostructures for quantitative biosening|
A method for calibrating multiple nanostructures in parallel for quantitative biosensing using a chip for localized surface plasmon resonance (lspr) biosensing and imaging. The chip is a glass coverslip compatible for use in a standard microscope with at least one array of functionalized plasmonic nanostructures patterned onto it using electron beam nanolithography.
|Light microscopy chips and data analysis methodology for quantitative localzied surface plasmon resonance (lspr) biosensing and imaging|
A chip for localized surface plasmon resonance (lspr) biosensing and imaging having a glass coverslip compatible for use in a standard microscope and at least one array of functionalized plasmonic nanostructures patterned onto the glass coverslip with electron beam nanolithography. The nanostructures can be regenerated allowing the chip to be used multiple times.
|In situ heat induced antigen recovery and staining method|
An automated in situ heat induced antigen recovery and staining method and apparatus for treating a plurality of microscope slides. The process of heat induced antigen recovery and the process of staining the biological sample on the microscope slide are conducted in the same apparatus, wherein the microscope slides do not need to be physically removed from one apparatus to another.
|Method and apparatus for inspecting thermal assist type magnetic head|
An apparatus for inspecting a thermal assist type magnetic head is constituted by a scanning probe microscope means including a cantilever having a probe with a magnetic film formed on the surface of a tip portion thereof; a probe unit which provides an alternating current to a terminal formed on the thermal assist type magnetic head element and causes a pulse drive current or pulse drive voltage; a scattered light detection means which scans the near-field light emitting part with the probe to detect the scattered light generated from the probe in the generation region of the near-field light; an imaging means which image the thermal assist type magnetic head element; and a signal process means inspects the thermal assist type magnetic head element and an output signal outputted from the scanning probe microscope means by scanning with the probe while providing an alternating current to the terminal.. .
|Method and apparatus for inspecting thermal assist type magnetic head|
An apparatus for inspecting a thermal assist type magnetic head is configured to include a scanning probe microscope unit comprising a cantilever having a probe with a magnetic film formed on the surface of a tip portion thereof; a prober unit which provides an alternating current to a terminal formed on the thermal assist type magnetic head element; a scattered light detection unit which detects scattered light generated from the probe; and a signal process unit which detects defect by using an output signal from the scanning probe microscope unit by scanning the surface of the thermal assist type magnetic head element with the probe in a state that the magnetic field is generated and the near-field light is stopped, and an output signal from the scattered light detection unit by scanning the surface with the probe while near-field light is generated and the magnetic field is off.. .
|Optical filter device, in particular for microscopes|
An optical filter device having a polarizing beamsplitter, an achromatic polarization manipulator, and at least one dichroic mirror. The polarization manipulator is arranged optically between a first input/output of the polarizing beamsplitter and the dichroic mirror.
There is provided a scanning microscope so configured that when the position of the exit pupil of an imaging optical system and a position conjugate to the exit pupil change, the position of the rotation center of a scanned light flux is moved and follows the changed exit pupil position. A scanning microscope includes a light source, an objective lens, and a scan unit.
|Illumination system for opthalmic microscope, and its operation method|
The present invention discloses a illumination system for ophthalmic microscope and its operation method. Light beams generated by white led, passes through the condenser and relay system to produce illumination on retina of the eye and boundary of the illumination is determined by the aperture stop.
|Charged particle microscope device and image capturing method|
A specimen image capture method using a charged particle microscope device includes: a first image acquisition step in which the gain of a detector in a charged particle microscope is set to a first gain value, charged particle beam scanning is carried out on a specimen, and a first image is obtained; a second image acquisition step in which the gain of the detector is set to a second gain value, which is different to the first gain value, charged particle beam scanning is carried out on the specimen, and a second image is obtained; and an image combination step in which the first gain value and the second gain value are used and the first image and the second image are combined.. .
|Small-profile lensless optical microscopy imaging and tomography instruments and elements for low cost and integrated microscopy|
Arrangements for small-sized, inexpensive, and innovative lensless and other micro-optic microscopy imaging and tomography are presented. An imaging region comprising flat or curved surfaces is provided with an illumination source proximate to the imaging region or arranged for collimated illumination.
|Magnetic head inspection system and magnetic head inspection method|
The magnetic head inspection method includes, exciting the cantilever of a magnetic force microscope at a predetermined frequency, the cantilever being provided with a magnetic probe on the end thereof, floating the magnetic probe over the writing head of the magnetic head and two-dimensionally scanning a search range, detecting the specific position of the writing head based on the search two-dimensional magnetic field intensity of the writing head with exciting state of the cantilever in the two-dimensional scan, setting a shape detection range smaller than the search range for detecting the shape of the writing head based on the specific position, and floating the magnetic probe over the writing head with exciting state of the cantilever, detecting the shape of the writing head by detecting the detection two-dimensional magnetic field intensity of the writing head in the two-dimensional scan.. .
|Method and apparatus for inspecting thermal assist type magnetic head device|
In order to enable inspection of the physical shape of a near-field light emitting portion of a thermal assist type magnetic head, a thermal assist type magnetic head device is placed on a table movable in a plane, a probe fixed to a cantilever scans a plane apart at a constant distance from the surface of the sample placed on the table while moving the table in a plane, the displacement of the cantilever is detected by applying light to the scanning cantilever and detecting reflected light from the cantilever, an atomic force microscope (afm) image of the thermal assist type magnetic head device is formed using information about the detected displacement of the cantilever and positional information about the table, and the quality of a physical shape including the size or typical dimensions of the near-field light emitting portion is determined by processing the formed afm image.. .
|Diffraction phase microscopy with white light|
A microscope and methods for obtaining a phase image of a substantially transparent specimen. Light collected from a specimen illuminated by a temporally incoherent source is diffracted into a first order and either the zeroth or first order is low-pass filtered in a fourier transform plane before the orders are recombined at a focal plane detector.
|Apparatus for selectively connecting items|
An apparatus for selectively connecting an accessory item to a surgical microscope includes a center pivot. An adapter arm includes an adapter support having a substantially planar support body which extends laterally in an outboard direction from the center pivot and has laterally spaced inboard and outboard support regions separated by a laterally oriented centerline.
|Phase derivative microscopy|
Methods and a module for use with a microscope for enhancing image contrast in an image of a phase object. A transmission image of a specimen is formed in an image plane, of which a fourier transform is generated in a fourier plane.
|Photon induced near field electron microscope and biological imaging system|
A method of obtaining pinem images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses.
|Scanning electron microscope and method for preparing specimen|
To select a highly critical defect as a defect to be analyzed, an automatic classification result from a review sem is used to select a defect to be analyzed. Further, to avoid an effect on a defect itself, a mark is placed in a position associated with the defect with the distance from the defect to the marking position changed on a defect basis.
|Scanning electron microscope|
A scanning electron microscope has a first condenser lens (121) having a lens gap (121a) facing toward an electron source (50) and a second condenser lens (122) having a lens gap (122a) facing toward an objective lens (13). The first and second condenser lenses are disposed between the electron source (50) and the objective lens (13).
|High aspect ratio sample holder|
An elongated member is formed which has a frontal and a distal end, and a length axis. The frontal end satisfies vacuum sealing and maneuverability specifications of a sample holder for a particle beam microscope.
|Modular uhv compatible angle physical contact fiber connection for transferable fiber interferometer type dynamic force microscope head|
A modular transferable ultra-high vacuum compatible device has a body with a tunnel through its thickness. An interferometric sensor is mounted above the body and has a brace on which a cantilever is disposed and through which an optical fiber passes so that the two may be aligned prior to installation in an atomic force measurement apparatus.
|Transformed caenorhabditis elegans and method for screening for substances regulating glucose metabolism using same|
The present invention relates to a method for preparing a transformed caenorhabditis elegans (c. Elegans) which reacts to glucose by exhibiting fluorescence, and to a method for screening for a candidate substance and for a novel gene capable of regulating glucose metabolism and metabolic diseases using the transformed caenorhabditis elegans.
|Slit lamp unit for a surgical microscope|
The present invention relates to a slit lamp unit (1) for a surgical microscope, the slit lamp unit (1) comprising a slit illumination unit (2) having a slit illumination optic for generating a slit illumination beam path (5, 6), and a guide rail (3) for displacement of the slit illumination unit (2) along a direction designated by the guide rail (3), the guide rail being embodied for displacement of the slit illumination unit (2) along a linear direction (12), and the slit illumination unit (2) being mounted on the guide rail (3) rotatably around a rotation axis (13) perpendicular to said linear displacement direction (12).. .
|Imaging apparatus and microscope system having the same|
Disclosed is an imaging apparatus including: a spectroscopic measurement section configured to measure a spectral characteristic of a subject; a spectral image capture section configured to capture a subject image separated into a plurality of colors through color separation to create a plurality of spectral images; and a color separation characteristic determining section configured to determine a color separation characteristic to be used for image capturing of the spectral image capture section, based on the spectral characteristic of the subject measured by the spectroscopic measurement section. The color separation characteristic determining section determines a count of color separations in the image capturing of the spectral image capture section and spectral bands corresponding to each of the color separations..
|X-ray detector for electron microscope|
Multiple detectors arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors preferably include a shutter and a cold shield that reduce ice formation on the detector.
|Three-dimensional mapping using scanning electron microscope images|
A method includes irradiating a surface of a sample, which is made-up of multiple types of materials, with a beam of primary electrons. Emitted electrons emitted from the irradiated sample are detected using multiple detectors that are positioned at respective different positions relative to the sample, so as to produce respective detector outputs.
|Method for identifying gambiered guangdong silk|
A method for identifying gambiered guangdong silk includes the steps of: detecting the surface state of fiber by microscope; detecting the pyrolysis fragments of fabrics by pyrolysis gas chromatography; determining the crude protein content in the fiber by kjeldahl determination; and detecting the dye component of the fabrics by high performance liquid chromatography. The method of the present invention can accurately identify the true and fake, good and bad of the gambiered guangdong silk, and then make an accurate evaluation on the gambiered guangdong silk; and the present invention is simple, useful, environmental and has low cost..
|Methods and means for manipulating particles|
The present invention is concerned with a system for sorting target particles from a flow of particles. The system has a microscope, a light source, a ccd camera, microfluidic chip device with microfluidic channels, a detection apparatus for detecting the target particles with predefined specific features, a response generating apparatus for generating a signal in response to the detection of the target particles, and an optical tweezing system for controlling movement of optical traps, the optical tweezing system is operably linked to the response signal..
|Adaptor for connecting an electronic device having a camera to an optical device|
This invention comprises an adaptor device for connecting an electronic device having a camera to a range of optical devices, including but not limited to binoculars, monoculars, riflescopes, spotting scopes, telescopes, and microscopes. This adaptor device has a plurality of protrusion that provide a self-centering and fitted connection between the electronic and optical device, so that the optical axes are aligned so that the user may take images or video on their electronic device through the optical device.
|X-ray microscope system with cryogenic handling system and method|
A cartridge-based cryogenic imaging system includes a sample handling system. This system uses a kinematic base and cold interface system that provides vertical loading to horizontally mounted high-precision rotation stages that are able to facilitate automated high-resolution three-dimensional (3d) imaging with computed tomography (ct).
|Fluid channels for computational imaging in optofluidic microscopes|
A microscope is disclosed, the microscope having a light source defining an optical axis along a z direction and a detector disposed in x-y direction, orthogonal to the optical axis, the detector configured to capture images of an object. The microscope includes a fluid channel having an inlet and an outlet configured with a fluid flow to transport the object from the inlet to the outlet.
|Digital confocal optical profile microscopy|
Various embodiments of microscopy systems, devices, and associated methods of analysis are described herein. In one embodiment, a method of operating a microscope includes acquiring a profile of a light signal from a sample with a photo detector without passing the light signal through a physical pinhole.
|Particle beam microscope for generating material data|
A method of operating a particle beam microscopy. A particle beam is scanned across a scanning region of a surface of the object.
|Method of performing tomographic imaging of a sample in a charged-particle microscope|
The invention relates to a method of performing tomographic imaging involving repeatedly directing a charged particle beam through a sample for a series of sample tilts to acquire a corresponding set of images and mathematically combining the images to construct a composite image. The latter of which consists of, at each of a second series of sample tilts, using a spectral detector to accrue a spectral map of said sample, thus acquiring a collection of spectral maps; analyzing said spectral maps to derive compositional data of the sample; and employing said compositional data in constructing said composite image..
|Inert gas delivery system for electrical inspection apparatus|
An apparatus for electrical inspection is disclosed. The apparatus comprises an inert gas delivery system that delivers inert gas near a microscope imaging element and electrical test probes.
A processor based method for measuring dimensional properties of a photoresist profile by determining a number acid generators and quenchers within a photoresist volume, determining a number of photons absorbed by the photoresist volume, determining a number of the acid generators converted to acid, determining a number of acid and quencher reactions within the photoresist volume, calculating a development of the photoresist volume, producing with the processor a three-dimensional simulated scanning electron microscope image of the photoresist profile created by the development of the photoresist volume, and measuring the dimensional properties of the photoresist profile.. .
|Negative-electrode material, negative electrode active material, negative electrode, and alkali metal ion battery|
A negative-electrode material is a carbonaceous negative-electrode material used in an alkali metal ion battery and an average layer spacing d002 of face (002) calculated by an x-ray diffraction method using cukα radiation as a radiation source is equal to or more than 0.340 nm. When the negative-electrode material is embedded in an epoxy resin, the epoxy resin is cured, the resultant cured material is cut and polished to expose a cross-section of the negative-electrode material, and the cross-section is observed in a bright field with 1000 times magnification using an optical microscope, a first region and a second region having different reflectance ratios are observed from the cross-section of the negative-electrode material..
|High speed x-ray inspection microscope|
The x-ray system may also be utilized in methods for high speed metrology or inspection, which in turn enable rapid process development, as well as manufacturing process control and yield management.. .
|Immersion liquid retainer, observed portion fixing apparatus and microscope|
An immersion liquid retainer is an immersion liquid retainer used for an observation made with a microscope including an immersion objective. The immersion liquid retainer includes a fixing part in which a first penetration hole for viewing an observed portion of a specimen is formed and which is fixed to the specimen, and an immersion liquid retaining part where a concave part that has a bottom surface configured with a transparent flat plate and is intended to retain an immersion liquid is formed.
|Adaptive device for inspecting endfaces of fiber-optic connector having multiple rows of fibers|
A device for shifting the imaging axis of a microscope for inspecting endfaces of a fiber-optic connector having multiple rows of endfaces has a supporting body for receiving a microscope; a first swinging lever mounted on top of the supporting body and rotatable about a first swinging axis perpendicular to the imaging axis of the microscope; a first connecting piece extending from the first swinging lever towards the imaging axis; a second swinging lever pivoted on the first connecting piece and rotatable about a second swinging axis perpendicular to the first swinging axis; and a fitting tip connected to the second swinging lever for interfacing with the fiber-optic connector. Using two sets of biasing means and adjustment drivers, the imaging axis passing through the supporting body and the fitting tip can be shifted in two mutually perpendicular directions to selectively align with any endface of the fiber-optic connector..
For an optical device as a transmission-type scanning optical microscope having a pinhole or a slit for limiting the amount of a detected light beam, a method of moving a scanning beam without moving an observation sample to be scanned is realized. A scanning beam from a beam scanning mechanism that has passed through an observation sample is focused onto a reflection plate, and is then returned back again to the observation sample.
A variety of actions are controlled based on an operator's various finger gestures used on the touch screen disposed on the display surface of the display means, for example, making contact by a finger (tap), making two consecutive contacts by a finger (double-tap), making contact by a finger, and moving the finger without releasing it (drag), making contact by a finger and maintaining the contact for a predetermined time or longer (touch-and-hold), making simultaneous contact by two fingers, and increasing spacing between the fingers (pinch-out) or decreasing the spacing (pinch-in), and making simultaneous contact by two fingers, and moving the fingers in parallel (double-drag).. .
|Motion-compensated confocal microscope|
A motion-compensated confocal microscope includes a laser scanning system, a fiber-optic component having a proximal end and a distal end such that the fiber-optic component is optically coupled to the laser scanning system to receive illumination light at the proximal end and to emit at least a portion of the illumination light at the distal end, and a detection system configured to receive and detect light returned from a specimen being observed and to output an image signal. The light returned from the specimen is received by the distal end of the fiber-optic component and transmitted back and out the proximal end of the fiber-optic component.
|Automatic microscopic focus system and method for analysis of transparent or low contrast specimens|
A microscope system and method empirically determines the boundaries of the depth of field of an objective lens. The system and method are largely automated, with the manipulation of a specimen to be imaged being carried out by processors and associated equipment.
|Specimen holder for holding a semiconductor device during a sample preparation procedure carried out using first and second sample preparation apparatuses|
A specimen holder is configured to hold, during a sample preparation procedure carried out using first and second sample preparation apparatuses, a semiconductor device to be analyzed using an electron microscope. The specimen holder includes a holding portion having a support configured to support the semiconductor device; and a supporting portion configured to releasable support the holding portion.
|Imaging a sample in a tem equipped with a phase plate|
The invention relates to a method of forming an image of a sample in a transmission electron microscope equipped with a phase plate. Prior art use of such a phase plate can introduce artifacts in the form of ringing and a halo.
|Coordinate correcting method, defect image acquiring method and electron microscope|
In accordance with an embodiment, a coordinate correcting method includes generating a pattern image for matching from an sem image acquired by an electron microscope in accordance with a defect coordinate, performing matching between a defect image and the pattern image, superimposing the defect image and the pattern image between which the matching has been performed on a difference image, specifying a position to which a defect position on the difference image corresponds on the pattern image, and converting the corresponding position on the sem image to a coordinate on a wafer. The defect coordinate, the defect image and the difference image are obtained by a defect inspection apparatus..
|Image quality adjusting method, non-transitory computer-readable recording medium, and electron microscope|
In accordance with an embodiment, a method of adjusting quality of an image of patterns common in shape includes acquiring a first gray value and a first waveform within a reference image, acquiring a sample image, acquiring a second gray value and a second waveform from third and fourth regions within a sample image, respectively, and adjusting the brightness and contrast of the sample image. The first gray value is a standard for the brightness of the image from a first region within a reference image.
|Widefield microscope illumination system and widefield illumination method|
A widefield microscope illumination system and a method for illumination, the system having a microscope objective with an optical objective axis, an illumination light source sending widefield illumination light along illumination beam paths having corresponding illumination axes along which the illumination light penetrates into the microscope objective through illumination light entry sites located within a predetermined illumination light entry area, a spatially resolving light detector detecting detected light sent from an illuminated sample through the microscope objective along a detected light beam path, and an automatic illumination light beam path manipulation device, controlled by a control system, which is arranged in front of the microscope objective in relation to the direction of the illumination light beam path, and by which illumination light beam path manipulation device the illumination axes are automatically movable at time intervals to a plurality of illumination light entry sites.. .
|Sheet heater and image fixing device including the sheet heater|
A sheet heater that includes a sheet article composed of a conductive resin composition containing a conductive material and a resin, and a pair of metal plate electrodes, each of the electrodes being bonded to each of the ends of the sheet article, wherein when elements of the sheet article are detected at a portion 1 μm depth from a surface of the metal plate electrode, a peak area ratio of silicon (si) to metal ion (m) is 1/100 to 1, the metal ion m being most abundant of all metal ions detected at the portion, the peaks being obtained by measuring an x ray generated at the portion by applying an x ray to the portion with the scanning electron microscope-energy dispersive x-ray spectrometer.. .