|| List of recent Inspect-related patents
| Systems and methods for prioritization of data for intelligent discard in a communication network|
Systems and methods for optimizing system performance of capacity and spectrum constrained, multiple-access communication systems by selectively discarding packets are provided. The systems and methods provided herein can drive changes in the communication system using control responses.
| Methods and apparatus to monitor usage of internet advertising networks|
Methods and apparatus to monitor usage of internet advertising networks are disclosed. An example method includes identifying, by inspecting a page info interface of a browser with a processor, a first universal resource locator (url) of a webpage displayed by the browser.
| Cad-based system for product definition, inspection and validation|
Various embodiments pertain to techniques for displaying and interacting with two-dimensional (2-d) drawing views in a three-dimensional (3-d) modeling environment within a computer-aided design (cad) system. In various embodiments, the application programmable interface (api) of the cad system is configured to enable 2-d drawing views to be displayed in the cad system's 3-d modeling environment.
| In-situ robotic inspection of components|
Methods and systems for inspecting a component within an assembled turbomachine are disclosed. At least one miniature robotic device having a non-destructive testing structure attached thereto is configured to travel around a surface of the component.
| Endoscopy systems|
Preparing an endoscope insertion assembly for performing endoscopy by providing the endoscope insertion assembly including an endoscope insertion tube operative for passage through a body cavity, and an optical assembly operative for inspection of said body cavity, and selectably inserting the optical assembly within said endoscope insertion tube.. .
| Method and system for determining overlap process windows in semiconductors by inspection techniques|
The formation of overlap areas in sophisticated semiconductor devices is a critical aspect which may not be efficiently evaluated on the basis of conventional measurement and design strategies. For this reason, the present disclosure provides measurement techniques and systems in which overlying device patterns are transformed into the same material layer, thereby forming a combined pattern which is accessible by well-established defect inspection techniques.
| Virtual testing and inspection of a virtual weldment|
Arc welding simulations that provide simulation of virtual destructive and non-destructive testing and inspection of virtual weldments for training purposes. The virtual testing simulations may be performed on virtual weldments created using a virtual reality welding simulator system (e.g., a virtual reality arc welding (vraw) system).
| Wind turbine system, an assembling method of a wind turbine system, an inspecting method of a wind turbine system, and an operation method of a wind turbine system|
A wind turbine system includes blades which rotate by receiving wind, a nacelle which supports the blades and rotates with the blades, a main shaft for transmitting torque which is connected to the hub and is rotated by the rotation of the hub, and a generator which generates electricity using rotating energy of the main shaft, wherein the main shaft is connected to the hub inside the hub in the axial direction of the main shaft.. .
| Method of automatic optical inspection for detection of macro defects of sub-pixel defect size in pattern wafers and non-pattern wafers|
A method of automatic optical self-contained inspection for detection of macro defects of sub-pixel defect size in pattern wafers and non-pattern wafers is based on surface light scattering color-intensity computerized analysis. The method includes setting-up initial calibration and deriving correction data.
| Descriptor guided fast marching method for analyzing images and systems using the same|
Methods and systems for descriptor guided fast marching method based image analysis and associated systems are disclosed. A representative image processing method includes processing an image of a microelectronic device using a fast marching algorithm to obtain arrival time information for the image.
| High speed x-ray inspection microscope|
The x-ray system may also be utilized in methods for high speed metrology or inspection, which in turn enable rapid process development, as well as manufacturing process control and yield management.. .
| Spacers with deflection-limited rod contacts for nuclear fuel assemblies and methods of making the same|
Nuclear fuel spacers include a deflection-limited elastic rod contact. Spacers may additionally include a rigid contact without elastic functionality.
| Distributed proxy addressing operations|
An addressing redirection mechanism is initiated at a switch or a router in a computing network in order to enable the switch to perform one or more distributed proxy addressing operations on behalf of a connected router. An address request transmitted from a first host device to a second host device to obtain addressing information of the second host device is received at the switch, and the switch inspects the address request to identify addressing information for the first host device.
| Wafer edge inspection|
Wafer edge inspection approaches are disclosed wherein an imaging device captures at least one image of an edge of a wafer. The at least one image can be analyzed in order to identify an edge bead removal line.
| Adaptive device for inspecting endfaces of fiber-optic connector having multiple rows of fibers|
A device for shifting the imaging axis of a microscope for inspecting endfaces of a fiber-optic connector having multiple rows of endfaces has a supporting body for receiving a microscope; a first swinging lever mounted on top of the supporting body and rotatable about a first swinging axis perpendicular to the imaging axis of the microscope; a first connecting piece extending from the first swinging lever towards the imaging axis; a second swinging lever pivoted on the first connecting piece and rotatable about a second swinging axis perpendicular to the first swinging axis; and a fitting tip connected to the second swinging lever for interfacing with the fiber-optic connector. Using two sets of biasing means and adjustment drivers, the imaging axis passing through the supporting body and the fitting tip can be shifted in two mutually perpendicular directions to selectively align with any endface of the fiber-optic connector..
| Light emission portion, photoelectric smoke sensor, and suction-type smoke sensing system|
The present invention can detect smoke with high accuracy. A light emitting portion is provided with a light emitting element outputting the inspection light with high brightness, the distribution of which is adjusted.
| Wave front aberration metrology of optics of euv mask inspection system|
Disclosed is test structure for measuring wave-front aberration of an extreme ultraviolet (euv) inspection system. The test structure includes a substrate formed from a material having substantially no reflectivity for euv light and a multilayer (ml) stack portion, such as a pillar, formed on the substrate and comprising a plurality of alternating pairs of layers having different refractive indexes so as to reflect euv light.
| Ophthalmologic apparatus and control method therefor|
To avoid, with a simple configuration and easy scanning, blocking of illumination light due to an eyelash or an eyelid of a subject, provided is an ophthalmologic apparatus, including: an optical system for scanning illumination light on an eye to be inspected in an up and down direction; a fixation target indicating unit for indicating a fixation target to the eye to be inspected at a selected position; a deflecting unit for changing an angle of the scanning for the eye to be inspected in a downward direction; and a fixation position shifting unit for shifting an indication position of the fixation target in a downward direction in accordance with the changed angle.. .
| Ophthalmologic apparatus and control method of ophthalmologic apparatus|
This invention provides an ophthalmologic apparatus that requires no fixation line control instruction by an operator to a patient even when executing an inspection set including a plurality of scanning conditions. In an ophthalmologic apparatus including a scanning unit configured to scan measuring light on an eye to be inspected and execute measurement of the eye to be inspected, and a fixation unit configured to fixate the eye to be inspected to a desired measurement position, a determination unit configured to determine whether to cause the scanning unit to continue the measurement of the eye to be inspected in accordance with an inspection set, and a fixation target control unit configured to change the on state of the fixation unit when the determination unit has determined to continue the measurement are arranged..
| Imaging apparatus and imaging method|
Provided is an imaging apparatus for acquiring a tomographic image of an object to be inspected based on light obtained by combining return light from the object illuminated with measuring light and reference light corresponding to the measuring light, the imaging apparatus including: a reference-light amount changing unit provided in an optical path of the reference light, for changing a reference-light amount of the reference light; and a control unit for controlling the reference-light amount changing means so as to control the reference-light amount within a predetermined range and an image quality of the tomographic image within a predetermined image-quality evaluation range.. .
| Adjustable variable resolution inspection systems and methods|
Camera heads configured to provide digitally articulated images or video, at adjustable resolutions and/or offsets and orientations, to a camera control unit (ccu) or other electronic computing system for display, storage, and/or transmission to other systems are disclosed.. .
| Method and system for cleaning surfaces and non-destructive inspection thereof|
An inspection system and methods for remote cleaning and inspection of difficult to access components within complex machinery. The system includes a display screen, a video borescope coupled to the display screen, an insertion tube, a camera head disposed at a distal end of the insertion tube, a feature for capturing an image and/or video with the camera head and displaying the image and/or video on the display screen, and a feature for remotely steering the distal end of the insertion tube as well as a nozzle of a feed tube that is attached to the insertion tube and adapted to apply a cleaning fluid to a surface to be inspected..
| System and method for online inspection of turbines using an optical tube with broadspectrum mirrors|
An optical inspection system for nondestructive internal visual inspection and non-contact infra-red (ir) temperature monitoring of an online, operating power generation turbine. The optical inspection system includes an optical tube having a viewing port, at least one reflective mirror or a mirror array having a reflectivity spectral range from 550 nm to 20 μm, and capable of continuous operation at temperatures greater than 932 degrees fahrenheit (500 degrees celsius), and a transparent window with high transmission within the same spectral range mounted distal the viewing port.
| Inverter-driven rotary electric machine, insulation inspection method and insulation inspection apparatus|
Insulation inspection method for an inverter-driven rotary electric machine includes: a step of applying, to an insulation sample (2), first impulse voltage simulating a voltage which occurs between winding turns of a rotary electric machine upon application of an inverter surge voltage to measure the number of times nt-t that an impulse voltage is applied until the insulation sample (2) suffers from insulation breakdown; a step of applying the first impulse voltage to the insulation sample(2) to measure an occurrence frequency npd of partial discharge which occurs per one time application; step of applying a second impulse voltage simulating the inverter surge voltage to a rotary electric machine (3) to measure a partial discharge occurrence frequency npd(motor) between the winding turns which occurs per one time application; and determining that an insulation performance of the rotary electric machine (3) is acceptable.. .
| Wiring defect inspecting method, wiring defect inspecting apparatus, and method for manufacturing semiconductor substrate|
A wiring defect inspecting method in accordance with the present invention comprises: obtaining a resistance of a short-circuited path of a semiconductor substrate; applying a voltage, which is specified on the basis of the resistance obtained, to the semiconductor substrate having a defect portion so as to cause the defect portion to generate heat; and capturing, with use of an infrared camera, an image of the semiconductor substrate whose temperature has increased due to the heat generated from the defect portion.. .
| Multi-doped lutetium based oxyorthosilicate scintillators having improved photonic properties|
The present invention relates to a set of multi-doped cerium-activated scintillation materials of the solid solutions on the basis of the rare earth silicate, comprising lutetium and having compositions represented by the chemical formulas: (lu2−w−x+2yawcexsi1−y)1−zmexjjoq and (lu2−w−x−2yawcexsi1+y)1−zmezjjoq. The invention is useful for detection of elementary particles and nuclei in high-energy physics, nuclear industry; medicine, positron emission tomography (tof pet and doi pet scanners) and single photon emission computed tomography (spect), positron emission tomography with magnetic resonance imaging (pet/mr); x-ray computer fluorography; non-destructive testing of solid state structure, including airport security systems, the gamma-ray systems for the inspection of trucks and cargo containers..
| Terahertz spectrometry device and method, and nonlinear optical crystal inspection device and method|
When light beams of two different wavelengths applied from an excitation light source are made incident on a nonlinear optical crystal having a unique nonlinear coefficient, the nonlinear optical crystal generates thz waves resulting from difference frequency generation according to the nonlinear coefficient that the crystal itself has and shg waves in which the light beams of two different wavelengths have been wavelength converted in accordance with the nonlinear coefficient. The generated thz waves pass through or are reflected from a sample and are detected by a thz detector.
| Methods and apparatuses for inspecting semiconductor devices using electron beams|
Methods and apparatuses for inspecting a semiconductor device using electron beam are provided. The methods may include performing detection operations on a detection target pattern n times and determining a number of detection operations which have been performed until a maximum secondary electron amount of the detection target pattern is obtained.
| Defect inspection apparatus, defect inspection method and non-transitory computer readable recording medium|
In accordance with an embodiment, a defect inspection apparatus includes an electron beam applying unit, a detection unit, a signal processing unit, and a control unit. The electron beam applying unit applies an electron beam to a semiconductor substrate on which first to n-th (n is a natural number equal to or more than 2) patterns are periodically provided.
| Coordinate correcting method, defect image acquiring method and electron microscope|
In accordance with an embodiment, a coordinate correcting method includes generating a pattern image for matching from an sem image acquired by an electron microscope in accordance with a defect coordinate, performing matching between a defect image and the pattern image, superimposing the defect image and the pattern image between which the matching has been performed on a difference image, specifying a position to which a defect position on the difference image corresponds on the pattern image, and converting the corresponding position on the sem image to a coordinate on a wafer. The defect coordinate, the defect image and the difference image are obtained by a defect inspection apparatus..
| Imaging device, inspection apparatus, and method of manufacturing electronic device|
The imaging device includes a sensor substrate, a light-blocking substrate, a light-collecting substrate, a sealing material, and a light-transmitting member. The light-transmitting member includes a light-transmitting base disposed to be in contact with either the sensor substrate or the light-blocking substrate, and a light-transmitting resin which is filled between the base and the sensor substrate or the light-blocking substrate.
| Ultrasonic array transducer holder and guide for flanges having cutouts and asymmetric geometry|
An ultrasonic inspection device employs a transducer incorporating an ultrasonic array and a positioner/holder having abase with a rail extending from the base to support the transducer in at least two lateral positions. A guide extends from the base for contact with a web of a composite shape, the guide maintaining the rail substantially perpendicular to the web.
| Floating head contour following holder for ultrasonic testing|
An ultrasonic transducer holder with a floating head is disclosed. This transducer holder allows the waterpath of the ultrasonic signal to be maintained over a contoured surface.
| Ultrasonic spectroscopic analysis-based inspection of rail components|
A solution for evaluating the condition of a rail component based on resonant response profiles across a set of bands of vibrations. The vibrations can be induced into the target component during normal operation of the target component.
|System and method for computer inspection of information objects for shared malware components|
Embodiments of a system and method for computer inspection of information objects, for example, executable software applications for common components that may include elements of computer viruses, items from hacker exploit libraries, or other malware components. Information objects may contain identified sequences of instructions, each of which may be identified and hierarchically grouped based on their structural relationship(s).
|Computer and memory inspection method|
In a memory inspection in a computer installing a x86 cpu, system software related to low-frequent processing is prevented from going down, and the suppression of performance degradation and the avoidance of a reduction in memory capacity by the memory inspection is realized. The computer having a processor, a memory, and an i/o device.
|System and method for detecting abnormal occurrences|
An abnormal-occurrence-detection-system comprising an abnormal-occurrence-detector inspecting a plurality of inspected-data-instances, each data-instance including values associated with at least one physical-attribute, the values defining the location of each data-instance in an attribute-space, the abnormal-occurrence-detector detecting when at least one data-instance corresponds to an abnormal-occurrence according to one of the following: when a density-point associated with one of the inspected-data-instances is not associated with at least one hilltop-point, and when the distance in the attribute-space, between a selected one of the inspected-data-instances associated with a first respective unique-identifier in a sorted list of unique-identifiers and a respective kth adjacent inspected-data-instance associated with a second respective unique-identifier in the sorted list of unique-identifiers, exceeds a distance-threshold-for-kth-adjacency, the sorted list of unique-identifiers defining a sorted sequence of data-instances, the respective kth adjacent inspected-data-instances being k entries away from the selected one inspected-data-instance in the sorted sequence of data-instances, and a database coupled with the event-detector, for storing data-instances.. .
|Method and apparatus for preparing cytological specimens|
An automated system for preparing a plurality of cytological specimens from a plurality of fluid samples in vials includes an apparatus for collecting a monolayer of cells from each sample and transferring the cells to a microscope slide for fixing, staining, and inspection. The system includes a first loading station for receiving the sample vials, a second loading station for receiving consumables such as filter membranes, a slide dispenser, and an unloading area for removing completed specimen slides.
|Culture apparatus, culture apparatus system, culture operation management method, and non-transitory storage medium storing program|
A culture apparatus includes a culture unit which cultures cells under a predetermined culture environment, and an imaging unit which captures an inspection image showing a state of a culture container which holds the cells or a state of the cells, further includes a carrying unit and a determining unit. The carrying unit delivers the culture container between at least one peripheral device to be used in a culture operation of the cells and the culture apparatus.
|Cast-in belt timing patch|
A cast-in reflective timing patch for a belt such as an intermediate transfer belt of a printing device. The timing patch is formed during manufacturing of the belt.
|Methods and systems for inspecting a workpiece|
Methods and systems for inspecting a workpiece are provided. The method includes storing model data associated with the workpiece in an inspection system, determining a relative position of a depth sensing device relative to the workpiece, and calibrating a pose view for the inspection system relative to the model based on the position of the depth sensing device relative to the workpiece.
|Integrated flying-spot x-ray apparatus|
Disclosed is an integrated flying-spot x-ray apparatus comprising a ray generator configured to generate the x-ray, a revolving collimator device provided thereon with at least one aperture and arranged to be rotatable about the ray generator, a frameless torque motor configured to drive the revolving collimator device to rotate about the ray generator, and a cooling device configured to cool the ray generator, wherein the ray generator, the revolving collimator device, the frameless torque motor and the cooling device are mounted on an integrated mounting frame. Compared with the prior art, the integrated flying-spot x-ray apparatus according to the present disclosure has a simple and compact structure and is used as a kernel apparatus for fields of safety inspection and medical treatment..
|Back-scatter human body security inspection system and scanning method thereof to detect radioactive matter|
The present invention discloses a back-scatter human body security inspection system, capable of detecting a radioactive matter carried by the human body, comprising: a radiation source configured to generate radiation rays, a flying spot forming device, configured to modulate the radiation rays from the radiation source, so as to form flying spot scanning beams for scanning the human body to be detected, a detector configured to detect radiation rays from the human body to be detected and output a signal characterizing a dose of the radiation rays, a control and data processing device, configured to process the signal outputted from the detector to obtain a radiation image of the human body to be detected. The detector detects the radiation rays from the radiation source scattered by the human body to be detected, separately at different times, and the radiation rays from the radioactive matter carried by the human body to be detected.
|Network traffic manager architecture|
Methods, systems, and devices are described for managing network communications. A traffic manager module may receive a message from a first network device to a second network device.
|Stateless load balancer in a multi-node system for transparent processing with packet preservation|
Stateless load balancing of network packets within a system avoids detection by a network client or end user for deep packet inspection or other bump-in-the-wire applications. At least one header field of a received packet is used in generating a hash value.
|Space imaging overlay inspection method and array substrate|
Embodiments of the invention discloses a space imaging overlay inspection method and an array substrate; the method comprises: forming a thin film having a space imaging overlay mark by photolithography; when the thin film is a transparent thin film, performing a color developing treatment on the space imaging overlay mark on the transparent thin film, so as to make the space imaging overlay mark appear in a non-transparent color; and conducting a space imaging overlay inspection between the transparent thin film and an adjacent thin film by using the space imaging overlay mark appear appearing in the non-transparent color. In the method, by conducting the color developing treatment to the space imaging overlay mark on the transparent thin film and then conducting positioning, the space imaging overlay mark can be positioned quickly and accurately, thus alignment condition between two photolithography procedures can be detected swiftly and effectively..
|Advanced inspection method utilizing short pulses led illumination|
An illumination module that may include a led driver; a group of light emitting diodes (leds) that comprises at least one led; the group of led is coupled to the led driver; wherein the led driver is arranged to activate the group of leds by driving a high current short duration driving signal; and wherein the group of leds is arranged to emit at least one light pulse in response to the high current short duration driving signal.. .
|Method and device for inspecting glass substrate of liquid crystal display|
The present invention provides a method and a device for inspecting glass substrate of liquid crystal display. The method includes (1) providing an inspection device, wherein the inspection device comprises a device body, an operation table mounted on the device body, an irradiation lamp mounted to the device body and located above the operation table, and a steam nozzle mounted to the device body and located above the operation table, the operation table having a bearing surface, the bearing surface forming an included angle with respect to the horizon; (2) positioning a glass substrate-to-be-inspected on the bearing surface; and (3) turning on the irradiation lamp and spraying steam through the steam nozzle toward the glass substrate-to-be-inspected and at the same time, performing visual inspection of the glass substrate to which the steam attaches..
Implementing compliance management includes displaying a checklist of inspection items on a display of a mobile communications device at an inspection site of an entity. Each of the inspection items is mapped to a corresponding compliance code governing environmental regulatory requirements for operation and maintenance of the entity.
|Machine vision inspection system comprising two cameras having a rotational offset|
A machine vision inspection system comprises an optical portion providing an image of a field of view of a workpiece which may be a magnified image. A first camera and a second camera provide first and second images of a shared or common field of view of the workpiece and are arranged such that the orientation of the common field of view imaged in the first camera is rotated relative to the orientation of the common field of view imaged in the second camera.
|Automatic optical inspection device|
Disclosed is an automatic optical inspection device. The automatic optical inspection device comprises a substrate support platform, a sensor fixed platform, an image sensor, and a backlight source.
|In-line particle discrimination for cosmetic inspection|
A method for in-line cosmetic inspection of at least a portion of a surface of a product includes identifying if at least one blemish exists on the portion of the surface, disturbing the portion of the surface based on the identifying, and determining if the at least one blemish is immobile based on the disturbing.. .
|Inspection device, bonding system and inspection method|
An inspection device for inspecting the interior of an overlapped substrate produced by bonding one substrate and another substrate, comprising: a first holding unit configured to hold the rear surface of the overlapped substrate and include a cutout formed to expose a portion of the rear surface of the overlapped substrate when viewed from the top; a second holding unit configured to hold and rotate the overlapped substrate; an infrared irradiator configured to irradiate the rear surface or front surface exposed from the cutout of the overlapped substrate held on the first holding unit with an infrared ray; and an image pickup unit configured to receive the infrared ray emitted from the infrared irradiator and image the overlapped substrate held on the first holding unit in division for each of regions exposed from the cutout.. .
|Flexible linkage camera system and method for visual inspection of off line industrial gas turbines and other power generation machinery|
Internal components of power generation machinery, including for example gas or steam industrial turbines as well as generators, are inspected a camera inspection system that is inserted and positioned within the machinery by an elongated cable carrier that has restricted cable flexure along a two-dimensional carrier cable flexure motion plane. A camera head that retains the camera is coupled to a distal end of the cable carrier.
|Apparatus and method for inspection of marking|
An apparatus and method for inspecting whether marking of a target chip in a wafer has been performed normally are provided. The apparatus includes a voltage application detector which detects application of a voltage to an external circuit, an image pickup unit which captures an image, and a controller which controls the image pickup unit to capture an image at at least one predetermined point when the application of the voltage is detected by the voltage application detector and determines whether the marking of the target chip has been performed normally based on the captured image.
|Nondestructive inspection device using alternating magnetic field, and nondestructive inspection method|
[problem] in conventional non-destructive inspection devices using magnetism, the subject of inspection was limited to the surface layer of the test object as a result of the skin effect, and it was not possible to perform flaw detection inspection at the interior or reverse surface of thick-structured test objects. [solution] the effect of the surface effect was eliminated by imparting an external signal canceling the detection output of the test object surface layer from the detection output of a magnetic field resulting from eddy currents induced in the test object.
|Inspection device, bonding system and inspection method|
According to an embodiment of the present disclosure, an apparatus of inspecting an overlapped substrate obtained by bonding substrates together is provided. The apparatus includes a first holding unit configured to hold and rotate the overlapped substrate, and a displacement gauge configured to measure displacements of peripheral sides of a first substrate and a second substrate constituting the overlapped substrate while rotating the overlapped substrate held by the first holding unit..
|Mini metering and biological balancer control station|
A water and wastewater treatment aerated mini-dosing air-lift pump system and filter housing, that replaces the conventional dosing pump, controls and additional tank. It is adaptable to all access ports and uniquely smaller than a 3″ inspection port and is integrally positioned in an existing or new raw water pretreatment or pump tank.
|Vibration feeding apparatus and method|
A vibration feeding apparatus comprises an alignment track that is operative to receive electronic components and to arrange the electronic components in a desired orientation by vibrating and accelerating the electronic components located on the alignment track. An inspection station rejects electronic components that are not in the desired orientation onto a reject track for reintroduction to the alignment track.
|Exhaust component cleaning and requalification process|
According to one embodiment, a method for cleaning and requalifying a component of an exhaust aftertreatment system includes inspecting the component using an x-ray processing technique. The method further includes associating the plurality of cleaning techniques with a plurality of compositions of material, and cleaning the component according to at least one of the plurality of cleaning techniques associated with the composition of material..
|System and method for on line monitoring within a gas turbine combustor section|
An on-line optical inspection and monitoring system is externally mounted to existing man way service access within the combustor housing. A replacement man way cover having an optical window is mounted to the combustor housing.
|Inspection pocket for baby garment|
A method and device comprising an inspection pocket or viewing slit provided on the backside of an infant onesie wherein a caregiver may quickly, efficiently and cleanly check the contents within an infant's diaper through said slit without having to remove the infant's clothing.. .
|Dynamic access control policy with port restrictions for a network security appliance|
A network security appliance supports definition of a security policy to control access to a network. The security policy is defined by match criteria including a layer seven network application, a static port list of layer four ports for a transport-layer protocol, and actions to be applied to packet flows that match the match criteria.
|System and method for identifying, diagnosing, maintaining, and repairing a vehicle|
A method for diagnosing and maintaining a vehicle at a repair shop includes connecting a first vehicle inspection device to a first work station and selecting a mobile vci which is provided a detection software component situated on a central repair shop server and a central diagnostic device; connecting the vci to the vehicle; establishing a communication between the vci and the diagnostic device; storing vehicle identification data in the vci via the diagnostic device; performing a first set of vehicle inspections using the first vehicle inspection device and/or the vci; disconnecting the first vehicle inspection device from the vehicle; connecting a second vehicle inspection device to the vehicle; reading out the identification data from the vci into the second vehicle inspection device at a second work station via the diagnostic device; and performing a second set of vehicle inspections using the second vehicle inspection device and/or the vci.. .
|Operating machine and maintenance and inspection information generating apparatus|
A hydraulic shovel (1) constituted by a plurality of components includes: a storage unit (20) which stores an operation history of a target component included in the plurality of components and targeted for life span estimation, a discrimination threshold value used for classifying usage of the target component into a plurality of usage modes based on the operation history, and a usage mode-specific estimated life span indicative of an estimated life span of the target component in each of the usage modes; and an arithmetic and control unit (10) which performs a process of calculating an operating time of the target component in each of the usage modes in accordance with the operation history of the target component and the discrimination threshold value, and a process of estimating the life span of the target component based on the operating time of the target component calculated for each of the usage modes in the aforementioned process and on the usage mode-specific estimated life span. This makes it possible to improve the accuracy in estimating the life spans of components constituting an operating machine..
|Toy gun having fire-control assembly|
The toy gun contains a power element electrically connected with a driver element and an electronic fire-control assembly. The electronic fire-control assembly turns on or off the driver element, which in turn engages or disengages a gear set.
|Method of extracting lectin from the common bean as well as a lectin preparation|
A method of extracting lectin from the common bean as well as a lectin preparation. The abstract of the disclosure is submitted herewith as required by 37 c.f.r.
|Automated inspection scenario generation|
Methods and systems for determining inspection scenarios without input from a user are presented. Inspection scenarios include at least one acquisition mode, defect detection parameter values, and classification parameter values.
|System and method for machine vision inspection|
A computer-implemented method for use in machine vision systems is provided. The method can include receiving a source image and segmenting the source image into one or more segments.
|Photon doppler velocimetry for laser bond inspection|
Methods, systems, and apparatuses are disclosed for using photon doppler velocimetry for laser bond inspection.. .
|Handheld device for detecting tampering aimed to modify the metering of measure-deliverable goods or services and inspection method|
A detecting device, for facilitating a detection of tampering aimed at altering a metering of a measure-deliverable good or service, for providing useful information for detecting a presence of a remotely activated/deactivated tampering device by means of a radiofrequency control signal, the tampering device comprising a radio receiver of said radio frequency signal is described. The detecting device is a handheld device.
|Remote inspection system and communication method thereof|
A remote inspection system and a communication method thereof are provided. According to exemplary embodiments, the system may be implemented such that desired inspection data can be received from a meter only after unlocking the meter, by setting the meter to a lock state using an inherent obis code at the beginning and receiving a corresponding unlock obis code from a remote inspection server.
|Laser interlock system for medical and other applications|
A laser interlock system and allows laser radiation to be generated when an inspector and a subject correctly wear safety glasses and during use of a photo-acoustic imaging apparatus, thereby protecting the eyes of the inspector and the subject and preventing unnecessary power consumption. The laser interlock system includes a sensing unit to sense whether or not contact between a user and safety glasses occurs, a light source unit to generate a laser, and a control unit that determines, based on an output value from the sensing unit, whether or not the user is wearing the safety glasses normally, and generates an interlock signal to turn on or off the light source unit for selective laser generation according to the determination..