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Defects patents



      
           
This page is updated frequently with new Defects-related patent applications. Subscribe to the Defects RSS feed to automatically get the update: related Defects RSS feeds. RSS updates for this page: Defects RSS RSS


Mosaic implants, kits and methods for correcting bone defects

Noncircular inner lumen guiding catheter with assisted variable support

Method for determining the spatiotemporal distribution of activity of a proteolytic enzyme in a heterogeneous system…

Date/App# patent app List of recent Defects-related patents
08/14/14
20140229922
 Efficient model checking technique for finding software defects patent thumbnailEfficient model checking technique for finding software defects
A method for detecting defects in a computer program. The method steps include obtaining source code and a potential defect definition; identifying, based on the potential defect definition, a set of program objects associated with a potential defect in the source code; extracting an executable program slice having the potential defect from the source code; generating, by a processor, an abstracted model of the program slice by: modeling, using data abstraction, the set of program objects as data-abstracted variables, identifying, within the program slice, a set of control statements including predicates necessary for evaluating the set of control statements, modeling, using predicate abstraction, the predicates as predicate-abstracted boolean variables, and creating, based on the data-abstracted variables and the predicate-abstracted boolean variables, a finite state machine (fsm) model of the program slice; and identifying an error state of the fsm indicating an occurrence of the potential defect within the program slice..
08/14/14
20140228969
 Mosaic implants, kits and methods for correcting bone defects patent thumbnailMosaic implants, kits and methods for correcting bone defects
The mosaic implant is configured to be deformable such that at least a portion of the mosaic implant is conformable to a curved surface, with the beam portion providing structural support which resists inward deformation of the curved portion of the implant. A kit for forming a mosaic implant is also provided, along with a method for correcting a bone defect in a patient..
08/14/14
20140228749
 Noncircular inner lumen guiding catheter with assisted variable support patent thumbnailNoncircular inner lumen guiding catheter with assisted variable support
A noncircular inner lumen guiding catheter with assisted variable support has an inner wall defining a noncircular cross-sectional shaped lumen for use in delivery of multiple microcatheters or other devices for treatment of neurovascular defects, such as for treatment of aneurysms. The noncircular inner lumen guiding catheter with assisted variable support includes torque transmittal guidance walls that are flexible linearly but not circumferentially, and that are neither collapsible nor kinkable.
08/14/14
20140227726
 Method for determining the spatiotemporal distribution of activity of a proteolytic enzyme in a heterogeneous system (variations), a device for realizing same and a method for diagnosing the defects  in the hemostatic system on the basis of a change in the spatiotemporal distribution of activity of a proteolytic enzyme in a heterogeneous system patent thumbnailMethod for determining the spatiotemporal distribution of activity of a proteolytic enzyme in a heterogeneous system (variations), a device for realizing same and a method for diagnosing the defects in the hemostatic system on the basis of a change in the spatiotemporal distribution of activity of a proteolytic enzyme in a heterogeneous system
The invention relates to the field of biotechnology. The method for determining the spatial and temporal distribution of the activity of a proteolytic enzyme in an in vitro heterogeneous system, such as blood or blood plasma, involves the introduction of a luminescent, fluorogenic or chromogenic substrate into a sample with the subsequent release of a detectable tag as the proteolytic enzyme cleaves the substrate, and the recording of the optical characteristics of the sample, which makes it possible to assess the spatial and temporal distribution of the activity of the enzyme.
08/14/14
20140227526
 Belt for electrophotography and production method therefor, and electrophotographic image forming apparatus patent thumbnailBelt for electrophotography and production method therefor, and electrophotographic image forming apparatus
Provided is a belt for electrophotography which is capable of suppressing the occurrence of adhesion to other members and blocking and which is less liable to cause image defects due to a singular protrusion. The belt for electrophotography comprises a surface layer which comprises heteroaggregate including an inorganic oxide particle having an average primary particle diameter of from 10 to 30 nm and an electroconductive metal oxide particle having an average primary particle diameter of from 5 to 40 nm, and a ten-point average roughness rzjis of a surface of the surface layer satisfies a relationship: 0.3 μm≦rzjis≦0.7 μm..
08/14/14
20140227463
 Self adhesive film and method to minimize or eliminate print defects in such film patent thumbnailSelf adhesive film and method to minimize or eliminate print defects in such film
The present invention relates to a self adhesive ink jet printable polymer film. The film comprises a polymeric resin and a low surface energy additive that is in a substantially free form.
08/14/14
20140226189
 Image test apparatus, image test system, and image test method patent thumbnailImage test apparatus, image test system, and image test method
An image test apparatus includes an image generating unit acquiring an output target image with which an image is formed and output by an image forming apparatus, and generating a test image for testing the read image, an image test unit determining a defect of the read image based on a difference between the test image and the read image, a defect number determining unit determining number of defects contained in the read image based on a determination result of the defect of the read image, a frequency distribution generating unit accumulating defect numbers of multiple read images, each of the defect numbers being the number of defects detected in one read image, and generating a frequency distribution of the defect numbers, and an abnormality determination unit determining an abnormality of the image forming apparatus based on a change in the frequency distribution generated for each predetermined period.. .
08/14/14
20140226123
 Casting cup assembly for forming an ophthalmic device patent thumbnailCasting cup assembly for forming an ophthalmic device
Disclosed in this specification is a casting cup assembly comprising frontcurve and basecurve molds which of which includes a ring that circumscribes the respective concave and convex mold surface. When the casting cup is assembled, the rings align and minimize de-centering and tilting of the concave and convex mold surfaces which, in turn, reduces edge defects..
08/14/14
20140226119
 Nematic liquid crystal composition and liquid crystal display element using the same patent thumbnailNematic liquid crystal composition and liquid crystal display element using the same
The nematic liquid crystal composition exhibits a negative dielectric anisotropy (Δ∈), the liquid crystal composition being useful as a liquid crystal display material, and a liquid crystal display element using the same. The liquid crystal composition of the present invention has a large absolute value of the dielectric anisotropy thereof and a low viscosity.
08/14/14
20140226027
 System and method for sensor failure detection patent thumbnailSystem and method for sensor failure detection
A novel image sensor includes a pixel array, a row control circuit, a test signal injection circuit, a sampling circuit, an image processing circuit, a comparison circuit, and a control circuit. In a particular embodiment, the test signal injection circuit injects test signals into the pixel array, the sampling circuit acquires pixel data from the pixel array, and the comparison circuit compares the pixel data with the test signals.
08/14/14
20140225624
Non-invasive pre-bond tsv test using ring oscillators and multiple voltage levels
A design for test (dft) architecture is provided that enables pre-bond parametric testing of through-silicon vias (tsvs). A grouping of n number of input/output (i/o) segments are configured to receive a test signal in a feedback loop, where each i/o segment includes one or more buffers (or inverters) and a tsv connected at one end to the one or more buffers.
08/14/14
20140225121
Algan template fabrication method and structure of the algan template
Provided are an aluminum gallium nitride template and a fabrication method thereof. The fabrication method includes forming an aluminum nitride (aln) layer on a substrate, forming a first aluminum gallium nitride (alxga1-xn) layer on the aluminum nitride (aln) layer, forming a second aluminum gallium nitride (alyga1-yn) layer on the first aluminum gallium nitride (alxga1-xn) layer, forming a third aluminum gallium nitride (alzga1-zn) layer on the second aluminum gallium nitride (alygal-yn) layer, wherein the first aluminum gallium nitride (alxga1-xn) layer, the second aluminum gallium nitride (alyga1-yn) layer, and the third aluminum gallium nitride (alzga1-zn) layer are formed to have crystal defects and a composition ratio of aluminum (where 1>x>y>z>0) that are gradually decreased as heights of the layers are increased..
08/14/14
20140224959
Casting cup assembly for forming an ophthalmic device
Disclosed in this specification is a casting cup assembly comprising frontcurve and basecurve molds which of which includes a ring that circumscribes the respective concave and convex mold surface. When the casting cup is assembled, the rings align and minimize de-centering and tilting of the concave and convex mold surfaces which, in turn, reduces edge defects..
08/14/14
20140224481
Method and device for supplying at least one electrical consumer of a drill pipe with an operating voltage
In a method and device for supplying at least one electrical consumer (10) of a drill pipe with an operating voltage, at least one electrical component (10, 11, 15) on pipe rods (6) of the drill pipe is tested for defects with a test voltage that is smaller than the operating voltage before the operating voltage is applied, and the operating voltage can only be applied when no defects are present.. .
08/14/14
20140224323
Solar cell sheet and heat treatment process thereof
Provided are a solar cell sheet and a heat treatment process thereof the heat treatment process includes: a) sifting from solar cell sheets after printed and sintered cell sheets with conversion efficiency lower than 18% and filling factor thereof higher than 70%; h) performing low temperature annealing on the sifted cell sheets; c) sifting from the cell sheets after low temperature annealing cell sheets with lowered filling factor; d) re-sintering the sifted cell sheets; and e) sifting from the re-sintered cell sheets cell sheets with conversion efficiency lower than 18% and returning back to b) until most or all of the sifted meet demands. The low temperature annealing and re-sintering processes proceed cyclically, low temperature annealing can repair the defects in the substrate material, and the re-sintering process can repair the defects generated from low temperature annealing, and the two processes cooperate with each other and sifting can be performed repeatedly, greatly reducing the number of low efficient sheets and improving economic benefits..
08/07/14
20140222058
Catch members for occluder devices
Devices and techniques for modifying and maintaining a configuration of an occlusion device for the closure of physical anomalies, such as an atrial septal defect, a patent foramen ovale (pfo), and other septal and vascular defects are described. The devices and techniques relate particularly to, but are not limited to, modifying and maintaining a configuration of a pfo occluder made from a polymer tube.
08/07/14
20140222002
Apparatus and method for repairing bone defects
A system can include a sizing and drill guide having a body with a bone engaging side, an opposite side and first and second guide holes. The bone engaging side can include a profile for positioning in the trochlear groove and the guide holes can include axes that can be orientated at an acute angle.
08/07/14
20140220730
Photoelectric conversion device and fabrication method thereof
In a thin film photoelectric conversion device fabricated by addition of a catalyst element with the use of a solid phase growth method, defects such as a short circuit or leakage of current are suppressed. A catalyst material which promotes crystallization of silicon is selectively added to a second silicon semiconductor layer formed over a first silicon semiconductor layer having one conductivity type, the second silicon semiconductor layer is partly crystallized by a heat treatment, a third silicon semiconductor layer having a conductivity type opposite to the one conductivity type is stacked, and element isolation is performed at a region in the second silicon semiconductor layer to which a catalyst material is not added, so that a left catalyst material is prevented from being diffused again, and defects such as a short circuit or leakage of current are suppressed..
08/07/14
20140220386
Substrate for magnetic disk and magnetic disk
A magnetic disk substrate is characterized in that when laser light with a wavelength of 405 nm and a laser power of 25 mw is irradiated with a spot size of 5 μm and scattered light from the substrate is detected, the number of defects detected to have a size of 0.1 μm to not more than 0.3 μm is less than 50 per 24 cm2 and, with respect to the defects, there is no defect in which, in a bearing curve obtained by a bearing curve plot method using an atomic force microscope, a portion from an apex of the defect to 45% thereof is located in an area of defect height higher than a virtual line connecting from the apex of the defect to 45% thereof.. .
08/07/14
20140220286
Glass laminate using textured adhesive
A method for laminating glass, a laminate assembly, and an adhesive-coated plastic material used in a laminate assembly. Specifically an adhesive, once applied to a plastic layer is grooved or textured to allow formerly trapped air to escape from between layers of a laminate assembly during a laminate process.
08/07/14
20140219544
Detecting defects on a wafer using defect-specific and multi-channel information
Methods and systems for detecting defects on a wafer using defect-specific and multi-channel information are provided. One method includes acquiring information for a target on a wafer.
08/07/14
20140218503
Apparatus and method for optical inspection, magnetic field and height mapping
A metrology system is configured to provide visual inspection of a workpiece, three-dimensional magnetic field map, and height measurement. A stage is configured to bring points of interest at the workpiece under the desired tool for measurement.
08/07/14
20140217449
Substrate for optics and semiconductor light emitting device
To provide a substrate for optics provided with a fine-structure product which improves luminous efficiency of an led while improving internal quantum efficiency iqe by decreasing the number of dislocation defects in a semiconductor layer, a substrate for optics (1) is provided with a fine-structure layer (12) including dots comprised of a plurality of convex portions (13) extending in the direction of from the main surface of a substrate (11) to outside the surface, where the fine-structure layer (12) has a plurality of dot lines (13-1 to 13-n) in which a plurality of dots is arranged with a pitch py in the first direction in the main surface of the substrate (11), while having the plurality of dot lines in which a plurality of dots is arranged with a pitch px in the second direction orthogonal to the first direction in the main surface of the substrate (11), one of the pitch py and the pitch px is a constant interval of nano-order, while the other one is an inconstant interval of nano-order, or both are inconstant intervals of nano-order.. .
08/07/14
20140217419
Semiconductor structures including stacks of indium gallium nitride layers
Methods of forming ternary iii-nitride materials include epitaxially growing ternary iii-nitride material on a substrate in a chamber. The epitaxial growth includes providing a precursor gas mixture within the chamber that includes a relatively high ratio of a partial pressure of a nitrogen precursor to a partial pressure of one or more group iii precursors in the chamber.
08/07/14
20140217406
Apparatus and method for non-intrusive random memory failure emulation within an integrated circuit
The system and methods allow for emulation of random hardware failure of an internal embedded memory array of an integrated circuit (ic) device. Emulation of potential defects is performed in order to evaluate the behavior of the rest of the design.
08/07/14
20140217283
Tem sample preparation
An improved method of preparing ultra-thin tem samples that combines backside thinning with an additional cleaning step to remove surface defects on the fib-facing substrate surface. This additional step results in the creation of a cleaned, uniform “hardmask” that controls the ultimate results of the sample thinning, and allows for reliable and robust preparation of samples having thicknesses down to the 10 nm range..
08/07/14
20140216990
Method and device for sorting identification objects
A method and a device for sorting identification objects is described, wherein identification objects are fed in a defined sequence, one after the other, to a first transfer position and inspected for defects. Identification objects identified as defect-free are transferred in the first transfer position by a first transfer arrangement to a transfer buffer, and identification objects identified as defective are transported away by a first transport arrangement.
08/07/14
20140216281
Machine and method for marking articles
The present invention relates to a machine for marking articles that includes a marking head applying a marking force on an article along to a first axis; a positioning system positioning the article facing the marking head and generally along a perpendicular second axis; and a support system supporting the article during marking by the marking head. The positioning system comprises at least one carriage-turret for supporting the article.
08/07/14
20140216158
Air coupled ultrasonic contactless method for non-destructive determination of defects in laminated structures
There is an air coupled ultrasonic contactless method and an installation for non-destructive determination of defects in laminated structures with a width (w) and a multiplicity of n lamellas with intermediate n−1 bonding plants (b), whereas at least one transmitter (t) in a fixed transmitter distance (wts) radiates ultrasound beams at multiple positions and at least one receiver (r) in a sensor distance (wsr) is receiving re-radiated ultrasound beams at multiple positions relative to the laminated structure (s). The method images the position and geometry of for example lamination defects and allows for inspection of laminated structure (s) of arbitrary height (h) and length (l), and an individual assessment of specific bonding planes (e.g.
07/31/14
20140213129
Multi-layer pad structure through needle punching working procedure
A multi-layer pad structure through needle punching working procedure is provided. The multi-layer pad structure comprises: a material layer which is a wrap knitted fabric with at least one mesh; and a base layer, which is a non-woven fabric surface composed of a needle punching cotton silk fiber, combined with the material layer tightly by embedding the needle punching cotton silk fiber into the material layer through needle punching working procedure.
07/31/14
20140213005
Defect-controlling structure for epitaxial growth, light emitting device containing defect-controlling structure, and method of forming the same
A method for reducing dislocations or other defects in a light emitting device, such as light emitting diode (led), by in-situ introducing nanoparticles into at least one of a defect-controlling layer, an n-type layer, a p-type layer, and a quantum well of the light emitting device. A light emitting device is provided, and nanoparticles are dispensed in-situ in at least one of a defect-controlling layer, an n-type layer, a p-type layer, and a quantum well of the light emitting device..
07/31/14
20140212024
Contour-based array inspection of patterned defects
One embodiment relates to a method of inspecting an array of cells on a substrate. A reference image is generated using a cell image that was previously determined to be defect free.
07/31/14
20140212022
Method of design-based defect classification and system thereof
There is provided an inspection method capable of classifying defects detected on a production layer of a specimen. The method comprises: obtaining input data related to the detected defects; processing the input data using a decision algorithm associated with the production layer and specifying two or more classification operations and a sequence thereof; and sorting the processed defects in accordance with predefined bins, wherein each bin is associated with at least one classification operation, wherein at least one classification operation sorts at least part of the processed defects to one or more classification bins to yield finally classified defects, and wherein each classification operation, excluding the last one, sorts at least part of the processed defects to be processed by one or more of the following classification operations..
07/31/14
20140212021
System, a method and a computer program product for patch-based defect detection
A system capable of inspecting an article for defects, the system including: a patch comparator, configured to determine with respect to each of a plurality of reference patches in a reference image a similarity level, based on a predefined patch-similarity criterion and on a source patch defined in the reference image; an evaluation module, configured to rate each inspected pixel out of multiple inspected pixels of the inspection image with a representative score which is based on the similarity level of a reference patch associated with a reference pixel corresponding to the inspected pixel; a selection module, configured to select multiple selected inspected pixels based on the representative scores of the multiple inspected pixels; and a defect detection module, configured to determine a presence of a defect in the candidate pixel based on an inspected value of the candidate pixel and inspected values of the selected inspected pixels.. .
07/31/14
20140211139
Liquid crystal display device
Since the liquid crystal display device of the present invention prevents a decrease in voltage holding ratio (vhr) and an increase in ion density (id) in the liquid crystal layer and resolves the problems of display defects such as image sticking, the liquid crystal display device is useful as va-mode and psva-mode liquid crystal display devices of an active matrix drive type, and is applicable to liquid crystal display devices of liquid crystal televisions, monitors, cellular phones, smart phones, etc.. .
07/31/14
20140211138
Liquid crystal display device
There is provided a liquid crystal display device capable of preventing a decrease in voltage holding ratio (vhr) of a liquid crystal layer and an increase in ion density (id) and resolving the problem of display defects such as white spots, alignment unevenness, image sticking, and the like. The liquid crystal display device prevents a decrease in voltage holding ratio (vhr) of a liquid crystal layer and an increase in ion density (id) and suppressing the occurrence of display defects such as image sticking and the like.
07/31/14
20140211137
Liquid crystal display device
The present invention provides a liquid crystal display device capable of preventing a decrease in voltage holding ratio (vhr) of a liquid crystal layer and an increase in ion density (id) and resolving the problem of display defects such as white spots, alignment unevenness, image sticking, and the like. The liquid crystal display device of the present invention is characterized by preventing a decrease in voltage holding ratio (vhr) of a liquid crystal layer and an increase in ion density (id) and suppressing the occurrence of display defects such as image sticking and the like, and is thus particularly useful for a va-mode or psva-mode liquid crystal display device for active matrix driving, and can be applied to liquid crystal display devices such as a liquid crystal tv, a monitor, a cellular phone, a smart phone, and the like..
07/31/14
20140211120
Third metal layer for thin film transistor witih reduced defects in liquid crystal display
A liquid crystal display (lcd) includes an array of pixels over a thin film transistor (tft) substrate. The tft substrate includes a tft that has a first metal layer to form a gate electrode and a second metal layer to form a source electrode and a drain electrode for each pixel.
07/31/14
20140210994
Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite side
Controlled amount of heat is injected into a stacked die using a light beam, and the propagated heat is measuring with lit camera from the other side of the die. The thermal image obtained can be characterized so that it can be used to calibrate the phase shift from a given stack layer, or can be used to identify defects in the stacked die.
07/31/14
20140210982
System and method for automatic quality control for assembly line processes
A system and method is disclosed for a quality control and/or inspection procedure for assembly line processes. The disclosed system and method enable automatic optical inspection of a device during different stages of manufacture as well as in its finished form.
07/31/14
20140210089
Copper interconnect structure and its formation
A structure with improved electromigration resistance and methods for making the same. A structure having improved electromigration resistance includes a bulk interconnect having a dual layer cap and a dielectric capping layer.
07/31/14
20140209476
Low copper electroplating solutions for fill and defect control
Certain embodiments herein relate to a method of electroplating copper into damascene features using a low copper concentration electrolyte having less than about 10 g/l copper ions and about 2-15 g/l acid. Using the low copper electrolyte produces a relatively high overpotential on the plating substrate surface, allowing for a slow plating process with few fill defects.
07/31/14
20140208660
Control of defects and sweep pattern in pdc by treating carbide substrate before sweep
A method for forming a polycrystalline diamond compact (pdc) includes treating a carbide substrate having a cobalt content therein with an acid, e.g., aqua regia, to remove cobalt from a surface portion of the carbide substrate; disposing diamond crystals on the treated carbide substrate; disposing a sweep material on the diamond crystals on a surface of the diamond opposite the carbide substrate; and applying high temperature and pressure to the carbide substrate, the diamond crystals and the sweep material such that the diamond crystals are sintered into a polycrystalline diamond attached to the carbide substrate to form the polycrystalline diamond compact.. .
07/24/14
20140207328
Method and device for the diagnosis of defects in components of chassis systems of motor vehicles
A method for the diagnosis of defects in components of motor vehicle chassis systems. Vibrations produced by rotating components of the chassis system due to an imbalance are filtered such that the frequency range which depends on the wheel rotation speed and contains the imbalance-induced vibrations of the rotating components is filtered out.
07/24/14
20140207243
Implants for altering wear patterns of articular surfaces
Methods and devices for correcting wear pattern defects in joints. The methods and devices described herein allow for the restoration of correcting abnormal biomechanical loading conditions in a joint brought on by wear pattern defects, and also can, in embodiments, permit correction of proper kinematic movement..
07/24/14
20140206133
Method for manufacturing semiconductor device
To reduce defects in an oxide semiconductor film in a semiconductor device. To improve electrical characteristics of and reliability in the semiconductor device including an oxide semiconductor film.
07/24/14
20140205179
Reticle defect inspection with systematic defect filter
Disclosed are methods and apparatus for inspecting a photolithographic reticle. A stream of defect data is received from a reticle inspection system, wherein the defect data identifies a plurality of defects that were detected for a plurality of different portions of the reticle.
07/24/14
20140205062
System and method for imaging defects
The invention is directed to a defect imaging device that has an energy beam that is directed at a device under test. The energy beam creates positrons deep within the material of the device under test.
07/24/14
20140204426
Method and apparatus for correcting a printed image
A method for printing and correction of a printed image defects. The method includes inspection of the printed image and detection of segments of printed image that could contain printed defects.
07/24/14
20140204322
Liquid crystal display panel and liquid crystal display device
The present invention provides a liquid crystal display panel and a liquid crystal display device having excellent display quality, with reduced string-like defects that occur in display pixels. The liquid crystal display panel of the present invention includes multiple spacers between a pair of substrates, wherein the spacers are arranged such that an inter-spacer distance between adjacent spacers in a longitudinal direction is different from an inter-spacer distance between adjacent spacers in a transverse direction, and an angle formed between a line connecting the spacers with a shorter inter-spacer distance and an alignment direction of liquid crystal molecules at a voltage lower than a threshold voltage in the liquid crystal layer is 20° or smaller..
07/24/14
20140203687
Stealth dicing for ultrasound transducer array
An ultrasound transducer array is formed with stealth dicing. A laser is used to form defects within the piezoelectric substrate and along the desired kerf locations.
07/24/14
20140202654
Continuous casting equipment for titanium or titanium alloy slab
Using plasma arcs generated by plasma torches, the surface of molten metal charged into a mold is heated. Emss arranged on the lateral sides of the mold are used to stir the surface of the molten metal or the vicinity thereof electromagnetically.
07/24/14
20140202651
Methods for sand core gas evacuation and related systems and apparatus
Methods, systems, and apparatus for reduction of gas pressure within a core, such as a sand casting core package, during a casting process in order to reduce bubble defects. Some embodiments may comprise a mold configured to receive a molten metal to create a metal casting, such as an engine block casting.
07/24/14
20140202359
Rapid setting high strength calcium phosphate cements comprising cyclodextrins
Rapid setting high strength calcium phosphate cements and methods of using the same are provided. Aspects of the cements include fine and coarse calcium phosphate particulate reactants and a cyclodextrin which, upon combination with a setting fluid, produce a flowable composition that rapidly sets into a high strength product.
07/17/14
20140201583
System and method for non-intrusive random failure emulation within an integrated circuit
The apparatus and methods allow random hardware failure emulation of an integrated circuit (ic) by emulation of potential defects to enable behavior evaluation of the rest of the design in such situation. This emulation can non-intrusively address multiple points of failure.
07/17/14
20140200830
Railway track geometry defect modeling for predicting deterioration, derailment risk, and optimal repair
Geo-defect repair modeling is provided. A method includes logically dividing a railroad network according to spatial and temporal dimensions with respect to historical data collected.
07/17/14
20140200829
Asset failure prediction with location uncertainty
Geo-defect repair modeling with location uncertainty is provided. A method includes logically dividing a railroad network into segments each of a specified length.
07/17/14
20140200828
Asset failure prediction with location uncertainty
Geo-defect repair modeling with location uncertainty is provided. A method includes logically dividing a railroad network into segments each of a specified length.
07/17/14
20140200827
Railway track geometry defect modeling for predicting deterioration, derailment risk, and optimal repair
Geo-defect repair modeling is provided. A method includes logically dividing a railroad network according to spatial and temporal dimensions with respect to historical data collected.
07/17/14
20140200597
Biodegradable apparatus and method for closure of trocar defects
A biodegradable device for providing scaffolding for a trocar defect to promote healing. The device consists of an upper and lower scaffold, offset by a connector.
07/17/14
20140199825
Silicon-germanium heterojunction tunnel field effect transistor and preparation method thereof
A silicon/germanium (sige) heterojunction tunnel field effect transistor (tfet) and a preparation method thereof are provided, in which a source region of a device is manufactured on a silicon germanium (sige) or ge region, and a drain region of the device is manufactured in a si region, thereby obtaining a high on-state current while ensuring a low off-state current. Local ge oxidization and concentration technique is used to implement a silicon germanium on insulator (sgoi) or germanium on insulator (goi) with a high ge content in some area.
07/17/14
20140199812
Bump structural designs to minimize package defects
A method of forming a chip package includes providing a chip with a plurality of first copper post bumps having a first height of copper post. The method also includes providing a substrate with a plurality of second copper post bumps having a second height of copper post.
07/17/14
20140199792
Defect pattern evaluation method, defect pattern evaluation apparatus, and recording media
According to a defect pattern evaluation method of an embodiment, defects are detected by performing optical defect inspection on a pattern on a substrate. Then, the defects are classified according to a type of a pattern layout using a pattern layout corresponding to coordinates of the defects.
07/17/14
20140199787
Semiconductor mask blanks with a compatible stop layer
Provided is a method for creating a mask blank that includes a stop layer. The stop layer is optically compatible and process compatible with other layers included as part of the mask blanks.
07/17/14
20140199619
Electrophotographic photoreceptor, method for manufacturing same, and electrophotographic apparatus using same
A layered, positively-charged electrophotographic photoreceptor, a method for manufacturing the photoreceptor and an electrophotographic apparatus using the photoreceptor are disclosed. The layered, positively-charged electrophotographic photoreceptor includes a conductive support on which is provided a sequential stack composed of a charge transport layer containing at least a first hole transport material and a first binder resin; and a charge generation layer containing at least a charge generation material, a second hole transport material, an electron transport material, and a second binder resin, wherein the charge generation layer and the charge transport layer have a total amount of residual solvents that is 50 μg/cm2 or less.
07/17/14
20140198974
Semiconductor device defect inspection method and system thereof
Provided are a semiconductor device defect inspection method and system thereof, with which predetermined hot spots are inspected using a sem, and with which the frequency of defects occurring at the hot spot is estimated statistically and with reliability. An inspection point is designated in design data by the defect type.
07/17/14
20140198222
Optical monitoring device for an imaging system
An optical monitoring device for an optical imaging system having a focal plane, an optical axis and an entry pupil, forming an image of a scene substantially at infinity on an image detector disposed substantially in the focal plane, comprises: a virtually point-like emission source at the periphery of the detector and substantially in the focal plane; a reflecting element with a plane surface upstream of the imaging system relative to the direction of light rays coming from the scene, and according to a position and inclination where a monitoring image of the source produced by the optical system and reflected by the reflecting element is substantially in the focal plane on a detection element connected to a monitoring image analyzer allowing potential optical defects to be identified; the reflecting element having an annular shape allowing passage of light rays coming from the scene and passing through the entry pupil.. .
07/17/14
20140196623
Reducing print quality defects
Reducing print quality defects can include printing a pattern with an offset printing device having a binary ink developer roller, determining a variation for a hue shift of the printed pattern; and varying gain in a feedback loop of a servo motor coupled to the binary ink developer roller to reduce the variation.. .
07/10/14
20140195396
Actionable exception alerts
Systems, method, apparatuses, and software are described for automatically detecting defects in financial transactions, automatically determining resolutions to the defects based on historical defect patterns, an interacting with customers to provide information and/or receive instructions regarding defects and how they should be resolved.. .
07/10/14
20140195395
Differentiated service levels for exception processing of financial transactions
Systems, method, apparatuses, and software are described for automatically detecting defects in financial transactions, automatically determining resolutions to the defects based on historical defect patterns, an interacting with customers to provide information and/or receive instructions regarding defects and how they should be resolved.. .
07/10/14
20140195346
Transaction exception-based financial product offers
Systems, method, apparatuses, and software are described for automatically detecting defects in financial transactions, automatically determining resolutions to the defects based on historical defect patterns, an interacting with customers to provide information and/or receive instructions regarding defects and how they should be resolved.. .


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Defects topics: Semiconductor, Polythioether, Semiconductor Substrate, Ammonium Hydroxide, Polyurethane, Irradiation, Scattering, Contiguous, Imaging System, Ammonium Hydroxide Solution, Solubility, Semiconductor Device, Integrated Circuit, Aqueous Solution, Surfactant

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