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Defects patents



      
           
This page is updated frequently with new Defects-related patent applications. Subscribe to the Defects RSS feed to automatically get the update: related Defects RSS feeds. RSS updates for this page: Defects RSS RSS


Railway track geometry defect modeling for predicting deterioration, derailment risk, and optimal repair

Asset failure prediction with location uncertainty

Asset failure prediction with location uncertainty

Date/App# patent app List of recent Defects-related patents
07/17/14
20140201583
 System and method for non-intrusive random failure emulation within an integrated circuit patent thumbnailSystem and method for non-intrusive random failure emulation within an integrated circuit
The apparatus and methods allow random hardware failure emulation of an integrated circuit (ic) by emulation of potential defects to enable behavior evaluation of the rest of the design in such situation. This emulation can non-intrusively address multiple points of failure.
07/17/14
20140200830
 Railway track geometry defect modeling for predicting deterioration, derailment risk, and optimal repair patent thumbnailRailway track geometry defect modeling for predicting deterioration, derailment risk, and optimal repair
Geo-defect repair modeling is provided. A method includes logically dividing a railroad network according to spatial and temporal dimensions with respect to historical data collected.
07/17/14
20140200829
 Asset failure prediction with location uncertainty patent thumbnailAsset failure prediction with location uncertainty
Geo-defect repair modeling with location uncertainty is provided. A method includes logically dividing a railroad network into segments each of a specified length.
07/17/14
20140200828
 Asset failure prediction with location uncertainty patent thumbnailAsset failure prediction with location uncertainty
Geo-defect repair modeling with location uncertainty is provided. A method includes logically dividing a railroad network into segments each of a specified length.
07/17/14
20140200827
 Railway track geometry defect modeling for predicting deterioration, derailment risk, and optimal repair patent thumbnailRailway track geometry defect modeling for predicting deterioration, derailment risk, and optimal repair
Geo-defect repair modeling is provided. A method includes logically dividing a railroad network according to spatial and temporal dimensions with respect to historical data collected.
07/17/14
20140200597
 Biodegradable apparatus and method for closure of trocar defects patent thumbnailBiodegradable apparatus and method for closure of trocar defects
A biodegradable device for providing scaffolding for a trocar defect to promote healing. The device consists of an upper and lower scaffold, offset by a connector.
07/17/14
20140199825
 Silicon-germanium heterojunction tunnel field effect transistor and preparation method thereof patent thumbnailSilicon-germanium heterojunction tunnel field effect transistor and preparation method thereof
A silicon/germanium (sige) heterojunction tunnel field effect transistor (tfet) and a preparation method thereof are provided, in which a source region of a device is manufactured on a silicon germanium (sige) or ge region, and a drain region of the device is manufactured in a si region, thereby obtaining a high on-state current while ensuring a low off-state current. Local ge oxidization and concentration technique is used to implement a silicon germanium on insulator (sgoi) or germanium on insulator (goi) with a high ge content in some area.
07/17/14
20140199812
 Bump structural designs to minimize package defects patent thumbnailBump structural designs to minimize package defects
A method of forming a chip package includes providing a chip with a plurality of first copper post bumps having a first height of copper post. The method also includes providing a substrate with a plurality of second copper post bumps having a second height of copper post.
07/17/14
20140199792
 Defect pattern evaluation method, defect pattern evaluation apparatus, and recording media patent thumbnailDefect pattern evaluation method, defect pattern evaluation apparatus, and recording media
According to a defect pattern evaluation method of an embodiment, defects are detected by performing optical defect inspection on a pattern on a substrate. Then, the defects are classified according to a type of a pattern layout using a pattern layout corresponding to coordinates of the defects.
07/17/14
20140199787
 Semiconductor mask blanks with a compatible stop layer patent thumbnailSemiconductor mask blanks with a compatible stop layer
Provided is a method for creating a mask blank that includes a stop layer. The stop layer is optically compatible and process compatible with other layers included as part of the mask blanks.
07/17/14
20140199619
Electrophotographic photoreceptor, method for manufacturing same, and electrophotographic apparatus using same
A layered, positively-charged electrophotographic photoreceptor, a method for manufacturing the photoreceptor and an electrophotographic apparatus using the photoreceptor are disclosed. The layered, positively-charged electrophotographic photoreceptor includes a conductive support on which is provided a sequential stack composed of a charge transport layer containing at least a first hole transport material and a first binder resin; and a charge generation layer containing at least a charge generation material, a second hole transport material, an electron transport material, and a second binder resin, wherein the charge generation layer and the charge transport layer have a total amount of residual solvents that is 50 μg/cm2 or less.
07/17/14
20140198974
Semiconductor device defect inspection method and system thereof
Provided are a semiconductor device defect inspection method and system thereof, with which predetermined hot spots are inspected using a sem, and with which the frequency of defects occurring at the hot spot is estimated statistically and with reliability. An inspection point is designated in design data by the defect type.
07/17/14
20140198222
Optical monitoring device for an imaging system
An optical monitoring device for an optical imaging system having a focal plane, an optical axis and an entry pupil, forming an image of a scene substantially at infinity on an image detector disposed substantially in the focal plane, comprises: a virtually point-like emission source at the periphery of the detector and substantially in the focal plane; a reflecting element with a plane surface upstream of the imaging system relative to the direction of light rays coming from the scene, and according to a position and inclination where a monitoring image of the source produced by the optical system and reflected by the reflecting element is substantially in the focal plane on a detection element connected to a monitoring image analyzer allowing potential optical defects to be identified; the reflecting element having an annular shape allowing passage of light rays coming from the scene and passing through the entry pupil.. .
07/17/14
20140196623
Reducing print quality defects
Reducing print quality defects can include printing a pattern with an offset printing device having a binary ink developer roller, determining a variation for a hue shift of the printed pattern; and varying gain in a feedback loop of a servo motor coupled to the binary ink developer roller to reduce the variation.. .
07/10/14
20140195396
Actionable exception alerts
Systems, method, apparatuses, and software are described for automatically detecting defects in financial transactions, automatically determining resolutions to the defects based on historical defect patterns, an interacting with customers to provide information and/or receive instructions regarding defects and how they should be resolved.. .
07/10/14
20140195395
Differentiated service levels for exception processing of financial transactions
Systems, method, apparatuses, and software are described for automatically detecting defects in financial transactions, automatically determining resolutions to the defects based on historical defect patterns, an interacting with customers to provide information and/or receive instructions regarding defects and how they should be resolved.. .
07/10/14
20140195346
Transaction exception-based financial product offers
Systems, method, apparatuses, and software are described for automatically detecting defects in financial transactions, automatically determining resolutions to the defects based on historical defect patterns, an interacting with customers to provide information and/or receive instructions regarding defects and how they should be resolved.. .
07/10/14
20140194363
Compression-resistant collagen-based artificial bone repair material
The present invention provides a compression-resistant collagen-based artificial bone repair material that could be used for bone defect repair at human load-bearing sites. Such material has a composition and structure of self-assembled nano-sized calcium phosphate salt and collagen molecules, thereby possessing a biomimetic mineralization structure similar to the natural bone.
07/10/14
20140193964
Method of manufacturing semiconductor device
The present invention provides a method of manufacturing a semiconductor device. The method at least comprises the following steps.
07/10/14
20140193738
Cell for fuel-cell battery using a proton exchange membrane, with gas diffusion layers of different rigidity at the anode and at the cathode
A cell structure for a fuel-cell battery, which allows the compromise necessary between the reduction in the non-uniformities of mechanical stress to be optimized, with the aim of obtaining a more uniform operation, and the independent accommodation with respect to the defects in planarity/thickness/alignment, while at the same time meeting the compactness constraint, comprises: a membrane/electrode assembly comprising a first electrode and a second electrode separated by a membrane; a gas diffusion layer stacked on each face of the assembly, between an electrode of the assembly and a current collector plate; and the gas diffusion layers stacked on either side of the assembly do not have the same rigidity, one of the gas diffusion layers having a young's modulus relative to an applied stress in the direction of the thickness, greater than the young's modulus of the other layer, in a ratio of the order of at least 100.. .
07/10/14
20140193351
Method and compositions for reducing pore size, and moisturizing and/or blurring appearance of defects on keratin surfaces
A method for simultaneously moisturizing and/or blurring the appearance of skin defects, or reducing pore size, or treating skin with a multi-benefit composition.. .
07/10/14
20140193065
Detecting defects on a wafer using template image matching
Various embodiments for detecting defects on a wafer are provided. Some embodiments include matching a template image, in which at least some pixels are associated with regions in the device having different characteristics, to output of an electron beam inspection system and applying defect detection parameters to pixels in the output based on the regions that the pixels in the output are located within to thereby detect defects on the wafer..
07/10/14
20140192959
Method and apparatus for surface mapping using in-plane grazing incidence diffraction
An apparatus for examining the surface of a crystalline sample uses in-plane grazing incidence diffraction with a position-sensitive detector. The x-ray source illuminates an extended region of the sample and, for crystal sections having the appropriate lattice orientation, an elongated diffraction signal is produced.
07/10/14
20140192353
Inspection apparatus
An inspection method and apparatus for detecting defects or haze of a sample, includes illuminating light to the sample from an oblique direction relative to a surface of the sample with an illuminator, detecting first scattered light at a forward position relative to an illuminating direction from the sample with a first detector, detecting second scattered light at a sideward or backward position relative to the illuminating direction from the sample with a second detection, and processing a first signal of the first scattered light and a second signal of the second scattered light with different weighting for the first signal and for the second signal with a processor.. .
07/10/14
20140192352
Optical type inspection apparatus, inspection system and the wafer for coordinates management
This optical inspection device has: a line sensor on which channels are arranged; a moving means for moving a wafer mounted on a stage relative to the line sensor; a stage position detection means for detecting the on-stage positions of pseudo-defects in images formed on the channels as pseudo-defect stage coordinates, said coordinate management wafer being a wafer on which one pseudo-defect die is formed per row and column of a matrix of dies and each pseudo-defect die has a plurality of pseudo-defects formed in a line in the columnar direction; a coordinate transformation means for transforming the pseudo-defect stage coordinates into pseudo-defect die coordinates; a difference computation means for computing the differences of the pseudo-defect die coordinates from design coordinates; and a characteristic pattern acquisition means for obtaining a coordinate error characteristic pattern in which the differences from the pseudo-defect stage coordinates increase or decrease along a straight line.. .
07/10/14
20140192308
Liquid crystal display
The present invention provides a liquid crystal display that suppresses defects caused by variation in process and improves display performance. The present invention is a liquid crystal display including: a first electrode; an insulating film provided on the first electrode; and a second electrode provided on the insulating film, the second electrode having a plurality of slits formed within a pixel, the first electrode facing the plurality of slits, the plurality of slits being parallel with each other, the plurality of slits each having a first straight portion that has a first end and a second end and extends in a first direction, a second straight portion that is connected to the first end of the first straight portion and extends in a second direction, and a bent portion bent in a connecting region of the first straight portion and the second straight portion, a plurality of the first straight portions having the second ends aligned along the same straight line, on an assumption of a first slit being an endmost slit among the plurality of slits in the pixel, a slit next to the first slit bending in a manner that the first straight portion and the second straight portion of the slit come closer to the first slit, a slit more distant from the first slit having a shorter first straight portion..
07/10/14
20140192144
Spherical panoramic image camera rig
One aspect of the present invention provides a simple, cost-effective, efficient solution directed to the generation of the source material for the generation of still panoramic images. The precision optical alignment among all the mounted lenses, provided by the precision rectangular mounting rig, greatly reduces or eliminates stitching errors.
07/10/14
20140191890
Apparatus, systems and methods for for digital testing of adc/dac combination
A circuit for testing digital-to-analog (dac) and analog-to-digital converters (adc) is provided. The circuit applies a code pattern having a plurality of sequential values to the digital to analog converter.
07/10/14
20140191370
Silicon single crystal wafer, manufacturing method thereof and method of detecting defects
A silicon single crystal wafer is provided. The silicon single crystal wafer includes an idp which is divided into an nig region and an nidp region, wherein the idp region is a region where a cu based defect is not detected, the nig region is a region where an ni based defect is detected and the nipd region is a region where an ni based defect is not detected..
07/10/14
20140191165
Post-treatment method of carbon materials for improving the electrical conductivity and mechanichal properties via dehydrocyclization reaction and polymer composite materials comprising the treated carbon materials
Provided are a method for post-treatment of a carbonaceous material using dehydrocyclization, a carbonaceous material post-treated by the method, and a polymer composite material including the carbonaceous material. More particularly, provided are a method for post-treatment of a carbonaceous material using dehydrocyclization, including subjecting the carbonaceous material to dehydrocyclization at room temperature to heal structural defects in the carbonaceous material, while increasing the effective conjugated length of the carbonaceous material to improve the electrical conductivity thereof, as well as a carbonaceous material post-treated by the method and a polymer composite material including the carbonaceous material..
07/10/14
20140190719
Double-valve mechanism
A double-valve mechanism and a pneumatic tool including the same are provided. The double-valve mechanism is mounted in a main body of the pneumatic tool.
07/03/14
20140189858
Generation method and device for generating anonymous dataset, and method and device for risk evaluation
An anonymous dataset generation method comprises following steps. A critical attribute set and a quasi-identifier (qid) set are acquired, and one of the critical attribute and the quasi-identifier is set as an anchor attribute.
07/03/14
20140189456
3d built-in self-test scheme for 3d assembly defect detection
Techniques and mechanisms are provided for an improved built in self-test (bist) mechanism for 3d assembly defect detection. According to an embodiment of the present disclosure, the described mechanisms and techniques can function to detect defects in interconnects which vertically connect different layers of a 3d device, as well as to detect defects on a 2d layer of a 3d integrated circuit.
07/03/14
20140189449
Method and system for checking software
A method and a system that checks software and includes a hooking module that collects process control block (pcb) information corresponding to each process on a kernel by being executed at the time of booting a system. In addition, the system includes a safety service module that searches and defends the defects of the process by being inserted into a memory region of the process based on the collected pcb information..
07/03/14
20140188409
Detecting tsv defects in 3d packaging
A computer determines a threshold signal voltage of a semiconductor device. The computer determines a first expected signal propagation time for a signal travelling through a first test path of the semiconductor device.
07/03/14
20140188224
Laterally expandable intervertebral fusion implant
The invention relates to an intervertebral fusion implant for fusing two adjacent vertebrae, comprising an adjustable support body, the base surface and cover surface of which are configured to bear on end plates of the adjacent vertebrae, wherein provision is made for a side bracket, which can be pivoted laterally about a hinge and the base and cover of which have a planar design, and provision is made for an actuator for pivoting out the side bracket into a position (working position) spread from the support body. As a result, the implant has particularly small dimensions and can, after assembly at the envisaged implantation site, be actuated in such a way that it becomes larger and thereby affords a larger support surface for support in the intervertebral space.
07/03/14
20140187496
Sgef controls macular, corpus callosum and hippocampal function and development, liver homeostasis, functions of the immune system, fever response atherosclerosis and tumorogenic cell growth
The invention provides a composition comprising sgef protein or gene as a therapeutic means to clinical or subclinical defects associated with anomalies of at least one from among the macula, corpus callosum, hippocampus, liver or immune system and diseases including a feverless response to infection, a cancer or vision loss. Methods of diagnosis of such disease and development anomalies are based on detection of mutations of the sgef gene or altered levels of the sgef mrna or protein.
07/03/14
20140187341
Tool for putting practice with case
A putting practice tool with a storage case includes a storage case with a cylindrical storage body, a storage space formed hollowly inside the storage body and a connective portion having a size enabling a golf ball to be caught on both sides of the storage body, and a cap, which is detachably coupled to the connective portion. The putting practice tool with a case includes a cylindrical storage case and caps.
07/03/14
20140187021
Method of healing defect at junction of semiconductor device using germanium
This invention relates to a method of healing defects at junctions of a semiconductor device, which includes growing a p-ge layer on a substrate, performing ion implantation on the p-ge layer to form an n+ ge region or performing in-situ doping on the p-ge layer and then etching to form an n+ ge region or depositing an oxide film on the p-ge layer and performing patterning, etching and in-situ doping to form an n+ ge layer, forming a capping oxide film, performing annealing at 600˜700° c. For 1˜3 hr, and depositing an electrode, and in which annealing enables ge defects at n+/p junctions to be healed and the depth of junctions to be comparatively reduced, thus minimizing leakage current, thereby improving properties of the semiconductor device and achieving high integration and fineness of the semiconductor device..
07/03/14
20140186791
Infrared dental imaging
Dental imaging systems include an optical scanner that scans one or more interrogation beams across a portion of at least one tooth to produce a dentally modulated light flux associated with light scattering, absorption, or other interaction of the interrogation beam and a tooth interior. The dentally modulated light flux is detected and processed to produce picture information associated with the tooth.
07/03/14
20140186751
Apparatus of repairing a mask and a method for the same
An apparatus includes a probe tip configured to contact the mask, a cantilever configured to mount the probe tip wherein the cantilever includes a mirror, an optical unit having a light source projecting a light beam on the mirror and a light detector receiving a reflected light beam from the mirror, and an electrical power supply configured to connect the probe tip. The apparatus further includes a computer system configured to connect the optical unit, the electrical power supply, and the stage.
07/03/14
20140186573
Synthetic laminated mat
An improved laminated mat which comprises synthetic materials are provided for herein. Embodiments may include a plurality of synthetic boards disposed adjacent to each other to form a top surface.
07/03/14
20140186459
Compositions and methods for forming and strengthening bone
Compositions are provided which stimulate bone growth. Also provided are methods for utilizing the compositions for filling in bone defects, promoting rapid fusion of bone fractures, grafts, and bone-prostheses, and promoting strengthening of osteoporotic bones..
07/03/14
20140186323
Factor viia-polysialic acid conjugates having prolonged in vivo half-life
The present invention relates to a proteinaceous construct comprising plasmatic or recombinant factor viia (fviia) or biologically active derivatives thereof, which are bound to a carbohydrate moiety comprising 1-4 sialic acid units, wherein the in vivo half-life of the proteinaceous construct is substantially prolonged in the blood of a mammal, as compared to the in vivo half-life of a fviia molecule not bound to a carbohydrate moiety. The invention also provides a method for controlling bleeding in a mammal having a bleeding disorder due to functional defects or deficiencies of fviia, fviii, or fix.
07/03/14
20140185919
Detecting defects on a wafer
Methods and systems for detecting defects on a wafer are provided. One method includes identifying one or more characteristics of first raw output generated for a wafer that correspond to one or more geometrical characteristics of patterned features formed on the wafer and assigning individual output in second raw output generated for the wafer to different segments based on the identified one or more characteristics of the first raw output and based on the individual output in the second raw output and individual output in the first raw output that were generated at substantially the same locations on the wafer such that the one or more geometrical characteristics of the patterned features that correspond to each of the different segments in the second raw output are different..
07/03/14
20140185915
Device for determining surface defects
A device for determining the existence or absence of surface defects includes a base, a movable platform, a support member, an image capturing unit, a light source unit, and a processing unit. The movable platform includes a main body for supporting the product, and a driving unit for moving the main body in six degrees of freedom, thereby orienting the product placed on the main body in different orientations.
07/03/14
20140185914
Device for determining surface defects
A device for determining the existence or absence of surface defects of a product includes a base, a rotatable platform, a support member, an image capturing unit, a light source unit, and a processing unit. The rotatable platform includes a main body supporting the product and a driving unit rotating the main body with respect to the base, thereby orienting the product placed thereon in different orientations.
07/03/14
20140185678
Heuristic detection of potential digital media artifacts and defects in digital media assets
A method, comprises monitoring a encoding process of a source video file performed by an encoder; obtaining an encoding decision parameter used to encode a picture of the source video file during the encoding process; comparing the encoding decision parameter to a threshold; based on the step of comparing, identifying the picture as a candidate picture for a visual defect or coding error; and storing a timestamp of the candidate picture.. .
07/03/14
20140185048
Method for detecting defect of display panel and related detecting device
The present invention provides a method for detecting a defect of a display panel and related defect detecting device. The method includes: utilizing lights having different colors to illuminate the display panel; obtaining a plurality of corresponding grey-scale diagrams when the lights illuminate the display panel; and determining whether the display panel has a defect.
07/03/14
20140184787
Device for determining surface defects
A device is used for determining whether or not a product has any surface defects. The device includes a platform, a mirror, an image capturing unit, and a processing unit.
07/03/14
20140184783
Device for determining surface defects
A device for determining the surface defects of a product includes a base, a support member, a platform, a lighting unit, an image capturing unit, and a processing unit. The lighting unit includes a driving unit, a frame and a number of light sources.
07/03/14
20140183985
Rotating electric machine and method for manufacturing stator coil of rotating electric machine
A large peeling force due to heat occurs at the boundary between the insulation coating over the coil end and the coil conductor when the stator coil emits heat and reaches a high temperature due to the high output of the rotating electric machine that causes the insulation coating to peel from the conductor consequently causing insulation defects. A sloped surface is formed on the insulation coating so that the thickness of the tip of the insulation coating on the coil end has a shape having a slope that becomes gradually thinner towards the welded coupling section made by welding the conductor..
07/03/14
20140183594
Radiation-emitting semiconductor chip having integrated esd protection
A radiation-emitting semiconductor chip having a semiconductor layer sequence based on a nitride compound semiconductor material and having a pn junction includes a first protective layer having deliberately introduced crystal defects, a second protective layer having a higher doping than the first protective layer, wherein the first protective layer protects the semiconductor chip against electrostatic discharge pulses, an active zone that generates radiation disposed downstream of the first protective layer in a growth direction, wherein during operation of the semiconductor chip, a breakdown behavior of the semiconductor layer sequence in a reverse direction in regions having crystal defects differs from regions without crystal defects, and wherein in the event of electrostatic discharge pulses, electrical charge is dissipated in a homogeneously distributed manner via the regions having crystal defects.. .
07/03/14
20140183443
Engineered substrates having epitaxial formation structures with enhanced shear strength and associated systems and methods
Engineered substrates having epitaxial formation structures with enhanced shear strength and associated systems and methods are disclosed herein. In several embodiments, for example, an engineered substrate can be manufactured by forming a shear strength enhancement material at a front surface of a donor substrate and implanting ions a depth into the donor substrate through the shear strength enhancement material.
07/03/14
20140183319
Synthetic laminated mat
An improved laminated mat which comprises synthetic materials are provided for herein. Embodiments may include a plurality of synthetic boards disposed adjacent to each other to form a top surface.
07/03/14
20140182788
Apparatus for stressing semiconductor substrates
Apparatus for use in preparing heterostructures having a reduced concentration of defects including apparatus for stressing semiconductor substrates to allow them to conform to a crystal having a different crystal lattice constant.. .
06/26/14
20140181793
Method of automatically testing different software applications for defects
A method of automatically testing different software applications for defects, comprising the step of a test automation enabler (a) converting recorded test scripts into a generic format that is not application-centric and (b) storing the resultant non-application centric data in generic data containers. A computer-based implementation called opus can be easily operated by any user with basic knowledge of software testing principles and ftat.
06/26/14
20140179752
Methods of treating soft tissue defects
The specification discloses compositions and methods for treating a soft tissue defect of an individual.. .
06/26/14
20140179116
Improvement of reverse recovery using oxygen-vacancy defects
A semiconductor device comprises a semiconductor substrate, a first electrode formed on a first main surface of the semiconductor substrate, and a second electrode formed on a second main surface of the semiconductor substrate. The semiconductor substrate includes a first region in which a density of oxygen-vacancy defects is greater than a density of vacancy cluster defects, and a second region in which the density of vacancy cluster defects is greater than the density of oxygen-vacancy defects..
06/26/14
20140178820
Resist composition, patterning process and polymer
An additive polymer comprising recurring styrene units having an ester group bonded to a cf3—c(or2)—r3 group (wherein r2 is h, acyl or acid labile group, r3 is h, ch3 or cf3) such as 1,1,1,3,3,3-hexafluoro-2-propanol is added to a polymer capable of increasing alkali solubility under the action of acid to formulate a resist composition. The resist composition can minimize outgassing from a resist film during the euv lithography and form a resist film having a hydrophilic surface sufficient to prevent formation of blob defects on the film after development..
06/26/14
20140178818
Resist composition and patterning process
An additive polymer comprising recurring units derived from a fluorosulfonamide-substituted styrene and recurring units derived from a stilbene, styrylnaphthalene, dinaphthylethylene, acenaphthylene, indene, benzofuran, or benzothiophene derivative is added to a polymer capable of increasing alkali solubility under the action of acid to formulate a resist composition. The resist composition can minimize outgassing from a resist film during the euv lithography and form a resist film having a hydrophilic surface sufficient to prevent formation of blob defects on the film after development..
06/26/14
20140178814
Dry film photoresist having oxygen permeable barrier layer and manufacturing method thereof
There is provided a dry film photoresist including: a base film having an oxygen permeable barrier layer formed thereon; a photosensitive resin layer formed on the oxygen permeable barrier layer; and a protective film formed on the photosensitive resin layer. According to the present invention, the dry film photoresist includes the oxygen permeable barrier layer formed on the base film to prevent a curing reaction from being deteriorated by oxygen permeation in the dry film photoresist, such that residue that is not peeled off may be decreased, thereby significantly decreasing process defects..
06/26/14
20140178453
Devices and methods for the regeneration of bony defects
This invention relates to methods for producing a composite bone graft material that can regenerate bony defects in the body. The invention further relates to methods that allow for the production of bioactive glass particles used in the composite that have been surface treated to allow for the production of a highly porous composite that can hold significant amounts of body fluid or other molecules that will aid in the regenerative process.
06/26/14
20140178343
Supports and methods for promoting integration of cartilage tissue explants
The present disclosure provides tissue supports and methods for preparing a cartilage composition for repairing cartilage defects, which is prepared by expanding and integrating small cartilage tissue pieces derived from donor or engineered tissue. The methods and supports described herein promote cell migration and integration of neighboring tissue pieces in culture to form the cartilage composition.
06/26/14
20140177938
System and method for identifying defects in a material
Described are computer-based methods and apparatuses, including computer program products, for identifying defects in a material. A set of features is identified based on an image of a material, wherein each feature in the set of features is a candidate portion of a defect in the material.
06/26/14
20140177016
Systems and methods for streak detection in image array scanning
A system and method are provided for streak detection in an image scanning system. The disclosed systems and methods may be particularly applicable to constant velocity transport (cvt) digital scanning systems by comparing multiple scans of a simply-produced test pattern passed over the sensor in multiple orientations.
06/26/14
20140176943
Surface defect inspection method and apparatus
A surface defect inspection apparatus and method is provided which illuminates a plurality of beams set to different intensity values to a sample. Scattered light from the plurality of beams is detected and processed to analyze the surface defects..
06/26/14
20140176891
Liquid crystal display panel
The present invention provides a liquid crystal display panel which facilitates laser repair for repairing defects even if an electrode facing a pixel electrode with an insulating film therebetween is a transparent electrode. The liquid crystal display panel of the present invention includes a first substrate having an insulating substrate, a thin film transistor, a scan signal line, a first light-shielding electrode, a first insulating film, a second light-shielding electrode, a second insulating film, a transparent electrode, a third insulating film, and a pixel electrode; a second substrate having an insulating substrate; and a liquid crystal layer sandwiched between the first substrate and the second substrate.
06/26/14
20140175512
Defect transferred and lattice mismatched epitaxial film
An embodiment uses a very thin layer nanostructure (e.g., a si or sige fin) as a template to grow a crystalline, non-lattice matched, epitaxial (epi) layer. In one embodiment the volume ratio between the nanostructure and epi layer is such that the epi layer is thicker than the nanostructure.
06/26/14
20140175449
Tft arrangement for display device
A new tft arrangement is demonstrated, which enables prevention of tft to be formed over a joint portion between the adjacent soi layers prepared by the process including the separation of a thin single crystal semiconductor layer from a semiconductor wafer. The tft arrangement is characterized by the structure where a plurality of tfts each belonging to different pixels is gathered and arranged close to an intersection portion of a scanning line and a signal line.
06/26/14
20140175437
Oxide semiconductor device and surface treatment method of oxide semiconductor
Oxygen defects formed at the boundary between the zinc oxide type oxide semiconductor and the gate insulator are terminated by a surface treatment using sulfur or selenium as an oxygen group element or a compound thereof, the oxygen group element scarcely occurring physical property value change. Sulfur or selenium atoms effectively substitute oxygen defects to prevent occurrence of electron supplemental sites by merely applying a gas phase or liquid phase treatment to an oxide semiconductor or gate insulator with no remarkable change on the manufacturing process.
06/26/14
20140175378
Epitaxial film growth on patterned substrate
An embodiment includes depositing a material onto a substrate where the material includes a different lattice constant than the substrate (e.g., iii-v or iv epitaxial (epi) material on a si substrate). An embodiment includes an epi layer formed within a trench having walls that narrow as the trench extends upwards.
06/26/14
20140175364
Radiation enhanced resistive switching layers
Provided are radiation enhanced resistive switching layers, resistive random access memory (reram) cells including these layers, as well as methods of forming these layers and cells. Radiation creates defects in resistive switching materials that allow forming and breaking conductive paths in these materials thereby improving their resistive switching characteristics.
06/26/14
20140175361
Resistive switching layers including hf-al-o
Provided are resistive random access memory (reram) cells having switching layers that include hafnium, aluminum, oxygen, and nitrogen. The composition of such layers is designed to achieve desirable performance characteristics, such as low current leakage as well as low and consistent switching currents.
06/26/14
20140175359
Diffusion barrier layer for resistive random access memory cells
Provided are resistive random access memory (reram) cells having diffusion barrier layers formed from various materials, such as beryllium oxide or titanium silicon nitrides. Resistive switching layers used in reram cells often need to have at least one inert interface such that substantially no materials pass through this interface.
06/26/14
20140175355
Carbon doped resistive switching layers
Provided are carbon doped resistive switching layers, resistive random access memory (reram) cells including these layers, as well as methods of forming thereof. Carbon doping of metal containing materials creates defects in these materials that allow forming and breaking conductive paths as evidenced by resistive switching.
06/26/14
20140175305
Methods for detecting defects in inorganic-coated polymer surfaces
Lipophilic fluorescent substances can be used to detect surface defects in materials having hydrophilic (e.g., inorganic) coatings. Use of the described methods makes surface defects appear fluorescent, while the remaining surfaces are not labeled.
06/26/14
20140175160
Solder paste material technology for elimination of high warpage surface mount assembly defects
A composition including a solder flux including a rosin material have a property to maintain a less than 10 percent drop in tackiness from an initial tackiness value of 20 gf to 120 gf over a temperature regime of 20° c. To 200° c.
06/26/14
20140175071
Method for detecting defects during a laser-machining process and laser-machining device
Detection of defects during a machining process includes: moving a laser beam along a predefined path over multiple workpieces to be machined so as to generate a weld seam or a cutting gap in the workpieces; detecting, in a two-dimensional spatially resolved detector field of a detector, radiation emitted and/or reflected by the multiple workpieces; selecting at least one detection field section in the detection field of the detector based on laser beam control data defining movement of the laser beam along the predefined path or based on a previously determined actual-position data of the laser beam along the predefined path, wherein each detection field section comprises a region encompassing less than the entire detection field; evaluating the radiation detected in in the selected detection field section; and determining whether a defect exists at the weld seam or the cutting gap based on the evaluated radiation.. .


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Defects topics: Semiconductor, Polythioether, Semiconductor Substrate, Ammonium Hydroxide, Polyurethane, Irradiation, Scattering, Contiguous, Imaging System, Ammonium Hydroxide Solution, Solubility, Semiconductor Device, Integrated Circuit, Aqueous Solution, Surfactant

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