FreshPatents.com Logo
Enter keywords:  

Track companies' patents here: Public Companies RSS Feeds | RSS Feed Home Page
Popular terms

[SEARCH]

Follow us on Twitter
twitter icon@FreshPatents

Web & Computing
Cloud Computing
Ecommerce
Search patents
Smartphone patents
Social Media patents
Video patents
Website patents
Web Server
Android patents
Copyright patents
Database patents
Programming patents
Wearable Computing
Webcam patents

Web Companies
Apple patents
Google patents
Adobe patents
Ebay patents
Oracle patents
Yahoo patents

[SEARCH]

Defect patents



      
           
This page is updated frequently with new Defect-related patent applications. Subscribe to the Defect RSS feed to automatically get the update: related Defect RSS feeds. RSS updates for this page: Defect RSS RSS


Defect analysis system for error impact reduction

Pipe damage interpretation system

Railway track geometry defect modeling for predicting deterioration, derailment risk, and optimal repair

Date/App# patent app List of recent Defect-related patents
07/17/14
20140201583
 System and method for non-intrusive random failure emulation within an integrated circuit patent thumbnailSystem and method for non-intrusive random failure emulation within an integrated circuit
The apparatus and methods allow random hardware failure emulation of an integrated circuit (ic) by emulation of potential defects to enable behavior evaluation of the rest of the design in such situation. This emulation can non-intrusively address multiple points of failure.
07/17/14
20140201573
 Defect analysis system for error impact reduction patent thumbnailDefect analysis system for error impact reduction
An apparatus includes a network interface, memory, and a processor. The processor is coupled with the network interface and memory.
07/17/14
20140200831
 Pipe damage interpretation system patent thumbnailPipe damage interpretation system
A technique facilitates evaluation of pipe. A sensor is positioned to examine a pipe and to obtain data on the pipe.
07/17/14
20140200830
 Railway track geometry defect modeling for predicting deterioration, derailment risk, and optimal repair patent thumbnailRailway track geometry defect modeling for predicting deterioration, derailment risk, and optimal repair
Geo-defect repair modeling is provided. A method includes logically dividing a railroad network according to spatial and temporal dimensions with respect to historical data collected.
07/17/14
20140200829
 Asset failure prediction with location uncertainty patent thumbnailAsset failure prediction with location uncertainty
Geo-defect repair modeling with location uncertainty is provided. A method includes logically dividing a railroad network into segments each of a specified length.
07/17/14
20140200828
 Asset failure prediction with location uncertainty patent thumbnailAsset failure prediction with location uncertainty
Geo-defect repair modeling with location uncertainty is provided. A method includes logically dividing a railroad network into segments each of a specified length.
07/17/14
20140200827
 Railway track geometry defect modeling for predicting deterioration, derailment risk, and optimal repair patent thumbnailRailway track geometry defect modeling for predicting deterioration, derailment risk, and optimal repair
Geo-defect repair modeling is provided. A method includes logically dividing a railroad network according to spatial and temporal dimensions with respect to historical data collected.
07/17/14
20140200701
 Systems and methods for detecting and rejecting defective absorbent articles from a converting line patent thumbnailSystems and methods for detecting and rejecting defective absorbent articles from a converting line
The present disclosure relates to systems and processes for detecting and rejecting defective absorbent articles from a converting line. In particular, the systems and methods may utilize feedback from technologies, such as vision systems, sensors, remote input and output stations, and controllers with synchronized embedded clocks to accurately correlate inspection results and measurements from an absorbent article converting process.
07/17/14
20140200700
 Inspecting device monitoring system patent thumbnailInspecting device monitoring system
In a monitoring system, when there is an evaluation that a product is defective, in a solder print inspecting device that is subject to monitoring, that information is sent to a mobile terminal possessed by an operator. The operator who views the notification performs, through the mobile terminal, a checking task for evaluating whether or not the evaluation result regarding the printed substrate that has been evaluated as a defective product is correct.
07/17/14
20140200597
 Biodegradable apparatus and method for closure of trocar defects patent thumbnailBiodegradable apparatus and method for closure of trocar defects
A biodegradable device for providing scaffolding for a trocar defect to promote healing. The device consists of an upper and lower scaffold, offset by a connector.
07/17/14
20140200201
Enzymatic production or chemical synthesis and uses for 5,7-dienes and uvb conversion products thereof
Provided herein are steroidal compounds that are androsta-5,7-dienes or a pregna-5,7-dienes and ultraviolet b (uvb) conversion products thereof which includes pharmaceutical compositions of the steroidal compounds as shown in tables 1 and 2. Also provided is a method for producing hydroxylated metabolites of cholecalciferol or ergocalciferol via the p450scc (cyp11a1) or cyp27b1 enzyme systems where the hydroxylase has an activity to hydroxylate position c20 of a secosteroid or its 5,7-dieneal precursor and the hydroxylated metabolites so produced.
07/17/14
20140199825
Silicon-germanium heterojunction tunnel field effect transistor and preparation method thereof
A silicon/germanium (sige) heterojunction tunnel field effect transistor (tfet) and a preparation method thereof are provided, in which a source region of a device is manufactured on a silicon germanium (sige) or ge region, and a drain region of the device is manufactured in a si region, thereby obtaining a high on-state current while ensuring a low off-state current. Local ge oxidization and concentration technique is used to implement a silicon germanium on insulator (sgoi) or germanium on insulator (goi) with a high ge content in some area.
07/17/14
20140199812
Bump structural designs to minimize package defects
A method of forming a chip package includes providing a chip with a plurality of first copper post bumps having a first height of copper post. The method also includes providing a substrate with a plurality of second copper post bumps having a second height of copper post.
07/17/14
20140199792
Defect pattern evaluation method, defect pattern evaluation apparatus, and recording media
According to a defect pattern evaluation method of an embodiment, defects are detected by performing optical defect inspection on a pattern on a substrate. Then, the defects are classified according to a type of a pattern layout using a pattern layout corresponding to coordinates of the defects.
07/17/14
20140199787
Semiconductor mask blanks with a compatible stop layer
Provided is a method for creating a mask blank that includes a stop layer. The stop layer is optically compatible and process compatible with other layers included as part of the mask blanks.
07/17/14
20140199784
Method and apparatus for making a semiconductor device
Disclosed is an apparatus and method for yield enhancement of making a semiconductor device. The apparatus for yield enhancement of making a semiconductor device comprises: a semiconductor device comprising an epitaxial layer in which a defect is included, and a photo-resistor on the epitaxial layer and covering the defect; an image recognition system to detect and identify a location of the defect; and an exposing module comprising a first light source to expose a part of the photo-resistor substantially corresponding to the detected defect identified by the image recognition system..
07/17/14
20140199657
Membrane for alveolar bone regeneration
A membrane for alveolar bone regeneration to guide bone generation by adapting to a bone graft material, which fills a bone defect area, includes a central hole through which an implant is inserted into an alveolar bone, wherein the membrane includes: a coupling part to couple the membrane with the implant; a side bending part that is downwardly bent from the coupling part to have an overall curved shape with a gentle slope; and lateral covering parts that protrude from edges of the side bending part and are bent and curved toward an alveolar bone defect area, wherein the side bending part and the lateral covering parts are pre-formed in three-dimensions to fit a final shape of the alveolar bone that is to be regenerated.. .
07/17/14
20140199619
Electrophotographic photoreceptor, method for manufacturing same, and electrophotographic apparatus using same
A layered, positively-charged electrophotographic photoreceptor, a method for manufacturing the photoreceptor and an electrophotographic apparatus using the photoreceptor are disclosed. The layered, positively-charged electrophotographic photoreceptor includes a conductive support on which is provided a sequential stack composed of a charge transport layer containing at least a first hole transport material and a first binder resin; and a charge generation layer containing at least a charge generation material, a second hole transport material, an electron transport material, and a second binder resin, wherein the charge generation layer and the charge transport layer have a total amount of residual solvents that is 50 μg/cm2 or less.
07/17/14
20140198975
Region-of-interest determination apparatus, observation tool or inspection tool, region-of-interest determination method, and observation method or inspection method using region-of-interest determination method
A region-of-interest determination apparatus includes: a calculation unit which calculates the incidence of a defect based on at least a plurality of kinds of defect attribute information regarding defect data, the defect data including an image corresponding to a defect position detected on a specimen by inspection thereof or an image corresponding to a defect position predicted to be likely to develop a defect on the specimen, both images being obtained by imaging; and a region determination unit which extracts the defect data of which the incidence is higher than a predetermined level, and determines the region to be observed or inspected on the specimen based on the extracted defect data.. .
07/17/14
20140198974
Semiconductor device defect inspection method and system thereof
Provided are a semiconductor device defect inspection method and system thereof, with which predetermined hot spots are inspected using a sem, and with which the frequency of defects occurring at the hot spot is estimated statistically and with reliability. An inspection point is designated in design data by the defect type.
07/17/14
20140198970
Edge detection device and edge detection method
An edge detection device includes: an image capturing mechanism configured to image-capture an edge of an optical joining block; and a control unit configured to control the image capturing mechanism, wherein the control unit: determines, based on image data of the edge, whether a plurality of regions included in the edge have a defective region including a defect or a non-defective region including no defect; determines whether or not first regions which are included in the plurality of regions and is determined to be the non-defective region satisfy a first condition; calculates a first straight line based on the first regions; and determines the first straight line as a position of the edge when the first regions has satisfied a first condition.. .
07/17/14
20140198818
Alleviation of laser-induced damage in optical materials by suppression of transient color centers formation and control of phonon population
Laser-induced damage in an optical material can be mitigated by creating conditions at which light absorption is minimized. Specifically, electrons populating defect energy levels of a band gap in an optical material can be promoted to the conduction band—a process commonly referred to as bleaching.
07/17/14
20140198593
Redundancy circuit and semiconductor memory device including the same
A redundancy circuit includes a redundancy decoder, a fuse array, and a decoder. The redundancy decoder decodes a redundancy enable signal generated when an address of a defective cell matches an input address.
07/17/14
20140198222
Optical monitoring device for an imaging system
An optical monitoring device for an optical imaging system having a focal plane, an optical axis and an entry pupil, forming an image of a scene substantially at infinity on an image detector disposed substantially in the focal plane, comprises: a virtually point-like emission source at the periphery of the detector and substantially in the focal plane; a reflecting element with a plane surface upstream of the imaging system relative to the direction of light rays coming from the scene, and according to a position and inclination where a monitoring image of the source produced by the optical system and reflected by the reflecting element is substantially in the focal plane on a detection element connected to a monitoring image analyzer allowing potential optical defects to be identified; the reflecting element having an annular shape allowing passage of light rays coming from the scene and passing through the entry pupil.. .
07/17/14
20140197845
Apparatus for inspecting touch panel and method thereof
Disclosed herein is an apparatus for inspecting a touch panel and a method thereof, the apparatus includes: a capacitance measuring unit measuring capacitance value of a number of regions set on a touch panel, and a defect determining unit determining whether or not a specific region is defective, by comparing the capacitance value of the specific region with the capacitance value of an adjacent region. According to the present embodiments, a touch panel having an improved defect detection ability and a method thereof, by comparing with capacitance of regions adjacent to each other, are provided..
07/17/14
20140197738
Light socket for series led lighting
Electrical and mechanical connection for a series connected led lamp to an appropriate electrical circuit. The circuit contains additional series connected light producing elements.
07/17/14
20140197493
Defect reduction for formation of epitaxial layer in source and drain regions
The embodiments of mechanisms for forming source/drain (s/d) regions of field effect transistors (fets) described enable forming an epitaxially grown silicon-containing layer with reduced number of particles on surface of recesses. The described mechanisms also reduce the effect of the residual particles on the epitaxial growth.
07/17/14
20140196782
Method for making semiconductor device and semiconductor device made thereby
Disclosed is a method for yield enhancement of making a semiconductor device. The method for yield enhancement of making a semiconductor device comprises the steps of: providing the semiconductor device comprising an epitaxial layer including a defect; forming a dielectric layer on the epitaxial layer; detecting and identifying a location of the defect; and etching the dielectric layer and leaving a part of the dielectric layer to cover an area substantially corresponding to the detected defect.
07/17/14
20140196623
Reducing print quality defects
Reducing print quality defects can include printing a pattern with an offset printing device having a binary ink developer roller, determining a variation for a hue shift of the printed pattern; and varying gain in a feedback loop of a servo motor coupled to the binary ink developer roller to reduce the variation.. .
07/10/14
20140195994
Defective artifact removal in photolithography masks corrected for optical proximity
Defective artifact removal is described in photolithography masks corrected for optical proximity. In one example a method is described in which partitions are identified in a mask design for independent optimization.
07/10/14
20140195396
Actionable exception alerts
Systems, method, apparatuses, and software are described for automatically detecting defects in financial transactions, automatically determining resolutions to the defects based on historical defect patterns, an interacting with customers to provide information and/or receive instructions regarding defects and how they should be resolved.. .
07/10/14
20140195395
Differentiated service levels for exception processing of financial transactions
Systems, method, apparatuses, and software are described for automatically detecting defects in financial transactions, automatically determining resolutions to the defects based on historical defect patterns, an interacting with customers to provide information and/or receive instructions regarding defects and how they should be resolved.. .
07/10/14
20140195346
Transaction exception-based financial product offers
Systems, method, apparatuses, and software are described for automatically detecting defects in financial transactions, automatically determining resolutions to the defects based on historical defect patterns, an interacting with customers to provide information and/or receive instructions regarding defects and how they should be resolved.. .
07/10/14
20140194632
Method for screening for compounds selectively interacting with rad9
Natural and synthetic compounds of formulae ia-ie having a lactone structure, in particular securolide, have been determined to be effective anti-tumor compounds which target the hrad9 gene and/or protein encoded thereby or complex containing the protein and/or the p53 gene and/or protein. Securolide is cytoselective for mutants of hrad9 based on studies conducted in rad9 mutant yeast strains.
07/10/14
20140194363
Compression-resistant collagen-based artificial bone repair material
The present invention provides a compression-resistant collagen-based artificial bone repair material that could be used for bone defect repair at human load-bearing sites. Such material has a composition and structure of self-assembled nano-sized calcium phosphate salt and collagen molecules, thereby possessing a biomimetic mineralization structure similar to the natural bone.
07/10/14
20140193964
Method of manufacturing semiconductor device
The present invention provides a method of manufacturing a semiconductor device. The method at least comprises the following steps.
07/10/14
20140193738
Cell for fuel-cell battery using a proton exchange membrane, with gas diffusion layers of different rigidity at the anode and at the cathode
A cell structure for a fuel-cell battery, which allows the compromise necessary between the reduction in the non-uniformities of mechanical stress to be optimized, with the aim of obtaining a more uniform operation, and the independent accommodation with respect to the defects in planarity/thickness/alignment, while at the same time meeting the compactness constraint, comprises: a membrane/electrode assembly comprising a first electrode and a second electrode separated by a membrane; a gas diffusion layer stacked on each face of the assembly, between an electrode of the assembly and a current collector plate; and the gas diffusion layers stacked on either side of the assembly do not have the same rigidity, one of the gas diffusion layers having a young's modulus relative to an applied stress in the direction of the thickness, greater than the young's modulus of the other layer, in a ratio of the order of at least 100.. .
07/10/14
20140193351
Method and compositions for reducing pore size, and moisturizing and/or blurring appearance of defects on keratin surfaces
A method for simultaneously moisturizing and/or blurring the appearance of skin defects, or reducing pore size, or treating skin with a multi-benefit composition.. .
07/10/14
20140193065
Detecting defects on a wafer using template image matching
Various embodiments for detecting defects on a wafer are provided. Some embodiments include matching a template image, in which at least some pixels are associated with regions in the device having different characteristics, to output of an electron beam inspection system and applying defect detection parameters to pixels in the output based on the regions that the pixels in the output are located within to thereby detect defects on the wafer..
07/10/14
20140192959
Method and apparatus for surface mapping using in-plane grazing incidence diffraction
An apparatus for examining the surface of a crystalline sample uses in-plane grazing incidence diffraction with a position-sensitive detector. The x-ray source illuminates an extended region of the sample and, for crystal sections having the appropriate lattice orientation, an elongated diffraction signal is produced.
07/10/14
20140192602
Defective memory column replacement with load isolation
Exemplary embodiments of the present invention disclose a method and system for substituting a group of memory cells for a defective group of memory cells in a memory. In a step, an exemplary embodiment replaces a signal path to a group of defective memory cells with a signal path to a redundant group of memory cells.
07/10/14
20140192353
Inspection apparatus
An inspection method and apparatus for detecting defects or haze of a sample, includes illuminating light to the sample from an oblique direction relative to a surface of the sample with an illuminator, detecting first scattered light at a forward position relative to an illuminating direction from the sample with a first detector, detecting second scattered light at a sideward or backward position relative to the illuminating direction from the sample with a second detection, and processing a first signal of the first scattered light and a second signal of the second scattered light with different weighting for the first signal and for the second signal with a processor.. .
07/10/14
20140192352
Optical type inspection apparatus, inspection system and the wafer for coordinates management
This optical inspection device has: a line sensor on which channels are arranged; a moving means for moving a wafer mounted on a stage relative to the line sensor; a stage position detection means for detecting the on-stage positions of pseudo-defects in images formed on the channels as pseudo-defect stage coordinates, said coordinate management wafer being a wafer on which one pseudo-defect die is formed per row and column of a matrix of dies and each pseudo-defect die has a plurality of pseudo-defects formed in a line in the columnar direction; a coordinate transformation means for transforming the pseudo-defect stage coordinates into pseudo-defect die coordinates; a difference computation means for computing the differences of the pseudo-defect die coordinates from design coordinates; and a characteristic pattern acquisition means for obtaining a coordinate error characteristic pattern in which the differences from the pseudo-defect stage coordinates increase or decrease along a straight line.. .
07/10/14
20140192308
Liquid crystal display
The present invention provides a liquid crystal display that suppresses defects caused by variation in process and improves display performance. The present invention is a liquid crystal display including: a first electrode; an insulating film provided on the first electrode; and a second electrode provided on the insulating film, the second electrode having a plurality of slits formed within a pixel, the first electrode facing the plurality of slits, the plurality of slits being parallel with each other, the plurality of slits each having a first straight portion that has a first end and a second end and extends in a first direction, a second straight portion that is connected to the first end of the first straight portion and extends in a second direction, and a bent portion bent in a connecting region of the first straight portion and the second straight portion, a plurality of the first straight portions having the second ends aligned along the same straight line, on an assumption of a first slit being an endmost slit among the plurality of slits in the pixel, a slit next to the first slit bending in a manner that the first straight portion and the second straight portion of the slit come closer to the first slit, a slit more distant from the first slit having a shorter first straight portion..
07/10/14
20140192249
Image capturing apparatus and method for controlling the same
An image capturing apparatus comprises: an image sensor that includes a plurality of pixels, each including a plurality of photoelectric conversion elements; a readout unit that reads out a signal from a portion of the photoelectric conversion elements of each pixel as a first signal and reads out a sum of signals from the plurality of photoelectric conversion elements of each pixel as an image signal; a generation unit that generates a second signal for each pixel using the image signal and the first signal; and a calculation unit that calculates a moving amount of a focus lens for achieving an in-focus state based on a phase difference between the first signal and the second signal. The calculation unit performs the calculation without using a signal from a defective line..
07/10/14
20140192237
Image processing apparatus, image processing method and program, and image pickup apparatus including image processing apparatus
The image processing apparatus processes an image signal obtained from an image pickup element, using an image pickup optical system arranged to obtain directional traveling information of object image light corresponding to a pupil division area of a photographing lens. The apparatus includes: a unit of setting a focal position at which the refocused image is generated; and a unit of correcting an image signal of a defect pixel of the image pickup element using an image signal of other pixel.
07/10/14
20140192236
Dynamic, local edge preserving defect pixel correction for image sensors
Various technologies described herein pertain to defect pixel correction for image data collected by a pixel array of an image sensor. Neighborhood statistics for a given pixel from the image data are computed based on values of neighbor pixels of the given pixel from the image data.
07/10/14
20140192144
Spherical panoramic image camera rig
One aspect of the present invention provides a simple, cost-effective, efficient solution directed to the generation of the source material for the generation of still panoramic images. The precision optical alignment among all the mounted lenses, provided by the precision rectangular mounting rig, greatly reduces or eliminates stitching errors.


Popular terms: [SEARCH]



Follow us on Twitter
twitter icon@FreshPatents

###

This listing is a sample listing of patent applications related to Defect for is only meant as a recent sample of applications filed, not a comprehensive history. There may be associated servicemarks and trademarks related to these patents. Please check with patent attorney if you need further assistance or plan to use for business purposes. This patent data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Defect with additional patents listed. Browse our RSS directory or Search for other possible listings.
     SHARE
  
         


FreshNews promo



0.4901

3225

3 - 0 - 76