|| List of recent Defect-related patents
| Sizing of a defect using phased array system|
Disclosed is an improved method of sizing a defect using a phased array system with a single probe orientation requiring only a simple one-pass scan. It is an improvement of the addt standard which is adapted to phased array systems with fixed probe orientations.
| Shovel, shovel management device, and shovel management method|
A machine controller controls a display device. The machine controller displays a suspected component which is estimated to be defective on the display device such that priority associated with the suspected component can be recognized, on the basis of failure estimation information including the suspected component and the priority associated with the suspected component..
| Systems and methods for accomodating anatomical characteristics in the treatment of septal defects|
Systems and methods for treating internal tissue defects, such as septal defects, with implantable devices are provided. An exemplary clip-based device includes a tubular body having at least a deflectable anchors coupled thereto.
| Implant for hernia repair|
A hernia repair implant includes a first layer made of mesh for facing a body structure having a hernia defect to cover the defect while promoting tissue growth into the first layer from the body structure. The implant also includes a second layer opposed to the first layer and that extends radially beyond the first layer.
| Treatment apparatus for surgical correction of defective eyesight, method of generating control data therefore, and method for surgical correction of defective eyesight|
A treatment method and apparatus for surgical correction of defective-eyesight in an eye of a patient, wherein a laser device is controlled by a control device, said laser device separating corneal tissue by irradiation of laser radiation to isolate a volume located within a cornea, wherein the control device controls the laser device to focus the laser radiation, by providing target points located within the cornea, into the cornea, wherein the control device, when providing the target points, allows for focus position errors which lead to a deviation between the predetermined position and the actual position of the target points when focusing the laser radiation, by pre-offsets depending on the positions of the respective target points to compensate for said focus position errors.. .
| Cover plate for wind mark control in spin coating process|
Techniques disclosed herein provide an apparatus and method of spin coating that inhibits the formation of wind marks and other defects from turbulent fluid-flow, thereby enabling higher rotational velocities and decreased drying times, while maintaining film uniformity. Techniques disclosed herein include a fluid-flow member, such as a ring or cover, positioned or suspended above the surface of a wafer or other substrate.
| Diamond particle mololayer heat spreaders and associated methods|
Thermally regulated semiconductor devices having reduced thermally induced defects are provided, including associated methods. Such a device can include a heat spreader having a monolayer of diamond particles within a thin metal matrix and a semiconductor material thermally coupled to the heat spreader.
| Inspection method for semiconductor light-emitting device and manufacturing method for semiconductor light-emitting device|
An inspection method for a semiconductor light-emitting device includes an image capturing step for capturing an image of photoluminescence released from the active layer, an inspection region extracting step for extracting an inspection region from the captured image; a luminance average determination step for, determining the semiconductor light emitting device as defective when a luminance average is smaller than a predetermined threshold, a luminance variance determination step for determining the semiconductor light emitting device as defective when a luminance variance is larger than a predetermined threshold, a color determination step for determining the semiconductor light-emitting device as defective when a pixel in which a color component indicating a photoluminescence intensity of light released from the active layer and having a wavelength shorter than the original emitting wavelength, and a total determination step for totally determining the semiconductor light-emitting device as defective when determined in at least one of these determination results within the inspection region.. .
| Rinse solution for lithography and pattern formation method employing the same|
The present invention provides a rinse solution for lithography and a pattern formation method using the solution. They can improve the pattern collapse, surface roughness and surface defects.
| Method for inhibiting oxygen and moisture degradation of a device and the resulting device|
A method for inhibiting oxygen and moisture degradation of a device and the resulting device are described herein. To inhibit the oxygen and moisture degradation of the device, a low liquidus temperature (llt) material which typically has a low low liquidus temperature (or in specific embodiments a low glass transition temperature) is used to form a barrier layer on the device.
| Bioscaffolds for formation of motor endplates and other specialized tissue structures|
Provided herein are scaffolds and methods useful to promote the formation of functional clusters on a tissue, for example, motor endplates (meps) or a component thereof on skeletal muscle cells or tissue, as well as the use of scaffolds so produced for repairing a tissue injury or defect.. .
| System, method and computer program product for defect detection based on multiple references|
A defect detection system for computerized detection of defects, the system including: an interface for receiving inspection image data including information of an analyzed pixel and of a plurality of reference pixels; and a processor, including: a differences analysis module, configured to: (a) calculate differences based on an inspected value representative of the analyzed pixel and on multiple reference values, each of which is representative of a reference pixel among the plurality of reference pixels; wherein the differences analysis module is configured to calculate for each of the reference pixels a difference between the reference value of the reference pixel and the inspected value; and (b) compute a representative difference value based on a plurality of the differences; and a defect analysis module, configured to determine a presence of a defect in the analyzed pixel based on the representative difference value.. .
| Systems, devices and methods for the quality assessment of oled stack films|
This disclosure provides techniques for assessing quality of a deposited film layer of an organic light emitting diode (“oled”) device. An image is captured and filtered to identify a deposited layer that is to be analyzed.
| Method, system, and computer program product for detection of defects based on multiple references|
A defect detection system for computerized detection of defects in an inspected object based on processing of an inspection image generated by collecting signals arriving from the inspected object, the system including: an interface for obtaining an inspected noise-indicative value and multiple reference noise-indicative values, the inspected noise-indicative value representative of an analyzed pixel and each of the reference noise-indicative values representative of a reference pixel among a plurality of reference pixels; and a processor, including: a noise analysis module, configured to compute a representative noise-indicative value based on a plurality of noise-indicative values which includes the inspected noise-indicative value and the multiple reference noise-indicative values; and a defect analysis module, configured to calculate a defect-indicative value based on an inspected value representative of the analyzed pixel, and to determine a presence of a defect in the analyzed pixel based on the representative noise-indicative value and the defect-indicative value.. .
| System to protect from unsafe conditions in an electrical power system|
A system for autonomous protection from fires and electrical shock of components used in construction of photovoltaic arrays is disclosed. The system detects conditions that left unattended will result in conflagration of combustible materials and unwanted electrification.
| Defect inspecting apparatus and defect inspecting method|
An invention being applied is a defect detecting apparatus that has: an illuminating optical system with a laser light source for irradiating a sample on whose surface a pattern is formed with light; a detecting optical system with a sensor for detecting light generated from the sample illuminated by the illuminating optical system; and a signal processing unit that extracts a defect from an image based on the light detected by the detecting optical system, in which an amplification rate of the sensor is dynamically changed during a time when the light is detected by the detecting optical system.. .
| Infrared-based metrology for detection of stress and defects around through silicon vias|
An approach for ir-based metrology for detecting stress and/or defects around tsvs of semiconductor devices is provided. Specifically, in a typical embodiment, a beam of ir light will be emitted from an ir light source through the material around the tsv.
| Defective pixel correction apparatus and method|
A defective pixel correction apparatus and a defective pixel correction method of the present technique include a first defective pixel corrector for specifying a defective pixel included in an image signal of each of color signals sent from an imaging unit, and obtaining a linear interpolation value from pixels around the defective pixel to perform a first defective pixel correction process on the defective pixel by linear interpolation. Further, the defective pixel correction apparatus and the defective pixel correction method include a second defective pixel corrector for performing an aberration correction process based on an image signal of a specific color after the first defective pixel correction process, and performing a second defective pixel correction process different from the first defective pixel correction process on the pixel that has been subjected to the first defective pixel correction process..
| Inspection method and inspection apparatus|
An inspection method and apparatus comprising, a step of reflecting linearly-polarized light having a predetermined wavelength using an non-polarizing beam splitter after transmitting the linearly-polarized light through a half-wave plate, irradiating a sample with the linearly-polarized light having a polarization plane of a predetermined angle, causing the light reflected by the sample to be incident to an image capturing sensor through a lens, the non-polarizing beam splitter, and an analyzer, and acquiring an optical image of a pattern formed on the sample; acquiring a plurality of optical images by changing an angle of the analyzer or the half-wave plate, and obtaining an angle of the analyzer or the half-wave plate such that a value of (σ/√a) becomes a minimum; and a step of inspecting whether a defect of the pattern exists, wherein the pattern is a repetitive pattern having a period at a resolution limit or less.. .
| Image forming apparatus, image forming method, and non-transitory computer readable medium|
An image forming apparatus includes: a plurality of nozzles that eject liquid droplets; an image forming unit that determines at least some of the plurality of nozzles as nozzles that do not eject liquid droplets, and to form a plurality of images by performing image formation for each of the determined nozzles based on image information predetermined using the remaining nozzles other than the determined nozzles; and an acquisition unit that acquires information representing a defective nozzle which is unusual in ejection of liquid droplets among the plurality of nozzles based on the plurality of images formed by the image forming unit.. .
| Field sequential image display device|
There has been room for improvement in terms of increasing the life of display elements which have occurrences of irreversible bright point defects and black point defects and shortened lives of display elements when dmds, which are reflective display devices, are used in high temperature environments such as being installed in vehicles. In the present invention, a display control means displays a display image in display elements.
| Methods and systems for defective phase identification and current sense calibration for multi-phase voltage regulator circuits|
Methods and systems are disclosed that may be implemented to complete individual phase current sense calibration of a multi-phase voltage regulator (vr) and/or to detect any and all individual bad phases of such a vr by utilizing the reconfiguration capability of a digital vr controller-based vr in conjunction with an improved test process. The disclosed systems and methods may be employed in one example to identify that all individual phases of the multi-phase vr are operational to contribute to the output of the multi-phase vr using a rotating single phase operation testing mode.
| Barrier film defect detecting method and apparatus|
A method for detecting a defect of a barrier film includes preparing a device including an electrode and a barrier film covering the electrode, allowing a charged medium to contact a surface of the barrier film, and measuring a change in a flow of current between the charged medium and the electrode.. .
| Apparatuses and methods for removing defective energy storage cells from an energy storage array|
Apparatuses and methods for removing a defective energy storage cell from an energy storage array is described. An apparatus includes an energy storage array including a plurality of energy storage cells, and a cell removal circuit coupled to the energy storage array.
| Lithography original checking device, lithography original checking method, and pattern data creating method|
In one embodiment, a lithography original checking method includes applying resin onto a first lithography original having a first concavo-convex pattern, hardening the resin, releasing the hardened resin from the first lithography original and producing a second lithography original having a second concavo-convex pattern corresponding to the first concavo-convex pattern, enlarging the second lithography original, detecting a defect on the enlarged second lithography original, and calculating a position of a defect on the first lithography original based on the position of the detected defect.. .
| Methods of containing defects for non-silicon device engineering|
An apparatus including a device including a channel material having a first lattice structure on a well of a well material having a matched lattice structure in a buffer material having a second lattice structure that is different than the first lattice structure. A method including forming a trench in a buffer material; forming an n-type well material in the trench, the n-type well material having a lattice structure that is different than a lattice structure of the buffer material; and forming an n-type transistor.
| Semiconductor light-emitting device and method of manufacturing the same|
A light-emitting device is disclosed including a light emitting structure comprising a lower layer of the first conductivity type, an active layer, an upper layer of the second conductivity type; a first electrode connected to the lower layer of the first conductivity type; a second electrode connected to the upper layer of the second conductivity type. The light emitting structure is formed using a shell member, which comprises a planar portion and a shell portion.
| Sensor and method for fabricating the same|
A sensor and its fabrication method are provided, the sensor comprises: a base substrate (32), a group of gate lines (30) and a group of data lines (31) arranged as crossing each other, and a plurality of sensing elements arranged in an array and defined by the group of gate lines (30) and the group of data lines (31), each sensing element comprising a tft device and a photodiode sensing device, wherein a channel region of the tft device is inverted and the source and drain electrodes (33, 34) are positioned between the active layer (36) and the gate electrode (38). The sensor reduces the number of mask as well as the production cost and simplifies the production process, thereby significantly improves the production capacity and the defect-free rate..
| Light emitting diode|
A light emitting diode including a substrate, a p-type and n-type semiconductor layers, an active layer, an interlayer, an electron barrier layer, a first and a second electrodes are provided. The n-type semiconductor layer is disposed on the sapphire substrate.
| Nematic liquid crystal composition and liquid crystal display device using the same|
A liquid crystal composition of the present invention has a liquid phase over a wide temperature range, low viscosity, good solubility at a low temperature, high resistivity and voltage holding ratio, and stability to heat and light, and can thus provide, in high yield, a liquid crystal display device having good display quality and causing little display defects such as image sticking, dropping marks, and the like. A liquid crystal display device using the liquid crystal composition of the present invention is useful, particularly useful for a liquid crystal display device for active matrix driving, because both fast response and suppression of display defects are achieved, and the liquid crystal display device can be applied to a liquid crystal display device for a va mode, a psva mode, or a tn mode..
| Barcode scanner having laser alignment indication|
A barcode scanner having a laser alignment indication mainly has an alignment light source module and a reading light source module. After the alignment light source module is aligned with a barcode, the reading light source module is started to read barcode information.
| Method for producing dialysis tank chamber frame|
A cut frame 1 is set on an unshown table of an impulse welder 30, distributors 13 are fitted into communicating passage 9 and communicating passages 11, and a net 15 is positioned so as to cover a central opening 3. Welded portions a and b, and the welded portions c and d are subjected to impulse welding.
| Graphene defect alteration|
Technologies are generally described for a method and system configured effective to alter a defect area in a layer on a substrate including graphene. An example method may include receiving and heating the layer to produce a heated layer and exposing the heated layer to a first gas to produce a first exposed layer, where the first gas may include an amine.
| Ultrasonic test equipment and evaluation method thereof|
An ultrasonic test equipment includes: a signal generating mechanism that generates a voltage waveform; an ultrasonic transmitting mechanism that excites ultrasonic vibrations having a lower frequency than a predetermined frequency to an object to be tested; an ultrasonic receiving mechanism that receives an ultrasonic response from the object to be tested; an ad converting mechanism that digitizes the received ultrasonic waveform; an analyzing mechanism that performs frequency analysis of the digital ultrasonic waveform digitized by the ad converting mechanism; an evaluating mechanism that extracts a variation of a nonlinear ultrasonic component from a frequency component of the digital ultrasonic wave obtained by the frequency analysis, compares the variation with defect data information in a defect information database, identifies a physical quantity of defect information of the object to be tested, and evaluates a defect in the object to be tested; and a control mechanism that partly or entirely controls a measurement system.. .
| Method for cambering glass sheets by suction|
A method and device for bending superposed sheets of glass. The sheets are picked up by a top form furnished with a suction creating an upward airflow blowing over the rim of the sheets, the suction being sufficient to lift and hold the superposed sheets against the top form, then the sheets are pressed between the top form and a full surface solid concave bottom form furnished with openings, the pressing beginning conducted while the suction is not yet finished or is finishing, then the superposed sheets are formed, by suction of the main face of the bottom sheet through the openings of the bottom concave mold, the forming by suction beginning while the pressing is not yet finished, and then the sheets are cooled.
| Methods for reducing zirconia defects in glass sheets|
Methods are disclosed for treating zircon-containing forming structures, e.g., zircon isopipes, with one or more treatment glass compositions in which defect-causing reactions between the zircon of the forming structure and molten glass are suppressed at the delivery temperature of the treatment glass. The treatment compositions can be used during start-up of a forming structure, between runs of the same production glass on a given forming structure, and/or when transitioning between runs of two production glasses on a given forming structure.
|Efficient model checking technique for finding software defects|
A method for detecting defects in a computer program. The method steps include obtaining source code and a potential defect definition; identifying, based on the potential defect definition, a set of program objects associated with a potential defect in the source code; extracting an executable program slice having the potential defect from the source code; generating, by a processor, an abstracted model of the program slice by: modeling, using data abstraction, the set of program objects as data-abstracted variables, identifying, within the program slice, a set of control statements including predicates necessary for evaluating the set of control statements, modeling, using predicate abstraction, the predicates as predicate-abstracted boolean variables, and creating, based on the data-abstracted variables and the predicate-abstracted boolean variables, a finite state machine (fsm) model of the program slice; and identifying an error state of the fsm indicating an occurrence of the potential defect within the program slice..
|Mosaic implants, kits and methods for correcting bone defects|
The mosaic implant is configured to be deformable such that at least a portion of the mosaic implant is conformable to a curved surface, with the beam portion providing structural support which resists inward deformation of the curved portion of the implant. A kit for forming a mosaic implant is also provided, along with a method for correcting a bone defect in a patient..
|Eye surgery system and method of inserting an intraocular lens|
A method of inserting an intraocular lens into an eye comprises: determining preoperative values of an eye; selecting an intraocular lens based on the preoperative values; inserting the intraocular lens into the eye; determining intraoperative values of the eye; providing an eye model, wherein the eye model includes plural parameters; determining the second value representing a postoperative visual defect of the eye using the eye model, wherein the preoperative values of the eye are assigned to a first subset of the plural parameters of the eye model and wherein the intraoperative values of the eye are assigned to a second subset of the plural parameters of the eye model; and correcting the position and/or the orientation of the inserted intraocular lens or inserting a different intraocular lens based on the value representing the postoperative visual defect of the eye.. .
|Noncircular inner lumen guiding catheter with assisted variable support|
A noncircular inner lumen guiding catheter with assisted variable support has an inner wall defining a noncircular cross-sectional shaped lumen for use in delivery of multiple microcatheters or other devices for treatment of neurovascular defects, such as for treatment of aneurysms. The noncircular inner lumen guiding catheter with assisted variable support includes torque transmittal guidance walls that are flexible linearly but not circumferentially, and that are neither collapsible nor kinkable.
|Identification of a manipulated or defect base station during handover|
A method of and arrangement for detecting a manipulated or defect base station of a communication network is disclosed, wherein a target base station, having selected one or more algorithms on the basis of a prioritized algorithm list (pal) and a ube security capabilities (scap), reports ue scap related information to a core network node. The core network node having knowledge of the ue scap compares this information or parts of this information with the retrieved ue scap related information in order to be able to identify a manipulated or defect base station when a comparison fails to match..
|Connection structure of bus bar and terminal|
By forming a bus bar-swaging part at a terminal, forming a bus bar-crimping part at a bus bar, and providing a crimping posture-retaining part that retains the crimping posture of the bus bar-crimping part when crimping the bus bar-swaging part to the bus bar-crimping part, the present invention provides a connection structure capable of preventing defective crimping caused by the change in the posture of the bus bar-crimping part to thereby enhance the reliability on connection.. .
|Method for determining the spatiotemporal distribution of activity of a proteolytic enzyme in a heterogeneous system (variations), a device for realizing same and a method for diagnosing the defects in the hemostatic system on the basis of a change in the spatiotemporal distribution of activity of a proteolytic enzyme in a heterogeneous system|
The invention relates to the field of biotechnology. The method for determining the spatial and temporal distribution of the activity of a proteolytic enzyme in an in vitro heterogeneous system, such as blood or blood plasma, involves the introduction of a luminescent, fluorogenic or chromogenic substrate into a sample with the subsequent release of a detectable tag as the proteolytic enzyme cleaves the substrate, and the recording of the optical characteristics of the sample, which makes it possible to assess the spatial and temporal distribution of the activity of the enzyme.
|Belt for electrophotography and production method therefor, and electrophotographic image forming apparatus|
Provided is a belt for electrophotography which is capable of suppressing the occurrence of adhesion to other members and blocking and which is less liable to cause image defects due to a singular protrusion. The belt for electrophotography comprises a surface layer which comprises heteroaggregate including an inorganic oxide particle having an average primary particle diameter of from 10 to 30 nm and an electroconductive metal oxide particle having an average primary particle diameter of from 5 to 40 nm, and a ten-point average roughness rzjis of a surface of the surface layer satisfies a relationship: 0.3 μm≦rzjis≦0.7 μm..
|Self adhesive film and method to minimize or eliminate print defects in such film|
The present invention relates to a self adhesive ink jet printable polymer film. The film comprises a polymeric resin and a low surface energy additive that is in a substantially free form.