 Patent Application Title |
Patent App Num. |
Date |
 Silver selenide sputtered films and method and apparatus for controlling defect formation in silver selenide sputtered films | 20130118894 | 20130516 |
 Method and apparatus for sputter depositing silver selenide and controlling defect formation in and on a sputter deposited silver selenide film are provided. A method of forming deposited silver selenide comprising both alpha and beta phases is further provided. The methods include depositing silver selenide using sputter powers of less than about 200 W, using sputter power densities of less than about 1 W/cm2, using sputter pressures of less than about 40 mTorr and preferably less than about 10 mTorr, using sputter gasses with molecular weight greater than that of neon, using cooling apparatus having a coolant flow rate at least greater than 2.5 gallons per minute and a coolant temperature less than about 25° C., using a magnetron sputtering system having a magnetron placed a... |
| Defect inspection method, and device thereof | 20130119250 | 20130516 |
 A conventional pattern inspection, which compares an image to be inspected with a reference image and subjects the resulting difference value to the defect detection using the threshold of defect determination, has difficulty in highly-sensitive inspection. Because defects occur only in specific circuit pattern sections, false reports occur in the conventional pattern inspections which are not based on the position. Disclosed are a defect inspection method and a device thereof which perform a pattern inspection by acquiring a GP image in advance, designating a place to be inspected and a threshold map to the GP image on the GUI, setting the identification reference of the defects, next acquiring the image to be inspected, applying the identification reference to the image to be inspected, and identifying the... |
| Method and apparatus for charged particle beam inspection | 20130119251 | 20130516 |
 A charged particle beam inspection apparatus comprises: an electron gun for irradiating an electron beam onto a sample; a detector for detecting a signal obtained from the sample; an image processor for forming an image from the signal obtained from the detector, and an energy controller for controlling the beam energy of the electron beam to be irradiated onto the sample. An identical charged particle beam inspection apparatus carries out a plurality of types of inspections. An inspection apparatus of a projection type may be applied thereto. A pattern defect inspection, a foreign material inspection, and an inspection for a defect in a multilayer are carried out. Beam energies E1, E2, and E3 in those inspections have a relation E1>E2 and E3>E2. Charge removal is performed... |
| Liquid crystal display and a defect correcting method for the same | 20130120703 | 20130516 |
 A liquid crystal display uses a pixel division method by which the size of a defect can be reduced much more than conventionally possible, and a defect correcting method for the liquid crystal display. The liquid crystal display is provided with an active matrix array substrate including a plurality of gate lines and a plurality of source lines arranged on a transparent substrate to intersect with each other, and a plurality of pixel electrodes arranged in a matrix, each pixel electrode including an assembly of a plurality of sub-pixel electrodes, separate TFTs respectively connected to the sub-pixel electrodes in the vicinity of an intersection portion of the gate line and the source line, the TFTs being driven by the common gate line and the common source... |
| Inspection method for imprint lithography and apparatus therefor | 20130120729 | 20130516 |
 A method is disclosed for inspecting a device imprint lithography template to detect defect particles of imprintable medium remaining on the patterned imprinting surface after an earlier imprint step. The method involves illuminating the patterned surface with radiation of a first wavelength selected to induce fluorescence of the defect particles and not to induce fluorescence of anti-adhesion compound on the patterned surface. The presence of defect particles is indicated by the presence of fluorescence from the patterned surface and can be used to initiate a cleaning step when necessary, speeding processing by eliminating unnecessary cleaning. The elimination of false positives from transferred anti-adhesion compound is reduced or eliminated. Related apparatus is also disclosed.
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| Radiation detector calibration using voltage injection | 20130121478 | 20130516 |
| Among other things, one or more systems and/or techniques for calibrating a direct conversion detector array are provided. An electrical charge is generated on an interface of a photoconductor (e.g., amorphous selenium) of the detector array when there is a change in voltage that is applied to the photoconductor. Such a change in voltage may occur because the voltage that is supplied to the photoconductor by a power supply is changed. The changed voltage causes an electrical charge to be produced, or causes a change in the net charge density at an interface of the photoconductor, that is substantially similar to the electrical charge that may be produced when radiation impinges the detector array. In this way, calibrations of the detector array (e.g., the generation of... |
| Platelet-derived growth factor compositions and methods for the treatment of osteochondral defects | 20130122095 | 20130516 |
| The present invention provides compositions and methods for treating an osteochondral defect. In one embodiment, provided is a composition for treating an osteochondral defect comprising a biphasic biocompatible matrix and platelet derived growth factor (PDGF), wherein the biphasic biocompatible matrix comprises a scaffolding material and wherein the scaffolding material forms a porous structure comprising an osseous phase and a cartilage phase. In another embodiment, also provided is a method for treating an osteochondral defect in an individual comprising administering to the individual an effective amount of a composition comprising a biphasic biocompatible matrix and PDGF to at least one site of the osteochondral defect, wherein the biphasic biocompatible matrix comprises a scaffolding material and wherein the scaffolding material forms a porous structure comprising an osseous phase... |
| Rinsing agent, and method for production of hard disk substrate | 20130122786 | 20130516 |
| 12.2C+18.2 (1).
... |
| Image forming apparatus and method of booting image forming apparatus having hibernation function | 20130124842 | 20130516 |
| A method of booting an image forming apparatus having a hibernation function. In the method, when booting of the image forming apparatus starts, whether a storage device has a defect is checked based on a flag indicating whether the hibernation function is activated, and a system of the image forming apparatus is booted using a stored boot image.
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| Method and apparatus for detecting internal rail defects | 20130111997 | 20130509 |
| An ultrasonic rail inspection system designed to detect defects in a rail which result from longitudinal cracks that propagate in the horizontal and transverse plane of the rail. Detection of this type of defect is possible by directing an ultrasonic beam into the rail at a predetermined angle from the perpendicular to the surface of the rail. The predetermined angle must be sufficient to detect these normally undetectable defects and can be in the range of 8° to 14° from the perpendicular.
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| Charged particle beam device, defect observation device, and management server | 20130112893 | 20130509 |
| Provided is a charged particle beam device that prevents the increase in processing trouble caused by deterioration in the reviewing performance (e.g., overlooking of defects) by detecting an operation abnormality affecting the performance of the device or a possibility of such an abnormality in the middle of a processing sequence of a sample and giving a feedback in real time. In each processing step of the charged particle beam device, monitoring items representing the operating status of the device (control status of the electron beam, an offset amount at the time of wafer positioning, a defect coordinate error offset amount, etc.) are monitored during the processing sequence of a sample and stored as history information. In the middle of the processing sequence, a comparative judgment between... |
| Semiconductor device | 20130113044 | 20130509 |
| It is an object to provide a semiconductor device typified by a display device having a favorable display quality, in which parasitic resistance generated in a connection portion between a semiconductor layer and an electrode is suppressed and an adverse effect such as voltage drop, a defect in signal wiring to a pixel, a defect in grayscale, and the like due to wiring resistance are prevented. In order to achieve the above object, a semiconductor device according to the present invention may have a structure where a wiring with low resistance is connected to a thin film transistor in which a source electrode and a drain electrode that include metal with high oxygen affinity are connected to an oxide semiconductor layer with a suppressed impurity concentration.... |
| System and method for data-driven automated borescope inspection | 20130113913 | 20130509 |
| A system and method for performing automated defect detection of blades within an engine is disclosed. The system and method may include an image capture device capable of capturing and transmitting images of a plurality of blades of an engine, creating a normal blade model of an undamaged one of the plurality of blades and determining defects within the plurality of blades by utilizing the normal blade model.
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| System and method for automated borescope inspection user interface | 20130113914 | 20130509 |
| A system and method for improving human-machine interface while performing automated defect detection is disclosed. The system and method may include an image capture device for capturing and transmitting data of an object, performing automated analysis of the data and reviewing results of the automated analysis by a human inspector and providing feedback. The system and method may further include refining the automated analysis of the data based upon the feedback of the human inspector.
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| Method and system for position control based on automated defect detection feedback | 20130113915 | 20130509 |
| A computer program product and method for performing position control on device members that have been identified as defective. The method may include providing a storage medium that stores data and programs used in processing images and a processing unit that processes the images, receiving, by the processing unit from an image capture device coupled to the processing unit, a set of images of a plurality of members inside of a device, detecting, by the processing unit, a defect in a first member of the plurality of members, and providing instructions to move the first member to an inspection position in the device. The device may be an engine and the members may be blades within the engine.
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| System and method for multiple simultaneous automated defect detection | 20130113916 | 20130509 |
| A system and method for performing automated defect detection using multiple image capture devices is disclosed. The system and method may include providing a plurality of image capture devices, the plurality of image capture devices capturing and transmitting a plurality of images of an object. The system and method may further include determining a feature correspondence between the plurality of images of the plurality of image capture devices, creating mosaiced images of the plurality of images if the feature correspondence is found or known and performing at least of an automated analysis and a manual inspection on the mosaiced images to find any defects in the object.
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| Defect inspection method and device therefor | 20130114078 | 20130509 |
| Disclosed is a defect inspection method which makes it possible to scan the entire surface of a sample and detect minute defects without causing thermal damage to the sample. A defect inspection method in which a pulse laser emitted from a light source is subjected to pulse division and irradiated on the surface of a sample which moves in one direction while the divided-pulse pulse laser is rotated, reflection light from the sample irradiated by the divided-pulse pulse laser is detected, the signal of the detected reflection light is processed to detect defects on the sample, and information regarding a detected defect is output to a display screen, wherein the barycentric position of the light intensity of the divided-pulse pulse laser is monitored and adjusted.
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| Defective word line detection | 20130114342 | 20130509 |
| Methods and non-volatile storage systems are provided for detecting defects in word lines. A “broken” word line defect may be detected. Information may be maintained as to which storage elements were intended to be programmed to a tracked state. Then, after programming is complete, the storage elements are read to determine which storage elements have a threshold voltage below a reference voltage level associated with the tracked state. By tracking which storage elements are in the tracked state, elements associated with other states may be filtered out such that an accurate assessment may be made as to which storage elements were under-programmed. From this information, a determination may be made whether the word line is defective. For example, if too many storage elements are under-programmed, this... |
| System and method for automated defect detection utilizing prior data | 20130114878 | 20130509 |
| A system and method for performing automated defect detection by utilizing data from prior inspections is disclosed. The system and method may include providing a image capture device for capturing and transmitting at least one current image of an object and providing a database for storing at least one prior image from prior inspections. The system and method may further include registering the at least one current image with the at least one prior image, comparing the registered at least one current image with the at least one prior image to determine a transformation therebetween and updating the database with the at least one current image.
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| Method and system for automated defect detection | 20130114879 | 20130509 |
| A computer program product and method for performing automated defect detection of blades within an engine is disclosed. The method may include providing a storage medium for storing data and programs used in processing video images, providing a processing unit for processing images, receiving from a borescope an initial set of images of a plurality of members inside of a device, and using the processing unit to apply Robust Principal Component Analysis to decompose the initial set of images into a first series of low rank component images and a second series of sparse component images, wherein there are at least two images in the initial series.
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| Method and apparatus for inspecting defect | 20130114880 | 20130509 |
| In inspecting a substrate having a transparent oxide film or a metal film formed on a surface thereof by using a dark field type inspection apparatus installing a laser light source, an illuminating beam having a high coherence causes variations in reflection strength due to multiple interferences within the transparent oxide film or an interference of scattered beams due to the surface roughness of the metal film occurs and which leads to degradation in the sensitivity of defect detection. The present invention solves the problem by providing a low-coherence but high-brightness illumination using a highly directive broadband light source, and a system in which the conventional laser light source is simultaneously employed to selectively use the light sources, thereby enabling a highly sensitive inspection according to... |
| Method and apparatus for reviewing defects | 20130114881 | 20130509 |
| Disclosed is a method for reviewing defects in a large number of samples within a short period of time through the use of a defect review apparatus. To collect defect images steadily and at high throughput, a defect detection method is selected before imaging and set up for each of review target defects in the samples in accordance with the external characteristics of the samples that are calculated from the design information about the samples. The defect images are collected after an imaging sequence is set up for the defect images and reference images in such a manner as to reduce the time required for stage movement in accordance with the defect coordinates of the samples and the selected defect detection method.
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| Partial joint resurfacing implant, instrumentation, and method | 20130116788 | 20130509 |
| A partial resurfacing implant for use in repairing an articular cartilage defect site that includes a top articulating portion having a top surface that is configured with at least one radius of curvature to approximate the surface contour of the articular cartilage surrounding the defect site. The implant also includes a supporting plate that has a top surface and a bottom surface. The top surface is attached to the top articulating portion by a locking mechanism. The bottom surface of the supporting plate is constructed to facilitate the insertion of the implant into the defect site. Extending from the bottom surface of the supporting plate is at least one implant fixation portion. The at least one implant fixation portion is integrally connected to and is oriented... |
| Pattern shape evaluation method, pattern shape evaluation device, pattern shape evaluating data generation device and semiconductor shape evaluation system using the same | 20130117723 | 20130509 |
| A pattern shape evaluation method and semiconductor inspection system having a unit for extracting contour data of a pattern from an image obtained by photographing a semiconductor pattern, a unit for generating pattern direction data from design data of the semiconductor pattern, and a unit for detecting a defect of a pattern, through comparison between pattern direction data obtained from the contour data and pattern direction data generated from the design data corresponding to a pattern position of the contour data.
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| Process for producing a curved substrate covered with a film | 20130105080 | 20130502 |
| A process for producing a curved substrate (20) covered with a film (10) comprises a heat treatment of the film performed between a step of preforming said film and a step of assembling the film with the substrate. A maximum temperature of the pre-assembling heat treatment is higher than another maximum temperature of a post-assembling heat treatment (F) which is performed after the assembling step. Then the assembly of the substrate (20) with the film (10) is not altered during said post-assembling heat treatment. In particular, no defect and no delamination appear, and no change in the curved shape of the substrate is caused by the post-assembling heat treatment, even if the substrate (20) has a low glass transition temperature.
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| Electronic component-embedded printed circuit board and method of manufacturing the same | 20130105201 | 20130502 |
| An electronic component-embedded printed circuit board and a method of manufacturing the same. The printed circuit board includes a base substrate including a hollow electronic component case, an electronic component inserted into the electronic component case, circuit pattern layers formed on upper and lower surfaces of the base substrate, and an insulating layer formed to cover the circuit pattern layers. Accordingly, since the printed circuit board includes the electronic component case formed therein and the electronic component is inserted into only the printed circuit board, which has no defect after manufacture and final inspection of the printed circuit board, component loss due to yield of the printed circuit board can be reduced.
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| Charged particle beam apparatus | 20130105690 | 20130502 |
| In recent years, in association with the miniaturization and high integration of semiconductor manufacturing processes, there have been arising many cases where observation target portions are densely located. In such a case, if observation is performed using a conventional pre-charge technology, scanning with an electron beam in pre-charging are repeatedly executed, therefore the charge potential on the surface of a specimen exceeds the dielectric breakdown voltage. As a result, dielectric breakdown arises in areas where scanning with an electron beam are repeatedly executed. An object of the present invention is to provide a defect observation method that can reduce the risk of dielectric breakdown, and a charged particle beam apparatus that utilizes the method. In the present invention, when a specimen is observed with the use... |
| Liquid crystal composition, polymer/liquid crystal composite, liquid crystal element, and liquid crystal display device | 20130105732 | 20130502 |
| In (G1), X represents a mesogenic skeleton; Y represents an oxyalkylene group (including carbon and oxygen), and includes hydrogen or fluorine; and Z1 and Z2 individually represent an acryloyl group or a methacryloyl group.
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| Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication | 20130105860 | 20130502 |
| Fabrication of monolithic lattice-mismatched semiconductor heterostructures with limited area regions having upper portions substantially exhausted of threading dislocations, as well as fabrication of semiconductor devices based on such lattice-mismatched heterostructures.
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| Mos device and method of manufacturing the same | 20130105907 | 20130502 |
| The present invention relates to a MOS device and method of manufacturing the same. The device comprises a semiconductor substrate; a channel formed in the semiconductor substrate; a gate stack formed on the channel and a spacer surrounding the gate stack; and source and drain regions formed in the substrates on both sides of the spacer; wherein the gate stack is comprised of an insulating layer and a multi-layer metal gate formed thereon, the multi-layer metal gate is comprised of a strained metal layer for introducing a stress to the channel and a work function regulating layer for regulating the work function of the metal gate, and the work function regulating layer surrounds the strained metal layer from the bottom and sides. The multi-layer metal gate... |
| Method and arrangement for detecting, localizing and classifying defects of a device under test | 20110015898 | 20110120 |
| An arrangement and method for assessing and diagnosing the operating state of a device under test in the presence of a disturbing ambient noise and for detecting, localizing and classifying defects of the device which affect its operational reliability and quality. At least two sensors monitor signals at arbitrary locations which are affected by signals emitted by defects and by ambient noise sources. A source analyzer receives the monitored signals, identifies the number and location of the sources, separates defect and noise sources, and analyzes the deterministic and stochastic signal components emitted by each source. Defect and noise vectors at the outputs of the source analyzer are supplied to a defect classificator which detects invalid parts of the measurements corrupted by ambient noise, accumulates the valid... |
| Method for the on-board functional diagnosis of a soot sensor in a motor vehicle and/or for the detection of further constituents in the soot | 20110015824 | 20110120 |
| A method for the on-board functional diagnosis of a soot sensor and detection of further constituents in the soot in a motor vehicle having an internal combustion engine. The soot sensor is connected electrically to an evaluation circuit in the motor vehicle. A faulty soot sensor and/or further constituents in the soot can be detected in an inexpensive way. The evaluation circuit measures the voltage coefficient of the soot sensor and detects the defectiveness of the soot sensor and/or the presence of further constituents in the soot using the voltage coefficient of the soot sensor.
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| Lead pin for package substrate | 20110014827 | 20110120 |
| The lead pin for the package substrate includes a cylindrical connection pin; and a head part that is formed on one end of the connection pin and has a convex round part formed on the lower end of the head part, having a step part. When the lead pin for the package substrate is mounted on the package substrate, the bulge phenomenon of a solder paste that surrounds the head part and is melted is prevented by a flange part, thereby making it possible to prevent the connection pin from being polluted and to improve a contact defect such as a short defect or the like when coupling a socket.
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| Sintered cubic boron nitride tool | 20110014426 | 20110120 |
| A sintered cubic boron nitride tool can perform stable machining without causing any defect for a long lifetime even under a high-load cutting condition and a high-efficiency cutting condition. The sintered cubic boron nitride tool is such that: assuming a reference length longer than five times an average particle size of cubic boron nitride is S, when a total length of profile curves of cubic boron nitride included in the reference length S of the chamfer honing surface is LCC, when a total length of profile curves of the binder phase included in the reference length S of the chamfer honing surface is LCB, and a ratio of LCC to LCB is PC(PC=LCC/LCB), and when a total length of profile curves of cubic boron nitride included... |
| Human respiratory syncytial virus (rsv) vaccine | 20110014220 | 20110120 |
| The present invention relates to a vaccine composition against the infection of human respiratory syncytial virus (RSV) comprising a replication-defective recombinant adenovirus carrying a nucleotide sequence encoding the F protein of RSV or fragment thereof. A method of preventing RSV infection-related diseases using the vaccine composition of the present invention is also provided.
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| Screening method for predicting susceptibility to breast cancer | 20110014206 | 20110120 |
| A method to aid in identifying a familial or sporadic pattern of risk in at least one individual for developing cancer of a mucosal epithelial tissue, the method comprising screening said at least one individual for heterozygosity or homozygosity for a mutation in a gene coding for a Poly-Ig (Fc) receptor or a Poly-Ig-like (Fc) receptor capable of mediating inhibition of cancer cell growth by an immunoglobulin inhibitor. A method of treating an individual so identified includes enhancing the amount of immunoglobulin inhibitor contacting a mucosal epithelial tissue of said individual, and, especially in individuals homozygous for the defective receptor, may also include prophylactic surgery. Other methods include implementation of a risk reduction or prevention program in individuals identified as being at risk.
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| Silver selenide sputtered films and method and apparatus for controlling defect formation in silver selenide sputtered films | 20110014115 | 20110120 |
| Method and apparatus for sputter depositing silver selenide and controlling defect formation in and on a sputter deposited silver selenide film are provided. A method of forming deposited silver selenide comprising both alpha and beta phases is further provided. The methods include depositing silver selenide using sputter powers of less than about 200 W, using sputter power densities of less than about 1 W/cm2, using sputter pressures of less than about 40 mTorr and preferably less than about 10 mTorr, using sputter gasses with molecular weight greater than that of neon, using cooling apparatus having a coolant flow rate at least greater than 2.5 gallons per minute and a coolant temperature less than about 25° C., using a magnetron sputtering system having a magnetron placed a... |
| Method for growing monocrystalline diamonds | 20110014112 | 20110120 |
| A method of forming mono-crystalline diamond by chemical vapour deposition, the method comprising the steps of: (a) providing at least one diamond seed; (b) exposing the seed to conditions for growing diamond by chemical vapour deposition, including supplying reaction gases that include a carbon-containing gas and hydrogen for growing diamond and include a nitrogen-containing gas; and (c) controlling the quantity of nitrogen-containing gas relative to other gases in the reaction gases such that diamond is caused to grow by step-growth with defect free steps without inclusions. The nitrogen is present in the range of 0.0001 to 0.02 vol %. Diborane can also be present in a range of from 0.00002 to 0.002 vol %. The carbon-containing gas can be methane.
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| Implementing channel start and file seek for decoder | 20110013889 | 20110120 |
| A video bit stream with pictures comprising inter-coded content can be decoded upon receiving a channel start or file seek instruction. Pictures for beginning decoding and display of the bit stream can be selected based at least in part on one or more tuning parameters that set a preference between a latency of beginning to display video and possible defects in the displayed video. In some embodiments, to implement decoding upon a channel start or file seek, one or more types of data are generated for one or more pictures. For example, picture order counts are generated for pictures after a channel start or file seek operation. As another example, a decoder generates a frame number value that triggers re-initialization of a reference picture buffer before... |
| Reconfigurable materials for photonic system embodiment | 20110013867 | 20110120 |
| A light guide device for steering an input light may include a PBC lattice having a input surface and a first surface. The input surface may receive the input light to cooperate with the first surface, and the PBC lattice may direct the input light to the first surface to output the light from the PBC lattice by a programmable lattice of defect. The PBC lattice may include a aperture adapted to be filled with fluid, and the PBC lattice may include a fluid valves adapted to cooperate with the aperture. The PBC lattice may include a layer of fluid to cooperate with the fluid valve and the aperture, and the PBC lattice may include a second surface for output of the light by reprogramming the... |
| In-line light sensor | 20110013864 | 20110120 |
| The sensor includes an optical waveguide defined in a light-transmitting medium. The waveguide includes a sensing portion and an non-sensing portion. The light-transmitting medium included in the sensing portion has defects that provide the light-transmitting medium with a deep band gap level between a valence band of the light-transmitting medium and a conduction band of the light-transmitting medium. The deep band gap level is configured such that the waveguide guiding light signals through the light-transmitting medium in the sensing portion causes free carriers to be generated in the light-transmitting medium. A detector is configured to detect the free carriers in the sensing region of the waveguide.
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| Test structure for charged particle beam inspection and method for defect determination using the same | 20110013826 | 20110120 |
| A test structure and method thereof for determining a defect in a sample of semiconductor device includes at least one transistor rendered grounded. The grounded transistor is preferably located at least one end of a test pattern designed to be included in the sample. When the test structure is inspected by charged particle beam inspection, the voltage contrast (VC) of the transistors in the test pattern including the grounded transistor is observed for determination of the presence of defect in the sample.
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| Method and apparatus for analyzing defect data and a review system | 20110013825 | 20110120 |
| In a process for manufacturing a semiconductor wafer, defect distribution state analysis is performed so as to facilitate identification of the defect cause including a device cause and a process cause by classifying the defect distribution state according to the defect position coordinates detected by the inspection device, into one of the distribution characteristic categories: repeated defects, clustered defects, arc-shaped regional defects, radial regional defects, line type regional defects, ring and blob type regional defects, and random defects.
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| Inspection area setting method, inspection area setting apparatus, and computer program product | 20110013824 | 20110120 |
| To provide an inspection area setting method including: extracting patterns from a plurality of sampling positions in a design layout data of a die of a semiconductor integrated circuit; classifying the extracted patterns into a plurality of types fewer than number of the extracted patterns, based on similarity of geometric feature attributes; and fixing a plurality of candidate areas smaller than a size of the die, and setting a candidate area including the largest number of types of the patterns classified at classifying, among the fixed candidate areas, as an inspection area in defect inspection.
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| Redundancy circuits and semiconductor memory devices | 20110013469 | 20110120 |
| A redundancy circuit includes at least one fuse set circuit and a fuse control circuit. The at least one fuse set circuit includes a plurality of fuse cells, each of the plurality of fuse cells having a first transistor and a second transistor having same sizes. The first transistor has a first contact resistance and the second transistor has a second contact resistance different from the first contact resistance. Each of the plurality of fuse cells stores a fuse address indicating a defective cell in a repair operation and outputs a repair address corresponding to the stored fuse address. The fuse control circuit, connected to the plurality of fuse cells, controls the plurality of fuse cells in response to a program signal and a precharge signal... |
| Liquid crystal display device and method for fabricating the same | 20110013125 | 20110120 |
| The liquid crystal display device includes first and second substrates placed opposite to each other, each having an active region at a center thereof, a seal pattern formed on an outside circumference of the active region spaced from a boundary portion of the active region, between the first substrate and the second substrate, a spread preventive wall formed on the first substrate between the boundary portion of the active region and the seal pattern, and an alignment film formed on an inner side of the spread preventive wall on the first substrate.
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| Image pickup device and noise reduction method thereof | 20110013068 | 20110120 |
| There is provided an image pickup device capable of reducing noises, e.g., smears outputted from a CCD without using a special light amount adjusting device regardless of pixel defects. The image-pickup device includes a CCD having an image-pickup area and a storage area; a control unit for vertical-transferring signals of a line number having no pixel signal from a vertical-transfer register of the storage area and vertical-transferring more lines than the line number of a vertical-transfer register of the image-pickup area by the line number to the vertical-transfer register of the storage area during a period; an image signal obtaining unit for obtaining first image signals outputted from predetermined pixels of the CCD; an obtaining unit for obtaining the second image signals of the line number... |
| Defective pixel detection and correction | 20110013053 | 20110120 |
| A device can include a detection module and a correction module. The detection module can classify a pixel in a sensor as a defective pixel, and can store location information for the defective pixel. The correction module can identify the defective pixel based on the location information, and can correct a digital pixel signal corresponding to the defective pixel.
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| Vision inspection system and inspection method using the same | 20110013015 | 20110120 |
| A vision inspection system for inspecting an inspection object of various types, and an inspection method of inspecting an inspection object using the vision inspection system are disclosed. The vision inspection system comprises a work-piece stage having a table on which an inspection object is placed, a plurality of linescan cameras, and a computer configured to process a scanned image of the inspection object. A plurality of markings, each of which has a marking stage coordinate value, are provided on an upper surface of the table such that the linescan cameras can obtain scanned images of the markings. Each two neighboring markings are placed in a field of view of each of the linescan cameras. The markings between the first and the last markings are respectively... |
| Tft. shift register, scan signal line driving circuit, display device, and tft trimming method | 20110012880 | 20110120 |
| In at least one embodiment, a TFT includes: a first capacitor formed of a first capacitor electrode connected to a source electrode and a second capacitor electrode; a second capacitor formed of a third capacitor electrode and a fourth capacitor electrode; a first lead-out line; a second lead-out line connected to a gate electrode; a third lead-out line; a fourth lead-out line; a first interconnection; and a second interconnection. This realizes a TFT which can be easily saved from being a defective product even if leakage occurs in a capacitor connected to a TFT body section.
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| Failure detection method and failure detection apparatus | 20110012613 | 20110120 |
| The present invention discloses a failure detection method and a failure detection apparatus for detecting a defect in an electrical conductor. The failure detection method includes: providing at least two output terminals on the electrical conductor under test, the at least two output terminals having identical electric potentials; inputting a constant detection current sequentially to detection points arranged on the electrical conductor under test along a predetermined path; detecting an output current at one or more output terminals of the at least two output terminals; building a correspondence relationship between the detected one or more output currents at the one or more output terminals and positions of the detection points, based on information of the positions of the detection points and information of the detected one... |
| Method and apparatus for improved detection of holes in plastic containers | 20110012279 | 20110120 |
| A method and apparatus for monitoring the production of blow molded plastic containers is disclosed, wherein the method and apparatus utilize a sound detector assembly adapted to be positioned adjacent a mold cavity during the introduction of pressure fluid to a preform in the mold cavity to form a container, the sound detector assembly including a reflector having a substantially conic cross-sectional shape and a sound detector and being responsive to a defect sound of the pressure fluid escaping from the interior of the container for generating an output signal.
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| Semiconductor wafer, semiconductor wafer manufacturing method, and electronic device | 20110012175 | 20110120 |
| A high-quality GaAs-type crystal thin film using an inexpensive Si wafer with good thermal release characteristics is achieved. Provided is a semiconductor wafer comprising an Si wafer; a Ge layer that is crystal-grown on the wafer and shaped as an isolated island; and a functional layer that is crystal-grown on the Ge layer. The Ge layer may be shaped as an island having a size that docs not exceed double a distance moved by crystal defects as a result of annealing the Ge layer at a certain temperature for a certain time. The Ge layer may be shaped as an island having a size for which stress due to a difference relative to a thermal expansion coefficient of Si, which is material of the wafer, does... |
| Method for manufacturing semiconductor substrate, and semiconductor device | 20110012131 | 20110120 |
| An object is to provide a novel manufacturing method of a semiconductor substrate containing silicon carbide, and another object is to provide a semiconductor device using silicon carbide. A semiconductor substrate is manufactured through the steps of: adding ions to a silicon carbide substrate to form an embrittlement region in the silicon carbide substrate; bonding the silicon carbide substrate to a base substrate with insulating layers interposed therebetween; heating the silicon carbide substrate and separating the silicon carbide substrate at the embrittlement region to form a silicon carbide layer over the base substrate with the insulating layers interposed between therebetween; and performing heat treatment on the silicon carbide layer at a temperature of 1000° C. to 1300° C. to reduce defects of the silicon carbide layer.... |
| Method of forming a group iii-nitride crystalline film on a patterned substrate by hydride vapor phase epitaxy (hvpe) | 20110012109 | 20110120 |
| A method of depositing a high quality low defect single crystalline Group III-Nitride film. A patterned substrate having a plurality of features with inclined sidewalls separated by spaces is provided. A Group III-Nitride film is deposited by a hydride vapor phase epitaxy (HVPE) process over the patterned substrate. The HVPE deposition process forms a Group III-Nitride film having a first crystal orientation in the spaces between features and a second different crystal orientation on the inclined sidewalls. The first crystal orientation in the spaces subsequently overgrows the second crystal orientation on the sidewalls and in the process turns over and terminates treading dislocations formed in the first crystal orientation.
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| Optical luminescence of functionalized fullerenes in an oxygen free environment | 20110012027 | 20110120 |
| Functionalized fullerenes, when excited at any of a broad range of wavelengths in an oxygen free environment, undergo luminescence. The oxygen sensitive luminescence of functionalized fullerenes is used for numerous applications including oxygen detection; irradiation induced healing of polymeric materials; and phosphors for optical location and display applications. The degradation of the functionalized fullerenes allows for the detection of oxygen by diminished luminescence when the fullerenes are exposed to an irradiation source, such as a laser beam, in the presence of oxygen. The luminescence from a portion of a surface of a material with functionalized fullerenes allows for the location of the surface containing a functionalized fullerene target in the absence of oxygen or to heat the object in the area irradiated that is exposed to... |
| Apparatus and method for fabricating bonded substrate | 20110011541 | 20110120 |
| A bonded-substrate fabricating apparatus capable of reducing defective bonded substrates fabricated. A transfer robot sucks the outer edge area of the bottom surface of a substrate and spouts gas toward the bottom surface of the substrate to carry the substrate into a vacuum process chamber of a press machine while keeping the substrate horizontally. A press plate holds the substrate, which is held by the transfer robot, by suction.
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| Apparatus for manufacturing bonded substrate | 20110011514 | 20110120 |
| The present invention provide an apparatus for manufacturing a bonded substrate that suppresses a defect in the bonded substrate. When the pressure in a vacuum chamber is at the atmospheric level, upper and lower chuck units respectively attract substrates through vacuum. When the vacuum chamber is depressurized, each chuck unit electrostatically attracts the associated substrate. During the depressurization of the vacuum chamber, the pressure for attracting each substrate to the associated chuck unit is controlled to be equal to the pressure in the vacuum chamber. This prevents each substrate from falling from or moving relative to the associated chuck unit. The first and second substrates are thus bonded together as accurately aligned.
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| Method and apparatus for producing large, single-crystals of aluminum nitride | 20110011332 | 20110120 |
| A method and apparatus for producing bulk single crystals of AlN having low dislocation densities of about 10,000 cm−2 or less includes a crystal growth enclosure with Al and N2 source material therein, capable of forming bulk crystals. The apparatus maintains the N2 partial pressure at greater than stoichiometric pressure relative to the Al within the crystal growth enclosure, while maintaining the total vapor pressure in the crystal growth enclosure at super-atmospheric pressure. At least one nucleation site is provided in the crystal growth enclosure, and provision is made for cooling the nucleation site relative to other locations in the crystal growth enclosure. The Al and N2 vapor is then deposited to grow single crystalline low dislocation density AlN at the nucleation site. High efficiency ultraviolet... |
| Memory system | 20110010606 | 20110113 |
| A memory system that can efficiently relieve a large number of defective bits with a small number of redundant bits is provided in a Flash-EEPROM nonvolatile memory. A memory system according to an embodiment of the present invention comprises a Flash-EEPROM memory in which a plurality of memory 5 having a floating gate or a charge trapping layer and capable of electrically erasing and writing data are arranged; a control circuit that controls a cache memory and the Flash-EEPROM memory; and an interface circuit that communicates with outside, wherein a plurality of group data and a plurality of flag data for storing presence of inversion of all bits of respective group data are stored in a memory area of the Flash-EEPROM memory.
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| Test apparatus and test method | 20090327822 | 20091231 |
| Provided is a test apparatus having a bad block memory for storing a plurality of pieces of fail information in association with blocks of a memory under test, each piece of fail information indicating whether there is a defect in the associated block. The test apparatus writes a test data sequence to a page under test of the memory under test, reads the test data sequence written to the page under test, and compares the read data sequence to the written data sequence. The test apparatus includes an allocation register that stores allocation information for setting which of the plurality of fail conditions for judging whether there is a defect in the page under test are allocated to the plurality of pieces of fail information. The... |
| Method of checking version number of encryption information, and optical disc playback device | 20090327359 | 20091231 |
| According to an embodiment of the present invention, the version number of encryption information on the device being used can be checked easily by the user by means of an external command. If this is a defect information version number, playback is not performed, and a display that prompts updating of the encryption information is made as required.
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| Method, system and apparatus for storing and querying session history records | 20090327247 | 20091231 |
| The present disclosure discloses a method, system and apparatus for storing and querying session history records. The method for storing session history records includes: receiving a request from the first server at the user side; judging whether the request carries a storage indication; if the request carries a storage indication, judging whether to store the session history records to be saved according to the storage policy. In the embodiments of the present disclosure, the storing of the session history records is managed uniformly, and the history record information of a session is stored only in the corresponding storage apparatus at the second server side rather than being stored in the network storage apparatus at each first server side, thus overcoming the defects of the prior art,... |
| Rotation sensing method and system | 20090326860 | 20091231 |
| A sensing system and method. A coded wheel is configured to generate a signal that varies with rotation of the coded wheel. A sensor is configured to sense the varying signal and output a corresponding signal. A correction module is configured to receive the signal output by the sensor and compare the received signal to a stored signal and detect a defect in the coded wheel in response to the comparison.
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| 1h-indazoles, benzothiazoles, 1,2-benzoisoxazoles, 1,2-benzoisothiazoles, and chromones and preparation and uses thereof | 20090325939 | 20091231 |
| The present invention relates generally to the field of ligands for nicotinic acetylcholine receptors (nAChR), activation of nAChRs, and the treatment of disease conditions associated with defective or malfunctioning nicotinic acetylcholine receptors, especially of the brain. Further, this invention relates to novel compounds (indazoles and benzothiazoles), which act as ligands for the α7 nAChR subtype, methods of preparing such compounds, compositions containing such compounds, and methods of use thereof.
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| Process for producing an in particular porous shaped ceramic body and shaped body produced thereby | 20090325442 | 20091231 |
| The invention relates to a method for producing an in particular porous molded ceramic article, which molded ceramic article is optionally reinforced with fibers and/or a semi-finished textile product such as woven fabric, wherein a powder A and at least one further powder B are suspended in a liquid, after which a molded article is formed from the suspension produced in this manner optionally in combination with fibers and/or a semi-finished textile product and the molded article is optionally sintered. It is provided according to the invention that the powders A and B are suspended approximately at a pH value of the liquid at which a viscosity minimum of the suspension is given, whereby high solids contents in the suspension can be adjusted with low viscosities.... |
| Method for manufacturing soi substrate | 20090325364 | 20091231 |
| To provide a technical means which is capable of increasing crystallinity and planarity of a single crystal semiconductor layer, crystal defects are reduced in such a manner that a single crystal semiconductor substrate, in which an insulating film is formed on its surface and an embrittlement region is formed in a region at a predetermined depth from the surface, and a supporting substrate are attached to each other with the insulating film interposed therebetween; the single crystal semiconductor substrate is separated in the embrittlement region by a heat treatment; a single crystal semiconductor layer is irradiated with laser light over the supporting substrate with the insulating film interposed therebetween; a surface of the single crystal semiconductor layer is etched; and a plasma treatment is performed on... |
| Method of reducing dislocation-induced leakage in a strained-layer field-effect transistor | 20090325358 | 20091231 |
| A structure and method of fabricating a semiconductor field-effect transistor (MOSFET) such as a strained Si n-MOSFET where dislocation or crystal defects spanning from source to drain is partially occupied by heavy p-type dopants. Preferably, the strained-layer n-MOSFET includes a Si, SiGe or SiGeC multi-layer structure having, in the region between source and drain, impurity atoms that preferentially occupy the dislocation sites so as to prevent shorting of source and drain via dopant diffusion along the dislocation. Advantageously, devices formed as a result of the invention are immune to dislocation-related failures, and therefore are more robust to processing and material variations. The invention thus relaxes the requirement for reducing the threading dislocation density in SiGe buffers, since the devices will be operable despite the presence of... |
| Methods for prenatal diagnosis of chromosomal abnormalities | 20090325232 | 20091231 |
| Chromosomal abnormalities are responsible for a significant number of birth defects, including mental retardation. The present invention is related to methods for non-invasive and rapid, prenatal diagnosis of chromosomal abnormalities based on analysis of a maternal blood sample. The invention exploits the differences in DNA between the mother and fetus, for instance differences in their methylation states, as a means to enrich for fetal DNA in maternal plasma sample. The methods described herein can be used to detect chromosomal DNA deletions and duplications. In a preferred embodiment, the methods are used to diagnose chromosomal aneuploidy and related disorders, such as Down's and Turner's Syndrome.
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| Method of determining susceptibility of a tumor cell to a chemotherapeutic agent: novel use of herpes | 20090325146 | 20091231 |
| The present invention provides a method of determining if a tumor cell is susceptible to killing by a chemotherapeutic agent, comprising: (a) providing a tumor cell; (b) infecting said tumor cell with a herpes simplex virus or a herpes simplex virus defective in an immediate early gene selected from the group consisting of ICP27, ICP4, and ICP22; and (c) determining the presence of apoptotic killing of said tumor cell, wherein the presence of apoptotic killing is indicative of susceptibility to said chemotherapeutic agent. Chemotherapeutic agent may include doxorubicin, etoposide, paclitaxel, cisplatin, or 5-fluorouracil. The present invention also provides a herpes simplex virus promoter construct having a lacZ gene to assess tumor resistance to chemotherapeutic agents.
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| Photomask manufacturing method | 20090325083 | 20091231 |
| A photomask manufacturing method includes a defect information storage step of storing defect information of a mask blank, provided with an identification marker on an end face thereof, into an information storage device in correspondence to the identification marker, a placing orientation determination step of determining a placing orientation of the mask blank with respect to an exposure/writing apparatus, and an orientation correction step of performing rotation control of a rotating apparatus so that an orientation of the mask blank coincides with the determined placing orientation.
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| Lithium secondary battery and method for producing the same | 20090325057 | 20091231 |
| Disclosed is a method for producing a lithium secondary battery, the method comprising the steps of: (a) distributing or scattering insulating powder partially or totally onto a surface of at least one of a cathode, an anode and a separator; (b) forming an electrode assembly by using the cathode, the anode and the separator; and (c) introducing the electrode assembly into a casing and sealing the casing. A lithium secondary battery obtained from the method is also disclosed. The method for manufacturing a lithium secondary battery, including a step of scattering insulating powder partially or totally onto the surface of a separator or the surface of at least one electrode facing to the separator, significantly reduces generation of an internal short circuit between both electrodes caused... |
| Cmc articles having small complex features | 20090324878 | 20091231 |
| A ceramic matrix composite (CMC) component for gas turbine engines, the component having fine features such as thin edges with thicknesses of less than about 0.030 inches and small radii of less that about 0.030 inches formed using the combination of prepreg plies layed up with non-ply ceramic inserts. The CMC components of the present invention replace small ply inserts cut to size to fit into areas of contour change or thickness change, and replace the small ply inserts with a fabricated single piece discontinuously reinforced composite insert, resulting in fewer defects, such as wrinkles, and better dimensional control.
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| Curable resin composition and process for producing cured coating using the same | 20090324831 | 20091231 |
| Disclosed is a curable resin composition which contains a copolymer; and an organic solvent having a boiling point of 180° C. or higher at atmospheric pressure, which copolymer contains monomer units (A) having an alkali-soluble group, and monomer units (B) corresponding to curable group-containing polymerizable unsaturated compounds. The copolymer contains the monomer units (B) in a content of 5 to 95 percent by weight, based on the total weight of monomer units constituting the copolymer, and the monomer units (B) contain 30 percent by weight or more of monomer units corresponding to at least one compound selected from compounds containing an 3,4-epoxytricyclo[5.2.1.02,6]decane ring. The curable resin composition gives a coat which is superior typically in transparency and thermal stability and does not suffer from uneven thickness... |
| Cartilage filling device | 20090324722 | 20091231 |
| Compositions and methods for treating a tissue defect.
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| Controlled release tissue graft combination biomaterials | 20090324683 | 20091231 |
| In one aspect, the invention relates to tissue graft combination biomaterials capable of controlled release of bioactive agents or pharmaceutically active agents through a rate-controlling polymer coating encapsulating the graft material, methods for preparing same, methods of controlled release using same, and methods for treating tissue defects. This abstract is intended as a scanning tool for purposes of searching in the particular art and is not intended to be limiting of the present invention.
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| Chloramphenicol acetyl transferase (cat)-defective somatostatin fusion protein and uses thereof | 20090324629 | 20091231 |
| Chimeric somatostatin-based polypeptides, polynucleotides used to encode the polypeptides, the methods for isolating and producing the polypeptides and the uses thereof are provided. In addition, low cost adjuvants for enhanced immunogenic response are provided. Vaccinations that include both chimeric somatostatin-based polypeptides and novel adjuvants are included, useful in facilitating farm animal productivity.
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| Effect of hydrocarbon and transport gas feedstock on efficiency and quality of grown single-walled nanotubes | 20090324484 | 20091231 |
| Methods and processes for synthesizing high quality carbon single-walled nanotubes (SWNTs) are provided. The method provides the means for optimization of amount of carbon precursor and transport gas per unit weight of catalyst. Efficiencies of about 20% can be achieved when contacting the catalyst deposited on a support with a carbon precursor gas with a flow rates of about 4.2×10−3 mol CH4/sec·g (Fe) at 780 ° C. Hydrocarbon flow rates of about 1.7 10−2 mol CH4/sec·g (Fe) and higher result in faster carbon SWNTs growth with improved quality. Slower rates of carbon atoms supply (˜4.5×1020 C atoms/s·g Fe or 6.4×10−4 mol CH4/sec·g (Fe)) result in the formation of more defective nanotubes.
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| Optical inspection tools featuring parallel post-inspection analysis | 20090324057 | 20091231 |
| An optical inspection tool can automatically perform analysis/operations that after the tool has generated data identifying defects (e.g. a defect list) from an inspection run of an object such as a semiconductor wafer. The tool can decouple post-inspection tasks from performing inspection runs so that one or more post-inspection tasks are performed on defect data from a previous inspection run while another inspection run is in progress. This can significantly improve the throughput of the tool when multiple inspections are performed, since the inspection run time effectively is shortened to include only the time the tool is actually used to acquire defect data. One or more post-inspection tasks can be performed, including, but not limited to, merging inspection runs, removing duplicate defects, removing straight-line false alarms,... |
| Polarization imaging | 20090324056 | 20091231 |
| A system and method for inspection a substrate for various defects is herein disclosed. Polarizing filters are used to improve the contrast of polarization dependent defects such as defocus and exposure defects, while retaining the same sensitivity to polarization independent defects, such as pits, voids, cracks, chips and particles.
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| System and method for generating spatial signatures reference to related applications | 20090324055 | 20091231 |
| A system and method for spatial signature analysis, the system includes a memory unit for storing wafer defect density maps of multiple resolutions, derived from a defect map obtained by an inspection tool; an analyzer for analyzing the wafer defect density maps to identify zones of interest; and a spatial signature generator for generating spatial signatures in response relations between zones of interest of different density resolution.
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| System and method for determing reticle defect printability | 20090324054 | 20091231 |
| A method and software program for determining printability of a defect on a reticle or photomask onto a substrate during processing. That is performed by creating a pixel grid image having a plurality of individual pixel images showing the defect. A gray scale value is assigned to each pixel image of the pixel grid image and a probable center pixel of the defect is selected. Then the polarity of the defect is determined, with a coarse center pixel of the defect optionally selected using the probable center defect and polarity of the defect. If a coarse center pixel is selected, then a fine center of the defect can optionally be selected from the coarse center pixel and polarity of the defect. From the center pixel the... |
| Semiconductor memory repairing a defective bit and semiconductor memory system | 20090323417 | 20091231 |
| A semiconductor memory has a plurality of blocks, and each of the blocks comprises a plurality of pages, and further, each of the pages has a plurality of memory cells. A block having defective bits less than N (N is an integer number more than 0) in all pages of the block stores a first data showing a normal block. A block including at least one page having defective bits more than N and including no page having defective bits more than M (M is an integer number of M>N) stores a second data showing a psedo-pass block as a pseudo-normal block. A block including at least one page having defective bits more than M stores a third data showing a defective block.
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| Flash memory array system including a top gate memory cell | 20090323415 | 20091231 |
| A memory system includes memory cells arranged in sectors. A decoder corresponding to a sector disables memory cells having a defective top gate. The decoder may include a low voltage or high voltage latch for the disabling. A top gate handling algorithm is included. The memory system may include dynamic top gate coupling. A programming algorithm and waveforms with top gate handling is included.
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| Servo signal recording method and magnetic disk apparatus | 20090323213 | 20091231 |
| An MCU included in a magnetic disk apparatus determines, as a defective track, a track in which a servo signal abnormality is generated in a servo sector of the magnetic disk, and performs control to rewrite the servo signal to the defective track based on servo signal information for one round of a normal track in which the servo signal is normally written.
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| Method for inspecting defect and apparatus for inspecting defect | 20090323054 | 20091231 |
| The present invention is an apparatus for inspecting foreign particles/defects, comprises an illumination optical system, a detection optical system, a shielding unit which is provided in said detection optical system to selectively shield diffracted light pattern coming from circuit pattern existing on an inspection object and an arithmetic processing system, wherein said shielding unit comprises a micro-mirror array device or a reflected type liquid crystal, or a transmission type liquid crystal, or an object which is transferred a shielding pattern to an optical transparent substrate, or a substrate or a film which is etched so as to leave shielding patterns, or an optical transparent substrate which can be changed in transmission by heating, sudden cold, or light illumination, or change of electric field or magnetic field,... |
| Optical inspection method and optical inspection apparatus | 20090323051 | 20091231 |
| An optical inspection apparatus irradiates a light beam onto the outer surface of an object to be inspected, in the form of an illumination spot having an illumination intensity which is higher in the outer peripheral part of the object to be inspected than in the inner peripheral part thereof while uniformly maintains a temperature rise caused by the irradiation of the light beam, over the outer surface of the object to be inspected, in order to prevent the effective entire signal value of a scattered light signal from lowering, without lowering the linear speed of a movable stage for the object to be inspected in the outer peripheral part of the object to be inspected, thereby it is possible to prevent lowering of the detectability... |
| Liquid crystal display panel and method of fabricating the same | 20090323001 | 20091231 |
| The liquid crystal display panel comprises: an array substrate having a pixel part and a color filter substrate; a seal line formed along an outer edge of the pixel part to attach the array substrate and the color filter substrate together; a plurality of signal wires for transmitting signals to the pixel part; and holes formed within the signal wires passing through the seal line and filled with a sealant comprising the seal line, wherein the holes are designed to have a different width at an inner side and an outer side of the liquid crystal display panel with respect to a predetermined region of the seal line.
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| Method and device for the detection of defective pixels of an image recording sensor, preferably in a driver assistance system | 20090322879 | 20091231 |
| In a method and an apparatus for detecting defective pixels of an image acquisition sensor, preferably in a driver assistance system, brightness values are evaluated statistically for each pixel while the image acquisition sensor is being operated as intended for image acquisition, at least one comparable parameter being determined for statistical evaluation for each pixel from the ascertained brightness values, and that parameter being compared with at least one predefinable reference value; and a defective pixel being detected when the at least one parameter determined for the relevant pixel meets a predefinable condition with respect to the at least one reference value.
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| Measuring arrangement, semiconductor arrangement and method for operating a semiconductor component as a reference source | 20090322371 | 20091231 |
| The invention relates to a measuring arrangement, a semiconductor arrangement and a method for operating a reference source, wherein at least one semiconductor component and a voltage source are connected to a measuring unit and the measuring unit provides a measured value that is proportional to the number of defects.
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| Method and apparatus for manufacturing electronic circuit board | 20080313893 | 20081225 |
| A method for manufacturing an electronic circuit board which contains an electronic circuit on a main surface of a glass substrate according to the invention sequentially performs a step of electrically inspecting the main surface of the glass substrate on which the electronic circuit is formed, a step of specifying positions and defect types of defects on the main surface of the glass substrate, a step of calculating reference point coordinates on the main surface of the glass substrate and correcting the coordinates, a step of extracting respective defects from an image around the defects and specifying a defect to be corrected in the extracted defects by referring to a defect existing range registered in advance for each defect type, and a step of cutting the... |
| System for sensing cigarette filters and method therefor | 20080314397 | 20081225 |
| The invention provides a system for sensing a cigarette filter, comprising: a plurality of rotary conveyance drums (12) delivering a first cigarette filter and second cigarette filters into which the first cigarette filter is divided by a cutter; two sensors (18) disposed adjacent to the rotary conveyance drum (12) to detect the second cigarette filters; an opto coupler connected to the two sensors (18) and operated by AND logic; a HIP connected to the opto coupler, it controlling a device of supplying cigarette filters to reject a cigarette having defects; and, a PLC connected with the HIP, it controlling the device of supplying cigarette filters, wherein the two sensors (18) detect active charcoal filters located at both ends of the second cigarette filters, the HIP controls... |
| Method of producing tire | 20080314494 | 20081225 |
| There is provided a method of producing a tire comprising the steps of: applying a chafer rubber 21 by spirally winding a rubber ribbon onto a base 15; applying a sidewall rubber 22 of a first color by spirally winding a rubber ribbon at a position on the base 15 spaced from the position where the chafer rubber is stuck; applying a sidewall rubber 23 of the second color by spirally winding a rubber ribbon between the chafer rubber sticking position and the first color sidewall rubber sticking position; and applying a cover rubber 24 of the first color over the entire surface of the sidewall rubber of the second color, wherein on the occasion when said chafer rubbers 21 or sidewall rubbers 23 of the... |
| Gas supply mechanism and substrate processing apparatus | 20080314523 | 20081225 |
| A processing gas supply hole is constituted with a gas outlet hole formed at an electrode plate and a gas injection hole formed at a processing gas supply mechanism main unit. At the gas injection hole, a processing gas having flowed in on the upstream side is injected toward the gas outlet hole through an injection opening of a nozzle portion disposed on the downstream side, so as to generate a suction force at a suction flow passage formed around the nozzle portion by taking advantage of the ejector defect.
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| Method for detecting defective electrodes in a micro-electrode matrix | 20080314765 | 20081225 |
| Method for detecting defective electrodes in a micro-electrode matrix The method for detecting defective electrodes in an electrode matrix comprises measurement of an electrochemical impedance spectrum for each of the electrodes. Modeling of the spectrum impedance relative to each electrode by means of an implicit non-integral frequency model is performed in the form of a parameter matrix. Principal components analysis of the matrix is performed to transform said parameter matrix into a final matrix containing decorrelated variables representing the parameter matrix in a new space. The distance between each electrode and a reference point is calculated. These calculated distances are compared with a preset threshold distance and the electrodes having a distance greater than the threshold distance are classified as being defective.
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| Objective lens, electron beam system and method of inspecting defect | 20080315090 | 20081225 |
| An electron beam system or a method for manufacturing a device using the electron beam system in which an electron beam can be irradiated at a high current density and a ratio of transmittance of a secondary electron beam of an image projecting optical system can be improved and which can be compact in size. The surface of the sample S is divided into plural stripe regions which in turn are divided into rectangle-shaped main fields. The main field is further divided into plural square-shaped subfields. The irradiation with the electron beams and the formation of a two-dimensional image are repeated in a unit of the subfields. A magnetic gap formed by the inner and outer magnetic poles of the objective lens is formed on the... |
| Scanning probe microscopy inspection and modification system | 20080315092 | 20081225 |
| A scanning probe microscopy (SPM) inspection and/or modification system which uses SPM technology and techniques. The system includes various types of microstructured SPM probes for inspection and/or modification of the object. The components of the SPM system include microstructured calibration structures. A probe may be defective because of wear or because of fabrication errors. Various types of reference measurements of the calibration structure are made with the probe or vice versa to calibrate it. The components of the SPM system further include one or more tip machining structures. At these structures, material of the tips of the SPM probes may be machined by abrasively lapping and chemically lapping the material of the tip with the tip machining structures.
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| Light emission using quantum dot emitters in a photonic crystal | 20080315177 | 20081225 |
| Devices and methods of manufacturing; for emitting substantially white light using a photonic crystal are described. The photonic crystal has a lattice of air holes and is made from a substrate containing quantum dots. The substrate is etched with three defects that are optically coupled together so that each emits only certain frequencies of light. In combination, the defects can produce substantially white light. The parameters of the photonic crystal are dimensioned so as to cause the coupling between the defects to produce substantially white light.
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| Thin film transistor, and active matrix substrate and display device provided with such thin film transistor | 20080315204 | 20081225 |
| A thin film transistor according to the present invention includes a gate electrode; an insulating film covering the gate electrode; a semiconductor layer provided on the insulating film; and a source electrode and a drain electrode provided on the insulating film and the semiconductor layer. The insulating film is a multiple layer insulating film including a first insulating layer and a second insulating layer provided on the first insulating layer. The multiple layer insulating film has a low stacking region excluding the first insulating layer and a high stacking region in which the first insulating layer and the second insulating layer are stacked. The first insulating layer is provided so as to cover at least an edge of the gate electrode. The semiconductor layer is provided... |
| System, apparatus and method of selective laser repair for metal bumps of semiconductor device stack | 20080315242 | 20081225 |
| Exemplary embodiments of the selective laser repair apparatus and method may allow the repair of metal bumps in a semiconductor device stack by applying a laser beam to a damaged and/or defective bump. Metal bumps may be repaired and individual chips and/or packages forming a device stack need not be separated. The operation of a control unit and a driving unit may position a laser unit such that a laser beam may be irradiated at the damaged and/or defective metal bump. An X-ray inspection unit may obtain information about the damaged and/or defective metal bump.
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| Image sensor and method for manufacturing the same | 20080315252 | 20081225 |
| An image sensor provides enhanced integration of transistor circuitry and photo diodes. The image sensor simultaneously improves resolution and sensitivity. An image sensor an a method for manufacturing prevents defects in a photo diode by adopting a vertical photo diode structure. An image sensor includes a substrate which may include at least one circuit element. A bottom electrode and a first conductive layer may be sequentially formed over the substrate. A strained intrinsic layer may be formed over the first conductive layer. A second conductive layer may be formed over the strained intrinsic layer. An upper electrode may be formed over the second conductive layer.
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| Image sensor and method of manufacturing the same | 20080315273 | 20081225 |
| An image sensor for minimizing a dark level defect is disclosed. The image sensor includes an isolation layer formed on a substrate. A field region and an active region are defined on the substrate by the isolation layer. A photodiode is formed in the image sensor in such a structure that a first region is formed below a surface of the substrate in the active region and a second region is formed under the first region. A first conductive type impurity is implanted into the first region and a second conductive type impurity is implanted into the second region. A dark current suppressor is formed on side and bottom surfaces of the isolation layer adjacent to the first region, and the dark current suppressor is doped... |
| Semiconductor device and manufacturing method for same | 20080315364 | 20081225 |
| After introducing oxygen into an N− type FZ wafer serving as an N− type first semiconductor layer, a P type second semiconductor layer and an anode are formed on a surface of the FZ wafer. The FZ wafer is irradiated with protons from the side of the anode, introducing crystal defects into the FZ wafer. By performing heat treatment to recover the crystal defects in the FZ wafer, the net doping concentration of a portion within the first semiconductor layer is made higher than the initial net doping concentration of the FZ wafer, and a desired broad buffer structure is formed. Accordingly, a semiconductor device with fast operation and low losses, and having soft switching characteristics, can be manufactured inexpensively using FZ bulk wafers, with good... |
| Method of manufacturing toothbrush with needle-shaped bristles and toothbrush manufactured by the same | 20080315669 | 20081225 |
| The present invention provides a method of manufacturing a toothbrush with needle-shaped bristles. The method includes the step of setting needle-shaped bristles, partially tapered by being immersed in a chemical, in a head part of a toothbrush body. The method further includes the step of grinding the needle-shape bristles using a drum grinder having protrusions such that end points of the bristles range from 0.01 to 0.03 mm in thickness and tapered portions of the bristles range from 3.5 to 8 mm in length. A toothbrush, in which needle-shaped bristles having end points of 0.03 to 0.05 mm in thickness and tapered portions of 3.5 to 10 mm in length are set, can be manufactured using the method of the present invention. In the present invention,... |
| Battery pack producing method and battery pack | 20080315835 | 20081225 |
| Provided is a battery pack producing method and a battery pack capable of suppressing defects such as overcharging or overdischarging in one or more of the used secondary batteries constituting a battery pack, and sufficiently exhibiting the performance of the used secondary batteries of the battery pack. This method includes an obtaining process for obtaining each full charge capacity of the used secondary batteries, a selecting process for selecting one or more used secondary batteries having similar full charge capacities from the used secondary batteries whose full charge capacities have been obtained, and an assembling process for assembling the selected secondary batteries.
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| Image display device | 20080315890 | 20081225 |
| An image display device includes a black spot defect position determination circuit which determines a position of a black-spot defective pixel of a self-luminous display panel. A detection-use current source in the black spot defect position determination circuit is connected to pixels during a period separate from a display period of data signals thus determining a black spot defect. The position of the black spot defect is stored in a storing circuit and is transmitted to a display and detection control circuit. The display and detection control circuit corrects the data signals to the pixels around the defective pixel based on a black spot defect position, and drives a data line drive circuit based on the corrected data signals thus visually correcting the black spot defect.
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| Methods and apparatus using one or more supernodes when testing for shorts between nodes of a circuit assembly | 20080315892 | 20081225 |
| A method of testing for shorts between nodes of a circuit assembly includes parsing circuit design data to identify positional data for nodes of a circuit assembly, and using the positional data to classify ones of the nodes as members of a supernode, where each member of the supernode is unlikely to be shorted to any other member of the supernode. Tests for shorts in a set of nodes that includes the supernode and a plurality of other nodes of the circuit assembly are then conducted, by iteratively i) stimulating a particular one of the set of nodes, and ii) while stimulating the particular node, grounding at least one other node in the set of nodes and monitoring a current flow through the particular node. When... |
| Test method and apparatus for spark plug insulator | 20080315895 | 20081225 |
| There is provided a test method for detecting the presence or absence of a defect in a spark plug insulator, including a reference voltage determination process, a test area determination process, a test voltage determination process and a current detection process. In the reference voltage determination process, a reference voltage VF is determined. In the test area and voltage determined processes, test area and voltage are determined so as not to incur a flashover on the basis of a reference insulator of the same material, shape and size as the spark plug insulator when the reference insulator is placed in position between first and second test electrodes. In the current detection step, the test voltage is applied between the first and second test electrodes to detect... |
| Inkjet printhead integrated circuit | 20080316239 | 20081225 |
| A printhead IC is provided which has an array of nozzles, drive circuitry for receiving print data and sending drive pulses of electrical energy to the array of nozzles in accordance with the print data, a temperature sensor connected to the drive circuitry to adjust the drive pulse profile in response to the temperature sensor output and open actuator test circuitry for selectively disabling the actuators when they receive a drive signal while comparing the resistance of the resistive heater to a predetermined threshold to assess whether the actuator is defective. During use, the temperature sensor can be de-activated after a period of use.
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| Camera module | 20080316329 | 20081225 |
| There is provided a camera module including: first and second image sensors having different optical characteristics and sensing images; first and second auxiliary image processors electrically connected to the first and second image sensors, respectively, and correcting optical defects of the images sensed by the first and second sensors, respectively; and an image signal processing section selecting at least one image between the images corrected by the first and second auxiliary image processors, and processing the selected image into an image signal that can be displayed, wherein at least one of the first and second image sensors may include: a center pixel array having a square shape; and first to fourth pixel arrays having one set of sides connected to sides of the center pixel array... |
| Liquid crystal display device and method of fabricating the same | 20080316406 | 20081225 |
| When radiating light onto a liquid crystal composition containing a photosensitive material, the alignment of liquid crystal molecules is adjusted by applying a voltage to the liquid crystal composition layer, to achieve substantially orderly alignment of the liquid crystal molecules, or the alignment of the liquid crystal molecules is made uniform by adjusting the structure of the liquid crystal display device, or any display defect is driven out of the display area. When radiating light to the liquid crystal composition containing the photosensitive material, the alignment of the liquid crystal molecules can be adjusted so as to achieve substantially orderly alignment of the liquid crystal molecules, and the liquid crystal display device can thus be driven stably.
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| Method and device for the correction of imaging defects | 20080316444 | 20081225 |
| The disclosure relates to a microlithography projection exposure system having optical corrective elements configured to modify the imaging characteristics, as well as related systems and components.
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| Defect inspection apparatus and defect inspection method | 20080316475 | 20081225 |
| An apparatus and a method for defect inspection enables a reduction in the amount of noise light from an underlying layer and a good defect inspection reliably. The apparatus includes an illumination device that irradiates, with illumination light, a substrate to be inspected including a resist layer having cyclic patterns formed on the upper layer, and an optical image forming system that forms an image of the substrate to be inspected according to light that emerges from the substrate to be inspected by the irradiation with illumination light. The wavelength of the illumination light is set so that intensity of the light from the surface of the resist layer, among the light emerged from the substrate to be inspected, is greater than that of light that... |
| Method and apparatus for data capture from imaged documents | 20080316552 | 20081225 |
| Methods and apparatus are disclosed for locating an area of interest within a digital image of a form captured by an imaging scanner. Specific examples include methods and apparatus for optical mark reading with a digital imaging scanner. In many of the methods, an image of a response form is captured by a scanner, and “target” areas for possible responses are located within the image based upon an expected location being adjusted as necessary for certain error-inducing defects in the forms or scanning process. Also disclosed are steps to normalize the darkness values of pixels captured from an optically scanned form.
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| Waveguide and light emitting device having the same | 20080316766 | 20081225 |
| A waveguide based on a three-dimensional photonic crystal is arranged to provide wave-guiding in a single mode and a mode having a field strength distribution with unimodality in a plane perpendicular to the wave-guiding direction, to thereby enable wave-guiding in a desired frequency band, wherein the three-dimensional photonic crystal has a plurality of line defect members which include a first line defect member made of a medium having a refractive index not smaller than that of the columnar structures and formed in a direction perpendicular to the direction in which the columnar structures extend, and a second line defect member formed in the same direction as the first line defect member.
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| Selection method of bit line redundancy repair and apparatus performing the same | 20080316844 | 20081225 |
| A selection method of bit line redundancy repair includes the steps of providing a plurality of logical addresses of memory blocks in the normal cell array, generating a plurality of extra fuse signals, generating a code based on states of the extra fuse signals, the code matching a defective type of the memory blocks, and selecting a plurality of redundancy blocks in the redundancy cell array to replace the memory blocks according to the code. The apparatus includes a redundancy repair enable circuit for generating a redundancy enable signal based on logical addresses of the memory blocks, a controlling fuse circuit for sending a code matching a defective type of the memory blocks, and a redundancy decoder circuit for receiving the redundancy enable signal and the... |
| Multi-layered information recording medium, reproduction apparatus, recording apparatus, reproduction method, and recording method | 20080316884 | 20081225 |
| A multi-layered information recording medium comprising a plurality of recording layers, a user data area for recording user data, provided in at least two of the plurality of recording layers, and a defect list storing area for storing a defect list. When at least one defective area is detected in the user data area, the defect list is used to manage the at least one defective area.
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| Apparatus and method for multi-protocol label switching label-switched path protection switching | 20080316920 | 20081225 |
| Provided are system and method for multi-protocol label switching (MPLS) label-switched path (LSP) protection switching in an MPLS system employing a working LSP and a protection LSP in a 1:1 mode, the apparatus and method prepare a dedicated LSP for one working LSP and are capable of rapidly processing a forward defect indication (FDI)/backward defect indication (BDI) signal when a failure occurs on the working LSP. The system includes: an ingress node multicasting input MPLS traffic through the working LSP and the protection LSP using a fed-back BDI signal; a transit node relaying the MPLS traffic input from the ingress node, and generating a FDI signal when the failure occurs; and an egress node extracting the MPLS traffic from the MPLS LSP input from the transit... |
| Visual inspection method and apparatus and image analysis system | 20080317329 | 20081225 |
| An image feature is calculated based on the image of a detected defect, a coordinate feature is calculated based on position coordinates of the detected defect, and false alarm judgment is performed according to a decision tree constructed by threshold processing to the image feature or the coordinate feature.
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| Circuit-pattern inspecting apparatus and method | 20080317330 | 20081225 |
| A circuit pattern inspection apparatus and inspection method facilitate the creation of a recipe and the confirmation of a defect. The apparatus and method employ a dialogue-based operation for the creation of a recipe and the confirmation of a defect. Input items (such as contrast, calibration, etc.) for the recipe creation and their purposes are clarified. Input items (such as clustering, filtering, etc.) for the defect confirmation and their purposes are also clarified. The results obtained on the basis of these inputs are registered in the recipe.
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| Methods to improve the in-film defectivity of pecvd amorphous carbon films | 20070295272 | 20071227 |
| An article having a protective coating for use in semiconductor applications and methods for making the same are provided. In certain embodiments, a method of coating an aluminum surface of an article utilized in a semiconductor processing chamber is provided. The method comprises providing a processing chamber; placing the article into the processing chamber; flowing a first gas comprising a carbon source into the processing chamber; flowing a second gas comprising a nitrogen source into the processing chamber; forming a plasma in the chamber; and depositing a coating material on the aluminum surface. In certain embodiments, the coating material comprises an amorphous carbon nitrogen containing layer. In certain embodiments, the article comprises a showerhead configured to deliver a gas to the processing chamber.
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| Mounting system for a solar panel | 20070295392 | 20071227 |
| An integrated module fame and racking system for a solar panel is disclosed. The solar panel comprises a plurality of solar modules and a plurality of splices for coupling the plurality of solar modules together. The plurality of splices provide a way to make the connected modules mechanically rigid both during transport to the roof and after mounting for the lifetime of the system, provide wiring connections between modules, provide an electrical grounding path for the modules, provide a way to add modules to the panel, and provide a way to remove or change a defective module. Connector sockets are provided on the sides of the modules to simplify the electrical assembly of modules when the modules are connected together with splices.
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| Mounting system for a solar panel | 20070295393 | 20071227 |
| An integrated module fame and racking system for a solar panel is disclosed. The solar panel comprises a plurality of solar modules and a plurality of splices for coupling the plurality of solar modules together. The plurality of splices provide a way to make the connected modules mechanically rigid both during transport to the roof and after mounting for the lifetime of the system, provide wiring connections between modules, provide an electrical grounding path for the modules, provide a way to add modules to the panel, and provide a way to remove or change a defective module. Connector sockets are provided on the sides of the modules to simplify the electrical assembly of modules when the modules are connected together with splices.
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| Method and composition for polishing a substrate | 20070295611 | 20071227 |
| Polishing compositions and methods for removing conductive materials from a substrate surface are provided. In one aspect, a composition includes an acid based electrolyte system, one or more chelating agents, one or more corrosion inhibitors, one or more inorganic or organic acid salts, one or more pH adjusting agents to provide a pH between about 2 and about 10, a polishing enhancing material selected from the group of abrasive particles, one or more oxidizers, and combinations thereof, and a solvent. The composition may be used in an conductive material removal process including disposing a substrate having a conductive material layer formed thereon in a process apparatus comprising an electrode, providing the composition between the electrode and substrate, applying a bias between the electrode and the substrate,... |
| Heat insulated container | 20070295684 | 20071227 |
| An object is to prevent cracking of a radiant heat preventing film which occurs near an opening area. A heat insulated container 10 produced by coating an external surface of a glass internal container 12 with a radiant heat preventing film 24, disposing the internal container 12 inside an external container 16 with a gap 14 interposed therebetween, heating an opening area so as to melt the same to thereby unite the internal container 12 with the external container 16, and evacuating the gap 14 to a vacuum, is characterized in that a region 26 not coated with the radiant heat preventing film 24 is provided in the vicinity of the opening area of the external surface. As a result, cracking does not occur in the... |
| Rocking wastebasket or bin for paper shredder | 20070295842 | 20071227 |
| A rocking wastebasket or bin for paper shredder, including a machine body having cutting blades therein and a wastebasket or bin for containing paper chips, wherein the wastebasket or bin has a section of planar placement surface at a bottom thereof, and the planar placement surface is provided with arcuate faces between the planar placement surface and engagement portions at the bin walls, such that when the user rocks the wastebasket or bin forwards and backwards, or sideways, the chips in the chip mountain accumulated beneath the discharge port at the cutting blades can be spread outwards, so as to increase the space for receiving the paper chips in the wastebasket or bin, and to prevent the “chip mountain” from impeding smooth falling of subsequent paper... |
| Exhaustive diagnosis of bridging defects in an integrated circuit | 20070296443 | 20071227 |
| A method, system and computer program product for diagnosing a bridging defect in an integrated circuit including multiple nodes are disclosed. Quiescent power supply current (IDDQ) of the integrated circuit (IC) is measured under multiple test vectors. Logic states of the nodes on the IC are also obtained under the multiple test vectors. The nodes are partitioned into sets based on their logic states under low-current test vectors. Large sets are further divided into subsets (“state-count subsets”) based on the logic states of nodes under high-current test vectors. For large sets, explicit evaluation under the IDDQ bridge fault model is performed only on pairs of nodes belonging to subsets having complementary state counts, to save system resources in computation. Exhaustive diagnosis considering all pairs of nodes... |
| Monitoring pattern for detecting a defect in a semiconductor device and method for detecting a defect | 20070296447 | 20071227 |
| A monitoring pattern for detecting a defect in a semiconductor device allows a voltage contrast inspection which may be verified by an electrical test where no special test pattern is required for the electrical test. The monitoring pattern includes a test pattern with line shapes arranged in parallel and spaced apart at predetermined linewidths and intervals, and an interconnection layer connected to the test pattern, where the test pattern is adapted to be charged with a specific potential to be displayed as a voltage contrast image when scanned with an electron beam.
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| Lcd test device and test process thereof | 20070296451 | 20071227 |
| An LCD test device and a test process thereof are disclosed, in which a defect of an LCD panel is exactly identified through exact electrical connection between an LCD panel and a probe unit. The LCD test device includes a work table on which an LCD panel is mounted, a clamping unit on the work table, clamping a top surface of an edge of the LCD panel mounted on the work table, a probe unit electrically connected with a pad of the LCD panel fixed to the work table by the clamping unit, and a back light unit supplying light to the LCD panel fixed to the work table. Accordingly, since the defect of the LCD panel can be tested exactly, reliability of the test is... |
| Fault tolerant integrated circuit architecture | 20070296458 | 20071227 |
| The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the... |
| Resilient integrated circuit architecture | 20070296459 | 20071227 |
| The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the... |
| Gate driving circuit and display apparatus having the same | 20070296662 | 20071227 |
| In a gate driving circuit and a display apparatus, the gate driving circuit comprises a plurality of stages. At least one of the stages comprises a pull-up section responsive to a first node signal; a pull-down section responsive to a second input signal; a discharging section discharging the first node signal in response to the second input signal; a first holding section responsive to the first clock signal, maintaining the first node signal at the off-voltage; and a second holding section responsive to the second clock signal, maintaining the first node signal at the off-voltage. The second holding section has a greater transistor width-to-length ratio than the first holding section. Therefore, an abnormal gate-on signal is less likely to occur, reducing driving defects of the display... |
| Lcd substrates | 20070296880 | 20071227 |
| A substrate for an LCD includes a transparent substrate, a pixel electrode, first and second storage wirings, and a storage duplication wiring. The pixel electrode is patterned as a unit pixel area on a thin film transistor layer formed on the substrate. The pixel electrode includes a first sub electrode receiving a first pixel voltage from the thin film transistor layer and a second sub electrode electrically separated from the first sub electrode and receiving a second pixel voltage. The first and second storage wirings are formed in the unit pixel area and respectively maintain the first and second pixel voltages during an image frame. The storage duplication wiring is formed along edges of the unit pixel area and is electrically connected to the first and... |
| Surface inspection apparatus and surface inspection method | 20070296962 | 20071227 |
| A surface inspection apparatus (1) for detecting a defect appearing on the surface of a sample (2) on which a pattern has been formed by a prescribed manufacturing process comprises: a defect detection unit (20, 24) for detecting a defect appearing on the surface of the sample (2); and a process recipe evaluation information acquiring unit (53) for acquiring prescribed process recipe evaluation information based on a detection result obtained when a known standard defect formed in advance on the sample by the manufacturing process is detected by the defect detection unit (20, 24), the prescribed process recipe evaluation information differing depending on the process recipe used in the prescribed manufacturing process.
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| Mastering device, disc manufacturing method, disc-shaped recording medium, disc reproduction device, and disc reproduction method | 20070297318 | 20071227 |
| Second digital information serving as copyright protection information can be stably and reliably read without any effect of a defect or pit missing on a disk-shaped recording medium. Second digital information is recorded onto a disk-shaped recording medium by wobbling a pit sequence recorded as a first signal. The second digital information is recorded so that a plurality of bits constituting the second digital information are allocated in a unit period of an identical sync signal contained in the first signal. During playback, the plurality of bits constituting the recorded second digital information are read a plurality of times every unit period of the sync signal, and information of the read bits is then integrated. Thus, information from a large number of wobbled pits across unit... |
| Information processor with digital broadcast receiver | 20070297342 | 20071227 |
| According to one embodiment, an information processor comprises an error detection circuit having at least one of a synchronous byte interval detection circuit, a synchronous byte comparison circuit and an error indication comparison circuit which receives digital information, transmitted as packet data, by a digital tuner unit and detects packet data having defects as an error in the sequentially received packet data from intervals of synchronous bytes, values of the synchronous bytes or values of error indications, and mounts a digital broadcast receiver to reproduce information from the packet data from which the packet data having the defects have been removed.
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| Edge smoothing filter for character recognition | 20070297688 | 20071227 |
| A system and method for correcting defects in a black white image. A character recognition system is disclosed that processes character data from a black white image, including: an edge smoothing filter that examines blocks of pixels in the black white image to determine if an indent or protrusion defect exists, and if so corrects the defect in a filtered image; and a recognition engine examines the filtered image and extracts character information.
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| Cctv pipeline inspection system data management system and computer-based monitoring/action application | 20070297752 | 20071227 |
| The Invention provides specific and proprietary means to digitally record CCTV inspection Header Information, Defect Observation Data, GPS information, and Distance Information; combine this data into a single digital file; and store it within single video files preferable over digital video format like MPEG, DiviX, Microsoft Windows Media, DVD, or related formats—from which it may be retrieved by compatible application software and serve as a basis for inspection viewing, reviewing, evaluation, mapping, report generation, and other uses provided or supported by compatible application software features. Formatted media can be played with media player like Microsoft media player, real player, Dix Player, Quick time player like computer based player and/or with any external media player like DVD player which can be connected to system like television for... |
| Sb-te alloy sintered compact sputtering target | 20070297938 | 20071227 |
| Provided is an Sb—Te alloy sintered compact sputtering target having at least Sb or Te as its primary component, wherein surface roughness Ra is 0.4 μm or less, purity excluding gas components is 4N or more, content of gas components as impurities is 1500 ppm or less, and average crystal grain size is 50 μm or less. With this Sb—Te alloy sintered compact sputtering target, the density of defects having a maximum length of 10 μm or greater arising in a surface finish by machining is 80 or less in an 800 μm square. Thus, the Sb—Te alloy sputtering target structure can be uniformalized and refined, generation of cracks in the sintered target can be inhibited, and generation of arcing during sputtering can be inhibited. Further,... |
| Injectable composition for treatment of skin defects or deformations | 20070298005 | 20071227 |
| Provided are injectable compositions for correction of skin contour defects or deformations. Also provided are methods of use and manufacturing of compositions for correction of skin contour defects or deformations.
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| Photoreactive compound specifically binding to calcium binding proteins | 20070298120 | 20071227 |
| The present invention provides a photoreactive reagent that binds specifically to Ca2+-binding proteins, links to them covalently after photo-activation, and labels them. The novel reagent enables the characterization, purification, inhibition and screening of Ca2+-binding proteins, as well as the preparation of a new affinity chromatography matrix and a new protein biosensor. The invention also relates to the use of the reagent in inhibiting apoptosis and necrosis and in diagnosing a disorder associated with a defect in the function of a Ca2+-binding protein, and in the preparation of a medicament for treating such disorders.
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| Method of transferring and liquid coating apparatus | 20070298181 | 20071227 |
| A transfer method including the steps of floating a transfer sheet 101 on the water surface of a transfer bath 11, coating an activator 14 onto the transfer sheet 101, immersing a transfer target 15 into the transfer bath from above the transfer sheet 101 to transfer the transfer sheet thereon, and after washing away the base material 102 with water, drying the transfer target 15 onto which the coating film 105 has been transferred so as to cure the coating film 105, wherein in the step of coating an activator onto the transfer sheet to activate the same, a pressure of not less than 0.008 MPa and not more than 0.040 Mpa is applied to the nozzle head 3 which includes a plurality of nozzles... |
| Method for high-temperature annealing a multilayer wafer | 20070298363 | 20071227 |
| A method for annealing a multilayer wafer by subjecting the wafer to a high temperature treatment that includes at least a temperature ramp-up between a boat-in temperature and a process of at least 800° C.; at least a processing phase in the range conduct at or above the process temperature; and a temperature ramp-down from the processing phase to a boat-out temperature. The boat-in temperature is sufficiently lower than the boat-out temperature to reduce or avoid tearing-off defects on the wafer and to reduce particle contaminants on the wafer, as well as to reduce or avoid degrading wafer Dit compared to an annealing method where the boat-in and boat-out temperatures are closer in temperature.
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| Adenoviral amplicon and producer cells for the production of replication-defective adenoviral vectors, methods of preparation and use thereof | 20070298498 | 20071227 |
| The present invention relates to a plasmid that can be used for the development of efficient producer cell lines for the production of helper independent adenovirus vectors carrying multiple deletions of non-structural as well as structural genes. More specifically, the present invention provides producer cells which comprise a novel adenoviral amplicon that can be used to complement a multi-deleted adenoviral vectors and obtain high titer preparations. The amplicon is an episomal plasmid that expresses Ad5 E2 viral genes (i.e., polymerase, pre-terminal protein and DNA binding protein) and E4 orf6, the EBV the latent origin of replication (OriP) as well as adenoviral origins of replications in form of a covalent junction of left and right ITRs. This plasmid is capable of self-replication upon induction of Ad5 E2... |
| Silicon wafers and method of fabricating the same | 20070298523 | 20071227 |
| By using a two-step RTP (rapid thermal processing) process, the wafer is provided which has an ideal semiconductor device region secured by controlling fine oxygen precipitates and OiSFs (Oxidation Induced Stacking Fault) located on the surface region of the wafer. By performing the disclosed two-step rapid thermal process, the distribution of defects can be accurately controlled and an ideal device active zone can be formed up to a certain distance from the surfaces of the wafer. In addition, it is possible to maximize the internal gettering (IG) efficiency by enabling the oxygen precipitates and the bulk stacking faults to have constant densities in the depth direction in an internal region of the wafer, that is, the bulk region. In order to obtain the constant concentration profile... |
| Quantum well intermixing in semiconductor photonic devices | 20070298531 | 20071227 |
| A method for fabricating a semiconductor device in a semiconductor structure, provides enhanced quantum well intermixing in desired regions of the device by forming a first, relatively high quality, epitaxial layer on a substrate, the high quality layer including a quantum well; forming a second, relatively lower quality, epitaxial defect layer on top of the high quality layer, and thermally processing the structure to effect at least partial diffusion of the defects from the defect layer into the high quality layer in order to achieve quantum well intermixing in the structure. The use of an epitaxially grown defect layer on top of, or within, a high quality epitaxially grown device body enables quantum well intermixing techniques to be performed at lower temperatures and thereby improves device... |
| Auto repair structure for liquid crystal display device | 20070298631 | 20071227 |
| An auto repair structure for liquid crystal display device includes a data line and a gate line. A protective film is formed over the data line and the gate line. A conductive layer and a plurality of contact holes are formed on the protective film. If the data line or the gate line has an open circuit defect, the signal passes through the conductive layer, thereby automatically repairing the liquid crystal display device.
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| Pad cleaning method | 20070298692 | 20071227 |
| A method for cleaning a polishing pad is disclosed. In CMP and ECMP, a polishing pad must be conditioned to obtain good and predictable polishing results. During conditioning, debris is generated that must be removed to prevent processing defects. An effective method to clean a polishing pad is disclosed herein. In one embodiment, a washing fluid is directed at the pad to clean debris from the while a second fluid is utilized to remove the washing fluid. In another embodiment, the washing fluid is provided by a high pressure water jet while the second fluid is provided by an air knife.
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| Method for manufacturing silicon carbide based honeycomb structure and silicon carbide based honeycomb structure | 20070298958 | 20071227 |
| There is provided a method for manufacturing a silicon carbide based honeycomb structure, the method using, as a part of a starting material, a recycled raw material recycled from a recovered material generated in a process for manufacturing the silicon carbide based honeycomb structure and derived from a starting material for a silicon carbide based honeycomb structure; wherein the recycled raw material is pulverized to have an average particle size of 10 to 300 μm. According to the present invention, structure defects such as voids or coarse particles, which have been problems upon manufacturing a silicon carbide based honeycomb structure, are hardly formed, and a silicon carbide based honeycomb structure having excellent strength and uniform heat conductivity can be obtained. In addition, since a once kneaded... |
| Superconducting coil testing | 20070298971 | 20071227 |
| A method of testing a superconducting coil path formed in a layer of superconducting material. The material is provided on a former (6) having a substantially curved surface. The method comprises the step of scanning the layer to detect defects in the layer.
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| Technique for predicting over insertions for partial grids and defective z-pins | 20060288555 | 20061228 |
| In accordance with the present invention, there is provided a technique which may be used in conjunction with an automated Z-pin insertion process to automatically monitor the insertion energy applied to the Z-pins during the initial insertion phase of the automated insertion process, and compare it to an empirically derived value for good insertions, thereafter allowing the insertion process to continue to a predetermined additional insertion depth before terminating the process. The insertion energy is calculated by cumulatively summing the insertion force and multiplying it by the insertion time, thus yielding the cumulative energy. At a specified, predetermined insertion depth, the energy accumulation is stopped and the value at the initial insertion depth is stored and compared to an empirically derived value. If the value is... |
| Method and apparatus for scanning corrosion and surface defects | 20060288756 | 20061228 |
| The present invention relates to a method and an apparatus for determining the life span for secure use of a pipeline comprising the steps of a) defining an area for surface corrosion analysis on the pipeline, b) providing a corrosion scanning system for scanning the defined area on the pipeline, c) localizing and measuring the corrosion on the surface of the defined area by means of the corrosion scanning system, d) determining the remaining wall-thickness of the pipeline at the defined area by means of the corrosion scanning system, and e) processing the surface condition data related to corrosion at the defined area obtained in steps c) and d) to determine the life span for secure use of the pipeline. In another aspect the present invention... |
| System and method of monitoring the quality of cutting | 20060289086 | 20061228 |
| A method and system for monitoring the quality of log cutting either off-line or in real-time is based on optical measurement of half-squared or full-squared cants characteristics as produced at primary or secondary cutting stage, so as to increase the proportion of high-value wood pieces that can be recovered from full squared-cants produced at the sawing stage. The log is fed lengthwise to a primary cutting station (canter) capable of producing the first pair of opposing cut faces, while guiding the log substantially in a direction of the machine axis. The profile of the peripheral log surface at a plurality of cross-sections along the machine axis is measured to generate corresponding post-cut profile data, from which an estimation of log raw profile characteristics is made, to... |
| Ito sputtering target | 20060289303 | 20061228 |
| Provided are an ITO sputtering target wherein the number of particles having a grain diameter of 100 nm or greater exposed in the ITO sputtering target as a result of royal water etching or sputter etching is 1 particle/μm2, and an ITO sputtering target having a density of 7.12 g/cm3 or greater capable of improving the sputtering performance, in particular inhibiting the generation of arcing, suppressing the generation of defects in the ITO film caused by such arcing, and thereby effectively inhibiting the deterioration of the ITO film.
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| Method for producing defect free composite membranes | 20060289350 | 20061228 |
| A defect free semipermeable composite membrane having excellent integrity and high water permeability is provided. Said composite membrane comprises an inside support layer to provide sufficient mechanical strength; an outside barrier layer to provide selective separation; and a middle layer to provide both physical adhesion and chemical binding between said support and said barrier layer to bond them together. Three different methods for making said defect free composite membrane are discovered. These methods have been successfully utilized to produce high quality coatings and defect free composite membranes, which are independent of chemical composition and physical structure of said support. In the present invention, ultrasonic sonication is discovered to be effective to speed up the phase inversion process of a membrane casting solution, thus allows produce a... |
| Observing method and its apparatus using electron microscope | 20060289752 | 20061228 |
| The present invention relates to high-speed acquisition of both a perpendicular observation image and a tilt observation image, in observation using a scanning electron microscope. An electron-beam observation apparatus includes: a first electro-optical system which scans a converged electron beam from a substantially perpendicular direction to a defect on a target wafer to be observed, and acquires a defect image signal with perpendicular observation by detecting a secondary electron image or a reflected electron image generated from the defect; and a second electro-optical system which scans a converged electron beam from a tilt direction to the defect, and acquires a defect image signal with tilt observation by detecting a secondary electron image or a reflected electron image generated from the defect.
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| Electromagnetic radiation detecting apparatus, radiation detecting apparatus, radiation detecting system and laser processing method | 20060289769 | 20061228 |
| As to an electromagnetic radiation detecting apparatus, a radiation detecting apparatus, a radiation detecting system and a laser processing method, a TFT is disposed on an insulating substrate. A conversion element converting electromagnetic radiation into an electric signal is disposed over the TFT. A member for marking the position of the switching element is disposed on the conversion element. The position of a switching element having a defect can be located by means of the member on the conversion element. By radiating laser light to be focused on the member, it becomes possible to perform repair accurately.
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| Silicon wafer with non-soluble protective coating | 20060289966 | 20061228 |
| A silicon wafer with an array of integrated circuit (IC) dies formed on the wafer is provided with a protective coat applied to a surface of the wafer to protect the IC dies from debris created during a laser scribing process. The IC dies can include die bumps that can be adversely affected by debris from the laser scribing process. The protective coat is a tape or a film that may be optically transparent, chemically non-reactive to the laser energy and formed of material that can be ablated by the laser scribing. The protective coat is removed from the IC dies after laser scribing leaving the IC dies and die bumps clean of any debris, thereby decreasing the number of defective dies.
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| Method of manufacturing honeycomb structure | 20060290036 | 20061228 |
| There is disclosed a method of manufacturing a honeycomb structure in which defects or deformations during forming can be reduced, and yield can be improved. The method of manufacturing the honeycomb structure includes the steps of mixing and kneading a clay material including a ceramic material, a binder and water to obtain a clay; forming the resultant clay into a honeycomb shape to obtain a honeycomb formed body; and firing the resultant honeycomb formed body to obtain a honeycomb structure, a material further including a water absorption resin is used as the clay material, an inorganic binder only is used as the binder included in the clay material, an organic binder is not substantially used, and the honeycomb structure having a porosity of 40% or more... |
| Organic electroluminescent display device | 20060290277 | 20061228 |
| The present invention provides an organic electroluminescent display device, comprising: pixels that are each divided into at least two segments; current supply lines each independently connected to each of the segments; and active elements that are provided per each pixel and control the connection between an organic electroluminescent element and a power supply line, wherein at least one connection line between a defective segment of the segments and the active element is cut.
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| Device and method for detecting the environment change of windshield | 20060290521 | 20061228 |
| A device and method for detecting environmental change of automobile windshield, the device comprises a plane capacitor which is disposed on the inner surface of the windshield, the two electrodes of said plane capacitor are disposed on the same plane, the total area of said two electrodes is less than 100 sq. centimeters, said plane capacitor is a sense element which detects the environmental change of windshield and environmental change after operating, said plane capacitor is electrically connected with a sensor detection circuit, the change signals in capacitance which is affected by the environmental is transmitted to said sensor detection circuit, and said sensor detection circuit is responsive to the change of capacitance to produce a control signal to control equipment work. The structure of this... |
| Apparatus and method for controlling gate voltage of liquid crystal display | 20060290640 | 20061228 |
| Gate voltage controlling apparatus and method wherein a gate voltage may be applied to a gate driver sequentially from a lower voltage toward a higher voltage to stably drive and protect the gate driver, thereby minimizing any defects in the gate driver. In the gate controlling apparatus, a power supply generates at least two gate voltages having a different voltage level. A gate driver generates a scanning pulse that selects a display line using the at least two gate voltages having a different voltage level. A gate voltage controller supplies the gate voltages to the gate driver in sequence from a lower voltage toward a higher voltage.
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| Imaging systems, articles of manufacture, and imaging methods | 20060290794 | 20061228 |
| Imaging systems, articles of manufacture, and imaging methods are described according to aspects of the disclosure. According to one embodiment, an imaging system includes processing circuitry configured to access image data of a plurality of pixels of an image, to provide a plurality of representations of the image data, to determine contrast difference between the representations of the image data for a respective one of the pixels, to identify the one of the pixels as being defective using the determined contrast difference, and to provide replacement image data for the one of the pixels identified as defective and which is different than the accessed image data for the one of the pixels identified as defective.
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| Image pickup apparatus | 20060290795 | 20061228 |
| An image pickup apparatus is constructed as including: a taking lens; CCD image pickup device for converting object light into electrical signals; AD converter for converting image pickup signals into digital signals; a defect detecting section for detecting defect pixels in the digital image pickup signals; a defect correcting section for performing correction processing of the defect pixels detected at the defect detecting section; and a system controlling section for managing the operation of the entire system. The taking lens is attachable/detachable and interchangeable and a function is provided at the system controlling section to detect attachment/detachment of the taking lens. The defect detecting section is caused to perform defect detection when the taking lens has been detached so that the power consumption is reduced and... |
| Liquid crystal display device | 20060290860 | 20061228 |
| A liquid crystal display (LCD) device is disclosed, which comprises a protrusion, and a column spacer being partially overlapped with the protrusion to thereby prevent a cell gap defect. The LCD device includes first and second substrates facing each other and gate and data line crossing each other to define a unit pixel region. In addition a thin film transistor formed adjacent to a crossing of the gate and data lines is included. The protrusions formed on the first substrate correspond with predetermined portions of the gate line. The column spacers are formed on the second substrate with a predetermined portion overlapped with some portion of one of the protrusions. A liquid crystal layer is formed between the first and second substrates.
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| Method and apparatus for detecting defects | 20060290923 | 20061228 |
| A method and apparatus for detecting defects are provided for detecting harmful defects or foreign matter with high sensitivity on an object to be inspected with a transparent film, such as an oxide film, by reducing noise due to a circuit pattern. The apparatus for detecting defects includes a stage part on which a substrate specimen is put and which is arbitrarily movable in each of the X-Y-Z-θ directions, an illumination system for irradiating the circuit pattern with light from an inclined direction, and an image-forming optical system for forming an image of an irradiated detection area on a detector from the upward and oblique directions. With this arrangement, diffracted light and scattered light caused on the circuit pattern through the illumination by the illumination system... |
| Method and apparatus for inspecting pattern defects | 20060290930 | 20061228 |
| The present invention relates to a pattern defect inspection apparatus, wherein light emitted from an illumination source capable of outputting a plurality of wavelengths is linearly illuminated by an illuminating optical system. Diffracted or scattered light due to a circuit pattern or defect on a wafer is collected by an imaging optical system onto a line sensor and converted into a digital signal, and the defect is detected by a signal processing section. Then, the defect can be detected with high sensitivity since a surface to be formed by an optical axis of the illuminating optical system and an optical axis of the imaging optical system is almost collimated to a direction of a wiring pattern and further since an angle to be formed by the... |
| Fabrication of magnetic tunnel junctions with epitaxial and textured ferromagnetic layers | 20060291105 | 20061228 |
| This invention relates to magnetic tunnel junctions and methods for making the magnetic tunnel junctions. The magnetic tunnel junctions include a tunnel barrier oxide layer sandwiched between two ferromagnetic layers both of which are epitaxial or textured with respect to the underlying substrate upon which the magnetic tunnel junctions are grown. The magnetic tunnel junctions provide improved magnetic properties, sharper interfaces and few defects.
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| Method and apparatus for programming a memory array | 20060291303 | 20061228 |
| A method and apparatus for programming a memory array are disclosed. In one embodiment, after each word line is programmed, an attempt is made to detect a defect on that word line. If a defect is detected, the word line is repaired with a redundant word line. The word lines are then reprogrammed and rechecked for defects. In another embodiment, after each word line is programmed, an attempt is made to detect a defect on that word line. If a defect is detected, that word line is repaired along with a previously-programmed adjacent word line. In yet another embodiment, after each word line is programmed, an attempt is made to detect a defect on that word line and a previously-programmed adjacent word line. If a defect... |
| Optical disc having small access units and address information modulation method therefor | 20060291337 | 20061228 |
| An address information modulation method includes using a first characteristic of a first modulation method and a second characteristic of a second modulation method to modulate address information and/or additional information. Accordingly, a data amount of information, to access a disc, in a predetermined space of the disc is increased, and the modulated information is formed in a form of a wobble signal in a track. Here, the first characteristic of the first modulation method can be physical location information of an MSK-modulated signal, and the second characteristic of the second modulation method can be sign information of a second harmonic wave obtained by an HMW modulation, which synthesizes a cosine function of a basic frequency of a wobble signal with a sine function having a... |
| Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle | 20060291714 | 20061228 |
| Various computer-implemented methods are provided. One method for sorting defects in a design pattern of a reticle includes searching for defects of interest in inspection data using priority information associated with individual defects in combination with one or more characteristics of a region proximate the individual defects. The priority information corresponds to modulation levels associated with the individual defects. The inspection data is generated by comparing images of the reticle generated for different values of a lithographic variable. The images include at least one reference image and at least one modulated image. A composite reference image can be generated from two or more reference images. The method also includes assigning one or more identifiers to the defects of interest. The identifier(s) may include, for example, a... |
| Apparatus and method for compensating for defective pixel | 20060291745 | 20061228 |
| An apparatus and a method for compensating for a defective pixel are provided. The apparatus includes a defective pixel information detecting unit and a halftoning unit. The defective pixel information detecting unit detects whether input continuous gray scale data forms a defective pixel caused by a defective image-forming element and outputs the detected result as defective pixel information. The halftoning unit reflects the defective pixel information in halftoning of the continuous gray scale data using error diffusion. In an image-forming apparatus (such as a printer, an LED etc) reproducing continuous gray scales using a plurality of image-forming elements each forming a limited gray scale, image quality deterioration caused by the defective pixel can be compensated for by performing halftoning in consideration of the defective image-forming element... |
| Optical element | 20060291780 | 20061228 |
| An optical element includes: a conductive film having a through opening and a periodic uneven structure (grooves) formed in a surface thereof, and a photonic crystal. The grooves are formed around the through opening, the photonic crystal has an optical waveguide and a defect structure (point defect) optically coupled to the optical waveguide formed therein, the conductive film is disposed opposite to the photonic crystal, and the through opening is opposite to the point defect.
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| Fabrication method of gallium manganese nitride single crystal nanowire | 20060292055 | 20061228 |
| The present invention relates to a fabrication method of gallium manganese nitride (GaMnN) single crystal nanowire, more particularly to a fabrication method of GaMnN single crystal nanowire substrate by halide vapor phase epitaxy (HVPE) in which such metal components as gallium (Ga) and manganese (Mn) react with such gas components as nitrogen (N2), hydrogen chloride (HCl) and ammonia (NH3), wherein the amount of the gas components are adjusted to control the Mn doping concentration in order to obtain nanowire having a perfect, one-dimensional, single crystal structure without internal defect, concentration of holes, or carriers, and magnetization value of which being determined by the doping concentration and showing ferromagnetism at room temperature, thus being a useful spin transporter in the field of the next-generation spintronics, such as... |
| Epidermal and dermal equivalents | 20060292126 | 20061228 |
| The present invention relates to the treatment of skin defects by organotypically-cultured autologous keratinocytes isolated from the outer root sheath of anagen or growing hair. Methods for primary, as well as subsequent organotypic cultures (i.e., epidermal equivalents) in fully-defined media supplemented by autologous human serum and substances isolated form blood components, with minimal allogeneic biological supplements, are disclosed herein. Techniques to prepare epidermal equivalents for transplantation by use of a biocompatible glue are also disclosed herein.
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| Method of plating mineral filled polyamide compositions and articles formed thereby | 20060292385 | 20061228 |
| A method of preparing metal plated articles comprising mineral filled polyamide compositions containing plasticizer, and articles plated thereby. The plated articles have a decreased incidence of visible surface defects.
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| Method of creating photo mask data, method of photo mask manufacturing, and method of manufacturing semiconductor device | 20060292458 | 20061228 |
| A method of creating photo mask data includes preparing design data of a photo mask, generating drawing data of the photo mask by using the design data, generating inspection control information configured to control inspection of defect on the photo mask by using the drawing data, and generating drawing and inspection data including the drawing data and the inspection control information by providing the drawing data with the inspection control information.
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| Method for study of the genetic and functional variability of hiv and kit for using it | 20060292553 | 20061228 |
| A method of analyzing a sample possibly containing an HIV virus, including a) extracting viral RNA in a biological sample that possibly contains an HIV virus; b) reverse transcription of the RNA obtained of (a) and amplification with a first pair of primers to obtain an amplified product of reverse transcription including all or part of at least two successive genes of a genome of an HIV virus; and one or both of c) and d): c) sequencing the amplified product of (b) to establish a genotype of HIV virus present in the sample and identify mutations that may be present in the amplified product; d1) amplifying the product of (b) with a second pair of primers complementary to the first pair of (b) and capable... |
| Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication | 20060292719 | 20061228 |
| Fabrication of monolithic lattice-mismatched semiconductor heterostructures with limited area regions having upper portions substantially exhausted of threading dislocations, as well as fabrication of semiconductor devices based on such lattice-mismatched heterostructures.
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| Mim capacitor in a semiconductor device and method therefor | 20060292815 | 20061228 |
| A MIM capacitor is formed over one or more metal interconnect layers in a semiconductor device. The capacitor has a lower plate electrode and an upper plate electrode. An insulator is formed between the plate electrodes. Prior to forming the first plate electrode a first insulating layer is deposited over the metal of an interconnect layer. The first insulating layer is planarized using a chemical mechanical polish (CMP) process. A second insulating layer is then deposited over the planarized first insulating layer. The first plate electrode is formed over the second insulating layer. An insulator is formed over the first plate electrode and functions as the capacitor dielectric. A second plate electrode is formed over the insulator. Planarizing the first insulating layer and depositing a second... |
