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Defect patents



      
           
This page is updated frequently with new Defect-related patent applications. Subscribe to the Defect RSS feed to automatically get the update: related Defect RSS feeds. RSS updates for this page: Defect RSS RSS


Method and device for the diagnosis of defects in components of chassis systems of motor vehicles

Implants for altering wear patterns of articular surfaces

Sealing device and delivery system

Date/App# patent app List of recent Defect-related patents
07/24/14
20140207396
 Integrated time dependent dielectric breakdown reliability testing patent thumbnailIntegrated time dependent dielectric breakdown reliability testing
Systems for reliability testing include a picometer configured to measure a leakage current across a device under test (dut); a camera configured to measure optical emissions from the dut based on a timing of the measurement of the leakage current; and a test system configured to apply a stress voltage to the dut and to correlate the leakage current with the optical emissions using a processor to determine a time and location of a defect occurrence within the dut by locating instances of increased noise in the leakage current that correspond in time with instances of increased optical emissions.. .
07/24/14
20140207328
 Method and device for the diagnosis of defects in components of chassis systems of motor vehicles patent thumbnailMethod and device for the diagnosis of defects in components of chassis systems of motor vehicles
A method for the diagnosis of defects in components of motor vehicle chassis systems. Vibrations produced by rotating components of the chassis system due to an imbalance are filtered such that the frequency range which depends on the wheel rotation speed and contains the imbalance-induced vibrations of the rotating components is filtered out.
07/24/14
20140207243
 Implants for altering wear patterns of articular surfaces patent thumbnailImplants for altering wear patterns of articular surfaces
Methods and devices for correcting wear pattern defects in joints. The methods and devices described herein allow for the restoration of correcting abnormal biomechanical loading conditions in a joint brought on by wear pattern defects, and also can, in embodiments, permit correction of proper kinematic movement..
07/24/14
20140207185
 Sealing device and delivery system patent thumbnailSealing device and delivery system
A medical device for sealing a defect in a body includes a wire frame that includes a plurality of wires that form a first occluding member and a second occluding member, the wire frame including a defect-occupying portion disposed between the first occluding member and the second occluding member. The defect-occupying portion is adapted to fill a wide range of potential defect sizes, such that no more than five devices of a range of sizes are required to effectively seal a range of nominal defect sizes of approximately 8 to 35 mm..
07/24/14
20140206252
 Method for repairing white defect of liquid crystal display panel patent thumbnailMethod for repairing white defect of liquid crystal display panel
A method for repairing white defect of liquid crystal display panel includes: (1) providing a laser repairing platform and a liquid crystal display panel that contains a white defect to be repaired, wherein the white defect contained liquid crystal display panel comprises a substrate, a first insulation layer formed on the common wiring layer, a metal layer formed on the first insulation layer, a second insulation layer formed on the metal layer, and a transparent conductive layer formed on the second insulation layer; and (2) applying the laser repairing platform to carry out multi-spot welding on the common wiring layer, the metal layer, and the transparent conductive layer at a location corresponding to a white defect of the liquid crystal display panel so as to have the common wiring layer, the metal layer, and the transparent conductive layer electrically connected at sites corresponding to the multiple welding spots.. .
07/24/14
20140206133
 Method for manufacturing semiconductor device patent thumbnailMethod for manufacturing semiconductor device
To reduce defects in an oxide semiconductor film in a semiconductor device. To improve electrical characteristics of and reliability in the semiconductor device including an oxide semiconductor film.
07/24/14
20140205752
 Methods of utilizing block copolymer to form patterns patent thumbnailMethods of utilizing block copolymer to form patterns
Some embodiments include methods of forming patterns. A block copolymer film may be formed over a substrate, with the block copolymer having an intrinsic glass transition temperature (tg,0) and a degradation temperature (td).
07/24/14
20140205647
 Method for treating defective dura mater patent thumbnailMethod for treating defective dura mater
Disclosed are an artificial dura mater and manufacturing method thereof. The artificial dura mater includes electrospun layers prepared by electrostatic spinning, at least one of which is a hydrophobic electrospun layer.
07/24/14
20140205180
 Method, apparatus and device for inspecting circuit pattern defect patent thumbnailMethod, apparatus and device for inspecting circuit pattern defect
A method for inspecting a defect of a circuit pattern includes obtaining an image containing the circuit pattern, expanding or contracting the circuit pattern contained in the image in one direction, so that a defective first portion of the circuit pattern contained in the image is overlapped after expanding the circuit pattern contained in the image, and so that a second portion formed between defective segments of the circuit pattern contained in the image is eliminated after contracting the circuit pattern contained in the image, and generating an inspection data that is associated with a position of a defect of the circuit pattern based on a position of the first portion or a position of the second portion.. .
07/24/14
20140205179
 Reticle defect inspection with systematic defect filter patent thumbnailReticle defect inspection with systematic defect filter
Disclosed are methods and apparatus for inspecting a photolithographic reticle. A stream of defect data is received from a reticle inspection system, wherein the defect data identifies a plurality of defects that were detected for a plurality of different portions of the reticle.
07/24/14
20140205063
Rolling element inspection method, rolling element manufacturing method, and rolling element
An inspection method of a rolling element includes the steps of: projecting an x-ray from a light source to a rolling element, detecting the x-ray passing through the rolling element by a detector, calculating data of the detected x-ray to form an image, and detecting a defect in the rolling element based on the image. At the step of projecting an x-ray, the light source rotates relatively around the rolling element while the x-ray is projected to an entire region of the rolling element facing the light source.
07/24/14
20140205062
System and method for imaging defects
The invention is directed to a defect imaging device that has an energy beam that is directed at a device under test. The energy beam creates positrons deep within the material of the device under test.
07/24/14
20140204693
Applying a voltage-delay correction to a non-defective memory block that replaces a defective memory block based on the actual location of the non-defective memory block
In an embodiment, a defective memory block is replaced with a non-defective memory block, and a voltage-delay correction is applied to the non-defective memory block that replaces the defective memory block based on the actual location of the non-defective memory block.. .
07/24/14
20140204426
Method and apparatus for correcting a printed image
A method for printing and correction of a printed image defects. The method includes inspection of the printed image and detection of segments of printed image that could contain printed defects.
07/24/14
20140204371
Method of inspecting wafer
Wafer inspection method to perform wafer inspection based on photo map information. The wafer inspection method may include: detecting a sample center location on a wafer; compensating the detected sample center location to a compensated center location based on photo map information; and detecting defective dies included in the wafer based on the compensated center location..
07/24/14
20140204322
Liquid crystal display panel and liquid crystal display device
The present invention provides a liquid crystal display panel and a liquid crystal display device having excellent display quality, with reduced string-like defects that occur in display pixels. The liquid crystal display panel of the present invention includes multiple spacers between a pair of substrates, wherein the spacers are arranged such that an inter-spacer distance between adjacent spacers in a longitudinal direction is different from an inter-spacer distance between adjacent spacers in a transverse direction, and an angle formed between a line connecting the spacers with a shorter inter-spacer distance and an alignment direction of liquid crystal molecules at a voltage lower than a threshold voltage in the liquid crystal layer is 20° or smaller..
07/24/14
20140204248
Apparatus and method for image processing and storage medium, and image pickup apparatus
An image processing method includes: acquiring a mosaic image photographed by image pickup means including an image pickup element in which a basic array pattern is repeatedly arranged in horizontal and vertical directions, storing first correction data containing a coordinate of a defective pixel and correction information associated with a position of the defective pixel in the basic array pattern, and second correction data containing a correction pattern corresponding to the correction information and indicating positions, relative to the defective pixel, of plural peripheral pixels that have a same color as the defective pixel, reading the correction pattern based on the correction information, calculating coordinates of the peripheral pixels based on the first correction data and the read correction pattern, extracting pixel values corresponding to the peripheral pixels at the calculated coordinates from the mosaic image, and calculating the pixel value of the defective pixel.. .
07/24/14
20140204202
Inspection apparatus
An inspection apparatus comprising, an optical system emitting light having a predetermined wavelength, illuminating a sample while the light is converted into light having a polarization plane not in the range of −5 degrees to 5 degrees and 85 degrees to 95 degrees with respect to a direction of a repetitive pattern on the sample, an optical system for acquiring an image and forming said image on an image sensor using a lens, a half-wave plate, a first image sensor, a second image sensor, an inspection analyzer, wherein these differ in a transmission axis direction, a processor that obtains an average gray level and a standard deviation in each predetermined unit region of the image, and a defect detector, wherein a resolution limit defined by a wavelength of the light source and a numerical aperture of the lens is a value in which the pattern is not resolved.. .
07/24/14
20140204194
Defect observation method and device therefor
This invention relates to a method for performing an analysis of defective material and the refractive index, and a three-dimensional analysis of very small pattern shapes including the steps of imaging by a scanning electron microscope to acquire an image of the position of a defect under observation using information of inspection results obtained by an optical inspection device, creating a model of the defect by using the acquired image of the defect under observation, calculating the values detected by the detector when reflected and scattered light emitted from a defect model is received by the detector when light is irradiated onto the defect model thus created, comparing the detection values thus calculated and the values detected by the detector, which has received light actually reflected and scattered from the sample, to obtain information relating to the height of the defect under observation, the material, or the refractive index.. .
07/24/14
20140203978
Semiconductor device
In a semiconductor device in which a copper plating layer is used for a conductor of an antenna and in which an integrated circuit and the antenna are formed over the same substrate, an object is to prevent an adverse effect on electrical characteristics of a circuit element due to diffusion of copper, as well as to provide a copper plating layer with favorable adhesiveness. Another object is to prevent a defect in the semiconductor device that stems from poor connection between the antenna and the integrated circuit, in the semiconductor device in which the integrated circuit and the antenna are formed over the same substrate.
07/24/14
20140203894
Notch filter structure with open stubs in semiconductor substrate and design structure
On-chip millimeter wave (mmw) notch filters with via stubs, methods of manufacture and design structures are disclosed. The notch filter includes a signal line comprising a metal trace line connected to a metal via stub partially extending into a semiconductor substrate.
07/24/14
20140203687
Stealth dicing for ultrasound transducer array
An ultrasound transducer array is formed with stealth dicing. A laser is used to form defects within the piezoelectric substrate and along the desired kerf locations.
07/24/14
20140203326
Methods of forming hetero-layers with reduced surface roughness and bulk defect density on non-native surfaces and the structures formed thereby
Methods of forming hetero-layers with reduced surface roughness and bulk defect density on non-native surfaces and the devices formed thereby are described. In one embodiment, the method includes providing a substrate having a top surface with a lattice constant and depositing a first layer on the top surface of the substrate.
07/24/14
20140203208
Body waste treating material, method for manufacturing body waste treating material, and apparatus for manufacturing the same
The body waste treating material is formed to a certain shape by the steps of: defiberizing used paper as a pulpable raw material to generate a dissolved material, deinking the dissolved material generated in the defiberizing step, dehydrating the dissolved material deinked in the deinking step to generate a fibrous material, classifying the fibrous material generated in the dehydrating step into a non-defective fibrous material suitable for forming paper and a defective fibrous material unsuitable for forming paper, mixing the non-defective fibrous material suitable for forming paper with the defective fibrous material unsuitable for forming paper, and molding a fibrous material mixed in the mixing step.. .
07/24/14
20140202654
Continuous casting equipment for titanium or titanium alloy slab
Using plasma arcs generated by plasma torches, the surface of molten metal charged into a mold is heated. Emss arranged on the lateral sides of the mold are used to stir the surface of the molten metal or the vicinity thereof electromagnetically.
07/24/14
20140202651
Methods for sand core gas evacuation and related systems and apparatus
Methods, systems, and apparatus for reduction of gas pressure within a core, such as a sand casting core package, during a casting process in order to reduce bubble defects. Some embodiments may comprise a mold configured to receive a molten metal to create a metal casting, such as an engine block casting.
07/24/14
20140202359
Rapid setting high strength calcium phosphate cements comprising cyclodextrins
Rapid setting high strength calcium phosphate cements and methods of using the same are provided. Aspects of the cements include fine and coarse calcium phosphate particulate reactants and a cyclodextrin which, upon combination with a setting fluid, produce a flowable composition that rapidly sets into a high strength product.
07/17/14
20140201583
System and method for non-intrusive random failure emulation within an integrated circuit
The apparatus and methods allow random hardware failure emulation of an integrated circuit (ic) by emulation of potential defects to enable behavior evaluation of the rest of the design in such situation. This emulation can non-intrusively address multiple points of failure.
07/17/14
20140201573
Defect analysis system for error impact reduction
An apparatus includes a network interface, memory, and a processor. The processor is coupled with the network interface and memory.
07/17/14
20140200831
Pipe damage interpretation system
A technique facilitates evaluation of pipe. A sensor is positioned to examine a pipe and to obtain data on the pipe.
07/17/14
20140200830
Railway track geometry defect modeling for predicting deterioration, derailment risk, and optimal repair
Geo-defect repair modeling is provided. A method includes logically dividing a railroad network according to spatial and temporal dimensions with respect to historical data collected.
07/17/14
20140200829
Asset failure prediction with location uncertainty
Geo-defect repair modeling with location uncertainty is provided. A method includes logically dividing a railroad network into segments each of a specified length.
07/17/14
20140200828
Asset failure prediction with location uncertainty
Geo-defect repair modeling with location uncertainty is provided. A method includes logically dividing a railroad network into segments each of a specified length.
07/17/14
20140200827
Railway track geometry defect modeling for predicting deterioration, derailment risk, and optimal repair
Geo-defect repair modeling is provided. A method includes logically dividing a railroad network according to spatial and temporal dimensions with respect to historical data collected.
07/17/14
20140200701
Systems and methods for detecting and rejecting defective absorbent articles from a converting line
The present disclosure relates to systems and processes for detecting and rejecting defective absorbent articles from a converting line. In particular, the systems and methods may utilize feedback from technologies, such as vision systems, sensors, remote input and output stations, and controllers with synchronized embedded clocks to accurately correlate inspection results and measurements from an absorbent article converting process.
07/17/14
20140200700
Inspecting device monitoring system
In a monitoring system, when there is an evaluation that a product is defective, in a solder print inspecting device that is subject to monitoring, that information is sent to a mobile terminal possessed by an operator. The operator who views the notification performs, through the mobile terminal, a checking task for evaluating whether or not the evaluation result regarding the printed substrate that has been evaluated as a defective product is correct.
07/17/14
20140200597
Biodegradable apparatus and method for closure of trocar defects
A biodegradable device for providing scaffolding for a trocar defect to promote healing. The device consists of an upper and lower scaffold, offset by a connector.
07/17/14
20140200201
Enzymatic production or chemical synthesis and uses for 5,7-dienes and uvb conversion products thereof
Provided herein are steroidal compounds that are androsta-5,7-dienes or a pregna-5,7-dienes and ultraviolet b (uvb) conversion products thereof which includes pharmaceutical compositions of the steroidal compounds as shown in tables 1 and 2. Also provided is a method for producing hydroxylated metabolites of cholecalciferol or ergocalciferol via the p450scc (cyp11a1) or cyp27b1 enzyme systems where the hydroxylase has an activity to hydroxylate position c20 of a secosteroid or its 5,7-dieneal precursor and the hydroxylated metabolites so produced.
07/17/14
20140199825
Silicon-germanium heterojunction tunnel field effect transistor and preparation method thereof
A silicon/germanium (sige) heterojunction tunnel field effect transistor (tfet) and a preparation method thereof are provided, in which a source region of a device is manufactured on a silicon germanium (sige) or ge region, and a drain region of the device is manufactured in a si region, thereby obtaining a high on-state current while ensuring a low off-state current. Local ge oxidization and concentration technique is used to implement a silicon germanium on insulator (sgoi) or germanium on insulator (goi) with a high ge content in some area.
07/17/14
20140199812
Bump structural designs to minimize package defects
A method of forming a chip package includes providing a chip with a plurality of first copper post bumps having a first height of copper post. The method also includes providing a substrate with a plurality of second copper post bumps having a second height of copper post.
07/17/14
20140199792
Defect pattern evaluation method, defect pattern evaluation apparatus, and recording media
According to a defect pattern evaluation method of an embodiment, defects are detected by performing optical defect inspection on a pattern on a substrate. Then, the defects are classified according to a type of a pattern layout using a pattern layout corresponding to coordinates of the defects.
07/17/14
20140199787
Semiconductor mask blanks with a compatible stop layer
Provided is a method for creating a mask blank that includes a stop layer. The stop layer is optically compatible and process compatible with other layers included as part of the mask blanks.
07/17/14
20140199784
Method and apparatus for making a semiconductor device
Disclosed is an apparatus and method for yield enhancement of making a semiconductor device. The apparatus for yield enhancement of making a semiconductor device comprises: a semiconductor device comprising an epitaxial layer in which a defect is included, and a photo-resistor on the epitaxial layer and covering the defect; an image recognition system to detect and identify a location of the defect; and an exposing module comprising a first light source to expose a part of the photo-resistor substantially corresponding to the detected defect identified by the image recognition system..
07/17/14
20140199657
Membrane for alveolar bone regeneration
A membrane for alveolar bone regeneration to guide bone generation by adapting to a bone graft material, which fills a bone defect area, includes a central hole through which an implant is inserted into an alveolar bone, wherein the membrane includes: a coupling part to couple the membrane with the implant; a side bending part that is downwardly bent from the coupling part to have an overall curved shape with a gentle slope; and lateral covering parts that protrude from edges of the side bending part and are bent and curved toward an alveolar bone defect area, wherein the side bending part and the lateral covering parts are pre-formed in three-dimensions to fit a final shape of the alveolar bone that is to be regenerated.. .
07/17/14
20140199619
Electrophotographic photoreceptor, method for manufacturing same, and electrophotographic apparatus using same
A layered, positively-charged electrophotographic photoreceptor, a method for manufacturing the photoreceptor and an electrophotographic apparatus using the photoreceptor are disclosed. The layered, positively-charged electrophotographic photoreceptor includes a conductive support on which is provided a sequential stack composed of a charge transport layer containing at least a first hole transport material and a first binder resin; and a charge generation layer containing at least a charge generation material, a second hole transport material, an electron transport material, and a second binder resin, wherein the charge generation layer and the charge transport layer have a total amount of residual solvents that is 50 μg/cm2 or less.
07/17/14
20140198975
Region-of-interest determination apparatus, observation tool or inspection tool, region-of-interest determination method, and observation method or inspection method using region-of-interest determination method
A region-of-interest determination apparatus includes: a calculation unit which calculates the incidence of a defect based on at least a plurality of kinds of defect attribute information regarding defect data, the defect data including an image corresponding to a defect position detected on a specimen by inspection thereof or an image corresponding to a defect position predicted to be likely to develop a defect on the specimen, both images being obtained by imaging; and a region determination unit which extracts the defect data of which the incidence is higher than a predetermined level, and determines the region to be observed or inspected on the specimen based on the extracted defect data.. .
07/17/14
20140198974
Semiconductor device defect inspection method and system thereof
Provided are a semiconductor device defect inspection method and system thereof, with which predetermined hot spots are inspected using a sem, and with which the frequency of defects occurring at the hot spot is estimated statistically and with reliability. An inspection point is designated in design data by the defect type.
07/17/14
20140198970
Edge detection device and edge detection method
An edge detection device includes: an image capturing mechanism configured to image-capture an edge of an optical joining block; and a control unit configured to control the image capturing mechanism, wherein the control unit: determines, based on image data of the edge, whether a plurality of regions included in the edge have a defective region including a defect or a non-defective region including no defect; determines whether or not first regions which are included in the plurality of regions and is determined to be the non-defective region satisfy a first condition; calculates a first straight line based on the first regions; and determines the first straight line as a position of the edge when the first regions has satisfied a first condition.. .
07/17/14
20140198818
Alleviation of laser-induced damage in optical materials by suppression of transient color centers formation and control of phonon population
Laser-induced damage in an optical material can be mitigated by creating conditions at which light absorption is minimized. Specifically, electrons populating defect energy levels of a band gap in an optical material can be promoted to the conduction band—a process commonly referred to as bleaching.
07/17/14
20140198593
Redundancy circuit and semiconductor memory device including the same
A redundancy circuit includes a redundancy decoder, a fuse array, and a decoder. The redundancy decoder decodes a redundancy enable signal generated when an address of a defective cell matches an input address.
07/17/14
20140198222
Optical monitoring device for an imaging system
An optical monitoring device for an optical imaging system having a focal plane, an optical axis and an entry pupil, forming an image of a scene substantially at infinity on an image detector disposed substantially in the focal plane, comprises: a virtually point-like emission source at the periphery of the detector and substantially in the focal plane; a reflecting element with a plane surface upstream of the imaging system relative to the direction of light rays coming from the scene, and according to a position and inclination where a monitoring image of the source produced by the optical system and reflected by the reflecting element is substantially in the focal plane on a detection element connected to a monitoring image analyzer allowing potential optical defects to be identified; the reflecting element having an annular shape allowing passage of light rays coming from the scene and passing through the entry pupil.. .


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This listing is a sample listing of patent applications related to Defect for is only meant as a recent sample of applications filed, not a comprehensive history. There may be associated servicemarks and trademarks related to these patents. Please check with patent attorney if you need further assistance or plan to use for business purposes. This patent data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Defect with additional patents listed. Browse our RSS directory or Search for other possible listings.
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