|| List of recent Defect-related patents
| Connection processing method and system|
The disclosure provides a connection processing method and system. The method includes: establishing a secure connection between a mobility management entity (mme) and/or serving gateway (s-gw) and a home (evolved) nodeb (h(e)nb); and protecting a connection between the mme and/or s-gw and the h(e)nb via the secure connection.
| Process for evaluating corrosion resistance of coating|
The present invention is directed to a process for evaluating corrosion resistance of coated metals substrates, such as autobodies at accelerated rate. An anode and cathode coated with protective coating being tested are exposed to an electrolyte in a chamber of a corrosion resistance evaluator.
| System and method for hazard detection and sharing|
A system and method for a navigation system including a hazard avoidance feature is disclosed. The system and method allows for professionals, civilians, vehicles, robots and computer systems to collaborate and share information regarding hazards, defects, obstacles, flaws, and other abnormalities that exist in any environment.
| Systems and methods for placing a coapting member between valvular leaflets|
The present invention relates to devices and methods for improving the function of a defective heart valve, and particularly for reducing regurgitation through an atrioventricular heart valve—i.e., the mitral valve and the tricuspid valve. For a tricuspid repair, the device includes an anchor deployed in the tissue of the right ventricle, in an orifice opening to the right atrium, or anchored to the tricuspid valve.
| Process of treating defects during the bonding of wafers|
The invention concerns a process of preparing a thin layer to be transferred onto a substrate having a surface topology and, therefore, variations in altitude or level, in a direction perpendicular to a plane defined by the thin layer, this process comprising the formation on the thin layer of a layer of adhesive material, the thickness of which enables carrying out a plurality of polishing steps of its surface in order to eliminate any defect or void or almost any defect or void, in preparation for an assembly via a molecular kind of bonding with the substrate.. .
| Compositions and methods for the production of recombinant virus vectors|
A method for the production of a replication-deficient recombinant virus vector is disclosed. The replication-deficient recombinant virus vector has a recombinant virus genome with one or more defective viral genes.
| Biomarkers and therapeutic targets for treating cardiomyopathies and congestive heart failure|
In alternative embodiments, the invention provides methods for predicting or diagnosing a heart disease or a defect in cardiac muscle contractility in an individual, or a defect in rate of cardiac muscle twitch relaxation and/or ventricular torsion, or detecting a cardiac trauma, in an individual or in a cardiac cell, or (by testing) a serum or a blood sample. In alternative embodiments, the invention provides methods for screening for a composition that can treat, ameliorate, prevent or reverse a heart disease or a congestive heart failure in an individual, or a defect in cardiac muscle contractility, or a defect in rate of cardiac muscle twitch relaxation and/or ventricular torsion in an individual or a cardiac muscle cell..
| Methods of cutting glass using a laser|
A method of cutting a glass article includes translating a laser beam relative to a first surface of the glass article. The laser beam includes a beam waist having a center.
| Template washing method, pattern forming method, photowashing apparatus, and nanoimprint apparatus|
A template washing method and a photowashing apparatus which ensure removal of resist residual remaining on a pattern surface of a template, a pattern forming method and a nanoimprint apparatus which ensure formation of patterns with fewer defects are provided. The template washing method of the invention for photowashing the pattern surface of the template used in nanoimprint includes a vacuum-ultraviolet light irradiation process for irradiating the pattern surface of the template with vacuum ultraviolet light under an atmosphere of dry air..
| Use of mtor inhibitors to treat bacterial infection|
A method for treating a mammal having an infection with an organism that persists intracellularly in a mammalian cell by inducing an autophagy defect includes administering to the mammal an effective dose of a bioavailable agent that restores autophagy function, by inhibition of the mtor pathway.. .
| Silicon single crystal wafer|
The present invention provides a silicon single crystal wafer sliced out from a silicon single crystal ingot grown by a czochralski method, wherein the silicon single crystal wafer is sliced out from the silicon single crystal ingot having oxygen concentration of 8×1017 atoms/cm3 (astm' 79) or less and includes of a defect region where neither fpds nor leps are detected by preferential etching but lstds are detected by an infrared scattering method. As a result, the wafer having the low oxygen concentration can be provided at low cost without causing a breakdown voltage failure or a leak failure at the time of fabricating a device..
| Defect inspection method and defect inspection apparatus|
A defect inspection method comprising: picking up an image of a subject under inspection to thereby acquire an inspection image; extracting multiple templates corresponding to multiple regions, respectively from design data of the subject under inspection; finding a first misregistration amount between the inspection image and the design data using a first template as any one template selected from among the plural templates; finding a second misregistration amount between the inspection image and the design data using a second template other than the first template, the second template being selected from among the plural templates, and the first misregistration-amount; and converting the design data, misregistration thereof being corrected using the first misregistration-amount, and the second misregistration-amount, into a design data image, and comparing the design data image with the inspection image to thereby detect a defect of the subject under inspection.. .
| Method and apparatus for efficient defect inspection|
A method of inspecting fabricated articles includes receiving a fabricated article to be inspected for defects, the fabricated article having a pattern thereon, and the pattern being based on a pattern design and creating a rule set for defining critical regions of the pattern as represented in the pattern design, the critical regions being regions in which defects are more likely to be found during inspection. The method also includes applying the rule set to the pattern design to identify a critical region of the pattern on the fabricated article and a non-critical region of the pattern on the fabricated article.
| Defect inspection device, defect inspection method, and defect inspection program|
A defect inspection device according to one aspect of the present invention includes a light source, a detector that receives light from an illuminated region of a sample, a stage that changes a relative position between light from the light source and the sample in order to sequentially inspect a plurality of unit inspection regions, a comparator that compares a detection signal output from the detector with a threshold according to scanning in the stage, a mask position setting unit that sets a common position of the plurality of unit inspection regions as a mask position in order to mask the common position when the plurality of unit inspection regions are sequentially inspected, and a defect detection unit that detects a defect based on a comparison result in the comparison unit in another region than the mask position.. .
| Image capturing apparatus, image capturing system, method of controlling image capturing apparatus, and storage medium|
An image capturing apparatus has an image capturing unit that accumulates a charge pixel-by-pixel and outputs an image signal corresponding to the amount of accumulated charge, a generation unit that acquires image signals by performing a set number of readouts of image signals of pixels from the image capturing unit, calculates, with respect to each pixel, image data that is an average of image signals read out from the same pixels, and generates an image having the image data as a characteristic of each pixel, and a correction unit that specifies a position of a defective pixel of the image capturing apparatus and generates correction data that is an image signal that is an average of a set certain number of pixels located in a periphery of a defective pixel.. .
| Congestion managment for fibre channel over ethernet over wide area networks|
In general, techniques are described for mapping wan conditions to appropriate back-pressure mechanisms at the wan edges to improve the performance of delay and/or loss-sensitive applications. In one example, a system includes a wide area network having a provider edge (pe) router to establish a fibre channel over ethernet (fcoe) pseudowire over the wide area network.
| Memory device to correct defect cell generated after packaging|
A memory device to correct a defect cell generated after packing is performed includes a memory cell array in which a plurality of memory cells are arranged, a repair circuit unit including a first storage unit to store defect cell information in the memory cell array, and a fuse circuit unit including a second storage unit that is programmed according to the defect cell information stored in the first storage unit. The first storage unit includes a volatile memory device, and the second storage unit includes a non-volatile memory device..
| Defect inspection method, low light detecting method and low light detector|
A defect inspection method includes an illumination light adjustment step of adjusting light emitted from a light source, an illumination intensity distribution control step of forming light flux obtained in the illumination light adjustment step into desired illumination intensity distribution, a sample scanning step of displacing a sample in a direction substantially perpendicular to a longitudinal direction of the illumination intensity distribution, a scattered light detection step of counting the number of photons of scattered light emitted from plural small areas in an area irradiated with illumination light to produce plural scattered light detection signals corresponding to the plural small areas, a defect judgment step of processing the plural scattered light detection signals to judge presence of a defect, a defect dimension judgment step of judging dimensions of the defect in each place in which the defect is judged to be present and a display step of displaying a position on sample surface and the dimensions of the defect in each place in which the defect is judged to be present.. .
| Super resolution inspection system|
The disclosure is directed to a system and method for inspecting a sample by illuminating the sample at a plurality of different angles and independently processing the resulting image streams. Illumination is directed through a plurality of pupil apertures to a plurality of respective field apertures so that the sample is imaged by portions of illumination directed at different angles.
| Defect tester|
A defect tester for detecting a defect in an article in a machine arrangement includes a starwheel having one or more pockets configured to hold respective one or more articles. The defect tester further includes one or more disks.
| Polymer/liquid crystal composite and liquid crystal display device including the same|
The occurrence of a defective orientation of a polymer/liquid crystal composite is suppressed. In addition, the occurrence of defective display of a liquid crystal display device including the polymer/liquid crystal composite is suppressed.
| Liquid crystal display device|
Disclosed are a liquid crystal display device and a testing method thereof. The liquid crystal display device includes a plurality of scan lines, and a plurality of data line sets crossing the scan lines, where each data line set includes a first data line, a second data line, and a third data line.
| Lcd device, array substrate, and method of manufacturing the array substrate|
A liquid crystal display (lcd) device, an array substrate in the lcd device, and a method of manufacturing the array substrate are proposed. The lcd device includes an array substrate, a color filter (cf) substrate, and a liquid crystal (lc) layer sandwiched between the array substrate and the cf substrate.
| Systems and methods for raw image processing|
Systems and methods for processing raw image data are provided. One example of such a system may include memory to store image data in raw format from a digital imaging device and an image signal processor to process the image data.
| Green non-uniformity correction|
Systems and methods for correcting green channel non-uniformity (gnu) are provided. In one example, gnu may be corrected using energies between the two green channels (gb and gr) during green interpolation processes for red and green pixels.
| Electro-scan integration into video pipe inspection vehicle|
A camera based sewer evaluation vehicle has an electro-scan pipe defect detection system integrated therein. A cable and winch of the camera based system are utilized to support either a camera or an electro-scan probe.
| Device for searching for defects on parts by endoscopy|
A device for searching for defects on parts that are masked, such as turbine engine blades, the device including a tubular sheath, a light-guide guiding light, an image-transmission mechanism transmitting images housed inside the sheath, an examination head at a distal end of the sheath including an illumination mechanism and an image-taking mechanism connected to the light-guide and to the image-transmission mechanism housed in the sheath, a mechanism spraying a succession of penetrant test materials on the part for inspection including a capillary slidably guided in a duct housed in the sheath, and a mechanism adjusting orientation of the examination head at the distal end of the sheath.. .
| Method for detecting liquid crystal display panel and detecting system|
The present provide a technical solution by introducing a method of detecting a liquid crystal display panel, characterized in that the method includes a) providing an all-connection lit-up fixture having a plurality of probes. And b) performing a lit-up test by establishing an electrical coupling between the probes and a plurality of contacts on the liquid crystal display panel.
| Detection of defects in touch sensors|
Defects in a touch sensor are detected by coupling the sensor lines to a common signal line. Each of the sensor lines is tested by disconnecting the sensor line from the common signal line, connecting it to a voltage (e.g., ground) and comparing the voltage on the common signal line to a reference voltage.
| Device for manufacturing alignment film|
The present invention provides a device for manufacturing alignment film, which includes: a heat-dissipating board, a coated substrate and a support rack, the coated substrate being disposed above the heat-dissipating board, the support rack being movable, further comprising supporting part and drive unit, the supporting part supporting the coated substrate and drive unit driving supporting part to default positions. The device for manufacturing alignment film of the present invention has the advantage of adaptability to various alignment film manufacturing processes, and manufactured alignment film has no defects of halo area and mura..
| Method of forming a group iii-nitride crystalline film on a patterned substrate by hydride vapor phase epitaxy (hvpe)|
A method of depositing a high quality low defect single crystalline group iii-nitride film. A patterned substrate having a plurality of features with inclined sidewalls separated by spaces is provided.