|| List of recent Defect-related patents
| Vehicular squeak and rattle detection|
A method for detecting buzz, squeak, or rattle of interior components in a vehicle. A sine sweep signal is output through speakers of an audio system mounted in the vehicle capable of causing buzz, squeak, and rattle by defective installed parts in the vehicle.
| Attachment device and methods of using the same|
Devices for attaching a first mass and a second mass and methods of making and using the same are disclosed. The devices can be made from an resilient, elastic or deformable materials.
| Method of closing an opening in a wall of the heart|
Disclosed is a closure catheter, for closing a tissue opening such as an atrial septal defect, patent foreman ovale, or the left atrial appendage of the heart. The closure catheter carries a plurality of tissue anchors, which may be deployed into tissue surrounding the opening, and used to draw the opening closed.
| Fenestration through foreign material|
Described herein is a method for creating a channel through a foreign material located in a septum of a heart at the site of a septal defect. The foreign material defines a material first surface and a substantially opposed material second surface, and the channel extends through the foreign material at least partially between the material first and second surfaces.
| Semiconductor device processing with reduced wiring puddle formation|
A method of forming an interconnect structure for a semiconductor device includes forming a lower antireflective coating layer over a dielectric layer; forming an organic planarizing layer on the lower antireflective coating layer; transferring a wiring pattern through the organic planarizing layer; transferring the wiring pattern through the lower antireflective coating layer; and transferring the wiring pattern through the dielectric layer, wherein unpatterned portions of the lower antireflective coating layer serve as an etch stop layer so as to prevent any bubble defects present in the organic planarizing layer from being transferred to the dielectric layer.. .
| Method for producing strained ge fin structures|
Disclosed are methods for forming fins. In an example embodiment, a method includes providing a substrate that includes at least two elongated structures separated by an isolation region.
| Array substrate for liquid crystal display device and method of fabricating the same|
A liquid crystal display device includes an array substrate and a color filter substrate, a plurality of gate lines and a plurality of data lines formed on the array substrate such that the gate lines and the data lines intersect each other to define a plurality of pixel regions, a plurality of thin film transistors formed at respective intersections of the gate lines and the data lines, a liquid crystal layer interposed between the array and color filter substrates, and a plurality of repair patterns formed on the first substrate. Each of the plurality of the repair patterns crosses a corresponding one of the data lines, and is along and adjacent to a corresponding one of the gate lines, such that the repair pattern includes protruding ends that protrude from the corresponding data line to repair a defect on the pixel regions..
| Fault detector for optical network communication system|
A fault detection method includes collecting operational parameters of the optical network, collecting information about the structure of the optical network, providing diagnosis outputs by a diagnosis engine analyzing the structure information and the operational parameters, and deriving optical network faults from the diagnosis outputs. The collected operational parameters and the collected structure information may be stored in a database.
| Method and system for modifying image quality of an image|
A method and a system are described where the quality of an image can be modified, using formatted information related to the defects of the appliances of the chain of appliances. The method may include compiling directories of sources of formatted information related to the said appliances, searching automatically for this formatted information related to the appliances of the said chain of appliances, modifying the said image automatically by image-processing software or components by taking into account the formatted information.
| Nonvolatile semiconductor memory apparatus|
According to one embodiment, a nonvolatile semiconductor memory apparatus includes a memory cell array, a row decoder, a controller. The memory cell array includes a plurality of memory strings.
| Flexible display panel|
A flexible display panel including: a flexible substrate comprising a first area and a second area, wherein the first area is formed in a first direction, and the second area is formed in a second direction that is different from the first direction; a first display area formed on the first area of the flexible substrate; a second display area formed on the second area of the flexible substrate; a bending area formed between the first display area and the second display area; and an encapsulation substrate encapsulating at least the first display area and the second display area. Accordingly, as a display area is not formed in a bent portion, display defects due to bending may be prevented..
| Occupant sensing device|
An occupant sensing device that accurately detects the state of an occupant regardless of the influence of extraneous noise and outside light and the influence of a defect in detected data when lighting of auxiliary light is delayed. When a specific part detection possibility/impossibility determination unit determines that the detection of the position of a specific part, such as a head, in the latest image is impossible, on the basis of past data stored as data corresponding to images outputted from a camera earlier than the latest image in a storage unit, the position of the head is predicted and detected..
| Identifying defects in a roulette wheel|
Systems and methods for identifying defects in a roulette wheel are described. A first trajectory of a roulette ball may be determined after launch of the roulette ball by capturing movement of the roulette ball on the roulette wheel.
| Shift register unit circuit, shift register, array substrate and display apparatus|
Embodiments of the present disclosure relate to a technique of liquid crystal display, and provide a shift register unit circuit, a shift register, an array substrate and a display apparatus. A first tft is added in the shift register unit circuit and is used to pull down the level of a node pu when a frame start signal is at a high level and a forward clock signal changes from a low level to the high level, such that a h-line defect generated in an output signal caused by a coupling effect of a coupling circuit can be avoided, which is advantageous for increasing productivity and yield rate of products..
| Monitoring system|
The invention relates to a monitoring system for monitoring a third-party device, in particular a medical device, wherein the third-party device has a signal device for displaying the device status and/or relevant device properties and the monitoring device (2) is associated with the third-party device. Based upon this prior art, in the context of the invention monitoring of the third-party device should be possible and should also operate when the actual status indication of the monitored third-party device is defective.
| Test method and test arrangement|
A test method in accordance with one or more embodiments may include: providing a semiconductor device to be tested, the semiconductor device including at least one device cell, the at least one device cell having at least one trench, at least one first terminal electrode region and at least one second terminal electrode region, at least one gate electrode, and at least one additional electrode disposed at least partially in the at least one trench, wherein an electrical potential of the at least one additional electrode may be controlled separately from electrical potentials of the at least one first terminal electrode region, the at least one second terminal electrode region and the at least one gate electrode; and applying at least one electrical test potential to at least the at least one additional electrode to detect defects in the at least one device cell.. .
| Spinwave based nondestructive material, structure, component, or device testing tools|
Systems and methods for spinwave-based metrology in accordance with embodiments of the disclosure involve generating and detecting spinwaves in a sample having a ferromagnetic material; and determining a material thickness, a material integrity measure, a presence of a manufacturing defect, a categorical type of manufacturing defect, and/or a manufacturing process statistic corresponding to spinwave behavior in the sample. In an embodiment, spinwaves are generated by way of concurrent exposure of a target measurement site of the sample to each of a bias magnetic field and radiation (e.g., microwave or radio frequency radiation) produced by a first set of integrated waveguides.
| Dual-phase intermetallic interconnection structure and method of fabricating the same|
Provided are a dual-phase intermetallic interconnection structure and a fabricating method thereof. The dual-phase intermetallic interconnection structure includes a first intermetallic compound, a second intermetallic compound, a first solder layer, and a second solder layer.
| Process of evaluating corrosion resistance|
The present invention is directed to a process for evaluating corrosion resistance of coated metals substrates, such as autobodies at an accelerated rate. An anode and cathode coated with protective coating being tested are exposed to an electrolyte in a chamber of a corrosion resistance evaluator.
| Marking method for the reject marking of test elements|
The test elements are provided that are adapted to detect at least one analyte in a sample. At least some of the test elements are provided with a defect marking which contains information about defectiveness of the test elements.
A method is provided to remediate defects in first computer program code that can be used to configure a computer to produce code for use by the same or a different computer configured using second computer program code to use the produced code to produce output information, the method comprising: configuring a computer to perform static analysis of the first program to produce an information structure in a non-transitory computer readable storage device that associates a respective code statement of the first program code with a respective context, wherein the context associates a parser state with a potential defect in the produced code; identify a defect in the first computer program code that is associated with the respective code statement; and determining a remediation for the identified defect.. .
|Pattern-dependent short media defect detection|
Systems and methods for computing sign disagreement between le and la signals may implement one or more operations including, but not limited to: receiving an extrinsic log likelihood ratio (llr) value; incrementing a sign-disagreement counter according to a sign disagreement between the extrinsic llr value and an a priori llr value; providing a value of the sign-disagreement counter to a binary short media defect (smd) detector.. .
|Path-based crosstalk fault test scanning in built-in self-testing|
A path-based crosstalk fault model is used in conjunction with a built-in self-test (bist) and software capability for automatic test pattern generation. The solution allows for test patterns to be generated that maximize switching activity as well as inductive and capacitive crosstalk.
|Latent defect identification|
A method of determining test data for use in testing software involves identifying software that is known to have one or more bugs and which has a similar structure to software under test before using knowledge of those one or more bugs to create test data for the software under test.. .
|Latent defect indication|
A method of determining test data for use in testing a software. The method includes determining that at least part of a software structure of the software to be tested is similar to, or the same as, a software structure associated with a defect.
|Method and apparatus for determining maintenance sections of a rail|
A method of determining maintenance sections of a rail includes partitioning the rail into a plurality of sections based on railway topographical information and track defect information; identifying, from the plurality of sections, sections whose sectional speed limits are lower than a recommended running speed; and determining, from the identified sections, sections which need maintenance.. .
|Vehicle data analysis apparatus, vehicle data analysis method, and defect diagnosis apparatus|
A vehicle data analysis apparatus analyzes vehicle data that indicates chronological change of a vehicle state. The vehicle data analysis apparatus is provided with a computing unit and a recognition unit.
|Process for cutting one or more glazings|
A process for cutting several pieces of glass from at least one glass sheet, includes reading information relating to defects in the at least one glass sheet; and automatically and dynamically generating an optimum cutting layout for each of the at least one glass sheet as a function of at least some of the information relating to the defects.. .
|Method of reducing sidewall compaction in a bone or articular joint penetration|
A method of creating a penetration with reduced sidewall compaction in a surface of a bone or articular joint. The method includes the steps of positioning a surgical instrument in contact with the surface, applying a longitudinal force to the surgical instrument causing the surgical instrument to penetrate the surface thereby creating a penetration with at least one sidewall, and retracting the surgical instrument and strategically scraping a portion of the surgical instrument against a portion of the at least one sidewall to remove compacted material from the penetration, thereby creating a small surgically created wound in the surface having reduced compaction at the margins to promote rapid vascular penetration, cellular migration, and faster healing with an enhanced histologically confirmed maturing tissue.
|Surgical instrument for penetrating removing bone|
A surgical instrument whose cutting portion is a sharp miniature chisel or awl shape with a series of ridges along the course of the cutting tool. Each ridge has, on its proximal surface, a concave surface.
|Method and composition for modulating canonical wnt pathway using folate and inositol|
The canonical wnt signaling pathway is implicated in many disorders including neural tube defects, limb malformations, and heart defects, developmental disorders associated with alcohol exposure (fetal alcohol syndrome) or exposure to bipolar medications (i.e. Lithium), wound healing, and alzheimer's disease.
|Compositions and methods for tissue engineering and cell based therapies|
The present application discloses strategies to recruit and mobilize stem cells using s1p receptor selective agonists and antagonists as wells as regulators of chemokine receptors. In an in vivo ischemic model, s1p1/s1p3 activation with fty720 impeded inflammatory cell infiltration and recruited endothelial progenitor cells (epcs) with the potential to increase microvascular remodeling.
|Hepatocyte growth factor (hgf) mimics as therapeutic agents|
Small molecule, peptidic hepatocyte growth factors mimics, which act as both mimetics and antagonists, have been generated. These molecules have been shown or predicted to have therapeutic potential for numerous pathologies including dementia, alzheimer's disease, parkinson's disease, amyotrphic lateral sclerosis, and other neurodegenerative diseases, spinal cord injury, traumatic brain injury, diabetes and metabolic syndrome, cancer, and defective wound healing..
|Active substance for increasing pathogenic defense in plants and methods for the defection thereof|
The invention relates to a method for finding compounds which induce plant pathogen defense, the enhanced expression of individual, or a plurality of, endogenous plant genes from the group consisting of jasmonic acid biosynthesis, plant proteinase inhibitors, plant xylanase inhibitors, plant pr proteins (pathogen-related proteins) and plant chitinases being regarded as a sign that induction has taken place, and to the use of these compounds alone or in combination with known compounds which act specifically and directly against phytopathogens, it being possible to carry out the application either simultaneously or staggered.. .
|Epitaxial buffer layers for group iii-n transistors on silicon substrates|
Embodiments include epitaxial semiconductor stacks for reduced defect densities in iii-n device layers grown over non-iii-n substrates, such as silicon substrates. In embodiments, a metamorphic buffer includes an alxin1-xn layer lattice matched to an overlying gan device layers to reduce thermal mismatch induced defects.
|D5 desaturase-defective mutant gene and use thereof|
It is an object of the present invention to provide a delta-5 desaturase-defective gene and uses of the gene and/or the mutant in algal transformation.. .
|Concurrent treatment of oral and systemic maladies in animals using electrical current|
A method and apparatus for the concurrent treatment of multiple oral diseases and defects while promoting general oral hygiene utilizing electricity are provided for non-human animals. Electrodes are used to deliver an electrical current to the gingival tissues of a mouth in order to achieve a number of therapeutic, prophylactic, and regenerative benefits.
|Large aluminum nitride crystals with reduced defects and methods of making them|
Reducing the microvoid (mv) density in aln ameliorates numerous problems related to cracking during crystal growth, etch pit generation during the polishing, reduction of the optical transparency in an aln wafer, and, possibly, growth pit formation during epitaxial growth of aln and/or algan. This facilitates practical crystal production strategies and the formation of large, bulk aln crystals with low defect densities—e.g., a dislocation density below 104 cm−2 and an inclusion density below 104 cm−3 and/or a mv density below 104cm−3..
|Compositions, methods and kits for remineralization and inhibition of dental caries in teeth|
Methods, compositions and kits are provided for enhancing remineralization of a tooth or bone containing hydroxyapatite and inhibiting caries progression or loss of hydroxyapatite using a bisphosphonate or pyrophosphonate. The tooth or tooth surface contains a trauma or defect, for example the tooth contains a caries that is identified using a detectable probe.
|Image evaluation device, image evaluation method and program storage medium|
An image evaluation device includes a storage unit that stores sample image data that represent a virtual sample image simulating a sample image included in a sample printout that is recognized as a non-defective printout; a reading unit that reads an inspection object image included in an inspection object printout obtained by printing the sample image on a recording medium by a printing device using image data representing the sample image; an extraction unit that extracts a line defect including a linear pattern formed in a specific direction from the inspection object image represented by inspection object image data, based on a difference value between the sample image data and the inspection object image data; and an evaluation unit that evaluates a visibility of the line defect extracted by the extraction unit.. .
|Method and apparatus for inspecting thermal assist type magnetic head|
An apparatus for inspecting a thermal assist type magnetic head is configured to include a scanning probe microscope unit comprising a cantilever having a probe with a magnetic film formed on the surface of a tip portion thereof; a prober unit which provides an alternating current to a terminal formed on the thermal assist type magnetic head element; a scattered light detection unit which detects scattered light generated from the probe; and a signal process unit which detects defect by using an output signal from the scanning probe microscope unit by scanning the surface of the thermal assist type magnetic head element with the probe in a state that the magnetic field is generated and the near-field light is stopped, and an output signal from the scattered light detection unit by scanning the surface with the probe while near-field light is generated and the magnetic field is off.. .
|Image evaluation device, image evaluation method and program storage medium|
An image evaluation device includes: a reading unit that reads a sample image included in a sample printout recognized as a non-defective printout and that reads an inspection object image included in an inspection object printout obtained by printing an image corresponding to the sample image on a recording medium using a printing device based on image data representing the image; an extraction unit that extracts a line defect including a linear pattern formed in a specific direction from the inspection object image represented by inspection object image data, based on a difference value between sample image data obtained by reading the sample image and the inspection object image data; and an evaluation unit that evaluates a visibility of the line defect extracted by the extraction unit.. .
|Image processing apparatus and image processing method|
An image processing apparatus that processes image data output from an image sensing device including a plurality of pixels, comprises: a storage unit that stores defect data at least including first information showing grades of defective pixels that are subject to correction and, with respect to each defective pixel among the plurality of pixels, address information, second information showing a grade of the defective pixel; an acquisition unit that acquires an imaging condition and an imaging environment at a time of image sensing; a determination unit that compares the first information and the second information, and determines whether defect correction of each defective pixel is necessary or not based on a comparison result; and a correction unit that performs the defect correction on image data output from a defective pixel for which the determination unit determines that defect correction is necessary.. .
|Image sensor defect identification using blurring techniques|
Embodiments described herein may operate to image a scene with an imaging system using an image blurring technique. An image sensor array (isa) element may be identified as a dark defect element if a first ratio of an average of a set of illuminance signal magnitudes from a set of surrounding isa elements to a magnitude of an illuminance signal from the isa element is greater than a threshold sharpness value.
|Recording apparatus and recording system|
A process of detecting a defective recording element and a process of correcting the defective recording element are performed with appropriate processing loads. When the detection process and the correction processes are performed with small loads, for example, at a time of recording, a resolution used for reading an inspection pattern is set lower than that set in a case where the processes can be performed with small loads, for example, at down time before recording.
|Artificial defect for eddy current inspection|
A flex circuit for creating artificial defects uses a thin conductive layer with rectangular slots therein representing defects. A thin insulating over-layer is used to protect the conductive layer as well as an eddy current probe.
|Methods of containing defects for non-silicon device engineering|
An apparatus including a device including a channel material having a first lattice structure on a well of a well material having a matched lattice structure in a buffer material having a second lattice structure that is different than the first lattice structure. A method including forming a trench in a buffer material; forming an n-type well material in the trench, the n-type well material having a lattice structure that is different than a lattice structure of the buffer material; and forming an n-type transistor.
The encoder includes a plurality of position-detection-signal generation systems that generates electrical signals as position detection signals having different cycles, respectively; a first computing unit that calculates first position data based on the position detection signals generated by the position-detection-signal generation systems; a second computing unit that calculates second position data based on electrical signals generated by fewer ones of the position-detection-signal generation systems than in the first computing unit; and a failure determination unit that determines whether the encoder is defective based on a comparison between the first position data and the second position data.. .